KR101704030B1 - 구리 첨가에 의한 솔더 인터커넥트의 개선 - Google Patents
구리 첨가에 의한 솔더 인터커넥트의 개선 Download PDFInfo
- Publication number
- KR101704030B1 KR101704030B1 KR1020100066127A KR20100066127A KR101704030B1 KR 101704030 B1 KR101704030 B1 KR 101704030B1 KR 1020100066127 A KR1020100066127 A KR 1020100066127A KR 20100066127 A KR20100066127 A KR 20100066127A KR 101704030 B1 KR101704030 B1 KR 101704030B1
- Authority
- KR
- South Korea
- Prior art keywords
- layer
- electronic device
- solder bump
- sub
- copper
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/01—Manufacture or treatment
- H10W70/05—Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
- H10W70/098—Applying pastes or inks, e.g. screen printing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/02—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
- B23K35/0222—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering or brazing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/66—Conductive materials thereof
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/01—Manufacture or treatment
- H10W70/05—Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
- H10W70/093—Connecting or disconnecting other interconnections thereto or therefrom, e.g. connecting bond wires or bumps
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01221—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition
- H10W72/01223—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition in liquid form, e.g. by dispensing droplets or by screen printing
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/019—Manufacture or treatment of bond pads
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07231—Techniques
- H10W72/07236—Soldering or alloying
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07251—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07251—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
- H10W72/07255—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting changes in materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/221—Structures or relative sizes
- H10W72/222—Multilayered bumps, e.g. a coating on top and side surfaces of a bump core
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/221—Structures or relative sizes
- H10W72/222—Multilayered bumps, e.g. a coating on top and side surfaces of a bump core
- H10W72/223—Multilayered bumps, e.g. a coating on top and side surfaces of a bump core characterised by the structure of the outermost layers, e.g. multilayered coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
- H10W72/252—Materials comprising solid metals or solid metalloids, e.g. PbSn, Ag or Cu
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
- H10W72/252—Materials comprising solid metals or solid metalloids, e.g. PbSn, Ag or Cu
- H10W72/2528—Intermetallic compounds
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
- H10W72/255—Materials of outermost layers of multilayered bumps, e.g. material of a coating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/29—Bond pads specially adapted therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
- H10W72/923—Bond pads having multiple stacked layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
- H10W72/934—Cross-sectional shape, i.e. in side view
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/9415—Dispositions of bond pads relative to the surface, e.g. recessed, protruding
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Wire Bonding (AREA)
- Manufacturing & Machinery (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/501,686 US8378485B2 (en) | 2009-07-13 | 2009-07-13 | Solder interconnect by addition of copper |
| US12/501,686 | 2009-07-13 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20110006615A KR20110006615A (ko) | 2011-01-20 |
| KR101704030B1 true KR101704030B1 (ko) | 2017-02-07 |
Family
ID=43027609
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020100066127A Active KR101704030B1 (ko) | 2009-07-13 | 2010-07-09 | 구리 첨가에 의한 솔더 인터커넥트의 개선 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US8378485B2 (https=) |
