KR101687997B1 - 광 검출 장치 및 표시 장치 - Google Patents
광 검출 장치 및 표시 장치 Download PDFInfo
- Publication number
- KR101687997B1 KR101687997B1 KR1020100080639A KR20100080639A KR101687997B1 KR 101687997 B1 KR101687997 B1 KR 101687997B1 KR 1020100080639 A KR1020100080639 A KR 1020100080639A KR 20100080639 A KR20100080639 A KR 20100080639A KR 101687997 B1 KR101687997 B1 KR 101687997B1
- Authority
- KR
- South Korea
- Prior art keywords
- light
- photodiode
- color filter
- shielding layer
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0204—Compact construction
- G01J1/0209—Monolithic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0214—Constructional arrangements for removing stray light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
- G01J3/506—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors measuring the colour produced by screens, monitors, displays or CRTs
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
- G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
- G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
- G01J3/513—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters having fixed filter-detector pairs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/805—Coatings
- H10F39/8053—Colour filters
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/805—Coatings
- H10F39/8057—Optical shielding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
- H10F39/8063—Microlenses
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/30—Devices specially adapted for multicolour light emission
- H10K59/38—Devices specially adapted for multicolour light emission comprising colour filters or colour changing media [CCM]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/60—OLEDs integrated with inorganic light-sensitive elements, e.g. with inorganic solar cells or inorganic photodiodes
- H10K59/65—OLEDs integrated with inorganic image sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Sustainable Development (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Light Receiving Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Liquid Crystal (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009193302 | 2009-08-24 | ||
| JPJP-P-2009-193302 | 2009-08-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20110020743A KR20110020743A (ko) | 2011-03-03 |
| KR101687997B1 true KR101687997B1 (ko) | 2016-12-21 |
Family
ID=43605094
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020100080639A Expired - Fee Related KR101687997B1 (ko) | 2009-08-24 | 2010-08-20 | 광 검출 장치 및 표시 장치 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8625058B2 (https=) |
| JP (1) | JP5530858B2 (https=) |
| KR (1) | KR101687997B1 (https=) |
| CN (1) | CN101997011B (https=) |
| TW (1) | TWI523240B (https=) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5553707B2 (ja) * | 2009-08-21 | 2014-07-16 | 株式会社半導体エネルギー研究所 | 光検出装置 |
| KR101113467B1 (ko) * | 2010-04-01 | 2012-02-29 | 삼성모바일디스플레이주식회사 | 터치 스크린 패널 |
| US8764504B2 (en) | 2011-02-25 | 2014-07-01 | Semiconductor Energy Laboratory Co., Ltd. | Lighting device and method for manufacturing the same |
| JP5504382B2 (ja) * | 2011-09-27 | 2014-05-28 | 富士フイルム株式会社 | 固体撮像素子及び撮像装置 |
| JP5845856B2 (ja) * | 2011-11-30 | 2016-01-20 | ソニー株式会社 | 固体撮像素子およびその製造方法、並びに電子機器 |
| CN103206969A (zh) * | 2013-03-27 | 2013-07-17 | 启东文鑫电子有限公司 | 一种光电探测器 |
| CN104752445B (zh) * | 2013-12-25 | 2018-08-17 | 昆山工研院新型平板显示技术中心有限公司 | 交互式电子装置 |
