KR102208719B1 - 패턴화되고 구조화된 전사 테이프 - Google Patents

패턴화되고 구조화된 전사 테이프 Download PDF

Info

Publication number
KR102208719B1
KR102208719B1 KR1020157019639A KR20157019639A KR102208719B1 KR 102208719 B1 KR102208719 B1 KR 102208719B1 KR 1020157019639 A KR1020157019639 A KR 1020157019639A KR 20157019639 A KR20157019639 A KR 20157019639A KR 102208719 B1 KR102208719 B1 KR 102208719B1
Authority
KR
South Korea
Prior art keywords
layer
backfill
template
backfill layer
structured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020157019639A
Other languages
English (en)
Korean (ko)
Other versions
KR20150099585A (ko
Inventor
마틴 비 월크
마이클 벤톤 프리
마가렛 엠 보겔-마틴
에반 엘 슈바르츠
미에크지슬로 에이치 마주렉
테리 오 콜리에
Original Assignee
쓰리엠 이노베이티브 프로퍼티즈 컴파니
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 쓰리엠 이노베이티브 프로퍼티즈 컴파니 filed Critical 쓰리엠 이노베이티브 프로퍼티즈 컴파니
Publication of KR20150099585A publication Critical patent/KR20150099585A/ko
Application granted granted Critical
Publication of KR102208719B1 publication Critical patent/KR102208719B1/ko
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C17/00Surface treatment of glass, not in the form of fibres or filaments, by coating
    • C03C17/28Surface treatment of glass, not in the form of fibres or filaments, by coating with organic material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B3/00Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form
    • B32B3/26Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by a particular shape of the outline of the cross-section of a continuous layer; characterised by a layer with cavities or internal voids ; characterised by an apertured layer
    • B32B3/263Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by a particular shape of the outline of the cross-section of a continuous layer; characterised by a layer with cavities or internal voids ; characterised by an apertured layer characterised by a layer having non-uniform thickness
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C17/00Surface treatment of glass, not in the form of fibres or filaments, by coating
    • C03C17/34Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • G03F7/161Coating processes; Apparatus therefor using a previously coated surface, e.g. by stamping or by transfer lamination
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/34Imagewise removal by selective transfer, e.g. peeling away
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/30Devices specially adapted for multicolour light emission
    • H10K59/38Devices specially adapted for multicolour light emission comprising colour filters or colour changing media [CCM]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K77/00Constructional details of devices covered by this subclass and not covered by groups H10K10/80, H10K30/80, H10K50/80 or H10K59/80
    • H10K77/10Substrates, e.g. flexible substrates
    • H10K77/111Flexible substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/40Organosilicon compounds, e.g. TIPS pentacene
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C2201/00Manufacture or treatment of microstructural devices or systems
    • B81C2201/01Manufacture or treatment of microstructural devices or systems in or on a substrate
    • B81C2201/0174Manufacture or treatment of microstructural devices or systems in or on a substrate for making multi-layered devices, film deposition or growing
    • B81C2201/0191Transfer of a layer from a carrier wafer to a device wafer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68368Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used in a transfer process involving at least two transfer steps, i.e. including an intermediate handle substrate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K2102/00Constructional details relating to the organic devices covered by this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K2102/00Constructional details relating to the organic devices covered by this subclass
    • H10K2102/301Details of OLEDs
    • H10K2102/311Flexible OLED
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K2102/00Constructional details relating to the organic devices covered by this subclass
    • H10K2102/301Details of OLEDs
    • H10K2102/331Nanoparticles used in non-emissive layers, e.g. in packaging layer
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10OLED displays
    • H10K59/12Active-matrix OLED [AMOLED] displays
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10OLED displays
    • H10K59/12Active-matrix OLED [AMOLED] displays
    • H10K59/1201Manufacture or treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/80Manufacture or treatment specially adapted for the organic devices covered by this subclass using temporary substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/10Organic polymers or oligomers
    • H10K85/141Organic polymers or oligomers comprising aliphatic or olefinic chains, e.g. poly N-vinylcarbazol, PVC or PTFE
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/549Organic PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/24Structurally defined web or sheet [e.g., overall dimension, etc.]
    • Y10T428/24479Structurally defined web or sheet [e.g., overall dimension, etc.] including variation in thickness
    • Y10T428/24521Structurally defined web or sheet [e.g., overall dimension, etc.] including variation in thickness with component conforming to contour of nonplanar surface

