KR101459494B1 - 광간섭 단층법을 이용하는 촬상장치 및 촬상 방법 - Google Patents

광간섭 단층법을 이용하는 촬상장치 및 촬상 방법 Download PDF

Info

Publication number
KR101459494B1
KR101459494B1 KR1020117030117A KR20117030117A KR101459494B1 KR 101459494 B1 KR101459494 B1 KR 101459494B1 KR 1020117030117 A KR1020117030117 A KR 1020117030117A KR 20117030117 A KR20117030117 A KR 20117030117A KR 101459494 B1 KR101459494 B1 KR 101459494B1
Authority
KR
South Korea
Prior art keywords
light
region
lights
measurement
spectroscopic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020117030117A
Other languages
English (en)
Korean (ko)
Other versions
KR20120023104A (ko
Inventor
히로후미 요시다
켄지 무토
Original Assignee
캐논 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 캐논 가부시끼가이샤 filed Critical 캐논 가부시끼가이샤
Publication of KR20120023104A publication Critical patent/KR20120023104A/ko
Application granted granted Critical
Publication of KR101459494B1 publication Critical patent/KR101459494B1/ko
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/12—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for looking at the eye fundus, e.g. ophthalmoscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/102—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for optical coherence tomography [OCT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
    • A61B5/0062—Arrangements for scanning
    • A61B5/0066—Optical coherence imaging
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
    • A61B5/0073—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence by tomography, i.e. reconstruction of 3D images from 2D projections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02027—Two or more interferometric channels or interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02044—Imaging in the frequency domain, e.g. by using a spectrometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02056—Passive reduction of errors
    • G01B9/02058—Passive reduction of errors by particular optical compensation or alignment elements, e.g. dispersion compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/35—Mechanical variable delay line
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/178—Methods for obtaining spatial resolution of the property being measured
    • G01N2021/1785—Three dimensional
    • G01N2021/1787—Tomographic, i.e. computerised reconstruction from projective measurements

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Surgery (AREA)
  • Veterinary Medicine (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Medical Informatics (AREA)
  • Molecular Biology (AREA)
  • Engineering & Computer Science (AREA)
  • Animal Behavior & Ethology (AREA)
  • Pathology (AREA)
  • Public Health (AREA)
  • Biomedical Technology (AREA)
  • Biophysics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Ophthalmology & Optometry (AREA)
  • Dispersion Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Eye Examination Apparatus (AREA)
KR1020117030117A 2009-05-22 2010-05-19 광간섭 단층법을 이용하는 촬상장치 및 촬상 방법 Expired - Fee Related KR101459494B1 (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JPJP-P-2009-124274 2009-05-22
JP2009124274 2009-05-22
JPJP-P-2010-082803 2010-03-31
JP2010082803A JP5645445B2 (ja) 2009-05-22 2010-03-31 撮像装置及び撮像方法
PCT/JP2010/058848 WO2010134624A1 (en) 2009-05-22 2010-05-19 Optical tomography device

Publications (2)

Publication Number Publication Date
KR20120023104A KR20120023104A (ko) 2012-03-12
KR101459494B1 true KR101459494B1 (ko) 2014-11-07

Family

ID=42634989

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020117030117A Expired - Fee Related KR101459494B1 (ko) 2009-05-22 2010-05-19 광간섭 단층법을 이용하는 촬상장치 및 촬상 방법

Country Status (6)

