KR101858829B1 - 편석 분석 장치 및 방법 - Google Patents

편석 분석 장치 및 방법 Download PDF

Info

Publication number
KR101858829B1
KR101858829B1 KR1020160117327A KR20160117327A KR101858829B1 KR 101858829 B1 KR101858829 B1 KR 101858829B1 KR 1020160117327 A KR1020160117327 A KR 1020160117327A KR 20160117327 A KR20160117327 A KR 20160117327A KR 101858829 B1 KR101858829 B1 KR 101858829B1
Authority
KR
South Korea
Prior art keywords
segregation
image
region
specimen
information
Prior art date
Application number
KR1020160117327A
Other languages
English (en)
Korean (ko)
Other versions
KR20180030293A (ko
Inventor
최철희
이종학
홍현국
최세호
배호문
Original Assignee
주식회사 포스코
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 포스코 filed Critical 주식회사 포스코
Priority to KR1020160117327A priority Critical patent/KR101858829B1/ko
Priority to CN201780055962.9A priority patent/CN109690289B/zh
Priority to JP2019513326A priority patent/JP2019533140A/ja
Priority to PCT/KR2017/009775 priority patent/WO2018048200A1/ko
Publication of KR20180030293A publication Critical patent/KR20180030293A/ko
Application granted granted Critical
Publication of KR101858829B1 publication Critical patent/KR101858829B1/ko

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N19/00—Methods or arrangements for coding, decoding, compressing or decompressing digital video signals
    • H04N19/10—Methods or arrangements for coding, decoding, compressing or decompressing digital video signals using adaptive coding
    • H04N19/102—Methods or arrangements for coding, decoding, compressing or decompressing digital video signals using adaptive coding characterised by the element, parameter or selection affected or controlled by the adaptive coding
    • H04N19/13—Adaptive entropy coding, e.g. adaptive variable length coding [AVLC] or context adaptive binary arithmetic coding [CABAC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765—Method using an image detector and processing of image signal
    • G01N2021/177—Detector of the video camera type

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Image Analysis (AREA)
KR1020160117327A 2016-09-12 2016-09-12 편석 분석 장치 및 방법 KR101858829B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020160117327A KR101858829B1 (ko) 2016-09-12 2016-09-12 편석 분석 장치 및 방법
CN201780055962.9A CN109690289B (zh) 2016-09-12 2017-09-06 偏析分析装置和方法
JP2019513326A JP2019533140A (ja) 2016-09-12 2017-09-06 偏析分析装置及び方法
PCT/KR2017/009775 WO2018048200A1 (ko) 2016-09-12 2017-09-06 편석 분석 장치 및 방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020160117327A KR101858829B1 (ko) 2016-09-12 2016-09-12 편석 분석 장치 및 방법

Publications (2)

Publication Number Publication Date
KR20180030293A KR20180030293A (ko) 2018-03-22
KR101858829B1 true KR101858829B1 (ko) 2018-05-18

Family

ID=61562533

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020160117327A KR101858829B1 (ko) 2016-09-12 2016-09-12 편석 분석 장치 및 방법

Country Status (4)

Country Link
JP (1) JP2019533140A (zh)
KR (1) KR101858829B1 (zh)
CN (1) CN109690289B (zh)
WO (1) WO2018048200A1 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20220047993A (ko) 2019-08-09 2022-04-19 미쓰비시 엔피쯔 가부시키가이샤 필기구
CN115791804B (zh) * 2022-12-20 2023-06-13 中国航发贵州黎阳航空动力有限公司 压气机叶片条纹缺陷检测方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2840347B2 (ja) * 1989-12-29 1998-12-24 キヤノン株式会社 基板実装検査装置
JP5575675B2 (ja) * 2011-01-31 2014-08-20 株式会社 日立産業制御ソリューションズ 金属缶端巻締め外観検査方法、金属缶の外観検査方法、および金属缶端巻締め外観検査装置

