KR101661533B1 - 입체 표시 장치 검출 시스템 및 그 검출 방법 - Google Patents

입체 표시 장치 검출 시스템 및 그 검출 방법 Download PDF

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Publication number
KR101661533B1
KR101661533B1 KR1020140191759A KR20140191759A KR101661533B1 KR 101661533 B1 KR101661533 B1 KR 101661533B1 KR 1020140191759 A KR1020140191759 A KR 1020140191759A KR 20140191759 A KR20140191759 A KR 20140191759A KR 101661533 B1 KR101661533 B1 KR 101661533B1
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KR
South Korea
Prior art keywords
stereoscopic
image
correction parameter
display
stereoscopic display
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KR1020140191759A
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English (en)
Korean (ko)
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KR20160042738A (ko
Inventor
징원 라이
퉁푸 리
펑 저우
젠 궁
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수퍼디 컴퍼니 리미티드
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/30—Image reproducers
    • H04N13/327—Calibration thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20—Image signal generators
    • H04N13/204—Image signal generators using stereoscopic image cameras

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Stereoscopic And Panoramic Photography (AREA)
KR1020140191759A 2014-10-11 2014-12-29 입체 표시 장치 검출 시스템 및 그 검출 방법 KR101661533B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201410535242.0 2014-10-11
CN201410535242.0A CN105578175B (zh) 2014-10-11 2014-10-11 立体显示装置检测系统及其检测方法

Publications (2)

Publication Number Publication Date
KR20160042738A KR20160042738A (ko) 2016-04-20
KR101661533B1 true KR101661533B1 (ko) 2016-09-30

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KR1020140191759A KR101661533B1 (ko) 2014-10-11 2014-12-29 입체 표시 장치 검출 시스템 및 그 검출 방법

Country Status (4)

Country Link
JP (1) JP6213966B2 (zh)
KR (1) KR101661533B1 (zh)
CN (1) CN105578175B (zh)
TW (1) TWI583967B (zh)

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US10091496B2 (en) * 2016-11-28 2018-10-02 X Development Llc Systems, devices, and methods for calibrating a light field projection system
CN108259888A (zh) * 2016-12-29 2018-07-06 深圳超多维光电子有限公司 立体显示效果的测试方法及系统
CN107202680B (zh) * 2017-06-23 2019-12-24 深圳超多维科技有限公司 一种模组检测设备及检测方法
CN108195563B (zh) * 2017-12-29 2020-04-28 深圳超多维科技有限公司 一种立体显示装置的显示效果测评方法、装置和测评终端
CN109005400B (zh) * 2018-07-02 2020-06-23 深圳超多维科技有限公司 一种检测光栅贴合偏移的方法、系统及存储介质

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Also Published As

Publication number Publication date
KR20160042738A (ko) 2016-04-20
CN105578175B (zh) 2018-03-30
TW201614243A (en) 2016-04-16
TWI583967B (zh) 2017-05-21
JP2016082558A (ja) 2016-05-16
JP6213966B2 (ja) 2017-10-18
CN105578175A (zh) 2016-05-11

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