Country Link
US (1) US8982357B2 (enExample)
EP (1) EP2433116A1 (enExample)
JP (1) JP5645445B2 (enExample)
KR (1) KR101459494B1 (enExample)
CN (1) CN102439426B (enExample)
WO (1) WO2010134624A1 (enExample)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8773650B2 (en) 2009-09-18 2014-07-08 Intuitive Surgical Operations, Inc. Optical position and/or shape sensing
JP5590942B2 (ja) * 2010-03-31 2014-09-17 キヤノン株式会社 撮影装置及び光干渉撮影システム、プログラム及び撮影装置の調整方法
JP5597012B2 (ja) * 2010-03-31 2014-10-01 キヤノン株式会社 断層画像撮像装置および断層画像撮像方法
US9025158B2 (en) * 2010-06-01 2015-05-05 Intuitive Surgical Operations, Inc. Interferometric measurement with crosstalk suppression
US8761479B2 (en) * 2010-11-08 2014-06-24 General Electric Company System and method for analyzing and visualizing spectral CT data
ES2415555B2 (es) 2011-05-20 2014-07-09 Medlumics, S.L. Dispositivo de barrido para interferometría de baja coherencia.
KR101202777B1 (ko) * 2011-05-26 2012-11-19 신동준 회절격자를 이용한 디지털 이미지 검출기 및 검출방법
US9433353B2 (en) 2011-06-23 2016-09-06 Nidek Co., Ltd. Optical coherence tomography apparatus
CN104066370B (zh) * 2011-12-30 2016-10-19 视乐有限公司 用于眼科的集成装置
JP2013146447A (ja) * 2012-01-20 2013-08-01 Canon Inc 撮影装置、画像処理方法、及びプログラム
US8830475B1 (en) * 2013-08-19 2014-09-09 National Cheng Kung University Interferometer and spatial interference fourier transform spectrometer
EP3588061B1 (en) 2014-12-23 2023-04-19 Apple Inc. Optical inspection system and method including accounting for variations of optical path length within a sample
DE102015207328A1 (de) * 2015-04-22 2016-10-27 Siemens Aktiengesellschaft Verfahren zur Tiefenbestimmung
US9869541B2 (en) * 2015-07-22 2018-01-16 Medlumics S.L. High-speed optical coherence tomography using multiple interferometers with suppressed multiple scattering cross-talk
KR102615932B1 (ko) 2015-09-01 2023-12-21 애플 인크. 물질의 비접촉 감지를 위한 레퍼런스 스위치 아키텍처
EP4589271A3 (en) 2016-04-21 2025-07-30 Apple Inc. Optical system for reference switching
KR101855816B1 (ko) * 2016-05-13 2018-05-10 주식회사 고영테크놀러지 생체 조직 검사 장치 및 그 방법
CN106725285B (zh) * 2017-01-06 2019-01-11 东北大学秦皇岛分校 光学相干人眼测量装置及人眼测量方法
US10126231B2 (en) 2017-03-15 2018-11-13 Savannah River Nuclear Solutions, Llc High speed spectroscopy using temporal positioned optical fibers with an optical scanner mirror
EP3688446A2 (en) 2017-09-29 2020-08-05 Apple Inc. Resolve path optical sampling architectures
JP6908131B2 (ja) * 2017-12-25 2021-07-21 日本電気株式会社 光ビーム制御器およびこれを用いた光干渉断層撮像器
CN114545550B (zh) 2018-02-13 2024-05-28 苹果公司 具有集成边缘外耦合器的集成光子装置
KR101990251B1 (ko) * 2018-10-15 2019-06-17 경북대학교 산학협력단 광 간섭성 단층 촬영 장치 및 이를 이용한 영상 생성 방법
WO2020214438A1 (en) * 2019-04-16 2020-10-22 University Of Rochester Absolute linear-in-k spectrometer
US11852318B2 (en) 2020-09-09 2023-12-26 Apple Inc. Optical system for noise mitigation
JP7442145B2 (ja) * 2021-02-25 2024-03-04 Ckd株式会社 三次元計測装置
US12201358B2 (en) 2021-03-30 2025-01-21 Nidek Co., Ltd. OCT device
JP7707610B2 (ja) * 2021-03-30 2025-07-15 株式会社ニデック Ｏｃｔ装置
JP2023074081A (ja) * 2021-11-17 2023-05-29 株式会社トーメーコーポレーション Ｓｄ－ｏｃｔ装置
DE102022120069A1 (de) * 2022-08-09 2024-02-15 Precitec Optronik Gmbh Vorrichtung zum Messen von Abständen an mehreren Messpunkten auf einem Werkstück

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009518088A (ja) * 2005-12-06 2009-05-07 カール ツァイス メディテック アクチエンゲゼルシャフト 干渉測定法による試料測定

