KR101681219B1 - 링 오실레이터 기반 물리적으로 클론가능하지 않은 기능 및 연령 검출 회로를 사용하는 집적 회로 식별 및 의존성 검증 - Google Patents
링 오실레이터 기반 물리적으로 클론가능하지 않은 기능 및 연령 검출 회로를 사용하는 집적 회로 식별 및 의존성 검증 Download PDFInfo
- Publication number
- KR101681219B1 KR101681219B1 KR1020157023912A KR20157023912A KR101681219B1 KR 101681219 B1 KR101681219 B1 KR 101681219B1 KR 1020157023912 A KR1020157023912 A KR 1020157023912A KR 20157023912 A KR20157023912 A KR 20157023912A KR 101681219 B1 KR101681219 B1 KR 101681219B1
- Authority
- KR
- South Korea
- Prior art keywords
- circuit
- ring
- ring oscillators
- ring oscillator
- puf
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000001514 detection method Methods 0.000 title claims description 10
- 238000012795 verification Methods 0.000 title description 2
- 238000012545 processing Methods 0.000 claims description 77
- 238000000034 method Methods 0.000 claims description 67
- 230000004044 response Effects 0.000 claims description 35
- 238000004519 manufacturing process Methods 0.000 claims description 14
- 238000005259 measurement Methods 0.000 claims description 8
- 238000003491 array Methods 0.000 claims description 7
- 230000008878 coupling Effects 0.000 claims description 7
- 238000010168 coupling process Methods 0.000 claims description 7
- 238000005859 coupling reaction Methods 0.000 claims description 7
- 230000006870 function Effects 0.000 description 31
- 238000010586 diagram Methods 0.000 description 18
- 230000036541 health Effects 0.000 description 14
- 238000012544 monitoring process Methods 0.000 description 13
- 230000008569 process Effects 0.000 description 9
- 230000035882 stress Effects 0.000 description 6
- 230000003862 health status Effects 0.000 description 5
- 230000032683 aging Effects 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 3
- 238000012806 monitoring device Methods 0.000 description 3
- 230000003679 aging effect Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 229910008065 Si-SiO Inorganic materials 0.000 description 1
- 229910006405 Si—SiO Inorganic materials 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000010367 cloning Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000036962 time dependent Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
- H03K3/03—Astable circuits
- H03K3/0315—Ring oscillators
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09C—CIPHERING OR DECIPHERING APPARATUS FOR CRYPTOGRAPHIC OR OTHER PURPOSES INVOLVING THE NEED FOR SECRECY
- G09C1/00—Apparatus or methods whereby a given sequence of signs, e.g. an intelligible text, is transformed into an unintelligible sequence of signs by transposing the signs or groups of signs or by replacing them by others according to a predetermined system
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/84—Generating pulses having a predetermined statistical distribution of a parameter, e.g. random pulse generators
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/156—Arrangements in which a continuous pulse train is transformed into a train having a desired pattern
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L9/00—Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols
- H04L9/08—Key distribution or management, e.g. generation, sharing or updating, of cryptographic keys or passwords
- H04L9/0861—Generation of secret information including derivation or calculation of cryptographic keys or passwords
- H04L9/0866—Generation of secret information including derivation or calculation of cryptographic keys or passwords involving user or device identifiers, e.g. serial number, physical or biometrical information, DNA, hand-signature or measurable physical characteristics