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62188965A (ja) * 1986-02-14 1987-08-18 Kawasaki Steel Corp りん偏析部検出試験用標準試料
JPS6484147A (en) * 1987-09-28 1989-03-29 Nippon Steel Corp Internal quality inspecting method for metal piece
JPH0627715B2 (ja) * 1988-07-13 1994-04-13 新日本製鐵株式会社 鋳片断面の品質評価装置
JP2762657B2 (ja) * 1990-02-28 1998-06-04 松下電器産業株式会社 基板の基準マークのセンターサーチ方法
JPH0599860A (ja) * 1991-10-09 1993-04-23 Nippon Steel Corp 金属材料の表面品質および内部品質の評価装置および方法
JPH07306161A (ja) * 1994-05-11 1995-11-21 Nippon Steel Corp 金属材料の偏析検出方法
KR20010057093A (ko) * 1999-12-18 2001-07-04 이구택 연속주조주편의 내부 품질 평가 방법
CN1106572C (zh) * 1999-12-28 2003-04-23 宝山钢铁股份有限公司 铸坯断面质量的自动评价方法
JP3997749B2 (ja) * 2001-10-22 2007-10-24 ソニー株式会社 信号処理方法及び装置、信号処理プログラム、並びに記録媒体
JP4139743B2 (ja) * 2003-06-12 2008-08-27 日本軽金属株式会社 アルミニウムにおける非金属介在物の測定装置
JP2005038178A (ja) * 2003-07-15 2005-02-10 Mega Trade:Kk 検査対象物の基準マーク検査装置
CN101470807A (zh) * 2007-12-26 2009-07-01 河海大学常州校区 公路车道标志线精确检测方法
KR101045393B1 (ko) * 2009-05-28 2011-07-01 (주) 애인테크놀로지 철강공정 내부 크랙 및 중심편석 판정 방법
KR101159939B1 (ko) * 2010-01-28 2012-06-25 현대제철 주식회사 연속주조 슬라브의 중심편석 평가방법
CN101819150A (zh) * 2010-04-21 2010-09-01 天津钢铁集团有限公司 一种连铸坯成分偏析的分析方法
CN101949851A (zh) * 2010-08-16 2011-01-19 河北钢铁股份有限公司邯郸分公司 一种利用直读光谱仪快速检验铸坯偏析的方法
CN102980893A (zh) * 2012-11-13 2013-03-20 上海交通大学 钢锭表面缺陷分类检测系统及方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2840347B2 (ja) * 1989-12-29 1998-12-24 キヤノン株式会社 基板実装検査装置
JP5575675B2 (ja) * 2011-01-31 2014-08-20 株式会社 日立産業制御ソリューションズ 金属缶端巻締め外観検査方法、金属缶の外観検査方法、および金属缶端巻締め外観検査装置

Also Published As

Publication number Publication date
JP2019533140A (ja) 2019-11-14
CN109690289B (zh) 2021-08-17
WO2018048200A1 (ko) 2018-03-15
KR20180030293A (ko) 2018-03-22
CN109690289A (zh) 2019-04-26

Similar Documents

Publication Publication Date Title
JP6922539B2 (ja) 表面欠陥判定方法および表面欠陥検査装置
KR101214806B1 (ko) 웨이퍼 결함 검사 장치 및 웨이퍼 결함 검사 방법
CN110403232B (zh) 一种基于二级算法的烟支质量检测方法
CN111122590B (zh) 一种陶瓷表面缺陷检测装置及检测方法
CN112686920A (zh) 一种圆形零件几何尺寸参数视觉测量方法及系统
CN110443278B (zh) 一种太阳能电池片栅线粗细异常的检测方法、装置及设备
CN105718931B (zh) 用于确定采集图像中的杂斑的系统和方法
CN110959114A (zh) 缺陷检查方法及缺陷检查装置
Samarawickrama et al. Matlab based automated surface defect detection system for ceremic tiles using image processing
JP2018096908A (ja) 検査装置及び検査方法
WO2017071406A1 (zh) 金针类元件的引脚检测方法和系统
CN113196040A (zh) 表面缺陷检测方法、表面缺陷检测装置、钢材的制造方法、钢材的品质管理方法、钢材的制造设备、表面缺陷判定模型的生成方法及表面缺陷判定模型
TWI512284B (zh) 玻璃氣泡瑕疵檢測系統
KR101858829B1 (ko) 편석 분석 장치 및 방법
CN110426395B (zh) 一种太阳能el电池硅片表面检测方法及装置
Kline et al. Automated hardwood lumber grading utilizing a multiple sensor machine vision technology
CN107037053B (zh) 用于检测斑缺陷的设备和方法
CN114120318B (zh) 一种基于集成决策树的暗场图像目标点精确提取方法
KR20130031331A (ko) 유리병 검사장치
JP4998722B2 (ja) 画像処理によるワーク欠陥検査方法
JP2001028059A (ja) 色ムラ検査方法及び装置
TWI493177B (zh) 一種檢測具週期性結構光學薄膜的瑕疵檢測方法及其檢測裝置
JP2004170374A (ja) 表面欠陥検出装置、及び表面欠陥検出方法
JP2016217913A (ja) Ｘ線検査装置
CN112782176A (zh) 一种产品外观检测方法及装置

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
AMND Amendment
E601 Decision to refuse application
AMND Amendment
X701 Decision to grant (after re-examination)