| EP (1) | EP2276063A3 (https=) |
| JP (1) | JP5604665B2 (https=) |
| KR (1) | KR101704030B1 (https=) |
| CN (1) | CN101958259B (https=) |
| TW (1) | TWI394632B (https=) |
Families Citing this family (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8378485B2 (en) | 2009-07-13 | 2013-02-19 | Lsi Corporation | Solder interconnect by addition of copper |
| CN103180944A (zh) * | 2010-10-25 | 2013-06-26 | 松下电器产业株式会社 | 电子元件的接合方式 |
| US8268675B2 (en) * | 2011-02-11 | 2012-09-18 | Nordson Corporation | Passivation layer for semiconductor device packaging |
| US8889995B2 (en) | 2011-03-03 | 2014-11-18 | Skyworks Solutions, Inc. | Wire bond pad system and method |
| WO2012118896A2 (en) * | 2011-03-03 | 2012-09-07 | Skyworks Solutions, Inc. | Apparatus and methods related to wire bond pads and reducing impact of high rf loss plating |
| US8686537B2 (en) | 2011-03-03 | 2014-04-01 | Skyworks Solutions, Inc. | Apparatus and methods for reducing impact of high RF loss plating |
| KR101108548B1 (ko) * | 2011-07-12 | 2012-01-30 | 김진철 | 이어폰 케이블 권취기구 |
| US9679869B2 (en) | 2011-09-02 | 2017-06-13 | Skyworks Solutions, Inc. | Transmission line for high performance radio frequency applications |
| US9099396B2 (en) | 2011-11-08 | 2015-08-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Post-passivation interconnect structure and method of forming the same |
| US20130241058A1 (en) * | 2012-03-16 | 2013-09-19 | Taiwan Semiconductor Manufacturing Company, Ltd. | Wire Bonding Structures for Integrated Circuits |
| JP5893800B2 (ja) | 2012-06-14 | 2016-03-23 | スカイワークス ソリューションズ, インコーポレイテッドSkyworks Solutions, Inc. | パワーアンプモジュールを含む関連するシステム、デバイス、および方法 |
| US10496977B2 (en) | 2012-07-16 | 2019-12-03 | Square, Inc. | Storing and forwarding payment transactions |
| JP5893528B2 (ja) * | 2012-07-27 | 2016-03-23 | 新日鉄住金マテリアルズ株式会社 | 無鉛はんだバンプ接合構造 |
| JP2014116367A (ja) * | 2012-12-06 | 2014-06-26 | Fujitsu Ltd | 電子部品、電子装置の製造方法及び電子装置 |
| JP2014146652A (ja) * | 2013-01-28 | 2014-08-14 | Toppan Printing Co Ltd | 配線基板およびその製造方法 |
| US9299680B2 (en) | 2013-03-14 | 2016-03-29 | Taiwan Semiconductor Manufacturing Company, Ltd. | Integrated circuit structure having dies with connectors |
| JP6046010B2 (ja) * | 2013-09-09 | 2016-12-14 | 株式会社東芝 | 半導体装置及びその製造方法 |
| US9723716B2 (en) * | 2013-09-27 | 2017-08-01 | Infineon Technologies Ag | Contact pad structure, an electronic component, and a method for manufacturing a contact pad structure |
| CN106030783B (zh) * | 2014-03-27 | 2019-06-18 | 英特尔公司 | 用于低温附接的混合互连 |
| JP6281468B2 (ja) | 2014-10-30 | 2018-02-21 | トヨタ自動車株式会社 | 半導体装置とその製造方法 |
| JP6287759B2 (ja) * | 2014-10-30 | 2018-03-07 | トヨタ自動車株式会社 | 半導体装置とその製造方法 |
| US9881302B1 (en) | 2014-12-11 | 2018-01-30 | Square, Inc. | Intelligent payment capture in failed authorization requests |
| US9576922B2 (en) | 2015-05-04 | 2017-02-21 | Globalfoundries Inc. | Silver alloying post-chip join |
| DE102016103585B4 (de) * | 2016-02-29 | 2022-01-13 | Infineon Technologies Ag | Verfahren zum Herstellen eines Package mit lötbarem elektrischen Kontakt |
| JP6729331B2 (ja) * | 2016-11-30 | 2020-07-22 | 富士通株式会社 | 電子装置及び電子装置の製造方法 |
| US10483221B2 (en) | 2017-10-30 | 2019-11-19 | Micron Technology, Inc. | 3DI solder cup |
| KR102075681B1 (ko) | 2018-11-16 | 2020-02-11 | 박민호 | 이어폰 전선 꼬임 방지장치 |
| CN110682021B (zh) * | 2019-11-11 | 2021-08-03 | 重庆理工大学 | 一种抑制界面imc生长的微焊点的制备方法 |
| KR102837298B1 (ko) | 2020-12-22 | 2025-07-23 | 삼성전자주식회사 | 반도체 패키지 및 그 제조 방법 |
| WO2023123116A1 (zh) | 2021-12-29 | 2023-07-06 | 京东方科技集团股份有限公司 | 线路板、功能背板、背光模组、显示面板及显示装置 |
| US12581596B2 (en) * | 2021-12-31 | 2026-03-17 | Boe Technology Group Co., Ltd. | Wiring board, functional backplane and method for manufacturing the same |
| CN116965159A (zh) | 2022-02-24 | 2023-10-27 | 京东方科技集团股份有限公司 | 线路板及其制造方法、功能背板、背光模组、显示装置 |
| US12610675B2 (en) | 2022-04-21 | 2026-04-21 | Boe Technology Group Co., Ltd. | Circuit board, light-emitting substrate, backlight module, display panel and display device |