| JP5683734B1 (ja) * | 2014-07-01 | 2015-03-11 | グンゼ株式会社 | 透明導電性積層体、タッチパネル、および透明導電性積層体の製造方法 |
| DE102015112042B4 (de) * | 2015-07-23 | 2021-07-01 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronische Leuchtvorrichtung |
| DE102017100798A1 (de) | 2017-01-17 | 2018-07-19 | Osram Opto Semiconductors Gmbh | Anzeigevorrichtung |
| CN108666342B (zh) * | 2017-03-31 | 2021-02-09 | 京东方科技集团股份有限公司 | 一种显示面板及制作方法、显示装置 |
| JP2019102664A (ja) * | 2017-12-04 | 2019-06-24 | 株式会社ブイ・テクノロジー | Led表示パネルの製造方法 |
| CN107978613A (zh) * | 2017-12-15 | 2018-05-01 | 中芯集成电路(宁波)有限公司 | 半导体感光器件及其感光表面处理方法 |
| US11844236B2 (en) | 2019-07-12 | 2023-12-12 | Semiconductor Energy Laboratory Co., Ltd. | Functional panel, display device, input/output device, and data processing device |
| US20210050385A1 (en) * | 2019-08-13 | 2021-02-18 | Apple Inc. | Photodetectors Integrated into Thin-Film Transistor Backplanes |
| US11611058B2 (en) | 2019-09-24 | 2023-03-21 | Apple Inc. | Devices and systems for under display image sensor |
| US11527582B1 (en) | 2019-09-24 | 2022-12-13 | Apple Inc. | Display stack with integrated photodetectors |
| US11997766B2 (en) | 2019-10-11 | 2024-05-28 | Semiconductor Energy Laboratory Co., Ltd. | Functional panel, display device, input/output device, and data processing device |
| CN112882356B (zh) * | 2019-11-29 | 2021-11-12 | 上海微电子装备(集团)股份有限公司 | 光电探测器、调焦调平装置以及光刻投影设备 |
| US11487859B2 (en) | 2020-07-31 | 2022-11-01 | Apple Inc. | Behind display polarized optical transceiver |
| WO2022168736A1 (ja) * | 2021-02-04 | 2022-08-11 | 株式会社ジャパンディスプレイ | 検出機器 |
| US11839133B2 (en) | 2021-03-12 | 2023-12-05 | Apple Inc. | Organic photodetectors for in-cell optical sensing |
| US12124002B2 (en) | 2021-09-03 | 2024-10-22 | Apple Inc. | Beam deflector metasurface |
| CN114264323A (zh) * | 2021-12-14 | 2022-04-01 | 武汉华星光电半导体显示技术有限公司 | 光学传感器及显示面板 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| KR100660346B1 (ko) * | 2005-09-21 | 2006-12-22 | 동부일렉트로닉스 주식회사 | 씨모스 이미지 센서 및 그 제조방법 |
| KR100731131B1 (ko) | 2005-12-29 | 2007-06-22 | 동부일렉트로닉스 주식회사 | 씨모스 이미지 센서 및 그 제조방법 |
| JP2010034426A (ja) | 2008-07-31 | 2010-02-12 | Panasonic Corp | 固体撮像装置およびその製造方法ならびにカメラ |
Family Cites Families (34)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2884458B2 (ja) | 1992-05-11 | 1999-04-19 | キヤノン株式会社 | 液晶表示パネルの製造方法 |
| JP3779052B2 (ja) | 1997-12-17 | 2006-05-24 | 株式会社半導体エネルギー研究所 | 液晶プロジェクタ |
| US7002659B1 (en) | 1999-11-30 | 2006-02-21 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal panel and liquid crystal projector |
| KR20010059238A (ko) * | 1999-12-30 | 2001-07-06 | 박종섭 | 광감도 개선을 위한 이미지센서 및 그 제조방법 |
| JP2001222025A (ja) * | 2000-02-09 | 2001-08-17 | Sharp Corp | 液晶表示装置 |
| US6690437B2 (en) | 2000-04-18 | 2004-02-10 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device |
| US6747289B2 (en) | 2000-04-27 | 2004-06-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of fabricating thereof |
| US7430025B2 (en) | 2000-08-23 | 2008-09-30 | Semiconductor Energy Laboratory Co., Ltd. | Portable electronic device |
| JP4476503B2 (ja) | 2001-02-07 | 2010-06-09 | 株式会社半導体エネルギー研究所 | 携帯型電子装置 |
| JP4251622B2 (ja) | 2003-06-20 | 2009-04-08 | 東芝松下ディスプレイテクノロジー株式会社 | 液晶表示装置 |
| JP4736013B2 (ja) * | 2003-12-16 | 2011-07-27 | 日本電気株式会社 | 発光表示装置の製造方法 |
| JP2005294647A (ja) * | 2004-04-01 | 2005-10-20 | Matsushita Electric Ind Co Ltd | 固体撮像装置およびその製造方法 |
