KR101729515B1 - 실리콘 단결정 잉곳의 성장 방법 - Google Patents
실리콘 단결정 잉곳의 성장 방법 Download PDFInfo
- Publication number
- KR101729515B1 KR101729515B1 KR1020150052307A KR20150052307A KR101729515B1 KR 101729515 B1 KR101729515 B1 KR 101729515B1 KR 1020150052307 A KR1020150052307 A KR 1020150052307A KR 20150052307 A KR20150052307 A KR 20150052307A KR 101729515 B1 KR101729515 B1 KR 101729515B1
- Authority
- KR
- South Korea
- Prior art keywords
- single crystal
- ingot
- silicon
- growing
- crystal ingot
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 66
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 66
- 239000010703 silicon Substances 0.000 title claims abstract description 66
- 239000013078 crystal Substances 0.000 title claims abstract description 50
- 238000000034 method Methods 0.000 title claims abstract description 41
- 230000020169 heat generation Effects 0.000 claims abstract description 7
- 238000009792 diffusion process Methods 0.000 claims description 11
- 239000001301 oxygen Substances 0.000 description 20
- 229910052760 oxygen Inorganic materials 0.000 description 20
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 18
- 230000012010 growth Effects 0.000 description 17
- 235000012431 wafers Nutrition 0.000 description 16
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000002019 doping agent Substances 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000000155 melt Substances 0.000 description 3
- 238000005498 polishing Methods 0.000 description 3
- 239000002244 precipitate Substances 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910002804 graphite Inorganic materials 0.000 description 2
- 239000010439 graphite Substances 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000021332 multicellular organism growth Effects 0.000 description 2
- 150000002926 oxygen Chemical class 0.000 description 2
- 238000007517 polishing process Methods 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000005247 gettering Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/14—Heating of the melt or the crystallised materials
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
- C30B15/305—Stirring of the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
- H01L21/0259—Microstructure
- H01L21/02598—Microstructure monocrystalline
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020150052307A KR101729515B1 (ko) | 2015-04-14 | 2015-04-14 | 실리콘 단결정 잉곳의 성장 방법 |
| JP2018504631A JP2018510839A (ja) | 2015-04-14 | 2016-04-12 | シリコン単結晶インゴットの成長装置及び方法 |
| US15/564,045 US10344395B2 (en) | 2015-04-14 | 2016-04-12 | Apparatus and method for growing silicon single crystal ingot |
| PCT/KR2016/003841 WO2016167542A1 (ko) | 2015-04-14 | 2016-04-12 | 실리콘 단결정 잉곳의 성장 장치 및 방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020150052307A KR101729515B1 (ko) | 2015-04-14 | 2015-04-14 | 실리콘 단결정 잉곳의 성장 방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20160122453A KR20160122453A (ko) | 2016-10-24 |
| KR101729515B1 true KR101729515B1 (ko) | 2017-04-24 |
Family
ID=57127285
