KR101833970B1 - 전기적 접촉자 및 전기적 접속장치 - Google Patents

전기적 접촉자 및 전기적 접속장치 Download PDF

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Publication number
KR101833970B1
KR101833970B1 KR1020160117751A KR20160117751A KR101833970B1 KR 101833970 B1 KR101833970 B1 KR 101833970B1 KR 1020160117751 A KR1020160117751 A KR 1020160117751A KR 20160117751 A KR20160117751 A KR 20160117751A KR 101833970 B1 KR101833970 B1 KR 101833970B1
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KR
South Korea
Prior art keywords
plunger
contact
electrical
plungers
electrical contact
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KR1020160117751A
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English (en)
Korean (ko)
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KR20170061058A (ko
Inventor
켄이찌 시부타니
Original Assignee
가부시키가이샤 니혼 마이크로닉스
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/64—Means for preventing incorrect coupling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/62—Means for facilitating engagement or disengagement of coupling parts or for holding them in engagement

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Connecting Device With Holders (AREA)
KR1020160117751A 2015-11-25 2016-09-13 전기적 접촉자 및 전기적 접속장치 Active KR101833970B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2015-229513 2015-11-25
JP2015229513A JP6637742B2 (ja) 2015-11-25 2015-11-25 電気的接触子及び電気的接続装置

Publications (2)

Publication Number Publication Date
KR20170061058A KR20170061058A (ko) 2017-06-02
KR101833970B1 true KR101833970B1 (ko) 2018-03-02

Family

ID=58719483

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020160117751A Active KR101833970B1 (ko) 2015-11-25 2016-09-13 전기적 접촉자 및 전기적 접속장치

Country Status (4)

Country Link
US (1) US10018669B2 (enExample)
JP (1) JP6637742B2 (enExample)
KR (1) KR101833970B1 (enExample)
TW (1) TWI639277B (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102078549B1 (ko) * 2018-12-19 2020-02-19 주식회사 오킨스전자 동축에서 직렬로 탑재되는 듀얼 코일 스프링을 포함하는 테스트 소켓용 테스트 핀
KR102121754B1 (ko) * 2018-12-19 2020-06-11 주식회사 오킨스전자 상하 2개의 영역으로 구분되는 단일 코일 스프링을 포함하는 테스트 소켓
KR102126753B1 (ko) * 2018-12-19 2020-06-25 주식회사 오킨스전자 단일 코일 스프링에 의하여 3개의 플런저가 독립적으로 슬라이드 동작하는 테스트 소켓에 있어서, 레일을 통하여 상기 슬라이드 동작이 제어되는 데스트 핀
KR102126752B1 (ko) * 2018-12-19 2020-06-25 주식회사 오킨스전자 이중 코일 스프링에 의하여 3개의 플런저가 독립적으로 슬라이드 동작하는 테스트 소켓에 있어서, 레일을 통하여 콘택 특성이 개선되는 데스트 핀

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MY177005A (en) * 2016-11-30 2020-09-01 Nidec Read Corp Contact terminal, inspection jig, and inspection device
KR102356584B1 (ko) 2017-05-17 2022-01-28 주식회사 만도 전자식 브레이크 시스템
JP7780969B2 (ja) * 2022-02-10 2025-12-05 日本発條株式会社 コンタクトプローブおよびプローブホルダ

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070128906A1 (en) 2004-02-04 2007-06-07 Nhk Spring Co., Ltd. Needle-like member, conductive contact, and conductive contact unit
US20090075529A1 (en) 2007-09-18 2009-03-19 Johnston Charles J Spring contact assembly
JP2012181096A (ja) * 2011-03-01 2012-09-20 Micronics Japan Co Ltd 接触子及び電気的接続装置
KR101328581B1 (ko) * 2012-06-13 2013-11-13 리노공업주식회사 검사용 프로브 및 그 제조방법

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5942972U (ja) * 1982-09-14 1984-03-21 日本電気株式会社 スル−ホ−ル導通抵抗測定端子
TWM260995U (en) 2004-03-31 2005-04-01 Chupond Prec Co Ltd Central processor socket
KR100584225B1 (ko) 2004-10-06 2006-05-29 황동원 전자장치용 콘택트
JP5361518B2 (ja) * 2009-04-27 2013-12-04 株式会社ヨコオ コンタクトプローブ及びソケット
JP5750535B2 (ja) * 2009-09-28 2015-07-22 株式会社日本マイクロニクス 接触子及び電気的接続装置
JPWO2011096067A1 (ja) * 2010-02-05 2013-06-10 株式会社日本マイクロニクス 接触子及び電気的接続装置
US8373430B1 (en) * 2012-05-06 2013-02-12 Jerzy Roman Sochor Low inductance contact probe with conductively coupled plungers
JP6041565B2 (ja) * 2012-07-26 2016-12-07 株式会社ヨコオ 検査治具
JP6168911B2 (ja) 2013-08-20 2017-07-26 日立造船株式会社 カーボンナノチューブの製造装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070128906A1 (en) 2004-02-04 2007-06-07 Nhk Spring Co., Ltd. Needle-like member, conductive contact, and conductive contact unit
US20090075529A1 (en) 2007-09-18 2009-03-19 Johnston Charles J Spring contact assembly
JP2012181096A (ja) * 2011-03-01 2012-09-20 Micronics Japan Co Ltd 接触子及び電気的接続装置
KR101328581B1 (ko) * 2012-06-13 2013-11-13 리노공업주식회사 검사용 프로브 및 그 제조방법

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102078549B1 (ko) * 2018-12-19 2020-02-19 주식회사 오킨스전자 동축에서 직렬로 탑재되는 듀얼 코일 스프링을 포함하는 테스트 소켓용 테스트 핀
KR102121754B1 (ko) * 2018-12-19 2020-06-11 주식회사 오킨스전자 상하 2개의 영역으로 구분되는 단일 코일 스프링을 포함하는 테스트 소켓
KR102126753B1 (ko) * 2018-12-19 2020-06-25 주식회사 오킨스전자 단일 코일 스프링에 의하여 3개의 플런저가 독립적으로 슬라이드 동작하는 테스트 소켓에 있어서, 레일을 통하여 상기 슬라이드 동작이 제어되는 데스트 핀
KR102126752B1 (ko) * 2018-12-19 2020-06-25 주식회사 오킨스전자 이중 코일 스프링에 의하여 3개의 플런저가 독립적으로 슬라이드 동작하는 테스트 소켓에 있어서, 레일을 통하여 콘택 특성이 개선되는 데스트 핀

Also Published As

Publication number Publication date
KR20170061058A (ko) 2017-06-02
US20170146593A1 (en) 2017-05-25
US10018669B2 (en) 2018-07-10
JP2017096787A (ja) 2017-06-01
TW201724662A (zh) 2017-07-01
TWI639277B (zh) 2018-10-21
JP6637742B2 (ja) 2020-01-29

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