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Organic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nanotechnology (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Laminated Bodies (AREA)
  • Microelectronics & Electronic Packaging (AREA)
KR1020157019639A 2012-12-21 2013-12-12 패턴화되고 구조화된 전사 테이프 Expired - Fee Related KR102208719B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/723,716 2012-12-21
US13/723,716 US9711744B2 (en) 2012-12-21 2012-12-21 Patterned structured transfer tape
PCT/US2013/074523 WO2014099562A1 (en) 2012-12-21 2013-12-12 Patterned structured transfer tape

Publications (2)

Publication Number Publication Date
KR20150099585A KR20150099585A (ko) 2015-08-31
KR102208719B1 true KR102208719B1 (ko) 2021-01-28

Family

ID=50974961

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020157019639A Expired - Fee Related KR102208719B1 (ko) 2012-12-21 2013-12-12 패턴화되고 구조화된 전사 테이프

Country Status (6)

Country Link
US (6) US9711744B2 (enExample)
EP (1) EP2934896B1 (enExample)
JP (1) JP6367226B2 (enExample)
KR (1) KR102208719B1 (enExample)
CN (1) CN104870198B (enExample)
WO (1) WO2014099562A1 (enExample)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140178698A1 (en) 2012-12-21 2014-06-26 3M Innovative Properties Company Curable silsesquioxane polymers, compositions, articles, and methods
US9711744B2 (en) 2012-12-21 2017-07-18 3M Innovative Properties Company Patterned structured transfer tape
KR20150100765A (ko) 2012-12-21 2015-09-02 쓰리엠 이노베이티브 프로퍼티즈 컴파니 경화성 실세스퀴옥산 중합체, 조성물, 물품, 및 방법
US20140175707A1 (en) 2012-12-21 2014-06-26 3M Innovative Properties Company Methods of using nanostructured transfer tape and articles made therefrom
US9878954B2 (en) 2013-09-13 2018-01-30 3M Innovative Properties Company Vacuum glazing pillars for insulated glass units
KR102350809B1 (ko) * 2014-01-20 2022-01-14 쓰리엠 이노베이티브 프로퍼티즈 컴파니 요각 구조체를 형성하기 위한 라미네이션 전사 필름
US20150202834A1 (en) * 2014-01-20 2015-07-23 3M Innovative Properties Company Lamination transfer films for forming antireflective structures
US9246134B2 (en) 2014-01-20 2016-01-26 3M Innovative Properties Company Lamination transfer films for forming articles with engineered voids
WO2015112708A1 (en) 2014-01-22 2015-07-30 3M Innovative Properties Company Microoptics for glazing
TW201539736A (zh) 2014-03-19 2015-10-16 3M Innovative Properties Co 用於藉白光成色之 oled 裝置的奈米結構
US9643381B2 (en) * 2014-05-19 2017-05-09 Vindicoat, Llc Composite binding materials
CN106461827B (zh) 2014-06-13 2019-10-08 3M创新有限公司 用于闪耀减少的光学叠堆
US9472788B2 (en) 2014-08-27 2016-10-18 3M Innovative Properties Company Thermally-assisted self-assembly method of nanoparticles and nanowires within engineered periodic structures
WO2016064565A1 (en) * 2014-10-20 2016-04-28 3M Innovative Properties Company Insulated glazing units and microoptical layer comprising microstructured diffuser and methods
US10518512B2 (en) * 2015-03-31 2019-12-31 3M Innovative Properties Company Method of forming dual-cure nanostructure transfer film
US10106643B2 (en) * 2015-03-31 2018-10-23 3M Innovative Properties Company Dual-cure nanostructure transfer film
US10435590B2 (en) * 2015-06-19 2019-10-08 3M Innovative Properties Company Segmented transfer tape and method of making and use thereof
CN107835741B (zh) 2015-06-19 2019-12-06 3M创新有限公司 分段式和非分段式转印带、由其制得的制品以及其制作和使用方法
WO2016205189A1 (en) * 2015-06-19 2016-12-22 3M Innovative Properties Company Micro-optical assemblies including transparent substrates having graphic layer and method of making thereof
US10656312B2 (en) 2015-06-30 2020-05-19 3M Innovative Properties Company Insulated glazing units and microoptical layer including microstructured anisotropic diffuser and methods
KR102288354B1 (ko) * 2015-08-10 2021-08-11 삼성디스플레이 주식회사 플렉서블 디스플레이 장치의 제조 방법
KR101896364B1 (ko) * 2015-11-11 2018-09-07 주식회사 아모텍 페라이트 시트의 제조방법 및 이를 이용한 페라이트 시트
JP6788018B2 (ja) 2016-09-16 2020-11-18 東京応化工業株式会社 基板接着方法及び積層体の製造方法
WO2018057586A1 (en) * 2016-09-20 2018-03-29 Sharklet Technologies, Inc Imprinting tape, method of manufacture thereof and articles comprising the same
US10367169B2 (en) * 2016-10-17 2019-07-30 Corning Incorporated Processes for making light extraction substrates for an organic light emitting diode using photo-thermal treatment
CN107021644B (zh) * 2017-04-13 2019-09-13 宁波大学 一种光伏玻璃的制备方法
JP7219606B2 (ja) * 2018-12-21 2023-02-08 東京応化工業株式会社 半導体基板の製造方法
US11825568B2 (en) * 2021-04-01 2023-11-21 Whirlpool Corporation Segmented thermoresistive heating system
CN114179536A (zh) * 2021-12-15 2022-03-15 上海豪承信息技术有限公司 一种图案的处理方法
US11878935B1 (en) * 2022-12-27 2024-01-23 Canon Kabushiki Kaisha Method of coating a superstrate
CN115974422B (zh) * 2022-12-29 2025-04-11 蓝思科技(长沙)有限公司 玻璃表面纹理的制备方法、具有纹理的玻璃和应用