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L9/00—Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols
- H04L9/32—Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols including means for verifying the identity or authority of a user of the system or for message authentication, e.g. authorization, entity authentication, data integrity or data verification, non-repudiation, key authentication or verification of credentials
- H04L9/3271—Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols including means for verifying the identity or authority of a user of the system or for message authentication, e.g. authorization, entity authentication, data integrity or data verification, non-repudiation, key authentication or verification of credentials using challenge-response
- H04L9/3278—Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols including means for verifying the identity or authority of a user of the system or for message authentication, e.g. authorization, entity authentication, data integrity or data verification, non-repudiation, key authentication or verification of credentials using challenge-response using physically unclonable functions [PUF]
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L2209/00—Additional information or applications relating to cryptographic mechanisms or cryptographic arrangements for secret or secure communication H04L9/00
- H04L2209/12—Details relating to cryptographic hardware or logic circuitry
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
Landscapes
- Engineering & Computer Science (AREA)
- Computer Security & Cryptography (AREA)
- Physics & Mathematics (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Semiconductor Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/764,507 US9083323B2 (en) | 2013-02-11 | 2013-02-11 | Integrated circuit identification and dependability verification using ring oscillator based physical unclonable function and age detection circuitry |
| US13/764,507 | 2013-02-11 | ||
| PCT/US2014/014896 WO2014124023A1 (en) | 2013-02-11 | 2014-02-05 | Integrated circuit identification and dependability verification using ring oscillator based physical unclonable function and age detection circuitry |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20150117284A KR20150117284A (ko) | 2015-10-19 |
| KR101681219B1 true KR101681219B1 (ko) | 2016-12-01 |
Family
ID=50156929
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020157023912A Active KR101681219B1 (ko) | 2013-02-11 | 2014-02-05 | 링 오실레이터 기반 물리적으로 클론가능하지 않은 기능 및 연령 검출 회로를 사용하는 집적 회로 식별 및 의존성 검증 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9083323B2 (enExample) |
| EP (1) | EP2954615B1 (enExample) |
| JP (2) | JP6359035B2 (enExample) |
| KR (1) | KR101681219B1 (enExample) |
| CN (1) | CN104969468B (enExample) |
| TW (1) | TWI545900B (enExample) |
| WO (1) | WO2014124023A1 (enExample) |
Families Citing this family (72)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9279856B2 (en) * | 2012-10-22 | 2016-03-08 | Infineon Technologies Ag | Die, chip, method for driving a die or a chip and method for manufacturing a die or a chip |
| DE102013203415B4 (de) * | 2013-02-28 | 2016-02-11 | Siemens Aktiengesellschaft | Erstellen eines abgeleiteten Schlüssels aus einem kryptographischen Schlüssel mittels einer physikalisch nicht klonbaren Funktion |
| US8981810B1 (en) | 2013-04-22 | 2015-03-17 | Xilinx, Inc. | Method and apparatus for preventing accelerated aging of a physically unclonable function |
