KR102003202B1 - 결정학적 그레인 배향 맵핑 능력을 가진 실험실 x-레이 마이크로-단층촬영 시스템 - Google Patents

결정학적 그레인 배향 맵핑 능력을 가진 실험실 x-레이 마이크로-단층촬영 시스템 Download PDF

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KR102003202B1
KR102003202B1 KR1020157011836A KR20157011836A KR102003202B1 KR 102003202 B1 KR102003202 B1 KR 102003202B1 KR 1020157011836 A KR1020157011836 A KR 1020157011836A KR 20157011836 A KR20157011836 A KR 20157011836A KR 102003202 B1 KR102003202 B1 KR 102003202B1
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sample
detector
grain
laboratory
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KR20150068436A (ko
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마이클 페저
크리스티안 홀츠너
에릭 마이델 라우리드센
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칼 짜이스 엑스-레이 마이크로스코피, 인크.
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    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/606—Specific applications or type of materials texture

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  • General Physics & Mathematics (AREA)
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  • Crystallography & Structural Chemistry (AREA)
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  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Radiology & Medical Imaging (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
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KR1020157011836A 2012-10-18 2013-10-18 결정학적 그레인 배향 맵핑 능력을 가진 실험실 x-레이 마이크로-단층촬영 시스템 Active KR102003202B1 (ko)

Applications Claiming Priority (3)

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US201261715696P 2012-10-18 2012-10-18
US61/715,696 2012-10-18
PCT/US2013/065584 WO2014063002A1 (en) 2012-10-18 2013-10-18 Laboratory x-ray micro-tomography system with crystallographic grain orientation mapping capabilities

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KR20150068436A KR20150068436A (ko) 2015-06-19
KR102003202B1 true KR102003202B1 (ko) 2019-07-24

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US (2) US9110004B2 (enExample)
EP (1) EP2909611B1 (enExample)
JP (1) JP6039093B2 (enExample)
KR (1) KR102003202B1 (enExample)
CN (1) CN104737005B (enExample)
WO (1) WO2014063002A1 (enExample)

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KR102003202B1 (ko) * 2012-10-18 2019-07-24 칼 짜이스 엑스-레이 마이크로스코피, 인크. 결정학적 그레인 배향 맵핑 능력을 가진 실험실 x-레이 마이크로-단층촬영 시스템
US9222900B2 (en) 2013-03-05 2015-12-29 Danmarks Tekniske Universitet Of Anker Engelundsvej X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus
EP2775295B8 (en) * 2013-03-05 2016-05-18 Danmarks Tekniske Universitet An X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus.
US9222901B2 (en) 2013-03-05 2015-12-29 Danmarks Tekniske Universitet Anker Engelundsvej X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus
CN105612416B (zh) * 2013-07-25 2019-01-01 模拟技术公司 对象内物品的衍射特征的生成
KR102025361B1 (ko) * 2014-07-10 2019-09-25 한화테크윈 주식회사 자동 초점 조절 시스템 및 방법
GB201421837D0 (en) * 2014-12-09 2015-01-21 Reishig Peter A method of generating a fingerprint for a gemstone using X-ray imaging
EP3223002B1 (en) * 2016-03-23 2021-04-28 Carl Zeiss X-Ray Microscopy, Inc. Method, tool and computer program product for measurement and estimation of an x-ray source spectrum in computed tomography, and x-ray ct system
CN105869179A (zh) * 2016-06-06 2016-08-17 青岛晶维科创医药工程有限公司 一种晶体颗粒三维成像系统及方法
CN108376656B (zh) * 2018-02-08 2020-07-31 北京科技大学 基于二维x射线检测技术的超大晶粒尺寸的无损检测方法
US11275039B2 (en) * 2018-07-25 2022-03-15 Bruker Axs, Inc. Divergent beam two dimensional diffraction
CN109490343A (zh) * 2018-12-04 2019-03-19 西北工业大学 一种串行晶体学样品输运装置及方法
EP3987279B1 (de) * 2019-06-24 2023-11-08 SMS Group GmbH Vorrichtung und verfahren zum bestimmen der werkstoffeigenschaften eines polykristallinen produkts
WO2021209048A1 (en) * 2020-04-17 2021-10-21 Master Dynamic Limited Imaging process and system
US12209978B2 (en) 2020-07-15 2025-01-28 Danmarks Tekniske Universitet Laboratory-based 3D scanning X-ray Laue micro-diffraction system and method (Lab3DμXRD)
EP4019951A1 (en) 2020-12-24 2022-06-29 Inel S.A.S Apparatuses and methods for combined simultaneous analyses of materials
WO2023113862A2 (en) * 2021-06-16 2023-06-22 Carl Zeiss X-ray Microscopy, Inc. Laboratory crystallographic x-ray diffraction analysis system
US12436115B2 (en) * 2022-02-25 2025-10-07 Proto Patents Ltd. Transmission X-ray diffraction apparatus and related method
CN115372395A (zh) * 2022-08-30 2022-11-22 郑州轻工业大学 一种基于纳米机器人拾放操作的块材内部晶界自动表征系统和方法
CN115494542B (zh) * 2022-09-16 2024-10-18 中国科学院上海高等研究院 一种同步辐射光束带宽的检测系统及方法
CN116184479B (zh) * 2023-02-20 2025-12-05 同济大学 一种多通道空间分辨弯晶谱仪及其装调方法
US20240298988A1 (en) * 2023-03-07 2024-09-12 Mark S. Quadling X-Ray Computed Tomography (CT) scanning using a line array detector
CN120426915B (zh) * 2025-06-25 2025-09-16 安徽创谱仪器科技有限公司 一种x射线光源光斑尺寸的测试方法及系统
CN120741531B (zh) * 2025-08-28 2025-11-07 中国航发北京航空材料研究院 一种晶体取向检测方法及相关装置

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KR102003202B1 (ko) * 2012-10-18 2019-07-24 칼 짜이스 엑스-레이 마이크로스코피, 인크. 결정학적 그레인 배향 맵핑 능력을 가진 실험실 x-레이 마이크로-단층촬영 시스템
EP2775295B8 (en) 2013-03-05 2016-05-18 Danmarks Tekniske Universitet An X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus.

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JP2015533415A (ja) 2015-11-24
US20150316493A1 (en) 2015-11-05
EP2909611B1 (en) 2016-04-13
WO2014063002A1 (en) 2014-04-24
US20140112433A1 (en) 2014-04-24
KR20150068436A (ko) 2015-06-19
US9110004B2 (en) 2015-08-18
CN104737005B (zh) 2017-09-29
EP2909611A1 (en) 2015-08-26
CN104737005A (zh) 2015-06-24
JP6039093B2 (ja) 2016-12-07
US9383324B2 (en) 2016-07-05

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