KR102365523B1 - 시험체 표면 내로의 침투체의 침투 이동 중에 측정 신호를 결정하는 측정 시스템, 측정기구 및 방법 - Google Patents

시험체 표면 내로의 침투체의 침투 이동 중에 측정 신호를 결정하는 측정 시스템, 측정기구 및 방법 Download PDF

Info

Publication number
KR102365523B1
KR102365523B1 KR1020197018897A KR20197018897A KR102365523B1 KR 102365523 B1 KR102365523 B1 KR 102365523B1 KR 1020197018897 A KR1020197018897 A KR 1020197018897A KR 20197018897 A KR20197018897 A KR 20197018897A KR 102365523 B1 KR102365523 B1 KR 102365523B1
Authority
KR
South Korea
Prior art keywords
indenter
specimen
measuring
measuring device
movement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020197018897A
Other languages
English (en)
Korean (ko)
Other versions
KR20190094388A (ko
Inventor
헬무트 휘셔
Original Assignee
헬무트 휘셔 게엠베하 인스티투트 퍼 엘렉트로닉 운트 메쓰테크닉
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 헬무트 휘셔 게엠베하 인스티투트 퍼 엘렉트로닉 운트 메쓰테크닉 filed Critical 헬무트 휘셔 게엠베하 인스티투트 퍼 엘렉트로닉 운트 메쓰테크닉
Publication of KR20190094388A publication Critical patent/KR20190094388A/ko
Application granted granted Critical
Publication of KR102365523B1 publication Critical patent/KR102365523B1/ko
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40Investigating hardness or rebound hardness
    • G01N3/42Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
    • G01N3/46Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid the indentors performing a scratching movement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/003Generation of the force
    • G01N2203/005Electromagnetic means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/026Specifications of the specimen
    • G01N2203/0262Shape of the specimen
    • G01N2203/0278Thin specimens
    • G01N2203/0282Two dimensional, e.g. tapes, webs, sheets, strips, disks or membranes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/026Specifications of the specimen
    • G01N2203/0286Miniature specimen; Testing on microregions of a specimen
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/06Indicating or recording means; Sensing means
    • G01N2203/0617Electrical or magnetic indicating, recording or sensing means
    • G01N2203/0635Electrical or magnetic indicating, recording or sensing means using magnetic properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0096Testing material properties on thin layers or coatings

Landscapes

  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
KR1020197018897A 2016-11-29 2017-11-06 시험체 표면 내로의 침투체의 침투 이동 중에 측정 신호를 결정하는 측정 시스템, 측정기구 및 방법 Expired - Fee Related KR102365523B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102016123010.3A DE102016123010A1 (de) 2016-11-29 2016-11-29 Messvorrichtung, Messanordnung und Verfahren zur Ermittlung von Messsignalen während einer Eindringbewegung eines Eindringkörpers in eine Oberfläche eines Prüfkörpers
DE102016123010.3 2016-11-29
PCT/EP2017/078275 WO2018099688A1 (de) 2016-11-29 2017-11-06 Messvorrichtung, messanordnung und verfahren zur ermittlung von messsignalen während einer eindringbewegung eines eindringkörpers in eine oberfläche eines prüfkörpers

Publications (2)

Publication Number Publication Date
KR20190094388A KR20190094388A (ko) 2019-08-13
KR102365523B1 true KR102365523B1 (ko) 2022-02-22

Family

ID=60245108

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020197018897A Expired - Fee Related KR102365523B1 (ko) 2016-11-29 2017-11-06 시험체 표면 내로의 침투체의 침투 이동 중에 측정 신호를 결정하는 측정 시스템, 측정기구 및 방법

Country Status (8)

Country Link
US (2) US20210116344A1 (enExample)
EP (1) EP3548866B1 (enExample)
JP (1) JP7200118B2 (enExample)
KR (1) KR102365523B1 (enExample)
CN (1) CN110234975A (enExample)
DE (1) DE102016123010A1 (enExample)
ES (1) ES2818657T3 (enExample)
WO (1) WO2018099688A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024003082A1 (en) * 2022-06-27 2024-01-04 4A Engineering Gmbh Modular material testing apparatus for material testing of a specimen