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020150052307A Active KR101729515B1 (ko) | 2015-04-14 | 2015-04-14 | 실리콘 단결정 잉곳의 성장 방법 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US10344395B2 (enExample) |
| JP (1) | JP2018510839A (enExample) |
| KR (1) | KR101729515B1 (enExample) |
| WO (1) | WO2016167542A1 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7342845B2 (ja) * | 2020-11-25 | 2023-09-12 | 株式会社Sumco | シリコン単結晶の製造方法 |
| US12486593B2 (en) | 2022-08-29 | 2025-12-02 | Globalwafers Co., Ltd. | Axial positioning of magnetic poles while producing a silicon ingot |
| US12486594B2 (en) | 2022-08-29 | 2025-12-02 | Globalwafers Co., Ltd. | Ingot puller apparatus that axially position magnetic poles |
| CN117364225B (zh) * | 2023-12-07 | 2024-02-23 | 天通控股股份有限公司 | 一种晶体与坩埚同向旋转的长晶方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100239864B1 (ko) | 1995-06-01 | 2000-01-15 | 와다 다다시 | 단결정의 제조방법 및 장치 |
| KR101379798B1 (ko) * | 2012-05-23 | 2014-04-01 | 주식회사 엘지실트론 | 단결정 실리콘 잉곳 성장 장치 및 방법 |
| JP2014214067A (ja) * | 2013-04-26 | 2014-11-17 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2546736B2 (ja) * | 1990-06-21 | 1996-10-23 | 信越半導体株式会社 | シリコン単結晶引上方法 |
| JPH08231294A (ja) | 1995-02-24 | 1996-09-10 | Toshiba Ceramics Co Ltd | 水平磁界下シリコン単結晶引上方法 |
| JPH09208385A (ja) | 1996-01-30 | 1997-08-12 | Mitsubishi Materials Corp | シリコン単結晶の育成方法及びその装置 |
| JP2003321297A (ja) | 2002-04-25 | 2003-11-11 | Shin Etsu Handotai Co Ltd | シリコン単結晶の製造方法及びシリコン単結晶ウェーハ |
| JP4457584B2 (ja) * | 2003-06-27 | 2010-04-28 | 信越半導体株式会社 | 単結晶の製造方法及び単結晶 |
| KR100831044B1 (ko) | 2005-09-21 | 2008-05-21 | 주식회사 실트론 | 고품질 실리콘 단결정 잉곳의 성장장치, 그 장치를 이용한성장방법 |
| JP2008019129A (ja) | 2006-07-13 | 2008-01-31 | Sumco Corp | 単結晶製造装置、単結晶の製造方法および単結晶 |
| JP4853237B2 (ja) * | 2006-11-06 | 2012-01-11 | 株式会社Sumco | エピタキシャルウェーハの製造方法 |
| JP2008214118A (ja) | 2007-03-01 | 2008-09-18 | Shin Etsu Handotai Co Ltd | 半導体単結晶の製造方法 |
| KR100954291B1 (ko) * | 2008-01-21 | 2010-04-26 | 주식회사 실트론 | 고품질의 반도체 단결정 잉곳 제조장치 및 방법 |
| JP5228671B2 (ja) * | 2008-07-24 | 2013-07-03 | 株式会社Sumco | シリコン単結晶の育成方法 |
| KR101105475B1 (ko) * | 2009-02-04 | 2012-01-13 | 주식회사 엘지실트론 | 공정 변동이 최소화된 단결정 제조방법 |
| WO2013176396A1 (ko) * | 2012-05-23 | 2013-11-28 | 주식회사 엘지실트론 | 단결정 실리콘 잉곳 및 웨이퍼, 그 잉곳 성장 장치 및 방법 |
| KR20150007885A (ko) * | 2013-07-12 | 2015-01-21 | 엘지이노텍 주식회사 | 형광체 및 이를 구비한 발광 소자 |
-
2015
- 2015-04-14 KR KR1020150052307A patent/KR101729515B1/ko active Active
-
2016
- 2016-04-12 JP JP2018504631A patent/JP2018510839A/ja active Pending
- 2016-04-12 WO PCT/KR2016/003841 patent/WO2016167542A1/ko not_active Ceased
- 2016-04-12 US US15/564,045 patent/US10344395B2/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100239864B1 (ko) | 1995-06-01 | 2000-01-15 | 와다 다다시 | 단결정의 제조방법 및 장치 |
| KR101379798B1 (ko) * | 2012-05-23 | 2014-04-01 | 주식회사 엘지실트론 | 단결정 실리콘 잉곳 성장 장치 및 방법 |
| JP2014214067A (ja) * | 2013-04-26 | 2014-11-17 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20180094359A1 (en) | 2018-04-05 |
| US10344395B2 (en) | 2019-07-09 |
| JP2018510839A (ja) | 2018-04-19 |
| WO2016167542A1 (ko) | 2016-10-20 |
| KR20160122453A (ko) | 2016-10-24 |
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