JP5645445B2 - 撮像装置及び撮像方法 - Google Patents
撮像装置及び撮像方法 Download PDFInfo
- Publication number
- JP5645445B2 JP5645445B2 JP2010082803A JP2010082803A JP5645445B2 JP 5645445 B2 JP5645445 B2 JP 5645445B2 JP 2010082803 A JP2010082803 A JP 2010082803A JP 2010082803 A JP2010082803 A JP 2010082803A JP 5645445 B2 JP5645445 B2 JP 5645445B2
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- JP
- Japan
- Prior art keywords
- light
- lights
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- sensor
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
- A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
- A61B3/12—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for looking at the eye fundus, e.g. ophthalmoscopes
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
- A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
- A61B3/102—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for optical coherence tomography [OCT]
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
- A61B5/0062—Arrangements for scanning
- A61B5/0066—Optical coherence imaging
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
- A61B5/0073—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence by tomography, i.e. reconstruction of 3D images from 2D projections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02027—Two or more interferometric channels or interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02041—Interferometers characterised by particular imaging or detection techniques
- G01B9/02044—Imaging in the frequency domain, e.g. by using a spectrometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02056—Passive reduction of errors
- G01B9/02058—Passive reduction of errors by particular optical compensation or alignment elements, e.g. dispersion compensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/35—Mechanical variable delay line
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N2021/178—Methods for obtaining spatial resolution of the property being measured
- G01N2021/1785—Three dimensional
- G01N2021/1787—Tomographic, i.e. computerised reconstruction from projective measurements
Landscapes
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Radiology & Medical Imaging (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Biophysics (AREA)
- Public Health (AREA)
- Pathology (AREA)
- Veterinary Medicine (AREA)
- Animal Behavior & Ethology (AREA)
- Surgery (AREA)
- Engineering & Computer Science (AREA)
- Biomedical Technology (AREA)
- Heart & Thoracic Surgery (AREA)
- Medical Informatics (AREA)
- Molecular Biology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Ophthalmology & Optometry (AREA)
- Dispersion Chemistry (AREA)
- Optics & Photonics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Eye Examination Apparatus (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010082803A JP5645445B2 (ja) | 2009-05-22 | 2010-03-31 | 撮像装置及び撮像方法 |
| EP10725902A EP2433116A1 (en) | 2009-05-22 | 2010-05-19 | Optical tomography device |
| CN201080022516.6A CN102439426B (zh) | 2009-05-22 | 2010-05-19 | 光学断层摄像装置 |
| PCT/JP2010/058848 WO2010134624A1 (en) | 2009-05-22 | 2010-05-19 | Optical tomography device |
| KR1020117030117A KR101459494B1 (ko) | 2009-05-22 | 2010-05-19 | 광간섭 단층법을 이용하는 촬상장치 및 촬상 방법 |
| US13/320,644 US8982357B2 (en) | 2009-05-22 | 2010-05-19 | Imaging device and imaging method |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009124274 | 2009-05-22 | ||
| JP2009124274 | 2009-05-22 | ||
| JP2010082803A JP5645445B2 (ja) | 2009-05-22 | 2010-03-31 | 撮像装置及び撮像方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011007775A JP2011007775A (ja) | 2011-01-13 |
| JP2011007775A5 JP2011007775A5 (enExample) | 2013-04-18 |
| JP5645445B2 true JP5645445B2 (ja) | 2014-12-24 |
Family
ID=42634989
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010082803A Expired - Fee Related JP5645445B2 (ja) | 2009-05-22 | 2010-03-31 | 撮像装置及び撮像方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8982357B2 (enExample) |
| EP (1) | EP2433116A1 (enExample) |
| JP (1) | JP5645445B2 (enExample) |
| KR (1) | KR101459494B1 (enExample) |
| CN (1) | CN102439426B (enExample) |
| WO (1) | WO2010134624A1 (enExample) |
Families Citing this family (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8773650B2 (en) | 2009-09-18 | 2014-07-08 | Intuitive Surgical Operations, Inc. | Optical position and/or shape sensing |
| JP5590942B2 (ja) * | 2010-03-31 | 2014-09-17 | キヤノン株式会社 | 撮影装置及び光干渉撮影システム、プログラム及び撮影装置の調整方法 |
| JP5597012B2 (ja) * | 2010-03-31 | 2014-10-01 | キヤノン株式会社 | 断層画像撮像装置および断層画像撮像方法 |
| US9025158B2 (en) * | 2010-06-01 | 2015-05-05 | Intuitive Surgical Operations, Inc. | Interferometric measurement with crosstalk suppression |