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070298176A1 (en) * 2006-06-26 2007-12-27 Dipietro Richard Anthony Aromatic vinyl ether based reverse-tone step and flash imprint lithography
US20100104807A1 (en) * 2008-10-23 2010-04-29 Compal Electronics, Inc. Transfer film, method of manufacturing the same, transfer method and object surface structure

Family Cites Families (67)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE24906E (en) 1955-11-18 1960-12-13 Pressure-sensitive adhesive sheet material
US4472480A (en) 1982-07-02 1984-09-18 Minnesota Mining And Manufacturing Company Low surface energy liner of perfluoropolyether
US4567073A (en) 1982-07-02 1986-01-28 Minnesota Mining And Manufacturing Company Composite low surface energy liner of perfluoropolyether
US4614667A (en) 1984-05-21 1986-09-30 Minnesota Mining And Manufacturing Company Composite low surface energy liner of perfluoropolyether
GB8911806D0 (en) 1989-05-23 1989-07-12 Rolls Royce Plc Gas turbine engine fuel control system with enhanced relight capability
US5234740A (en) * 1991-08-28 1993-08-10 Minnesota Mining And Manufacturing Company Slip control sheeting and articles covered with same
WO1993005123A1 (en) 1991-09-12 1993-03-18 Minnesota Mining And Manufacturing Company Patterned pressure sensitive adhesive transfer tape
US5591958A (en) 1993-06-14 1997-01-07 Nikon Corporation Scanning exposure method and apparatus
US5691846A (en) 1993-10-20 1997-11-25 Minnesota Mining And Manufacturing Company Ultra-flexible retroreflective cube corner composite sheetings and methods of manufacture
JP3444053B2 (ja) 1995-10-13 2003-09-08 ソニー株式会社 薄膜半導体装置
DE69922725T2 (de) * 1998-03-17 2005-12-15 Chi Mei Optoelectronics Corp. Material bestehend aus einer Anti-Reflektionsbeschichtung auf einem flexiblen Glassubstrat
US6329058B1 (en) * 1998-07-30 2001-12-11 3M Innovative Properties Company Nanosize metal oxide particles for producing transparent metal oxide colloids and ceramers
US6521324B1 (en) 1999-11-30 2003-02-18 3M Innovative Properties Company Thermal transfer of microstructured layers
US6838142B2 (en) 2001-05-18 2005-01-04 3M Innovative Properties Company Specular laminates
US6858253B2 (en) 2001-05-31 2005-02-22 3M Innovative Properties Company Method of making dimensionally stable composite article
JP4436030B2 (ja) 2002-05-10 2010-03-24 スリーエム イノベイティブ プロパティズ カンパニー アクリル系剥離剤前駆体、剥離剤物品及び剥離剤物品の製造方法
US6849558B2 (en) 2002-05-22 2005-02-01 The Board Of Trustees Of The Leland Stanford Junior University Replication and transfer of microstructures and nanostructures
US6805809B2 (en) * 2002-08-28 2004-10-19 Board Of Trustees Of University Of Illinois Decal transfer microfabrication
WO2004022637A2 (en) * 2002-09-05 2004-03-18 Nanosys, Inc. Nanocomposites
KR100638091B1 (ko) 2003-07-02 2006-10-25 재단법인서울대학교산학협력재단 나노입자 패터닝 방법 및 이를 이용한 소결체의 제조 방법
US20050147838A1 (en) 2003-12-30 2005-07-07 3M Innovative Properties Company Polymerizable compositions for optical articles
JP2005193473A (ja) 2004-01-06 2005-07-21 Three M Innovative Properties Co 転写用成形型及びその製造方法ならびに微細構造体の製造方法
US7419912B2 (en) 2004-04-01 2008-09-02 Cree, Inc. Laser patterning of light emitting devices
US7490547B2 (en) * 2004-12-30 2009-02-17 Asml Netherlands B.V. Imprint lithography
US7645478B2 (en) * 2005-03-31 2010-01-12 3M Innovative Properties Company Methods of making displays
DE102005017170B4 (de) * 2005-04-13 2010-07-01 Ovd Kinegram Ag Transferfolie, Verfahren zu deren Herstellung sowie Mehrschichtkörper und dessen Verwendung
US20060270806A1 (en) * 2005-05-26 2006-11-30 Hale Wesley R Miscible high Tg polyester/polymer blend compositions and films formed therefrom
AU2006282042B2 (en) 2005-06-17 2011-12-22 The University Of North Carolina At Chapel Hill Nanoparticle fabrication methods, systems, and materials
US20070020451A1 (en) 2005-07-20 2007-01-25 3M Innovative Properties Company Moisture barrier coatings
US7569254B2 (en) 2005-08-22 2009-08-04 Eastman Kodak Company Nanocomposite materials comprising high loadings of filler materials and an in-situ method of making such materials
US20070077349A1 (en) * 2005-09-30 2007-04-05 Eastman Kodak Company Patterning OLED device electrodes and optical material
US7677877B2 (en) * 2005-11-04 2010-03-16 Asml Netherlands B.V. Imprint lithography