| US9444618B1 (en) * | 2013-04-22 | 2016-09-13 | Xilinx, Inc. | Defense against attacks on ring oscillator-based physically unclonable functions |
| US9082514B1 (en) * | 2013-04-22 | 2015-07-14 | Xilinx, Inc. | Method and apparatus for physically unclonable function burn-in |
| KR102186475B1 (ko) | 2013-12-31 | 2020-12-03 | 주식회사 아이씨티케이 홀딩스 | 랜덤한 디지털 값을 생성하는 장치 및 방법 |
| US9224030B2 (en) | 2014-01-10 | 2015-12-29 | Qualcomm Incorporated | Sensor identification |
| JP6354172B2 (ja) * | 2014-01-20 | 2018-07-11 | 富士通株式会社 | 半導体集積回路及び認証システム |
| US10432409B2 (en) | 2014-05-05 | 2019-10-01 | Analog Devices, Inc. | Authentication system and device including physical unclonable function and threshold cryptography |
| EP2988141A1 (en) * | 2014-08-19 | 2016-02-24 | Nagravision S.A. | Aging control of a system on chip |
| JP2016046719A (ja) | 2014-08-25 | 2016-04-04 | 株式会社東芝 | データ生成装置、通信装置、移動体、データ生成方法およびプログラム |
| DE102014218218A1 (de) * | 2014-09-11 | 2016-03-17 | Robert Bosch Gmbh | Verfahren zum Erzeugen eines kryptographischen Schlüssels in einem System-on-a-Chip |
| US10036773B1 (en) | 2014-12-11 | 2018-07-31 | University Of South Florida | Aging-sensitive recycling sensors for chip authentication |
| US9501664B1 (en) * | 2014-12-15 | 2016-11-22 | Sandia Corporation | Method, apparatus and system to compensate for drift by physically unclonable function circuitry |
| CN107615285B (zh) * | 2015-03-05 | 2020-08-11 | 美国亚德诺半导体公司 | 包括物理不可克隆功能和阈值加密的认证系统和装置 |
| US10002810B2 (en) | 2015-06-25 | 2018-06-19 | International Business Machines Corporation | On-chip combined hot carrier injection and bias temperature instability monitor |
| TW201708835A (zh) * | 2015-08-04 | 2017-03-01 | 財團法人工業技術研究院 | 電子電路監測系統及電子電路監測方法 |
| CN108474812A (zh) * | 2015-10-29 | 2018-08-31 | 加利福尼亚大学董事会 | 老化传感器及假冒集成电路检测 |
| US10142335B2 (en) | 2015-12-18 | 2018-11-27 | International Business Machines Corporation | Dynamic intrinsic chip identification |
| US10073138B2 (en) * | 2015-12-22 | 2018-09-11 | Intel Corporation | Early detection of reliability degradation through analysis of multiple physically unclonable function circuit codes |
| TWI689933B (zh) | 2016-01-08 | 2020-04-01 | 美商希諾皮斯股份有限公司 | 使用反熔絲記憶體陣列產生物理不可複製函數值的系統與方法 |
| US9762241B1 (en) * | 2016-06-30 | 2017-09-12 | Intel Corporation | Physically unclonable function circuit including memory elements |
| CN106020170B (zh) | 2016-07-07 | 2019-03-15 | 工业和信息化部电子第五研究所 | SoC健康监测的方法、装置及系统 |
| US11797994B2 (en) * | 2016-07-15 | 2023-10-24 | Maxim Integrated Products, Inc. | Systems and methods for a secure payment terminal without batteries |
| US10911229B2 (en) | 2016-08-04 | 2021-02-02 | Macronix International Co., Ltd. | Unchangeable physical unclonable function in non-volatile memory |
| US10715340B2 (en) | 2016-08-04 | 2020-07-14 | Macronix International Co., Ltd. | Non-volatile memory with security key storage |
| US11258599B2 (en) | 2016-08-04 | 2022-02-22 | Macronix International Co., Ltd. | Stable physically unclonable function |
| US10680809B2 (en) | 2016-08-04 | 2020-06-09 | Macronix International Co., Ltd. | Physical unclonable function for security key |
| US10855477B2 (en) | 2016-08-04 | 2020-12-01 | Macronix International Co., Ltd. | Non-volatile memory with physical unclonable function and random number generator |
| CN106372539B (zh) * | 2016-08-31 | 2019-12-03 | 电子科技大学 | 变频环形振荡器puf电路及其控制方法 |
| US9806719B1 (en) * | 2016-09-29 | 2017-10-31 | Intel Corporation | Physically unclonable circuit having a programmable input for improved dark bit mask accuracy |
