KR102270956B1 - 광학 부재의 검사 방법, 광학 제품의 제조 방법 및 광학 부재의 검사 장치 - Google Patents

광학 부재의 검사 방법, 광학 제품의 제조 방법 및 광학 부재의 검사 장치 Download PDF

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KR102270956B1
KR102270956B1 KR1020140090810A KR20140090810A KR102270956B1 KR 102270956 B1 KR102270956 B1 KR 102270956B1 KR 1020140090810 A KR1020140090810 A KR 1020140090810A KR 20140090810 A KR20140090810 A KR 20140090810A KR 102270956 B1 KR102270956 B1 KR 102270956B1
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optical member
light source
imaging unit
source unit
imaging
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KR1020140090810A
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Korean (ko)
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KR20150017663A (ko
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도루 다무라
슈야 후루사와
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닛토덴코 가부시키가이샤
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Priority to KR1020200073511A priority Critical patent/KR102373254B1/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Mathematical Physics (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020140090810A 2013-08-07 2014-07-18 광학 부재의 검사 방법, 광학 제품의 제조 방법 및 광학 부재의 검사 장치 KR102270956B1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020200073511A KR102373254B1 (ko) 2013-08-07 2020-06-17 광학 부재의 검사 방법, 광학 제품의 제조 방법 및 광학 부재의 검사 장치

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2013-164481 2013-08-07
JP2013164481A JP6255186B2 (ja) 2013-08-07 2013-08-07 光学部材の検査方法、光学製品の製造方法、及び、光学部材の検査装置

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KR1020200073511A Division KR102373254B1 (ko) 2013-08-07 2020-06-17 광학 부재의 검사 방법, 광학 제품의 제조 방법 및 광학 부재의 검사 장치

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KR20150017663A KR20150017663A (ko) 2015-02-17
KR102270956B1 true KR102270956B1 (ko) 2021-07-01

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KR1020140090810A KR102270956B1 (ko) 2013-08-07 2014-07-18 광학 부재의 검사 방법, 광학 제품의 제조 방법 및 광학 부재의 검사 장치
KR1020200073511A KR102373254B1 (ko) 2013-08-07 2020-06-17 광학 부재의 검사 방법, 광학 제품의 제조 방법 및 광학 부재의 검사 장치

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JP (1) JP6255186B2 (ja)
KR (2) KR102270956B1 (ja)
CN (1) CN104345062B (ja)
TW (2) TWI649555B (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6255186B2 (ja) * 2013-08-07 2017-12-27 日東電工株式会社 光学部材の検査方法、光学製品の製造方法、及び、光学部材の検査装置
JP6807637B2 (ja) * 2015-09-30 2021-01-06 日東電工株式会社 偏光子の検査方法および偏光板の製造方法
JP6898492B2 (ja) * 2015-09-30 2021-07-07 日東電工株式会社 偏光子の検査方法および偏光板の製造方法
JP6986614B2 (ja) * 2015-10-05 2021-12-22 日東電工株式会社 偏光子の製造方法
JP6795883B2 (ja) * 2015-10-05 2020-12-02 日東電工株式会社 偏光子の製造方法
CN110139827B (zh) * 2016-10-26 2023-04-14 得克萨斯州大学系统董事会 用于反射和透射纳米光子器件的高吞吐量、高分辨率光学计量

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JP2002048726A (ja) * 2000-07-31 2002-02-15 Dainippon Printing Co Ltd 光散乱透過シートの欠点検査装置
JP2006113575A (ja) * 2004-09-17 2006-04-27 Sumitomo Chemical Co Ltd 光学積層体
JP2007298416A (ja) * 2006-04-28 2007-11-15 Kaneka Corp シート状透明体検査装置、シート状透明体の検査方法およびシート状透明体の製造方法
JP2009205138A (ja) 2008-01-28 2009-09-10 Nitto Denko Corp 光学表示ユニットの製造方法および製造システム

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JP3677133B2 (ja) * 1996-12-18 2005-07-27 株式会社ヒューテック 透明体検査装置
JP2003344301A (ja) * 2002-05-31 2003-12-03 Sumitomo Chem Co Ltd 偏光フィルムの検査方法および検査装置
JP4755888B2 (ja) * 2005-11-21 2011-08-24 住友化学株式会社 枚葉フィルム検査装置及び枚葉フィルム検査方法
JP5051874B2 (ja) 2006-01-11 2012-10-17 日東電工株式会社 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置
JP4960161B2 (ja) * 2006-10-11 2012-06-27 日東電工株式会社 検査データ処理装置及び検査データ処理方法
JP2008175609A (ja) * 2007-01-17 2008-07-31 Sekisui Chem Co Ltd 光学フィルムの検査方法及び光学フィルム
JP2009069142A (ja) * 2007-08-23 2009-04-02 Nitto Denko Corp 積層フィルムの欠陥検査方法およびその装置
JP4785944B2 (ja) * 2008-04-16 2011-10-05 日東電工株式会社 光学表示装置の製造方法
JP4503691B1 (ja) * 2009-10-13 2010-07-14 日東電工株式会社 液層表示素子の連続製造方法及び装置
JP2011085520A (ja) * 2009-10-16 2011-04-28 Kaneka Corp 欠陥判別装置、欠陥判別方法及びシート状物
JP2011226957A (ja) * 2010-04-21 2011-11-10 Sanritz Corp 偏光板の欠陥検査方法及び欠陥検査装置
JP5944165B2 (ja) * 2010-05-25 2016-07-05 東レ株式会社 フィルムの欠陥検査装置および欠陥検査方法
JP4921597B1 (ja) * 2011-03-18 2012-04-25 日東電工株式会社 液晶表示パネルの連続製造システムおよび液晶表示パネルの連続製造方法、並びに、検査装置および検査方法
JP6255186B2 (ja) * 2013-08-07 2017-12-27 日東電工株式会社 光学部材の検査方法、光学製品の製造方法、及び、光学部材の検査装置

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002048726A (ja) * 2000-07-31 2002-02-15 Dainippon Printing Co Ltd 光散乱透過シートの欠点検査装置
JP2006113575A (ja) * 2004-09-17 2006-04-27 Sumitomo Chemical Co Ltd 光学積層体
JP2007298416A (ja) * 2006-04-28 2007-11-15 Kaneka Corp シート状透明体検査装置、シート状透明体の検査方法およびシート状透明体の製造方法
JP2009205138A (ja) 2008-01-28 2009-09-10 Nitto Denko Corp 光学表示ユニットの製造方法および製造システム

Also Published As

Publication number Publication date
CN104345062A (zh) 2015-02-11
KR102373254B1 (ko) 2022-03-10
TWI649555B (zh) 2019-02-01
KR20200078438A (ko) 2020-07-01
CN104345062B (zh) 2018-09-28
JP6255186B2 (ja) 2017-12-27
TW201506384A (zh) 2015-02-16
KR20150017663A (ko) 2015-02-17
TWI630380B (zh) 2018-07-21
JP2015034710A (ja) 2015-02-19
TW201809641A (zh) 2018-03-16

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