KR101733017B1 - 광학 필름의 불량 검출 장치 및 방법 - Google Patents

광학 필름의 불량 검출 장치 및 방법 Download PDF

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Publication number
KR101733017B1
KR101733017B1 KR1020150026616A KR20150026616A KR101733017B1 KR 101733017 B1 KR101733017 B1 KR 101733017B1 KR 1020150026616 A KR1020150026616 A KR 1020150026616A KR 20150026616 A KR20150026616 A KR 20150026616A KR 101733017 B1 KR101733017 B1 KR 101733017B1
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KR
South Korea
Prior art keywords
defect
area
search
region
defective
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KR1020150026616A
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English (en)
Korean (ko)
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KR20160103795A (ko
Inventor
김종우
박진용
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동우 화인켐 주식회사
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Priority to KR1020150026616A priority Critical patent/KR101733017B1/ko
Priority to TW105102026A priority patent/TWI678529B/zh
Priority to JP2016030721A priority patent/JP6703856B2/ja
Priority to CN201610102536.3A priority patent/CN105910794B/zh
Publication of KR20160103795A publication Critical patent/KR20160103795A/ko
Application granted granted Critical
Publication of KR101733017B1 publication Critical patent/KR101733017B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8858—Flaw counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8877—Proximity analysis, local statistics
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • General Factory Administration (AREA)
  • Image Analysis (AREA)
KR1020150026616A 2015-02-25 2015-02-25 광학 필름의 불량 검출 장치 및 방법 KR101733017B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020150026616A KR101733017B1 (ko) 2015-02-25 2015-02-25 광학 필름의 불량 검출 장치 및 방법
TW105102026A TWI678529B (zh) 2015-02-25 2016-01-22 光學薄膜缺陷檢測裝置及方法
JP2016030721A JP6703856B2 (ja) 2015-02-25 2016-02-22 光学フィルムの不良検出装置及び方法
CN201610102536.3A CN105910794B (zh) 2015-02-25 2016-02-24 光学膜的不良检测装置及方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020150026616A KR101733017B1 (ko) 2015-02-25 2015-02-25 광학 필름의 불량 검출 장치 및 방법

Publications (2)

Publication Number Publication Date
KR20160103795A KR20160103795A (ko) 2016-09-02
KR101733017B1 true KR101733017B1 (ko) 2017-05-24

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Application Number Title Priority Date Filing Date
KR1020150026616A KR101733017B1 (ko) 2015-02-25 2015-02-25 광학 필름의 불량 검출 장치 및 방법

Country Status (4)

Country Link
JP (1) JP6703856B2 (zh)
KR (1) KR101733017B1 (zh)
CN (1) CN105910794B (zh)
TW (1) TWI678529B (zh)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101733018B1 (ko) * 2015-02-25 2017-05-24 동우 화인켐 주식회사 광학 필름의 불량 검출 장치 및 방법
KR101876908B1 (ko) * 2018-01-16 2018-07-10 (주) 리드에이텍 디스플레이 패널의 결함 위치 정확도 개선 방법
CN113466256B (zh) * 2021-06-29 2022-04-15 深圳市楠轩光电科技有限公司 一种光学薄膜缺陷批量式检测设备
CN116730056B (zh) * 2023-08-15 2023-10-27 江苏铭丰电子材料科技有限公司 一种可测缺陷的铜箔收卷装置

Citations (1)

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JP2015031613A (ja) 2013-08-02 2015-02-16 住友化学株式会社 欠陥検査システム及びフィルム製造装置

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US3758150A (en) * 1972-06-28 1973-09-11 P Williams Collapsible wheel chair
CA2359379A1 (en) * 2001-10-19 2003-04-19 Richard Eakins Raisable leg rest
KR100838724B1 (ko) 2001-12-05 2008-06-16 주식회사 포스코 산세강판의 롤마크 표면결함 검출시스템
JP4516884B2 (ja) * 2005-04-28 2010-08-04 新日本製鐵株式会社 周期性欠陥検査方法及び装置
CN101198859B (zh) * 2005-06-21 2012-03-28 郡是株式会社 膜检查装置和膜检查方法
ATE425452T1 (de) * 2006-06-13 2009-03-15 Abb Oy Verfahren und vorrichtung zur erkennung von sich wiederholenden mustern
KR101609007B1 (ko) * 2008-07-18 2016-04-04 아사히 가라스 가부시키가이샤 결함 검사를 위한 화상 데이터의 처리 장치 및 방법, 이것들을 사용한 결함 검사 장치 및 방법, 이것들을 사용한 판 형상체의 제조 방법, 및 기록 매체
CN102792154B (zh) * 2010-03-10 2015-09-23 3M创新有限公司 幅材制备工艺中专用的重复缺陷检测
KR101294218B1 (ko) * 2010-05-10 2013-08-07 동우 화인켐 주식회사 편광 필름 원반의 품질 판정 시스템 및 방법
KR101744606B1 (ko) * 2010-05-25 2017-06-09 도레이 카부시키가이샤 필름의 결함 검사 장치, 결함 검사 방법 및 이형 필름
US8866899B2 (en) * 2011-06-07 2014-10-21 Photon Dynamics Inc. Systems and methods for defect detection using a whole raw image
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KR101330098B1 (ko) * 2012-05-10 2013-11-18 동우 화인켐 주식회사 광학 필름의 결함 판별 방법
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CN104048599B (zh) * 2013-03-13 2018-06-01 以操作-试验名义经营的索夫泰克系统配套公司 用于对发光器件进行特征分析的方法和系统
KR20140148067A (ko) * 2013-06-21 2014-12-31 동우 화인켐 주식회사 광학 필름의 결함 판별 방법

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Also Published As

Publication number Publication date
TWI678529B (zh) 2019-12-01
CN105910794A (zh) 2016-08-31
KR20160103795A (ko) 2016-09-02
JP2016156821A (ja) 2016-09-01
TW201631313A (zh) 2016-09-01
CN105910794B (zh) 2021-02-09
JP6703856B2 (ja) 2020-06-03

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