| US12457685B2 (en) | 2022-10-31 | 2025-10-28 | Beijing Boe Technology Development Co., Ltd. | Circuit board, light-emitting substrate, backlight module, and display apparatus |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080157395A1 (en) * | 2006-12-28 | 2008-07-03 | Luc Belanger | Interconnections for flip-chip using lead-free solders and having improved reaction barrier layers |
| JP2009094224A (ja) | 2007-10-05 | 2009-04-30 | Fujitsu Ltd | 回路基板、半導体装置、及び半導体装置の製造方法 |
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| US5545923A (en) * | 1993-10-22 | 1996-08-13 | Lsi Logic Corporation | Semiconductor device assembly with minimized bond finger connections |
| US5466635A (en) * | 1994-06-02 | 1995-11-14 | Lsi Logic Corporation | Process for making an interconnect bump for flip-chip integrated circuit including integral standoff and hourglass shaped solder coating |
| JP3060896B2 (ja) * | 1995-05-26 | 2000-07-10 | 日本電気株式会社 | バンプ電極の構造 |
| US5918794A (en) * | 1995-12-28 | 1999-07-06 | Lucent Technologies Inc. | Solder bonding of dense arrays of microminiature contact pads |
| US5667132A (en) * | 1996-04-19 | 1997-09-16 | Lucent Technologies Inc. | Method for solder-bonding contact pad arrays |
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| JP2003045908A (ja) | 2001-08-01 | 2003-02-14 | Toshiba Corp | 半導体装置とその製造方法 |
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| JP2003303842A (ja) * | 2002-04-12 | 2003-10-24 | Nec Electronics Corp | 半導体装置およびその製造方法 |
| US20030219623A1 (en) * | 2002-05-21 | 2003-11-27 | Kao Cheng Heng | Solder joints with low consumption rate of nickel layer |
| DE10241589B4 (de) * | 2002-09-05 | 2007-11-22 | Qimonda Ag | Verfahren zur Lötstopp-Strukturierung von Erhebungen auf Wafern |
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| DE102005051857A1 (de) * | 2005-05-25 | 2007-02-22 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | UBM-PAD, Lötkontakt und Verfahren zur Herstellung einer Lötverbindung |
| JP4305430B2 (ja) * | 2005-08-24 | 2009-07-29 | ソニー株式会社 | 部品実装方法および部品実装体 |
| DE102005055488A1 (de) | 2005-11-18 | 2007-01-04 | Infineon Technologies Ag | Elektronische Struktur mit mehreren elektronischen Komponenten und Verfahren zu ihrer Herstellung |
| US20070238283A1 (en) * | 2006-04-05 | 2007-10-11 | Taiwan Semiconductor Manufacturing Co., Ltd. | Novel under-bump metallization for bond pad soldering |
| JP4597940B2 (ja) * | 2006-10-26 | 2010-12-15 | 富士通セミコンダクター株式会社 | 外部接続端子 |
| WO2009013826A1 (ja) | 2007-07-25 | 2009-01-29 | Fujitsu Microelectronics Limited | 半導体装置 |
| JP2010040691A (ja) * | 2008-08-04 | 2010-02-18 | Ebara Corp | 鉛フリーバンプ形成方法 |
| US8378485B2 (en) | 2009-07-13 | 2013-02-19 | Lsi Corporation | Solder interconnect by addition of copper |
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2009
- 2009-07-13 US US12/501,686 patent/US8378485B2/en active Active
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2010
- 2010-07-05 TW TW099122029A patent/TWI394632B/zh active
- 2010-07-09 KR KR1020100066127A patent/KR101704030B1/ko active Active
- 2010-07-09 EP EP10169010A patent/EP2276063A3/en not_active Withdrawn
- 2010-07-12 CN CN201010226969.2A patent/CN101958259B/zh active Active
- 2010-07-13 JP JP2010158372A patent/JP5604665B2/ja active Active
-
2013
- 2013-01-29 US US13/752,524 patent/US8580621B2/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080157395A1 (en) * | 2006-12-28 | 2008-07-03 | Luc Belanger | Interconnections for flip-chip using lead-free solders and having improved reaction barrier layers |
| JP2009094224A (ja) | 2007-10-05 | 2009-04-30 | Fujitsu Ltd | 回路基板、半導体装置、及び半導体装置の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101958259A (zh) | 2011-01-26 |
| KR20110006615A (ko) | 2011-01-20 |
| JP2011023721A (ja) | 2011-02-03 |
| US8580621B2 (en) | 2013-11-12 |
| TWI394632B (zh) | 2013-05-01 |
| EP2276063A3 (en) | 2011-04-20 |
| US8378485B2 (en) | 2013-02-19 |
| EP2276063A2 (en) | 2011-01-19 |
| CN101958259B (zh) | 2014-09-03 |
| TW201107071A (en) | 2011-03-01 |
| US20110006415A1 (en) | 2011-01-13 |
| JP5604665B2 (ja) | 2014-10-08 |
| US20130149857A1 (en) | 2013-06-13 |
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