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102018221337A1 (de) * 2018-12-10 2020-06-10 Vetter Pharma-Fertigung GmbH & Co. KG Kraftmessanordnung, Kraftmessvorrichtung mit einer solchen Kraftmessanordnung und Verfahren mit einer solchen Kraftmessanordnung
CN109781507B (zh) * 2019-03-04 2021-07-20 天津中德应用技术大学 一种超长试样硬度测量平衡装置
CN112161185B (zh) * 2020-09-21 2021-08-24 安徽工程大学 用于磁流体润滑的摩擦副磁场强度微调装置及其使用方法
GB2602264B (en) * 2020-12-17 2024-12-18 Peratech Ip Ltd Calibration of a force sensing device
DE102020134454B4 (de) * 2020-12-21 2024-10-31 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Eindringkörperaufnahme für eine Messvorrichtung sowie Messvorrichtung zur Erfassung von Signalen
DE202021100529U1 (de) 2021-02-03 2022-05-04 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Auswechselbares Komponentenmodul für eine Messvorrichtung
DE102021118556A1 (de) 2021-07-19 2023-01-19 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Verfahren und Messvorrichtung zur Erfassung von Messsignalen
CN113640508B (zh) * 2021-07-19 2024-02-27 安徽桐康医疗科技股份有限公司 一种荧光免疫定量分析仪用检测板
CN113607114B (zh) * 2021-08-02 2024-05-10 芜湖全程智能科技有限公司 汽车epb压轴套测量机构
TWI826100B (zh) * 2022-11-04 2023-12-11 國立臺灣海洋大學 磨耗試驗機構
CN118091026B (zh) * 2024-01-05 2024-09-20 江苏斯德瑞克化工有限公司 一种聚醚类湿电子化学品的测试装置及测试方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000227321A (ja) 1999-01-29 2000-08-15 Renishaw Plc 振動減衰スタイラスを有するプロ―ブ
US20010031077A1 (en) 1997-10-24 2001-10-18 Ultratouch Corporation Method and apparatus for detecting very small breast anomalies
US20040111199A1 (en) 2002-12-06 2004-06-10 Hossein Javaherian Method for remote engine start

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5025581U (enExample) * 1973-06-29 1975-03-24
JPS5548635A (en) * 1978-10-05 1980-04-07 Union Kogaku Kk Weighing load device for hardness gauge
JPS5879249U (ja) * 1981-11-24 1983-05-28 セイコーエプソン株式会社 荷重可変方式硬度計
JP2551931B2 (ja) * 1985-02-22 1996-11-06 日本電気株式会社 薄膜硬度測定器
DE3738106C2 (de) * 1987-11-10 1995-06-22 Helmut Fischer Gmbh & Co Vorrichtung für ein Härtemeßgerät
JPH01187434A (ja) * 1988-01-22 1989-07-26 Mc Sci:Kk 熱機械分析装置
DE4343612C2 (de) * 1993-12-16 1997-04-30 Uwe Dipl Ing Bluecher Vorrichtung zur Bestimmung der Elastizität von Materialien
JPH09178636A (ja) * 1995-12-27 1997-07-11 Nikon Corp 表面物性評価装置および表面物性評価装置の試料位置補正方法
US5866807A (en) * 1997-02-04 1999-02-02 Digital Instruments Method and apparatus for measuring mechanical properties on a small scale
CA2321797A1 (en) 1998-03-11 1999-09-16 Li Lin Test apparatus and method of measuring mar resistance of film or coating
US6945097B2 (en) * 2002-04-10 2005-09-20 Mts Systems Corporation Characteristic strain and fracture resistance for scratch independently of indenter geometry
JP4102722B2 (ja) 2003-07-23 2008-06-18 埼玉県 微小変位制御装置およびそれを用いた装置と方法
CN100357722C (zh) * 2004-09-07 2007-12-26 中国科学院力学研究所 电磁式微力学压痕测试仪及其测试方法
JP2009020048A (ja) 2007-07-13 2009-01-29 Jtekt Corp 接触式センサ
CN101451938A (zh) * 2007-11-29 2009-06-10 李汀 便携式硬度计
CN201191257Y (zh) * 2008-05-15 2009-02-04 中国科学院力学研究所 一种便携式压入仪
JP2010071929A (ja) 2008-09-22 2010-04-02 Citizen Holdings Co Ltd 硬度計
CN201464309U (zh) * 2009-06-29 2010-05-12 杭州立威化工涂料有限公司 油漆涂层硬度测定仪
JP2011133317A (ja) 2009-12-24 2011-07-07 Koyo Mach Ind Co Ltd 変位測定装置
CN201689026U (zh) * 2010-05-10 2010-12-29 深圳市南和华毅塑胶制品有限公司 指甲模拟测试装置
CN103308405B (zh) * 2012-03-13 2015-06-17 沈阳天星试验仪器有限公司 便携式数显硬度测量装置
JP6134929B2 (ja) 2012-10-02 2017-05-31 国立大学法人 岡山大学 材料特性評価装置
JP6067426B2 (ja) * 2013-03-06 2017-01-25 株式会社ミツトヨ 硬さ試験機
DE102014101577A1 (de) * 2014-02-07 2015-08-13 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Verfahren zur elektrischen Ansteuerung eines Messstativs sowie Messstativ zur Aufnahme einer Messsonde
DE102015103136A1 (de) * 2015-03-04 2016-09-08 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Verfahren zur elektronischen Ansteuerung eines Messstativs