| CN109765476A (zh) * | 2016-10-27 | 2019-05-17 | 电子科技大学 | 集成电路芯片防伪检测方法 |
| EP3340214B1 (en) * | 2016-12-21 | 2021-01-20 | Secure-IC SAS | Synthetic physically unclonable function |
| US9811689B1 (en) | 2016-12-27 | 2017-11-07 | Macronix International Co., Ltd. | Chip ID generation using physical unclonable function |
| US10564213B2 (en) | 2017-02-27 | 2020-02-18 | International Business Machines Corporation | Dielectric breakdown monitor |
| CN106874799B (zh) * | 2017-02-27 | 2020-02-18 | 广东顺德中山大学卡内基梅隆大学国际联合研究院 | 一种基于时钟分布网络的物理不可克隆函数生成方法 |
| CN107271879B (zh) * | 2017-05-31 | 2020-07-31 | 上海华力微电子有限公司 | 半导体芯片老化测试装置及方法 |
| US10425235B2 (en) | 2017-06-02 | 2019-09-24 | Analog Devices, Inc. | Device and system with global tamper resistance |
| US10938580B2 (en) | 2017-06-06 | 2021-03-02 | Analog Devices, Inc. | System and device employing physical unclonable functions for tamper penalties |
| US10958452B2 (en) | 2017-06-06 | 2021-03-23 | Analog Devices, Inc. | System and device including reconfigurable physical unclonable functions and threshold cryptography |
| CN107483180B (zh) * | 2017-08-21 | 2020-05-01 | 湖南大学 | 一种高稳定性物理不可克隆函数电路 |
| US11159167B2 (en) * | 2017-09-25 | 2021-10-26 | Intel Corporation | Techniques for reducing uneven aging in integrated circuits |
| EP3483772A1 (en) * | 2017-11-14 | 2019-05-15 | Nagravision S.A. | Integrated circuit personalisation with data encrypted with the output of a physically unclonable function |
| US10841107B2 (en) | 2017-11-20 | 2020-11-17 | Analog Devices, Inc. | Efficient delay-based PUF implementation using optimal racing strategy |
| CN108199845B (zh) * | 2017-12-08 | 2021-07-09 | 中国电子科技集团公司第三十研究所 | 一种基于puf的轻量级认证设备及认证方法 |
| JP6585215B2 (ja) * | 2018-03-16 | 2019-10-02 | 株式会社東芝 | データ生成装置、通信装置、移動体、データ生成方法およびプログラム |
| US10554209B2 (en) | 2018-03-22 | 2020-02-04 | Intel Corporation | Adaptive aging tolerant apparatus |
| CN108540109A (zh) * | 2018-04-11 | 2018-09-14 | 中国电子科技集团公司第五十八研究所 | 基于环形振荡器的物理指纹生成电路及方法 |
| US10778451B2 (en) * | 2018-07-30 | 2020-09-15 | United States Of America As Represented By The Secretary Of The Navy | Device and method for hardware timestamping with inherent security |
| US11258596B2 (en) * | 2018-08-13 | 2022-02-22 | Taiwan Semiconductor Manufacturing Company Ltd. | System to generate a signature key and method of operating the same |
| US10320387B1 (en) * | 2018-09-28 | 2019-06-11 | Nxp Usa, Inc. | Static state control of a digital logic circuit within an integrated circuit during low power mode |
| KR102600349B1 (ko) * | 2018-11-16 | 2023-11-09 | 한국전자통신연구원 | 링 발진기 구조 기반의 비밀 정보 생성 장치 및 방법 |
| CN109784099B (zh) * | 2018-12-18 | 2023-01-10 | 上海华虹集成电路有限责任公司 | 一种基于查找表的新型强物理不可克隆函数的构建方法 |
| KR102738403B1 (ko) | 2018-12-31 | 2024-12-04 | 삼성전자주식회사 | 물리적 복제방지 기능의 보안을 위한 집적 회로 및 이를 포함하는 장치 |
| CN110135000B (zh) * | 2019-04-15 | 2023-06-30 | 深圳市纽创信安科技开发有限公司 | 芯片年龄判断方法、装置、ip模块及芯片 |
| US11196575B2 (en) * | 2019-04-24 | 2021-12-07 | International Business Machines Corporation | On-chipset certification to prevent spy chip |
| CN112019129B (zh) * | 2019-05-31 | 2022-04-01 | 蜂巢传动系统(江苏)有限公司保定研发分公司 | 驱动保护方法、桥式驱动系统及电机控制器 |
| KR102212513B1 (ko) * | 2019-09-16 | 2021-02-04 | 성균관대학교산학협력단 | PUF(physically unclonable function) 회로 및 PUF 셀을 이용한 사용자 인증 용 개인 키 생성 방법 |
| CN111130536B (zh) * | 2019-12-09 | 2023-04-28 | 宁波大学 | 一种同时具有老化检测和puf功能的电路 |
| CN111800129B (zh) * | 2020-06-22 | 2022-11-11 | 华中科技大学 | 一种支持环境感知的puf单元、puf和混合puf |
| KR20220019156A (ko) | 2020-08-06 | 2022-02-16 | 삼성전자주식회사 | 물리적 복제 방지 셀들을 포함하는 포함하는 보안 장치 및 그것의 동작 방법 |
