KR101697071B1 - 광학 필름의 결함 판별 방법 - Google Patents

광학 필름의 결함 판별 방법 Download PDF

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Publication number
KR101697071B1
KR101697071B1 KR1020140046832A KR20140046832A KR101697071B1 KR 101697071 B1 KR101697071 B1 KR 101697071B1 KR 1020140046832 A KR1020140046832 A KR 1020140046832A KR 20140046832 A KR20140046832 A KR 20140046832A KR 101697071 B1 KR101697071 B1 KR 101697071B1
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South Korea
Prior art keywords
foreign
defect
foreign object
defects
classified
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KR1020140046832A
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English (en)
Korean (ko)
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KR20150120761A (ko
Inventor
이은규
박재현
허재영
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동우 화인켐 주식회사
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Application filed by 동우 화인켐 주식회사 filed Critical 동우 화인켐 주식회사
Priority to KR1020140046832A priority Critical patent/KR101697071B1/ko
Priority to TW104111243A priority patent/TW201541068A/zh
Priority to JP2015082538A priority patent/JP6541404B2/ja
Priority to CN201510184141.8A priority patent/CN105044130B/zh
Publication of KR20150120761A publication Critical patent/KR20150120761A/ko
Application granted granted Critical
Publication of KR101697071B1 publication Critical patent/KR101697071B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B32—LAYERED PRODUCTS
    • B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00—Layered products comprising a layer of synthetic resin
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
KR1020140046832A 2014-04-18 2014-04-18 광학 필름의 결함 판별 방법 KR101697071B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020140046832A KR101697071B1 (ko) 2014-04-18 2014-04-18 광학 필름의 결함 판별 방법
TW104111243A TW201541068A (zh) 2014-04-18 2015-04-08 光學薄膜缺陷鑑別方法
JP2015082538A JP6541404B2 (ja) 2014-04-18 2015-04-14 光学フィルムの欠陥判別方法及び装置
CN201510184141.8A CN105044130B (zh) 2014-04-18 2015-04-17 一种光学膜的缺陷判别方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020140046832A KR101697071B1 (ko) 2014-04-18 2014-04-18 광학 필름의 결함 판별 방법

Publications (2)

Publication Number Publication Date
KR20150120761A KR20150120761A (ko) 2015-10-28
KR101697071B1 true KR101697071B1 (ko) 2017-01-17

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KR1020140046832A KR101697071B1 (ko) 2014-04-18 2014-04-18 광학 필름의 결함 판별 방법

Country Status (4)

Country Link
JP (1) JP6541404B2 (ja)
KR (1) KR101697071B1 (ja)
CN (1) CN105044130B (ja)
TW (1) TW201541068A (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109581573B (zh) * 2018-12-18 2021-12-17 深圳市三利谱光电科技股份有限公司 一种剥离偏光片的方法和鉴定偏光片类型的方法及其系统

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005291883A (ja) 2004-03-31 2005-10-20 Shin Nisseki Ekisho Film Kk 光学フィルムの検査方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004198163A (ja) * 2002-12-17 2004-07-15 Sumitomo Chem Co Ltd 保護フィルム粘着偏光板の欠陥検査方法
JP4396160B2 (ja) * 2003-07-31 2010-01-13 住友化学株式会社 透明性フィルムの異物検査方法
US7339664B2 (en) * 2004-09-29 2008-03-04 General Electric Company System and method for inspecting a light-management film and method of making the light-management film
US7859274B2 (en) * 2006-02-15 2010-12-28 Dongjin Semichem Co., Ltd. System for testing a flat panel display device and method thereof
JP4960026B2 (ja) * 2006-06-09 2012-06-27 富士フイルム株式会社 フイルムの欠陥検査装置及びフイルムの製造方法
JP2009069142A (ja) * 2007-08-23 2009-04-02 Nitto Denko Corp 積層フィルムの欠陥検査方法およびその装置
KR20100024753A (ko) 2008-08-26 2010-03-08 주식회사 에이스 디지텍 라인 형태의 이물 검출방법
JP5556212B2 (ja) * 2010-02-08 2014-07-23 住友化学株式会社 偏光板を貼合した液晶パネルの欠陥検査方法
TW201132963A (en) * 2010-02-08 2011-10-01 Sumitomo Chemical Co An inspection method for defect in a liquid crystal panel laminated with polarizing plates
JP5274622B2 (ja) * 2011-06-27 2013-08-28 富士フイルム株式会社 欠陥検査装置及び方法
CN102288619B (zh) * 2011-07-01 2013-04-24 明基材料有限公司 三维光学膜的瑕疵检测方法及系统
KR101330098B1 (ko) * 2012-05-10 2013-11-18 동우 화인켐 주식회사 광학 필름의 결함 판별 방법
KR101349662B1 (ko) * 2013-05-16 2014-01-13 동우 화인켐 주식회사 광학 필름의 결함 판별 방법
CN103759644B (zh) * 2014-01-23 2016-05-18 广州市光机电技术研究院 一种滤光片表面缺陷的分离细化智能检测方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005291883A (ja) 2004-03-31 2005-10-20 Shin Nisseki Ekisho Film Kk 光学フィルムの検査方法

Also Published As

Publication number Publication date
TW201541068A (zh) 2015-11-01
CN105044130B (zh) 2019-04-05
KR20150120761A (ko) 2015-10-28
CN105044130A (zh) 2015-11-11
JP2015206790A (ja) 2015-11-19
JP6541404B2 (ja) 2019-07-10

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