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20010031077A1 (en) 1997-10-24 2001-10-18 Ultratouch Corporation Method and apparatus for detecting very small breast anomalies
JP2000227321A (ja) 1999-01-29 2000-08-15 Renishaw Plc 振動減衰スタイラスを有するプロ―ブ
US20040111199A1 (en) 2002-12-06 2004-06-10 Hossein Javaherian Method for remote engine start

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024003082A1 (en) * 2022-06-27 2024-01-04 4A Engineering Gmbh Modular material testing apparatus for material testing of a specimen

Also Published As

Publication number Publication date
EP3548866B1 (de) 2020-06-17
CN110234975A (zh) 2019-09-13
US20210116344A1 (en) 2021-04-22
US20220074838A1 (en) 2022-03-10
DE102016123010A1 (de) 2018-05-30
KR20190094388A (ko) 2019-08-13
ES2818657T3 (es) 2021-04-13
WO2018099688A1 (de) 2018-06-07
JP7200118B2 (ja) 2023-01-06
EP3548866A1 (de) 2019-10-09
JP2020501168A (ja) 2020-01-16
US11867666B2 (en) 2024-01-09

Similar Documents

Publication Publication Date Title
KR102365523B1 (ko) 시험체 표면 내로의 침투체의 침투 이동 중에 측정 신호를 결정하는 측정 시스템, 측정기구 및 방법
US10429178B2 (en) Correcting and/or preventing errors during the measurement of coordinates of a work piece
CN102317737B (zh) 坐标测量机(cmm)和补偿坐标测量机中的误差的方法
US8144340B2 (en) Surface sensing device with optical sensor
JP5414155B2 (ja) 寸法計測装置
KR20030011085A (ko) 동적 인장 시험기
US20220316851A1 (en) Metrology system
US7086170B2 (en) Analogue probe
KR20190127659A (ko) 수치 제어 머신 툴을 측정하기 위한 방법에 적용하기 위한 수치 제어 머신 툴에 사용하기 위한 디바이스
KR20190022318A (ko) 갠트리 타입의 위치 결정 장치
KR100919391B1 (ko) 스테이지장치
GB2606243A (en) Indenter receptacle for a measuring device, and a measuring device for detecting signals
US4941352A (en) Method and apparatus for mass centering of a rotor
JP2000002636A (ja) 材料試験機
DE102011104228B4 (de) Vorrichtung zur Längenmessung und Verwendung der Vorrichtung zur Bestimmung physikalischer Eigenschaften von Messobjekten
CN219914324U (zh) 一种轴类零件圆度测量装置
CN120292974B (zh) 一种具有阻尼功能的扫描测头及三坐标测量机
JPH11230714A (ja) 円筒形状測定装置
CN121067776A (zh) 测量机器
CN85106993A (zh) 表面跟踪器
JPH11281545A (ja) 材料試験機
Karuc et al. A measurement probe for coordinate measuring machines based on GMR technology
HK1263070A1 (en) Measuring device for detecting measurement signals during a penetration movement of a penetration body
JPH0686015U (ja) 測定機のバランス装置
KR20180102618A (ko) 침투체의 침투 이동 중에 측정 신호를 검출하는 측정 장치

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

A201 Request for examination
PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PN2301 Change of applicant

St.27 status event code: A-3-3-R10-R13-asn-PN2301

St.27 status event code: A-3-3-R10-R11-asn-PN2301

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U12-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20250217

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20250217