WO2007081057A1 (en) * 2006-01-16 2007-07-19 Fujifilm Corporation Curable composition and cured product, laminate film and antireflective film using the same and polarizing plate and image display device using the antireflective film
JP2007335253A (ja) 2006-06-15 2007-12-27 Toshiba Matsushita Display Technology Co Ltd 有機el表示装置
JP5084194B2 (ja) * 2006-07-18 2012-11-28 エヌ・ティ・ティ・アドバンステクノロジ株式会社 表面改質組成物および積層体
US7604916B2 (en) 2006-11-06 2009-10-20 3M Innovative Properties Company Donor films with pattern-directing layers
US20080233404A1 (en) 2007-03-22 2008-09-25 3M Innovative Properties Company Microreplication tools and patterns using laser induced thermal embossing
US7604381B2 (en) 2007-04-16 2009-10-20 3M Innovative Properties Company Optical article and method of making
US20090015142A1 (en) * 2007-07-13 2009-01-15 3M Innovative Properties Company Light extraction film for organic light emitting diode display devices
WO2009032815A1 (en) * 2007-09-06 2009-03-12 3M Innovative Properties Company Tool for making microstructured articles
US8236668B2 (en) * 2007-10-10 2012-08-07 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing SOI substrate
US8293354B2 (en) * 2008-04-09 2012-10-23 The Regents Of The University Of Michigan UV curable silsesquioxane resins for nanoprint lithography
US20090263668A1 (en) 2008-04-21 2009-10-22 3M Innovative Properties Company Durable coating of an oligomer and methods of applying
KR20110039461A (ko) 2008-07-15 2011-04-18 바스프 코포레이션 이산화염소 투여를 위한 방법, 시스템 및 장치
US7957621B2 (en) 2008-12-17 2011-06-07 3M Innovative Properties Company Light extraction film with nanoparticle coatings
US8222352B2 (en) 2008-12-24 2012-07-17 Nitto Denko Corporation Silicone resin composition
JP5052534B2 (ja) * 2009-01-08 2012-10-17 株式会社ブリヂストン 光硬化性転写シート、及びこれを用いた凹凸パターンの形成方法
US20100188751A1 (en) 2009-01-29 2010-07-29 3M Innovative Properties Company Optical films with internally conformable layers and method of making the films
US8899148B2 (en) * 2009-07-02 2014-12-02 E I Du Pont De Nemours And Company Method for printing a material onto a substrate
JP2011066100A (ja) * 2009-09-16 2011-03-31 Bridgestone Corp 光硬化性転写シート、及びこれを用いた凹凸パターンの形成方法
US20110091694A1 (en) * 2009-10-20 2011-04-21 E. I. Du Pont De Nemours And Company Method for forming fine electrode patterns
KR20110054841A (ko) * 2009-11-18 2011-05-25 삼성모바일디스플레이주식회사 유기 발광 표시 장치 및 그 제조 방법
JP2011105894A (ja) 2009-11-20 2011-06-02 Konica Minolta Holdings Inc 付着テープの製造方法
CN102712140B (zh) 2010-01-13 2015-06-03 3M创新有限公司 具有微结构化低折射率纳米空隙层的光学膜及其方法
JP2011221470A (ja) * 2010-04-14 2011-11-04 Sony Corp 光学素子、およびその製造方法、表示装置、ならびに太陽電池
US20110305787A1 (en) * 2010-06-11 2011-12-15 Satoshi Ishii Stamper for transfer of microscopic structure and transfer apparatus of microscopic structure
US8469551B2 (en) 2010-10-20 2013-06-25 3M Innovative Properties Company Light extraction films for increasing pixelated OLED output with reduced blur
BR112013014167A2 (pt) 2010-12-09 2016-09-13 Asahi Chemical Ind produto em camadas de estrutura fina, métodos de preparação do mesmo, de fabricação de um produto de estrutura fina, bateria solar, membro de iluminação, e, mostrador
JP6033233B2 (ja) 2010-12-17 2016-11-30 スリーエム イノベイティブ プロパティズ カンパニー マルチサイズ粒子を有する転写物品及び方法
US8692446B2 (en) 2011-03-17 2014-04-08 3M Innovative Properties Company OLED light extraction films having nanoparticles and periodic structures
EP2714358B1 (en) 2011-05-31 2020-02-19 3M Innovative Properties Company Methods for making differentially pattern cured microstructured articles
SG195166A1 (en) 2011-05-31 2013-12-30 3M Innovative Properties Co Method for making microstructured tools having discontinuous topographies, articles produced therefrom
US9780335B2 (en) 2012-07-20 2017-10-03 3M Innovative Properties Company Structured lamination transfer films and methods
US20140175707A1 (en) * 2012-12-21 2014-06-26 3M Innovative Properties Company Methods of using nanostructured transfer tape and articles made therefrom
US9711744B2 (en) 2012-12-21 2017-07-18 3M Innovative Properties Company Patterned structured transfer tape
WO2015069444A1 (en) * 2013-11-11 2015-05-14 3M Innovative Properties Company Nanostructures for oled devices
US9246134B2 (en) 2014-01-20 2016-01-26 3M Innovative Properties Company Lamination transfer films for forming articles with engineered voids

