KR101715458B1 - 능동 깊이 감지를 위한 아핀-불변 공간 마스크의 수신 - Google Patents

능동 깊이 감지를 위한 아핀-불변 공간 마스크의 수신 Download PDF

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KR101715458B1
KR101715458B1 KR1020147031300A KR20147031300A KR101715458B1 KR 101715458 B1 KR101715458 B1 KR 101715458B1 KR 1020147031300 A KR1020147031300 A KR 1020147031300A KR 20147031300 A KR20147031300 A KR 20147031300A KR 101715458 B1 KR101715458 B1 KR 101715458B1
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KR20150006438A (ko
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칼린 미트코브 아타나소브
제임스 윌슨 내쉬
비카스 라마찬드라
세르지우 라두 고마
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퀄컴 인코포레이티드
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
    • H04B1/06—Receivers
    • H04B1/10—Means associated with receiver for limiting or suppressing noise or interference
    • H04B1/12—Neutralising, balancing, or compensation arrangements

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Signal Processing (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Measurement Of Optical Distance (AREA)
  • Studio Devices (AREA)
KR1020147031300A 2012-05-24 2013-04-18 능동 깊이 감지를 위한 아핀-불변 공간 마스크의 수신 Active KR101715458B1 (ko)

Applications Claiming Priority (13)

Application Number Priority Date Filing Date Title
US201261651528P 2012-05-24 2012-05-24
US201261651535P 2012-05-24 2012-05-24
US201261651533P 2012-05-24 2012-05-24
US201261651529P 2012-05-24 2012-05-24
US61/651,535 2012-05-24
US61/651,529 2012-05-24
US61/651,533 2012-05-24
US61/651,528 2012-05-24
US201261666405P 2012-06-29 2012-06-29
US61/666,405 2012-06-29
US13/785,939 US9448064B2 (en) 2012-05-24 2013-03-05 Reception of affine-invariant spatial mask for active depth sensing
US13/785,939 2013-03-05
PCT/US2013/037221 WO2013176807A1 (en) 2012-05-24 2013-04-18 Reception of affine-invariant spatial mask for active depth sensing

Publications (2)

Publication Number Publication Date
KR20150006438A KR20150006438A (ko) 2015-01-16
KR101715458B1 true KR101715458B1 (ko) 2017-03-10

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US (3) US9188433B2 (https=)
EP (3) EP2856078B1 (https=)
JP (5) JP6416083B2 (https=)
KR (1) KR101715458B1 (https=)
CN (3) CN104285127B (https=)
ES (2) ES2810274T3 (https=)
HU (2) HUE050266T2 (https=)
WO (3) WO2013176808A1 (https=)

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