KR102114654B1 - 이동 재료 웨브를 모니터링하기 위한 디바이스 및 방법 - Google Patents

이동 재료 웨브를 모니터링하기 위한 디바이스 및 방법 Download PDF

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Publication number
KR102114654B1
KR102114654B1 KR1020187016278A KR20187016278A KR102114654B1 KR 102114654 B1 KR102114654 B1 KR 102114654B1 KR 1020187016278 A KR1020187016278 A KR 1020187016278A KR 20187016278 A KR20187016278 A KR 20187016278A KR 102114654 B1 KR102114654 B1 KR 102114654B1
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South Korea
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camera
elements
data
control
link
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KR1020187016278A
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English (en)
Korean (ko)
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KR20180081574A (ko
Inventor
마르쿠스 클라인도프
토마스 베스키
노르베르트 그라프
가버 브라가
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프로테크나 허브스트 게엠베하 앤 코 카게
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/66—Remote control of cameras or camera parts, e.g. by remote control devices
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/90—Arrangement of cameras or camera modules, e.g. multiple cameras in TV studios or sports stadiums
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8896—Circuits specially adapted for system specific signal conditioning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/50—Constructional details
    • H04N23/51—Housings

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Textile Engineering (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020187016278A 2015-11-11 2016-11-03 이동 재료 웨브를 모니터링하기 위한 디바이스 및 방법 KR102114654B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102015119444.9 2015-11-11
DE102015119444.9A DE102015119444B4 (de) 2015-11-11 2015-11-11 Vorrichtung und Verfahren zur Überwachung einer laufenden Warenbahn
PCT/EP2016/076539 WO2017080904A1 (de) 2015-11-11 2016-11-03 Vorrichtung und verfahren zur überwachung einer laufenden warenbahn

Publications (2)

Publication Number Publication Date
KR20180081574A KR20180081574A (ko) 2018-07-16
KR102114654B1 true KR102114654B1 (ko) 2020-05-25

Family

ID=57256282

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020187016278A KR102114654B1 (ko) 2015-11-11 2016-11-03 이동 재료 웨브를 모니터링하기 위한 디바이스 및 방법

Country Status (8)

Country Link
US (1) US20190049391A1 (ja)
EP (1) EP3374760B1 (ja)
JP (1) JP6789291B2 (ja)
KR (1) KR102114654B1 (ja)
CN (1) CN108351308B (ja)
DE (1) DE102015119444B4 (ja)
TW (1) TWI629465B (ja)
WO (1) WO2017080904A1 (ja)

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CN107248158A (zh) * 2017-07-20 2017-10-13 广东工业大学 一种图像处理的方法及系统
DE102017221474A1 (de) * 2017-11-29 2019-05-29 Robert Bosch Gmbh Überwachungsmodul, Überwachungsmodulanordnung, Überwachungsanlage und Verfahren
FI128235B (en) * 2018-12-10 2020-01-15 Procemex Oy Ltd Top side light
BE1027378B1 (nl) * 2019-06-18 2021-01-28 Bms Bvpa Inspectiesysteem en werkwijze
US11685104B2 (en) 2019-12-20 2023-06-27 Industrial Technology Research Institute Dynamic correcting system of manufacturing process using wire and dynamic correcting method using the same
TWI772991B (zh) 2020-12-02 2022-08-01 財團法人工業技術研究院 編織路徑生成方法與裝置以及動態修正方法與編織系統
IT202000007145U1 (it) * 2020-12-29 2022-06-29 Fedrigoni Spa Sistema di monitoraggio per impianti per la produzione di carta.
CN114441545A (zh) * 2022-03-14 2022-05-06 无锡职业技术学院 一种高度自适应绕组视觉检测平台及方法

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JP2007132757A (ja) * 2005-11-09 2007-05-31 Osaka City 外観検査方法および同装置
US20120206616A1 (en) * 2009-10-20 2012-08-16 Westfaelische Hochschule Gelsenkirchen, Bocholt, Recklinghausen Image sensor array for detecting image information for automatic image data processing

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US5696591A (en) 1996-01-05 1997-12-09 Eastman Kodak Company Apparatus and method for detecting longitudinally oriented flaws in a moving web
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US20070008538A1 (en) * 2004-01-22 2007-01-11 Kiraly Christopher M Illumination system for material inspection
JP2007132757A (ja) * 2005-11-09 2007-05-31 Osaka City 外観検査方法および同装置
US20120206616A1 (en) * 2009-10-20 2012-08-16 Westfaelische Hochschule Gelsenkirchen, Bocholt, Recklinghausen Image sensor array for detecting image information for automatic image data processing

Also Published As

Publication number Publication date
KR20180081574A (ko) 2018-07-16
JP2019502901A (ja) 2019-01-31
DE102015119444B4 (de) 2018-01-18
EP3374760A1 (de) 2018-09-19
TW201728899A (zh) 2017-08-16
US20190049391A1 (en) 2019-02-14
TWI629465B (zh) 2018-07-11
DE102015119444A1 (de) 2017-05-11
WO2017080904A1 (de) 2017-05-18
CN108351308B (zh) 2021-08-10
JP6789291B2 (ja) 2020-11-25
CN108351308A (zh) 2018-07-31
EP3374760B1 (de) 2024-05-15

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