KR101846545B1 - 인터커넥트 조립체 - Google Patents

인터커넥트 조립체 Download PDF

Info

Publication number
KR101846545B1
KR101846545B1 KR1020110062762A KR20110062762A KR101846545B1 KR 101846545 B1 KR101846545 B1 KR 101846545B1 KR 1020110062762 A KR1020110062762 A KR 1020110062762A KR 20110062762 A KR20110062762 A KR 20110062762A KR 101846545 B1 KR101846545 B1 KR 101846545B1
Authority
KR
South Korea
Prior art keywords
contact pads
interconnect assembly
die
interconnect
dielectric layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020110062762A
Other languages
English (en)
Korean (ko)
Other versions
KR20120001651A (ko
Inventor
폴 알란 맥코넬리
케빈 매튜 듀로셔
스콧 스미스
도날드 폴 커닝햄
Original Assignee
제너럴 일렉트릭 캄파니
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 제너럴 일렉트릭 캄파니 filed Critical 제너럴 일렉트릭 캄파니
Publication of KR20120001651A publication Critical patent/KR20120001651A/ko
Application granted granted Critical
Publication of KR101846545B1 publication Critical patent/KR101846545B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H10W70/65
    • H10W72/00
    • H10W20/20
    • H10W70/05
    • H10W70/09
    • H10W70/093
    • H10W70/095
    • H10W70/614
    • H10W70/635
    • H10W70/657
    • H10W70/66
    • H10W70/685
    • H10W72/073
    • H10W90/401

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Geometry (AREA)
  • Wire Bonding (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
KR1020110062762A 2010-06-29 2011-06-28 인터커넥트 조립체 Active KR101846545B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/826,359 US8653670B2 (en) 2010-06-29 2010-06-29 Electrical interconnect for an integrated circuit package and method of making same
US12/826,359 2010-06-29

Publications (2)

Publication Number Publication Date
KR20120001651A KR20120001651A (ko) 2012-01-04
KR101846545B1 true KR101846545B1 (ko) 2018-04-06

Family

ID=44532585

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020110062762A Active KR101846545B1 (ko) 2010-06-29 2011-06-28 인터커넥트 조립체

Country Status (6)

Country Link
US (4) US8653670B2 (cg-RX-API-DMAC10.html)
EP (1) EP2402992B1 (cg-RX-API-DMAC10.html)
JP (1) JP6014309B2 (cg-RX-API-DMAC10.html)
KR (1) KR101846545B1 (cg-RX-API-DMAC10.html)
CN (1) CN102315190B (cg-RX-API-DMAC10.html)
TW (1) TWI536526B (cg-RX-API-DMAC10.html)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8658473B2 (en) * 2012-03-27 2014-02-25 General Electric Company Ultrathin buried die module and method of manufacturing thereof
US9165885B2 (en) * 2013-12-30 2015-10-20 Taiwan Semiconductor Manufacturing Company, Ltd. Staggered via redistribution layer (RDL) for a package and a method for forming the same
US9653438B2 (en) 2014-08-21 2017-05-16 General Electric Company Electrical interconnect structure for an embedded semiconductor device package and method of manufacturing thereof
US9666516B2 (en) 2014-12-01 2017-05-30 General Electric Company Electronic packages and methods of making and using the same
US10141251B2 (en) 2014-12-23 2018-11-27 General Electric Company Electronic packages with pre-defined via patterns and methods of making and using the same
CN106972093B (zh) * 2016-01-13 2019-01-08 光宝光电(常州)有限公司 发光二极管封装结构
US9563732B1 (en) 2016-01-26 2017-02-07 International Business Machines Corporation In-plane copper imbalance for warpage prediction
KR102019352B1 (ko) 2016-06-20 2019-09-09 삼성전자주식회사 팬-아웃 반도체 패키지
EP3553816A4 (en) * 2016-12-08 2020-05-06 Hitachi Chemical Co., Ltd. METHOD FOR PRODUCING A SEMICONDUCTOR COMPONENT
TWI648854B (zh) * 2017-06-14 2019-01-21 Win Semiconductors Corp. 用以減少化合物半導體晶圓變形之改良結構
TWI762894B (zh) * 2019-11-05 2022-05-01 友達光電股份有限公司 電路裝置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090051038A1 (en) 2007-08-24 2009-02-26 Casio Computer Co., Ltd. Semiconductor device including semiconductor constituent and manufacturing method thereof
US20100108371A1 (en) 2008-11-06 2010-05-06 Ibiden Co., Ltd. Wiring board with built-in electronic component and method for manufacturing the same