| US8761479B2 (en) * | 2010-11-08 | 2014-06-24 | General Electric Company | System and method for analyzing and visualizing spectral CT data |
| ES2415555B2 (es) | 2011-05-20 | 2014-07-09 | Medlumics, S.L. | Dispositivo de barrido para interferometría de baja coherencia. |
| KR101202777B1 (ko) * | 2011-05-26 | 2012-11-19 | 신동준 | 회절격자를 이용한 디지털 이미지 검출기 및 검출방법 |
| EP2574273B1 (en) * | 2011-06-23 | 2014-09-24 | Nidek Co., Ltd. | Optical coherence tomography apparatus |
| AU2011384708B2 (en) * | 2011-12-30 | 2015-01-22 | Alcon Inc. | An integrated device for ophthalmology |
| JP2013146447A (ja) * | 2012-01-20 | 2013-08-01 | Canon Inc | 撮影装置、画像処理方法、及びプログラム |
| US8830475B1 (en) * | 2013-08-19 | 2014-09-09 | National Cheng Kung University | Interferometer and spatial interference fourier transform spectrometer |
| EP3213053B1 (en) | 2014-12-23 | 2019-08-28 | Apple Inc. | Optical inspection system and method including accounting for variations of optical path length within a sample |
| DE102015207328A1 (de) * | 2015-04-22 | 2016-10-27 | Siemens Aktiengesellschaft | Verfahren zur Tiefenbestimmung |
| US9869541B2 (en) * | 2015-07-22 | 2018-01-16 | Medlumics S.L. | High-speed optical coherence tomography using multiple interferometers with suppressed multiple scattering cross-talk |
| KR102500358B1 (ko) | 2015-09-01 | 2023-02-16 | 애플 인크. | 물질의 비접촉 감지를 위한 레퍼런스 스위치 아키텍처 |
| US10788366B2 (en) | 2016-04-21 | 2020-09-29 | Apple Inc. | Optical system for reference switching |
| KR101855816B1 (ko) * | 2016-05-13 | 2018-05-10 | 주식회사 고영테크놀러지 | 생체 조직 검사 장치 및 그 방법 |
| CN106725285B (zh) * | 2017-01-06 | 2019-01-11 | 东北大学秦皇岛分校 | 光学相干人眼测量装置及人眼测量方法 |
| US10126231B2 (en) | 2017-03-15 | 2018-11-13 | Savannah River Nuclear Solutions, Llc | High speed spectroscopy using temporal positioned optical fibers with an optical scanner mirror |
| US11579080B2 (en) | 2017-09-29 | 2023-02-14 | Apple Inc. | Resolve path optical sampling architectures |
| EP3734252A4 (en) * | 2017-12-25 | 2021-02-24 | NEC Corporation | OPTICAL RAY CONTROL UNIT AND DEVICE FOR TOMOGRAPHIC IMAGING WITH OPTICAL INTERFERENCES, USING THEREOF |
| CN114545550B (zh) | 2018-02-13 | 2024-05-28 | 苹果公司 | 具有集成边缘外耦合器的集成光子装置 |
| KR101990251B1 (ko) * | 2018-10-15 | 2019-06-17 | 경북대학교 산학협력단 | 광 간섭성 단층 촬영 장치 및 이를 이용한 영상 생성 방법 |
| EP3948185A1 (en) * | 2019-04-16 | 2022-02-09 | University of Rochester | Absolute linear-in-k spectrometer |
| EP4176304A1 (en) | 2020-09-09 | 2023-05-10 | Apple Inc. | Optical system for noise mitigation |
| JP7442145B2 (ja) * | 2021-02-25 | 2024-03-04 | Ckd株式会社 | 三次元計測装置 |
| US12201358B2 (en) | 2021-03-30 | 2025-01-21 | Nidek Co., Ltd. | OCT device |
| JP7707610B2 (ja) * | 2021-03-30 | 2025-07-15 | 株式会社ニデック | Oct装置 |
| JP2023074081A (ja) * | 2021-11-17 | 2023-05-29 | 株式会社トーメーコーポレーション | Sd-oct装置 |
| DE102022120069A1 (de) * | 2022-08-09 | 2024-02-15 | Precitec Optronik Gmbh | Vorrichtung zum Messen von Abständen an mehreren Messpunkten auf einem Werkstück |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2875181B2 (ja) | 1995-03-17 | 1999-03-24 | 株式会社生体光情報研究所 | 断層撮影装置 |
| JP3689901B2 (ja) * | 1999-05-28 | 2005-08-31 | 横河電機株式会社 | バイオチップ読取装置 |
| WO2002004929A2 (en) * | 2000-07-10 | 2002-01-17 | University Health Network | Method and apparatus for high resolution coherent optical imaging |
| CN1268289C (zh) * | 2003-11-03 | 2006-08-09 | 四川大学 | 光学相干断层成像系统中纵向扫描方法及其装置 |
| JP4499476B2 (ja) * | 2004-05-25 | 2010-07-07 | オリンパス株式会社 | 分光画像入力装置及びそれを備えた光学装置 |
| JP2005351839A (ja) * | 2004-06-14 | 2005-12-22 | Fujinon Corp | 断層映像装置 |
| DE102004037479A1 (de) * | 2004-08-03 | 2006-03-16 | Carl Zeiss Meditec Ag | Fourier-Domain OCT Ray-Tracing am Auge |
| JP4883549B2 (ja) * | 2004-12-09 | 2012-02-22 | 大学共同利用機関法人自然科学研究機構 | 分光器 |
| WO2006133030A2 (en) * | 2005-06-06 | 2006-12-14 | Board Of Regents | Oct using spectrally resolved bandwidth |
| ATE516739T1 (de) * | 2005-12-06 | 2011-08-15 | Zeiss Carl Meditec Ag | Interferometrische probenmessung |
-
2010
- 2010-03-31 JP JP2010082803A patent/JP5645445B2/ja not_active Expired - Fee Related
- 2010-05-19 CN CN201080022516.6A patent/CN102439426B/zh not_active Expired - Fee Related
- 2010-05-19 EP EP10725902A patent/EP2433116A1/en not_active Withdrawn
- 2010-05-19 WO PCT/JP2010/058848 patent/WO2010134624A1/en not_active Ceased
- 2010-05-19 KR KR1020117030117A patent/KR101459494B1/ko not_active Expired - Fee Related
- 2010-05-19 US US13/320,644 patent/US8982357B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2011007775A (ja) | 2011-01-13 |
| CN102439426B (zh) | 2014-04-02 |
| WO2010134624A1 (en) | 2010-11-25 |
| US20120062901A1 (en) | 2012-03-15 |
| KR101459494B1 (ko) | 2014-11-07 |
| US8982357B2 (en) | 2015-03-17 |
| CN102439426A (zh) | 2012-05-02 |
| EP2433116A1 (en) | 2012-03-28 |
| KR20120023104A (ko) | 2012-03-12 |
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