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2875181B2 (ja) * 1995-03-17 1999-03-24 株式会社生体光情報研究所 断層撮影装置
JP3689901B2 (ja) * 1999-05-28 2005-08-31 横河電機株式会社 バイオチップ読取装置
WO2002004929A2 (en) * 2000-07-10 2002-01-17 University Health Network Method and apparatus for high resolution coherent optical imaging
CN1268289C (zh) * 2003-11-03 2006-08-09 四川大学 光学相干断层成像系统中纵向扫描方法及其装置
JP4499476B2 (ja) * 2004-05-25 2010-07-07 オリンパス株式会社 分光画像入力装置及びそれを備えた光学装置
JP2005351839A (ja) * 2004-06-14 2005-12-22 Fujinon Corp 断層映像装置
DE102004037479A1 (de) * 2004-08-03 2006-03-16 Carl Zeiss Meditec Ag Fourier-Domain OCT Ray-Tracing am Auge
JP4883549B2 (ja) * 2004-12-09 2012-02-22 大学共同利用機関法人自然科学研究機構 分光器
EP1887946A2 (en) * 2005-06-06 2008-02-20 The Board Of Regents, The University Of Texas System Oct using spectrally resolved bandwidth

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009518088A (ja) * 2005-12-06 2009-05-07 カール ツァイス メディテック アクチエンゲゼルシャフト 干渉測定法による試料測定

Also Published As

Publication number Publication date
JP2011007775A (ja) 2011-01-13
KR20120023104A (ko) 2012-03-12
JP5645445B2 (ja) 2014-12-24
WO2010134624A1 (en) 2010-11-25
US20120062901A1 (en) 2012-03-15
US8982357B2 (en) 2015-03-17
CN102439426A (zh) 2012-05-02
EP2433116A1 (en) 2012-03-28
CN102439426B (zh) 2014-04-02

Similar Documents

Publication Publication Date Title
KR101459494B1 (ko) 광간섭 단층법을 이용하는 촬상장치 및 촬상 방법
US8794761B2 (en) Imaging apparatus and method for taking image of eyeground by optical coherence tomography
US8425036B2 (en) Optical tomographic imaging apparatus and control method for the same
CN109414163B (zh) 用于分析样本的装置及方法
US9492078B2 (en) Extended range imaging
US9820645B2 (en) Ophthalmologic apparatus
JP5610706B2 (ja) 撮像装置および撮像方法
US7940397B2 (en) Optical connector and an optical tomographic imaging system using the same
US8678588B2 (en) Optical coherence tomographic imaging apparatus
US9115972B2 (en) Optical tomographic imaging apparatus and imaging method therefor to acquire images indicating polarization information
CN201139554Y (zh) 大探测深度的频域光学相干层析成像装置
GB2407155A (en) Spectral interferometry method and apparatus
JP2009541770A (ja) 調整システムを有する光周波数領域トモグラフィ用装置、光周波数領域トモグラフィ用装置の調整システム、および光周波数領域トモグラフィ用装置を調整する方法、および物体の画像化方法
WO2011111376A1 (en) Ophthalmologic imaging apparatus
JP4461258B2 (ja) 光断層画像化法における補正方法
US8873065B2 (en) Tomographic imaging apparatus and tomographic imaging method
EP1870028A1 (en) Apparatus and method for frequency domain optical coherence tomography
EP1870030A1 (en) Apparatus and method for frequency domain optical coherence tomography
JP5726238B2 (ja) 撮像装置及び撮像方法
JP7119286B2 (ja) Ｏｃｔ装置
EP1870029A1 (en) Apparatus and method for frequency domain optical coherence tomography

Legal Events

Date Code Title Description
A201 Request for examination
AMND Amendment
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

AMND Amendment
E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E90F Notification of reason for final refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

E601 Decision to refuse application
PE0601 Decision on rejection of patent

St.27 status event code: N-2-6-B10-B15-exm-PE0601

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

AMND Amendment
E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PX0901 Re-examination

St.27 status event code: A-2-3-E10-E12-rex-PX0901

E90F Notification of reason for final refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

AMND Amendment
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PX0701 Decision of registration after re-examination

St.27 status event code: A-3-4-F10-F13-rex-PX0701

X701 Decision to grant (after re-examination)
GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U12-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

FPAY Annual fee payment

Payment date: 20171025

Year of fee payment: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20181104

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20181104