KR102385931B1 - 중공 음극 방전 (hcd) 을 억제하는 용량적으로 결합된 플라즈마 전극 및 가스 분배 대면플레이트 - Google Patents

중공 음극 방전 (hcd) 을 억제하는 용량적으로 결합된 플라즈마 전극 및 가스 분배 대면플레이트 Download PDF

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KR102385931B1
KR102385931B1 KR1020150075156A KR20150075156A KR102385931B1 KR 102385931 B1 KR102385931 B1 KR 102385931B1 KR 1020150075156 A KR1020150075156 A KR 1020150075156A KR 20150075156 A KR20150075156 A KR 20150075156A KR 102385931 B1 KR102385931 B1 KR 102385931B1
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holes
plasma
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face plate
metal seal
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KR20150138073A (ko
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제레미 터커
에드워드 오거스티니아크
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램 리써치 코포레이션
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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    • C23C16/4401Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
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    • C23C16/45525Atomic layer deposition [ALD]
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    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/505Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
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    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means
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    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
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    • H01J37/32431Constructional details of the reactor
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    • H01J37/32Gas-filled discharge tubes
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KR1020150075156A 2014-05-30 2015-05-28 중공 음극 방전 (hcd) 을 억제하는 용량적으로 결합된 플라즈마 전극 및 가스 분배 대면플레이트 Active KR102385931B1 (ko)

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KR1020220043586A KR102529263B1 (ko) 2014-05-30 2022-04-07 중공 음극 방전 (hcd) 을 억제하는 용량적으로 결합된 플라즈마 전극 및 가스 분배 대면플레이트

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Application Number Priority Date Filing Date Title
US201462005454P 2014-05-30 2014-05-30
US62/005,454 2014-05-30
US14/700,749 US10077497B2 (en) 2014-05-30 2015-04-30 Hollow cathode discharge (HCD) suppressing capacitively coupled plasma electrode and gas distribution faceplate
US14/700,749 2015-04-30

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KR1020220043586A Division KR102529263B1 (ko) 2014-05-30 2022-04-07 중공 음극 방전 (hcd) 을 억제하는 용량적으로 결합된 플라즈마 전극 및 가스 분배 대면플레이트

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KR102385931B1 true KR102385931B1 (ko) 2022-04-11

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KR1020150075156A Active KR102385931B1 (ko) 2014-05-30 2015-05-28 중공 음극 방전 (hcd) 을 억제하는 용량적으로 결합된 플라즈마 전극 및 가스 분배 대면플레이트
KR1020220043586A Active KR102529263B1 (ko) 2014-05-30 2022-04-07 중공 음극 방전 (hcd) 을 억제하는 용량적으로 결합된 플라즈마 전극 및 가스 분배 대면플레이트
KR1020230056606A Active KR102731243B1 (ko) 2014-05-30 2023-04-28 중공 음극 방전 (hcd) 을 억제하는 용량적으로 결합된 플라즈마 전극 및 가스 분배 대면플레이트

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KR1020230056606A Active KR102731243B1 (ko) 2014-05-30 2023-04-28 중공 음극 방전 (hcd) 을 억제하는 용량적으로 결합된 플라즈마 전극 및 가스 분배 대면플레이트

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US (2) US10077497B2 (https=)
JP (2) JP6599132B2 (https=)
KR (3) KR102385931B1 (https=)
CN (1) CN105185682B (https=)
SG (1) SG10201504088VA (https=)
TW (2) TWI680203B (https=)

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US10604841B2 (en) 2016-12-14 2020-03-31 Lam Research Corporation Integrated showerhead with thermal control for delivering radical and precursor gas to a downstream chamber to enable remote plasma film deposition
JP7176860B6 (ja) 2017-05-17 2022-12-16 アプライド マテリアルズ インコーポレイテッド 前駆体の流れを改善する半導体処理チャンバ
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US10964512B2 (en) 2018-02-15 2021-03-30 Applied Materials, Inc. Semiconductor processing chamber multistage mixing apparatus and methods
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