KR101952447B1 - 안경테 형상 측정 장치 - Google Patents
안경테 형상 측정 장치 Download PDFInfo
- Publication number
- KR101952447B1 KR101952447B1 KR1020120103323A KR20120103323A KR101952447B1 KR 101952447 B1 KR101952447 B1 KR 101952447B1 KR 1020120103323 A KR1020120103323 A KR 1020120103323A KR 20120103323 A KR20120103323 A KR 20120103323A KR 101952447 B1 KR101952447 B1 KR 101952447B1
- Authority
- KR
- South Korea
- Prior art keywords
- slider
- rim
- clamp pin
- clamp
- unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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- 230000007246 mechanism Effects 0.000 claims abstract description 62
- 239000000428 dust Substances 0.000 abstract description 6
- 238000005259 measurement Methods 0.000 description 18
- 238000010586 diagram Methods 0.000 description 8
- 238000007373 indentation Methods 0.000 description 6
- 238000012986 modification Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 239000011324 bead Substances 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000002000 scavenging effect Effects 0.000 description 2
- 230000029142 excretion Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
- G01B5/0004—Supports
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
- Eyeglasses (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011205482 | 2011-09-21 | ||
JPJP-P-2011-205482 | 2011-09-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20130031789A KR20130031789A (ko) | 2013-03-29 |
KR101952447B1 true KR101952447B1 (ko) | 2019-02-26 |
Family
ID=47966523
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020120103323A Active KR101952447B1 (ko) | 2011-09-21 | 2012-09-18 | 안경테 형상 측정 장치 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP6102139B2 (enrdf_load_stackoverflow) |
KR (1) | KR101952447B1 (enrdf_load_stackoverflow) |
CN (1) | CN103017639B (enrdf_load_stackoverflow) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9535269B2 (en) * | 2013-06-24 | 2017-01-03 | Nidek Co., Ltd. | Eyeglass frame shape measuring apparatus |
JP6295523B2 (ja) * | 2013-06-24 | 2018-03-20 | 株式会社ニデック | 眼鏡枠形状測定装置 |
CN106123751B (zh) * | 2016-08-15 | 2019-01-25 | 温州市八达光学有限公司 | 一种用于测试眼镜倾角的仪器 |
WO2020153742A1 (ko) * | 2019-01-24 | 2020-07-30 | 주식회사 고영테크놀러지 | 검사 장치용 이송 기구, 검사 장치, 및 이를 이용하는 대상물 검사 방법 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009068926A (ja) * | 2007-09-11 | 2009-04-02 | Nidek Co Ltd | レンズ枠形状測定装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3695988B2 (ja) * | 1999-04-30 | 2005-09-14 | 株式会社ニデック | 眼鏡枠形状測定装置 |
JP4629848B2 (ja) * | 2000-10-17 | 2011-02-09 | 株式会社トプコン | レンズ枠形状測定装置 |
JP4429535B2 (ja) * | 2001-02-06 | 2010-03-10 | 株式会社トプコン | レンズ形状測定装置 |
JP4267228B2 (ja) * | 2001-12-03 | 2009-05-27 | 株式会社トプコン | レンズ枠形状測定装置 |
JP4091413B2 (ja) * | 2002-04-08 | 2008-05-28 | Hoya株式会社 | 眼鏡枠形状測定装置 |
JP5122844B2 (ja) * | 2007-03-20 | 2013-01-16 | 株式会社トプコン | レンズ枠形状測定装置 |
FR2930050B1 (fr) * | 2008-04-14 | 2010-09-24 | Essilor Int | Appareil de lecture de la geometrie d'un cercle ou d'une arcade de monture de lunettes et procede de lecture correspondant |
JP5198978B2 (ja) * | 2008-09-01 | 2013-05-15 | 株式会社ニデック | 眼鏡枠形状測定装置 |
JP5586930B2 (ja) | 2009-12-09 | 2014-09-10 | 株式会社ニデック | 眼鏡枠形状測定装置 |
JP5562624B2 (ja) * | 2009-12-09 | 2014-07-30 | 株式会社ニデック | 眼鏡枠形状測定装置 |
-
2012
- 2012-09-18 KR KR1020120103323A patent/KR101952447B1/ko active Active
- 2012-09-20 JP JP2012207060A patent/JP6102139B2/ja active Active
- 2012-09-21 CN CN201210357105.3A patent/CN103017639B/zh active Active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009068926A (ja) * | 2007-09-11 | 2009-04-02 | Nidek Co Ltd | レンズ枠形状測定装置 |
Also Published As
Publication number | Publication date |
---|---|
JP6102139B2 (ja) | 2017-03-29 |
KR20130031789A (ko) | 2013-03-29 |
CN103017639A (zh) | 2013-04-03 |
CN103017639B (zh) | 2017-08-29 |
JP2013079951A (ja) | 2013-05-02 |
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Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 20120918 |
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Comment text: Notification of reason for refusal Patent event date: 20180628 Patent event code: PE09021S01D |
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Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20181220 |
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Comment text: Registration of Establishment Patent event date: 20190220 Patent event code: PR07011E01D |
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