| JP2005321670A (ja) * | 2004-05-11 | 2005-11-17 | Sony Corp | 薄膜半導体装置、液晶表示装置及び画像プロジェクタ装置 |
| JP2005353799A (ja) * | 2004-06-10 | 2005-12-22 | Toppan Printing Co Ltd | リニアセンサー |
| KR100606900B1 (ko) * | 2004-12-21 | 2006-08-01 | 동부일렉트로닉스 주식회사 | 씨모스 이미지 센서 및 그 제조방법 |
| KR100672660B1 (ko) * | 2004-12-24 | 2007-01-24 | 동부일렉트로닉스 주식회사 | 씨모스 이미지 센서 및 그 제조방법 |
| KR100672687B1 (ko) * | 2005-06-03 | 2007-01-22 | 동부일렉트로닉스 주식회사 | 씨모스 이미지 센서 및 그 제조방법 |
| KR100710204B1 (ko) * | 2005-09-08 | 2007-04-20 | 동부일렉트로닉스 주식회사 | 씨모스 이미지 센서 및 그 제조방법 |
| KR101389808B1 (ko) | 2005-11-18 | 2014-04-29 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 광전변환장치 |
| US8053816B2 (en) | 2006-03-10 | 2011-11-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| CN102082189B (zh) | 2006-04-28 | 2012-11-28 | 株式会社半导体能源研究所 | 光电转换元件和光电转换元件制造方法 |
| JP4391497B2 (ja) | 2006-05-19 | 2009-12-24 | シャープ株式会社 | カラーセンサー、カラーセンサーの製造方法、センサー、及び電子機器 |
| JP4854745B2 (ja) | 2006-10-11 | 2012-01-18 | シャープ株式会社 | 液晶表示装置 |
| US8110832B2 (en) * | 2007-02-22 | 2012-02-07 | Seiko Epson Corporation | Electro-optical substrate, method for designing the same, electro-optical device, and electronic apparatus |
| US7825998B2 (en) | 2007-04-06 | 2010-11-02 | Hannstar Display Corp. | Input display having particular photo sensor, color filter, and light-shielding element arrangement |
| JP2009021415A (ja) * | 2007-07-12 | 2009-01-29 | Panasonic Corp | 固体撮像装置およびその製造方法 |
| KR100877293B1 (ko) * | 2007-08-31 | 2009-01-07 | 주식회사 동부하이텍 | 이미지 센서 및 그 제조방법 |
| JP2009134275A (ja) | 2007-11-02 | 2009-06-18 | Sony Corp | カラー液晶表示装置組立体及び光変換装置 |
| US20090141004A1 (en) | 2007-12-03 | 2009-06-04 | Semiconductor Energy Laboratory Co., Ltd. | Display device and method for manufacturing the same |
| KR20090066459A (ko) | 2007-12-20 | 2009-06-24 | 삼성전자주식회사 | 액정 표시 장치용 컬러 필터 기판 및 그 제조 방법 |
| US8736587B2 (en) | 2008-07-10 | 2014-05-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| US8941617B2 (en) | 2008-11-07 | 2015-01-27 | Semiconductor Energy Laboratory Co., Ltd. | Image input-output device with color layer between photodetector and display elements to improve the accuracy of reading images in color |
| KR101550067B1 (ko) * | 2008-12-24 | 2015-09-03 | 인텔렉추얼디스커버리 주식회사 | 이미지 센서 및 이의 제조 방법 |
| JP5553707B2 (ja) | 2009-08-21 | 2014-07-16 | 株式会社半導体エネルギー研究所 | 光検出装置 |
-
2010
- 2010-08-19 TW TW099127745A patent/TWI523240B/zh not_active IP Right Cessation
- 2010-08-20 KR KR1020100080639A patent/KR101687997B1/ko not_active Expired - Fee Related
- 2010-08-23 US US12/861,476 patent/US8625058B2/en not_active Expired - Fee Related
- 2010-08-23 JP JP2010185957A patent/JP5530858B2/ja not_active Expired - Fee Related
- 2010-08-24 CN CN201010266753.9A patent/CN101997011B/zh not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100660346B1 (ko) * | 2005-09-21 | 2006-12-22 | 동부일렉트로닉스 주식회사 | 씨모스 이미지 센서 및 그 제조방법 |
| KR100731131B1 (ko) | 2005-12-29 | 2007-06-22 | 동부일렉트로닉스 주식회사 | 씨모스 이미지 센서 및 그 제조방법 |
| JP2010034426A (ja) | 2008-07-31 | 2010-02-12 | Panasonic Corp | 固体撮像装置およびその製造方法ならびにカメラ |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201208083A (en) | 2012-02-16 |
| JP5530858B2 (ja) | 2014-06-25 |
| CN101997011B (zh) | 2015-04-22 |
| US8625058B2 (en) | 2014-01-07 |
| CN101997011A (zh) | 2011-03-30 |
| US20110043735A1 (en) | 2011-02-24 |
| JP2011071495A (ja) | 2011-04-07 |
| KR20110020743A (ko) | 2011-03-03 |
| TWI523240B (zh) | 2016-02-21 |
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