JP2019533140A - 偏析分析装置及び方法 - Google Patents

偏析分析装置及び方法 Download PDF

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Publication number
JP2019533140A
JP2019533140A JP2019513326A JP2019513326A JP2019533140A JP 2019533140 A JP2019533140 A JP 2019533140A JP 2019513326 A JP2019513326 A JP 2019513326A JP 2019513326 A JP2019513326 A JP 2019513326A JP 2019533140 A JP2019533140 A JP 2019533140A
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JP
Japan
Prior art keywords
segregation
region
image
test piece
captured image
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Pending
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JP2019513326A
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English (en)
Japanese (ja)
Inventor
チョル−ヒ チェ、
チョル−ヒ チェ、
ジョン−ハク イ、
ジョン−ハク イ、
ヒョン−グク ホン、
ヒョン−グク ホン、
セ−ホ チェ、
セ−ホ チェ、
ホ−ムン ペ、
ホ−ムン ペ、
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Posco Holdings Inc
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Posco Co Ltd
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Application filed by Posco Co Ltd filed Critical Posco Co Ltd
Publication of JP2019533140A publication Critical patent/JP2019533140A/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N19/00—Methods or arrangements for coding, decoding, compressing or decompressing digital video signals
    • H04N19/10—Methods or arrangements for coding, decoding, compressing or decompressing digital video signals using adaptive coding
    • H04N19/102—Methods or arrangements for coding, decoding, compressing or decompressing digital video signals using adaptive coding characterised by the element, parameter or selection affected or controlled by the adaptive coding
    • H04N19/13—Adaptive entropy coding, e.g. adaptive variable length coding [AVLC] or context adaptive binary arithmetic coding [CABAC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765—Method using an image detector and processing of image signal
    • G01N2021/177—Detector of the video camera type

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Image Analysis (AREA)
JP2019513326A 2016-09-12 2017-09-06 偏析分析装置及び方法 Pending JP2019533140A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
KR1020160117327A KR101858829B1 (ko) 2016-09-12 2016-09-12 편석 분석 장치 및 방법
KR10-2016-0117327 2016-09-12
PCT/KR2017/009775 WO2018048200A1 (ko) 2016-09-12 2017-09-06 편석 분석 장치 및 방법

Publications (1)

Publication Number Publication Date
JP2019533140A true JP2019533140A (ja) 2019-11-14

Family

ID=61562533

Family Applications (1)

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JP2019513326A Pending JP2019533140A (ja) 2016-09-12 2017-09-06 偏析分析装置及び方法

Country Status (4)

Country Link
JP (1) JP2019533140A (zh)
KR (1) KR101858829B1 (zh)
CN (1) CN109690289B (zh)
WO (1) WO2018048200A1 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20220047993A (ko) 2019-08-09 2022-04-19 미쓰비시 엔피쯔 가부시키가이샤 필기구
CN115791804B (zh) * 2022-12-20 2023-06-13 中国航发贵州黎阳航空动力有限公司 压气机叶片条纹缺陷检测方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62188965A (ja) * 1986-02-14 1987-08-18 Kawasaki Steel Corp りん偏析部検出試験用標準試料
JPS6484147A (en) * 1987-09-28 1989-03-29 Nippon Steel Corp Internal quality inspecting method for metal piece
JPH0224542A (ja) * 1988-07-13 1990-01-26 Nippon Steel Corp 鋳片断面の品質評価装置
JPH07306161A (ja) * 1994-05-11 1995-11-21 Nippon Steel Corp 金属材料の偏析検出方法
US20040057627A1 (en) * 2001-10-22 2004-03-25 Mototsugu Abe Signal processing method and processor
JP2005003510A (ja) * 2003-06-12 2005-01-06 Nippon Light Metal Co Ltd アルミニウムなどにおける非金属介在物などの測定方法およびこれに用いる測定装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2840347B2 (ja) * 1989-12-29 1998-12-24 キヤノン株式会社 基板実装検査装置
JP2762657B2 (ja) * 1990-02-28 1998-06-04 松下電器産業株式会社 基板の基準マークのセンターサーチ方法
JPH0599860A (ja) * 1991-10-09 1993-04-23 Nippon Steel Corp 金属材料の表面品質および内部品質の評価装置および方法
KR20010057093A (ko) * 1999-12-18 2001-07-04 이구택 연속주조주편의 내부 품질 평가 방법
CN1106572C (zh) * 1999-12-28 2003-04-23 宝山钢铁股份有限公司 铸坯断面质量的自动评价方法
JP2005038178A (ja) * 2003-07-15 2005-02-10 Mega Trade:Kk 検査対象物の基準マーク検査装置
CN101470807A (zh) * 2007-12-26 2009-07-01 河海大学常州校区 公路车道标志线精确检测方法
KR101045393B1 (ko) * 2009-05-28 2011-07-01 (주) 애인테크놀로지 철강공정 내부 크랙 및 중심편석 판정 방법
KR101159939B1 (ko) * 2010-01-28 2012-06-25 현대제철 주식회사 연속주조 슬라브의 중심편석 평가방법
CN101819150A (zh) * 2010-04-21 2010-09-01 天津钢铁集团有限公司 一种连铸坯成分偏析的分析方法
CN101949851A (zh) * 2010-08-16 2011-01-19 河北钢铁股份有限公司邯郸分公司 一种利用直读光谱仪快速检验铸坯偏析的方法
JP5575675B2 (ja) * 2011-01-31 2014-08-20 株式会社 日立産業制御ソリューションズ 金属缶端巻締め外観検査方法、金属缶の外観検査方法、および金属缶端巻締め外観検査装置
CN102980893A (zh) * 2012-11-13 2013-03-20 上海交通大学 钢锭表面缺陷分类检测系统及方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62188965A (ja) * 1986-02-14 1987-08-18 Kawasaki Steel Corp りん偏析部検出試験用標準試料
JPS6484147A (en) * 1987-09-28 1989-03-29 Nippon Steel Corp Internal quality inspecting method for metal piece
JPH0224542A (ja) * 1988-07-13 1990-01-26 Nippon Steel Corp 鋳片断面の品質評価装置
JPH07306161A (ja) * 1994-05-11 1995-11-21 Nippon Steel Corp 金属材料の偏析検出方法
US20040057627A1 (en) * 2001-10-22 2004-03-25 Mototsugu Abe Signal processing method and processor
JP2005003510A (ja) * 2003-06-12 2005-01-06 Nippon Light Metal Co Ltd アルミニウムなどにおける非金属介在物などの測定方法およびこれに用いる測定装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
"QUANTITATIVE ASSESSMENT OF SEGREGATION BY VIDEO IMAGE PROCESSING", ASTM SPECIAL TECHNICAL PUBLICATION, JPN7020001189, 1990, pages 185 - 198, ISSN: 0004259343 *

Also Published As

Publication number Publication date
CN109690289B (zh) 2021-08-17
WO2018048200A1 (ko) 2018-03-15
KR20180030293A (ko) 2018-03-22
KR101858829B1 (ko) 2018-05-18
CN109690289A (zh) 2019-04-26

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