| CN111966329B (zh) * | 2020-08-18 | 2023-03-21 | 合肥工业大学 | 一种基于物理不可克隆函数puf的真随机数发生器 |
| US11380379B2 (en) | 2020-11-02 | 2022-07-05 | Macronix International Co., Ltd. | PUF applications in memories |
| TWI768532B (zh) * | 2020-11-04 | 2022-06-21 | 國立彰化師範大學 | 電路老化監測系統及其方法 |
| CN114614987B (zh) * | 2020-12-03 | 2023-07-07 | 北京京东方技术开发有限公司 | 一种集成电路及其数字指纹生成电路、方法 |
| TWI750021B (zh) * | 2021-02-01 | 2021-12-11 | 瑞昱半導體股份有限公司 | 可靠度偵測裝置與可靠度偵測方法 |
| US11750192B2 (en) * | 2021-02-24 | 2023-09-05 | Nvidia Corp. | Stability of bit generating cells through aging |
| US12047518B2 (en) | 2021-03-18 | 2024-07-23 | Analog Devices, Inc. | Delay based PUF implementation with integrated determination of optimum configuration |
| KR102650331B1 (ko) | 2021-08-09 | 2024-03-21 | 포항공과대학교 산학협력단 | 물리적 복제 방지 기능을 구현하는 반도체 장치 |
| US12309299B2 (en) * | 2021-09-22 | 2025-05-20 | Intel Corporation | Method, system and apparatus for protection of multi-die structures |
| CN115277029A (zh) * | 2022-09-28 | 2022-11-01 | 南方电网数字电网研究院有限公司 | 基于物理不可克隆函数的芯片信息的加密认证方法及系统 |
| CN115865353B (zh) * | 2023-02-23 | 2023-05-30 | 湖北工业大学 | 基于瞬态效应环形振荡器的强puf电路及响应生成方法 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008503883A (ja) | 2004-06-16 | 2008-02-07 | トランスメータ・コーポレーション | 時間依存性絶縁破壊を測定するためのシステムおよび方法 |
| JP2008503882A (ja) | 2004-06-16 | 2008-02-07 | トランスメータ・コーポレーション | 負バイアス温度不安定性を測定するシステム及び方法 |
| WO2008056612A1 (en) | 2006-11-06 | 2008-05-15 | Panasonic Corporation | Information security apparatus |
| WO2011027553A1 (ja) | 2009-09-07 | 2011-03-10 | 日本電気株式会社 | 経年劣化診断装置、経年劣化診断方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7205854B2 (en) | 2003-12-23 | 2007-04-17 | Intel Corporation | On-chip transistor degradation monitoring |
| US7579689B2 (en) * | 2006-01-31 | 2009-08-25 | Mediatek Inc. | Integrated circuit package, and a method for producing an integrated circuit package having two dies with input and output terminals of integrated circuits of the dies directly addressable for testing of the package |
| JP2009016586A (ja) * | 2007-07-05 | 2009-01-22 | Nec Electronics Corp | 半導体装置およびその製造方法 |
| US20090276232A1 (en) * | 2008-05-02 | 2009-11-05 | Goodnow Kenneth J | Warranty monitoring and enforcement for integrated circuit |
| US8468186B2 (en) | 2009-08-05 | 2013-06-18 | Verayo, Inc. | Combination of values from a pseudo-random source |
| US8549363B2 (en) | 2010-01-08 | 2013-10-01 | International Business Machines Corporation | Reliability and performance of a system-on-a-chip by predictive wear-out based activation of functional components |
-
2013
- 2013-02-11 US US13/764,507 patent/US9083323B2/en active Active
-
2014
- 2014-02-05 JP JP2015557029A patent/JP6359035B2/ja active Active
- 2014-02-05 CN CN201480007659.8A patent/CN104969468B/zh not_active Expired - Fee Related
- 2014-02-05 KR KR1020157023912A patent/KR101681219B1/ko active Active
- 2014-02-05 EP EP14706190.7A patent/EP2954615B1/en not_active Not-in-force
- 2014-02-05 WO PCT/US2014/014896 patent/WO2014124023A1/en not_active Ceased
- 2014-02-07 TW TW103104142A patent/TWI545900B/zh not_active IP Right Cessation
-
2018
- 2018-01-05 JP JP2018000620A patent/JP6377865B2/ja not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008503883A (ja) | 2004-06-16 | 2008-02-07 | トランスメータ・コーポレーション | 時間依存性絶縁破壊を測定するためのシステムおよび方法 |
| JP2008503882A (ja) | 2004-06-16 | 2008-02-07 | トランスメータ・コーポレーション | 負バイアス温度不安定性を測定するシステム及び方法 |
| WO2008056612A1 (en) | 2006-11-06 | 2008-05-15 | Panasonic Corporation | Information security apparatus |