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5527741A (en) * 1994-10-11 1996-06-18 Martin Marietta Corporation Fabrication and structures of circuit modules with flexible interconnect layers
EP1030369B1 (en) * 1997-08-19 2007-12-12 Hitachi, Ltd. Multichip module structure and method for manufacturing the same
JP3618330B2 (ja) * 2002-11-08 2005-02-09 沖電気工業株式会社 半導体装置及びその製造方法
KR100613903B1 (ko) 2004-05-13 2006-08-17 한국전자통신연구원 유전자 알고리즘을 이용한 배열 안테나의 배열 간격 결정방법 및 이를 이용한 소파형 부등간격 배열 안테나
US7453157B2 (en) * 2004-06-25 2008-11-18 Tessera, Inc. Microelectronic packages and methods therefor
JP2006134912A (ja) * 2004-11-02 2006-05-25 Matsushita Electric Ind Co Ltd 半導体モジュールおよびその製造方法、ならびにフィルムインターポーザ
JP4520355B2 (ja) * 2005-04-19 2010-08-04 パナソニック株式会社 半導体モジュール
CN100392849C (zh) * 2005-12-09 2008-06-04 威盛电子股份有限公司 封装体及封装体模块
US20080197478A1 (en) 2007-02-21 2008-08-21 Wen-Kun Yang Semiconductor device package with die receiving through-hole and connecting through-hole and method of the same
US20090127686A1 (en) * 2007-11-21 2009-05-21 Advanced Chip Engineering Technology Inc. Stacking die package structure for semiconductor devices and method of the same
US7863721B2 (en) * 2008-06-11 2011-01-04 Stats Chippac, Ltd. Method and apparatus for wafer level integration using tapered vias
TWI443789B (zh) 2008-07-04 2014-07-01 欣興電子股份有限公司 嵌埋有半導體晶片之電路板及其製法
US8237257B2 (en) * 2008-09-25 2012-08-07 King Dragon International Inc. Substrate structure with die embedded inside and dual build-up layers over both side surfaces and method of the same
US8114708B2 (en) 2008-09-30 2012-02-14 General Electric Company System and method for pre-patterned embedded chip build-up
US7964974B2 (en) 2008-12-02 2011-06-21 General Electric Company Electronic chip package with reduced contact pad pitch
US8008781B2 (en) 2008-12-02 2011-08-30 General Electric Company Apparatus and method for reducing pitch in an integrated circuit
US8163596B2 (en) * 2009-03-24 2012-04-24 General Electric Company Stackable electronic package and method of making same
US20110058348A1 (en) 2009-09-10 2011-03-10 Ibiden Co., Ltd. Semiconductor device
JP5633493B2 (ja) 2011-09-16 2014-12-03 オムロン株式会社 半導体装置及びマイクロフォン

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090051038A1 (en) 2007-08-24 2009-02-26 Casio Computer Co., Ltd. Semiconductor device including semiconductor constituent and manufacturing method thereof
US20100108371A1 (en) 2008-11-06 2010-05-06 Ibiden Co., Ltd. Wiring board with built-in electronic component and method for manufacturing the same
WO2010052942A1 (ja) 2008-11-06 2010-05-14 イビデン株式会社 電子部品内蔵配線板及びその製造方法

Also Published As

Publication number Publication date
US20160211208A1 (en) 2016-07-21
US20140159213A1 (en) 2014-06-12
CN102315190B (zh) 2016-03-16
JP2012015504A (ja) 2012-01-19
US8653670B2 (en) 2014-02-18
KR20120001651A (ko) 2012-01-04
EP2402992A3 (en) 2013-05-08
US9679837B2 (en) 2017-06-13
US10068840B2 (en) 2018-09-04
US9299647B2 (en) 2016-03-29
TW201222755A (en) 2012-06-01
CN102315190A (zh) 2012-01-11
US20170278782A1 (en) 2017-09-28
EP2402992A2 (en) 2012-01-04
JP6014309B2 (ja) 2016-10-25
EP2402992B1 (en) 2018-11-21
US20110316167A1 (en) 2011-12-29
TWI536526B (zh) 2016-06-01

Similar Documents

Publication Publication Date Title
KR101846545B1 (ko) 인터커넥트 조립체
US8658473B2 (en) Ultrathin buried die module and method of manufacturing thereof
CN101877348B (zh) 用于堆叠的管芯嵌入式芯片堆积的系统和方法
US9570376B2 (en) Electrical interconnect for an integrated circuit package and method of making same
KR101730650B1 (ko) 실장 기판 및 반도체 모듈
US8987602B2 (en) Multilayer electronic support structure with cofabricated metal core
TW201405720A (zh) 具有一體化結構組件的多層電子支撐結構
JP2006019368A (ja) インターポーザ及びその製造方法並びに半導体装置
JP2013243345A5 (cg-RX-API-DMAC10.html)
EP2243161A2 (en) Semiconductor package
US9685376B2 (en) Semiconductor device and method of manufacturing semiconductor device
TWI550792B (zh) 半導體裝置、半導體積層模組構造、積層模組構造及此等之製造方法
US20240096838A1 (en) Component-embedded packaging structure

Legal Events

Date Code Title Description
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

R18-X000 Changes to party contact information recorded

St.27 status event code: A-3-3-R10-R18-oth-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-3-3-R10-R18-oth-X000

A201 Request for examination
PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000