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070298176A1 (en) * 2006-06-26 2007-12-27 Dipietro Richard Anthony Aromatic vinyl ether based reverse-tone step and flash imprint lithography
US20100104807A1 (en) * 2008-10-23 2010-04-29 Compal Electronics, Inc. Transfer film, method of manufacturing the same, transfer method and object surface structure

Also Published As

Publication number Publication date
CN104870198B (zh) 2017-12-05
US20250058543A1 (en) 2025-02-20
US20140178646A1 (en) 2014-06-26
US20220324195A1 (en) 2022-10-13
US20180351119A1 (en) 2018-12-06
US11396156B2 (en) 2022-07-26
EP2934896A1 (en) 2015-10-28
US20160104851A1 (en) 2016-04-14
US9711744B2 (en) 2017-07-18
EP2934896B1 (en) 2021-04-14
US12172417B2 (en) 2024-12-24
US11565495B2 (en) 2023-01-31
WO2014099562A1 (en) 2014-06-26
CN104870198A (zh) 2015-08-26
EP2934896A4 (en) 2016-07-20
KR20150099585A (ko) 2015-08-31
JP6367226B2 (ja) 2018-08-01
JP2016508894A (ja) 2016-03-24
US20230141149A1 (en) 2023-05-11

Similar Documents

Publication Publication Date Title
US11565495B2 (en) Patterned structured transfer tape
KR102174276B1 (ko) 나노구조화된 전사 테이프의 사용방법 및 그로부터 제조된 제품
US10475858B2 (en) Nanostructures for color-by-white OLED devices
KR102307788B1 (ko) Oled 디바이스용 나노구조체
KR20160111436A (ko) 글레이징을 위한 미세광학체
CN107820461B (zh) 分段式转印带及其制备和使用方法

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

P22-X000 Classification modified

St.27 status event code: A-2-2-P10-P22-nap-X000

D13-X000 Search requested

St.27 status event code: A-1-2-D10-D13-srh-X000

D14-X000 Search report completed

St.27 status event code: A-1-2-D10-D14-srh-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

Fee payment year number: 1

St.27 status event code: A-2-2-U10-U12-oth-PR1002

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

PC1903 Unpaid annual fee

Not in force date: 20240123

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

St.27 status event code: A-4-4-U10-U13-oth-PC1903

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

PC1903 Unpaid annual fee

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20240123

St.27 status event code: N-4-6-H10-H13-oth-PC1903

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000