KR102172015B1 - 임프린트 장치, 임프린트 방법 및 물품의 제조 방법 - Google Patents

임프린트 장치, 임프린트 방법 및 물품의 제조 방법 Download PDF

Info

Publication number
KR102172015B1
KR102172015B1 KR1020170084605A KR20170084605A KR102172015B1 KR 102172015 B1 KR102172015 B1 KR 102172015B1 KR 1020170084605 A KR1020170084605 A KR 1020170084605A KR 20170084605 A KR20170084605 A KR 20170084605A KR 102172015 B1 KR102172015 B1 KR 102172015B1
Authority
KR
South Korea
Prior art keywords
mold
light
optical path
pattern
imprint
Prior art date
Application number
KR1020170084605A
Other languages
English (en)
Korean (ko)
Other versions
KR20180007309A (ko
Inventor
히로시 사토
유우이치 후지타
기요히토 야마모토
Original Assignee
캐논 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 캐논 가부시끼가이샤 filed Critical 캐논 가부시끼가이샤
Publication of KR20180007309A publication Critical patent/KR20180007309A/ko
Application granted granted Critical
Publication of KR102172015B1 publication Critical patent/KR102172015B1/ko

Links

Images

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70591Testing optical components
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70605Workpiece metrology
    • G03F7/70616Monitoring the printed patterns
    • G03F7/70641Focus

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Shaping Of Tube Ends By Bending Or Straightening (AREA)
  • Surface Treatment Of Glass (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
KR1020170084605A 2016-07-12 2017-07-04 임프린트 장치, 임프린트 방법 및 물품의 제조 방법 KR102172015B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2016-137691 2016-07-12
JP2016137691A JP6758967B2 (ja) 2016-07-12 2016-07-12 インプリント装置、インプリント方法、及び物品の製造方法

Publications (2)

Publication Number Publication Date
KR20180007309A KR20180007309A (ko) 2018-01-22
KR102172015B1 true KR102172015B1 (ko) 2020-10-30

Family

ID=60995780

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020170084605A KR102172015B1 (ko) 2016-07-12 2017-07-04 임프린트 장치, 임프린트 방법 및 물품의 제조 방법

Country Status (2)

Country Link
JP (1) JP6758967B2 (es)
KR (1) KR102172015B1 (es)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6821408B2 (ja) * 2016-11-28 2021-01-27 キヤノン株式会社 インプリント装置、インプリント方法、および物品の製造方法
CN113314451B (zh) * 2021-06-10 2022-08-02 哈尔滨工业大学 一种基于莫尔条纹的晶圆键合对准系统及方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009288301A (ja) 2008-05-27 2009-12-10 V Technology Co Ltd 近接露光装置
JP2011165264A (ja) 2010-02-09 2011-08-25 Hitachi High-Technologies Corp 両面インプリント装置の被転写体位置決め方法および両面インプリント装置
JP2012099790A (ja) 2010-10-08 2012-05-24 Canon Inc インプリント装置、及び、物品の製造方法
JP2015005542A (ja) * 2013-06-19 2015-01-08 キヤノン株式会社 光源装置、およびリソグラフィ装置
JP2015138963A (ja) * 2014-01-24 2015-07-30 キヤノン株式会社 インプリント装置、および物品の製造方法
JP2016096269A (ja) 2014-11-14 2016-05-26 キヤノン株式会社 インプリント装置及び物品の製造方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005116978A (ja) * 2003-10-10 2005-04-28 Sumitomo Heavy Ind Ltd ナノインプリント装置及び方法
JP4958614B2 (ja) * 2006-04-18 2012-06-20 キヤノン株式会社 パターン転写装置、インプリント装置、パターン転写方法および位置合わせ装置
JP4795300B2 (ja) * 2006-04-18 2011-10-19 キヤノン株式会社 位置合わせ方法、インプリント方法、位置合わせ装置、インプリント装置、及び位置計測方法
NL2003347A (en) * 2008-09-11 2010-03-16 Asml Netherlands Bv Imprint lithography.
JP6304934B2 (ja) * 2012-05-08 2018-04-04 キヤノン株式会社 インプリント装置および物品の製造方法
JP6120678B2 (ja) * 2013-05-27 2017-04-26 キヤノン株式会社 インプリント方法、インプリント装置及びデバイス製造方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009288301A (ja) 2008-05-27 2009-12-10 V Technology Co Ltd 近接露光装置
JP2011165264A (ja) 2010-02-09 2011-08-25 Hitachi High-Technologies Corp 両面インプリント装置の被転写体位置決め方法および両面インプリント装置
JP2012099790A (ja) 2010-10-08 2012-05-24 Canon Inc インプリント装置、及び、物品の製造方法
JP2015005542A (ja) * 2013-06-19 2015-01-08 キヤノン株式会社 光源装置、およびリソグラフィ装置
JP2015138963A (ja) * 2014-01-24 2015-07-30 キヤノン株式会社 インプリント装置、および物品の製造方法
JP2016096269A (ja) 2014-11-14 2016-05-26 キヤノン株式会社 インプリント装置及び物品の製造方法

Also Published As

Publication number Publication date
KR20180007309A (ko) 2018-01-22
JP6758967B2 (ja) 2020-09-23
JP2018010927A (ja) 2018-01-18

Similar Documents

Publication Publication Date Title
JP7087056B2 (ja) インプリント装置、インプリント方法および物品の製造方法
US20200223126A1 (en) Imprint apparatus and method for manufacturing article
KR101894167B1 (ko) 임프린트 장치 및 물품 제조 방법
CN110083009B (zh) 压印方法、压印装置和器件制造方法
KR101937009B1 (ko) 임프린트 장치 및 물품의 제조 방법
TWI720301B (zh) 壓印裝置及製造物品的方法
JP2017204539A (ja) 位置検出装置、位置検出方法、インプリント装置及び物品の製造方法
JP7210162B2 (ja) インプリント装置、インプリント方法および物品の製造方法
KR102282089B1 (ko) 임프린트 장치, 임프린트 방법 및 물품의 제조 방법
JP2013225661A (ja) インプリント装置、それを用いた物品の製造方法
KR102459131B1 (ko) 임프린트 장치, 임프린트 방법 및 물품 제조 방법
KR102172015B1 (ko) 임프린트 장치, 임프린트 방법 및 물품의 제조 방법
KR20200124620A (ko) 성형 장치, 결정 방법 및 물품 제조 방법
KR102259008B1 (ko) 임프린트 장치, 제어 데이터의 생성 방법, 및 물품의 제조 방법
KR20190013512A (ko) 임프린트 장치 및 물품 제조 방법
US10948819B2 (en) Imprint apparatus and article manufacturing method
US11698583B2 (en) Imprint apparatus and article manufacturing method
JP7179655B2 (ja) インプリント装置、インプリント方法、および物品の製造方法
JP2020165910A (ja) 形状計測装置、パターン形成装置および物品の製造方法
JP7358192B2 (ja) インプリント装置、インプリント方法及び物品の製造方法
JP2020038164A (ja) 位置検出装置、位置検出方法、型、インプリント装置および、物品の製造方法
KR20240013057A (ko) 검출 장치, 리소그래피 장치 및 물품 제조 방법

Legal Events

Date Code Title Description
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant