KR101755651B1 - 투명 또는 저 콘트라스트 검체의 분석을 위한 자동 현미경 초점 시스템 및 방법 - Google Patents

투명 또는 저 콘트라스트 검체의 분석을 위한 자동 현미경 초점 시스템 및 방법 Download PDF

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KR101755651B1
KR101755651B1 KR1020157002892A KR20157002892A KR101755651B1 KR 101755651 B1 KR101755651 B1 KR 101755651B1 KR 1020157002892 A KR1020157002892 A KR 1020157002892A KR 20157002892 A KR20157002892 A KR 20157002892A KR 101755651 B1 KR101755651 B1 KR 101755651B1
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focal plane
specimen
objective lens
depth
stop
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KR20150034757A (ko
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매튜 씨 푸트먼
존 비 푸트먼
제프리 에스 아처
줄리 에이 올랜도
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나노트로닉스 이미징, 인코포레이티드
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/244—Devices for focusing using image analysis techniques
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Automatic Focus Adjustment (AREA)
KR1020157002892A 2012-08-31 2013-08-29 투명 또는 저 콘트라스트 검체의 분석을 위한 자동 현미경 초점 시스템 및 방법 Active KR101755651B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/600,962 2012-08-31
US13/600,962 US9488819B2 (en) 2012-08-31 2012-08-31 Automatic microscopic focus system and method for analysis of transparent or low contrast specimens
PCT/US2013/057311 WO2014036276A2 (en) 2012-08-31 2013-08-29 Automatic microscopic focus system and method for analysis of transparent or low contrast specimens

Publications (2)

Publication Number Publication Date
KR20150034757A KR20150034757A (ko) 2015-04-03
KR101755651B1 true KR101755651B1 (ko) 2017-07-10

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KR1020157002892A Active KR101755651B1 (ko) 2012-08-31 2013-08-29 투명 또는 저 콘트라스트 검체의 분석을 위한 자동 현미경 초점 시스템 및 방법

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US (1) US9488819B2 (https=)
EP (1) EP2891005A4 (https=)
JP (1) JP6310460B2 (https=)
KR (1) KR101755651B1 (https=)
CN (1) CN105209955B (https=)
WO (1) WO2014036276A2 (https=)

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US10247910B1 (en) 2018-03-14 2019-04-02 Nanotronics Imaging, Inc. Systems, devices and methods for automatic microscopic focus
US10146041B1 (en) 2018-05-01 2018-12-04 Nanotronics Imaging, Inc. Systems, devices and methods for automatic microscope focus
US10545096B1 (en) 2018-10-11 2020-01-28 Nanotronics Imaging, Inc. Marco inspection systems, apparatus and methods
US10812701B2 (en) * 2018-12-13 2020-10-20 Mitutoyo Corporation High-speed tag lens assisted 3D metrology and extended depth-of-field imaging
US10901327B2 (en) 2018-12-20 2021-01-26 Canon Kabushiki Kaisha Automatic defect analyzer for nanoimprint lithography using image analysis
US10915992B1 (en) 2019-08-07 2021-02-09 Nanotronics Imaging, Inc. System, method and apparatus for macroscopic inspection of reflective specimens
US11593919B2 (en) 2019-08-07 2023-02-28 Nanotronics Imaging, Inc. System, method and apparatus for macroscopic inspection of reflective specimens
DE112020004172T5 (de) * 2019-08-30 2022-05-25 Mitutoyo Corporation Schnelles gepulstes hochleistungslichtquellensystem für diehochgeschwindigkeitsmetrologiebildgebung
US12301990B2 (en) 2020-08-07 2025-05-13 Nanotronics Imaging, Inc. Deep learning model for auto-focusing microscope systems
CN115342918B (zh) * 2021-05-14 2024-12-06 刘承贤 可携式观察微流道用环型萤光光路系统及其运作方法

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US20070152130A1 (en) 2005-12-30 2007-07-05 General Electric Company System and method for utilizing an autofocus feature in an automated microscope

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US6043475A (en) 1996-04-16 2000-03-28 Olympus Optical Co., Ltd. Focal point adjustment apparatus and method applied to microscopes
JP2004522191A (ja) 2001-03-16 2004-07-22 カール ツアイス マイクロエレクトロニック システムズ ゲゼルシャフト ミット ベシュレンクテル ハフツング オートフォーカス装置付き顕微鏡
US20070152130A1 (en) 2005-12-30 2007-07-05 General Electric Company System and method for utilizing an autofocus feature in an automated microscope

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Publication number Publication date
JP6310460B2 (ja) 2018-04-11
US9488819B2 (en) 2016-11-08
KR20150034757A (ko) 2015-04-03
CN105209955B (zh) 2017-11-28
JP2015528590A (ja) 2015-09-28
US20140063222A1 (en) 2014-03-06
EP2891005A2 (en) 2015-07-08
WO2014036276A2 (en) 2014-03-06
CN105209955A (zh) 2015-12-30
EP2891005A4 (en) 2016-08-17
WO2014036276A3 (en) 2015-07-16

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