| WO2011027553A1 (ja) | 2009-09-07 | 2011-03-10 | 日本電気株式会社 | 経年劣化診断装置、経年劣化診断方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104969468B (zh) | 2018-10-16 |
| JP6359035B2 (ja) | 2018-07-18 |
| JP2018082483A (ja) | 2018-05-24 |
| US20140225639A1 (en) | 2014-08-14 |
| JP2016508003A (ja) | 2016-03-10 |
| KR20150117284A (ko) | 2015-10-19 |
| EP2954615B1 (en) | 2018-08-08 |
| US9083323B2 (en) | 2015-07-14 |
| TW201444289A (zh) | 2014-11-16 |
| EP2954615A1 (en) | 2015-12-16 |
| TWI545900B (zh) | 2016-08-11 |
| JP6377865B2 (ja) | 2018-08-22 |
| WO2014124023A1 (en) | 2014-08-14 |
| CN104969468A (zh) | 2015-10-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR101681219B1 (ko) | 링 오실레이터 기반 물리적으로 클론가능하지 않은 기능 및 연령 검출 회로를 사용하는 집적 회로 식별 및 의존성 검증 | |
| US9337837B2 (en) | Physical unclonable function generation and management | |
| US9015500B2 (en) | Method and apparatus for using dynamic voltage and frequency scaling with circuit-delay based integrated circuit identification | |
| JP5248328B2 (ja) | 信号発生器をベースとした装置セキュリティ | |
| JP6096930B2 (ja) | データ依存型回路経路応答を使用する一意でクローン化不能なプラットフォーム識別子 | |
| CN112689837B (zh) | 用于检测对密码装置的故障注入攻击的密码集成电路和方法 | |
| WO2015098207A1 (ja) | Id生成装置、id生成方法、およびid生成システム | |
| US9276583B1 (en) | Soft dark bit masking with integrated load modulation and burn-in induced destabilization for physically unclonable function keys | |
| CN106796264A (zh) | 片上系统的老化控制 | |
| KR101359783B1 (ko) | 부정합 부하 저항 소자 기반 물리적 복제 불가 함수 시스템 | |
| US10223532B2 (en) | Protection of data stored in a volatile memory | |
| WO2018186968A1 (en) | Random number generator that includes physically unclonable circuits | |
| US11879938B2 (en) | Method for detecting perturbations in a logic circuit and logic circuit for implementing this method | |
| TW202401027A (zh) | 感知竄改的老化感測器 | |
| Samarin et al. | IP core protection using voltage-controlled side-channel receivers | |
| JP2019161645A (ja) | 情報処理システム、情報処理装置、及び情報処理装置の制御方法 | |
| JP2008289086A (ja) | 半導体装置 | |
| US20140164788A1 (en) | Secure Switch Between Modes |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
Patent event date: 20150902 Patent event code: PA01051R01D Comment text: International Patent Application |
|
| PG1501 | Laying open of application | ||
| A201 | Request for examination | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20160223 Comment text: Request for Examination of Application |
|
| PA0302 | Request for accelerated examination |
Patent event date: 20160223 Patent event code: PA03022R01D Comment text: Request for Accelerated Examination |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20160609 Patent event code: PE09021S01D |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20161021 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20161124 Patent event code: PR07011E01D |
|
| PR1002 | Payment of registration fee |
Payment date: 20161125 End annual number: 3 Start annual number: 1 |
|
| PG1601 | Publication of registration | ||
| FPAY | Annual fee payment |
Payment date: 20190924 Year of fee payment: 4 |
|
| PR1001 | Payment of annual fee |
Payment date: 20190924 Start annual number: 4 End annual number: 4 |
|
| PR1001 | Payment of annual fee |
Payment date: 20201005 Start annual number: 5 End annual number: 5 |
|
| PR1001 | Payment of annual fee |
Payment date: 20210929 Start annual number: 6 End annual number: 6 |
|
| PR1001 | Payment of annual fee |
Payment date: 20220921 Start annual number: 7 End annual number: 7 |
|
| PR1001 | Payment of annual fee |
Payment date: 20230921 Start annual number: 8 End annual number: 8 |
|
| PR1001 | Payment of annual fee |