KR101390130B1 - 공기 이온 측정 장치 - Google Patents

공기 이온 측정 장치 Download PDF

Info

Publication number
KR101390130B1
KR101390130B1 KR1020127029699A KR20127029699A KR101390130B1 KR 101390130 B1 KR101390130 B1 KR 101390130B1 KR 1020127029699 A KR1020127029699 A KR 1020127029699A KR 20127029699 A KR20127029699 A KR 20127029699A KR 101390130 B1 KR101390130 B1 KR 101390130B1
Authority
KR
South Korea
Prior art keywords
ion
electrode
current
air
flow rate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020127029699A
Other languages
English (en)
Korean (ko)
Other versions
KR20130008064A (ko
Inventor
요시나리 후쿠다
Original Assignee
코가네이 코포레이션
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 코가네이 코포레이션 filed Critical 코가네이 코포레이션
Publication of KR20130008064A publication Critical patent/KR20130008064A/ko
Application granted granted Critical
Publication of KR101390130B1 publication Critical patent/KR101390130B1/ko
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/60—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrostatic variables, e.g. electrographic flaw testing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05F—STATIC ELECTRICITY; NATURALLY-OCCURRING ELECTRICITY
    • H05F3/00—Carrying-off electrostatic charges
    • H05F3/04—Carrying-off electrostatic charges by means of spark gaps or other discharge devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01T—SPARK GAPS; OVERVOLTAGE ARRESTERS USING SPARK GAPS; SPARKING PLUGS; CORONA DEVICES; GENERATING IONS TO BE INTRODUCED INTO NON-ENCLOSED GASES
    • H01T19/00—Devices providing for corona discharge

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Elimination Of Static Electricity (AREA)
KR1020127029699A 2010-07-22 2011-01-27 공기 이온 측정 장치 Expired - Fee Related KR101390130B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2010-165206 2010-07-22
JP2010165206A JP5005074B2 (ja) 2010-07-22 2010-07-22 イオン量測定装置
PCT/JP2011/051609 WO2012011293A1 (ja) 2010-07-22 2011-01-27 イオン量測定装置

Publications (2)

Publication Number Publication Date
KR20130008064A KR20130008064A (ko) 2013-01-21
KR101390130B1 true KR101390130B1 (ko) 2014-04-28

Family

ID=45496724

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020127029699A Expired - Fee Related KR101390130B1 (ko) 2010-07-22 2011-01-27 공기 이온 측정 장치

Country Status (4)

Country Link
US (1) US8901506B2 (enExample)
JP (1) JP5005074B2 (enExample)
KR (1) KR101390130B1 (enExample)
WO (1) WO2012011293A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5960619B2 (ja) * 2013-01-28 2016-08-02 日本特殊陶業株式会社 外部ガス流を利用した微粒子センサ
KR101750740B1 (ko) * 2013-04-11 2017-06-27 가부시키가이샤 고가네이 이온 발생기
WO2015076155A1 (ja) * 2013-11-20 2015-05-28 株式会社コガネイ イオン発生器
KR102498445B1 (ko) 2015-10-20 2023-02-13 삼성전자주식회사 이온의 농도를 검출하는 검출기 및 이를 구비하는 이온 크로마토그래피 장치
EP3225982A1 (en) 2016-03-28 2017-10-04 Naturion Pte. Ltd. Device for measuring ion concentration
KR102382561B1 (ko) * 2020-02-21 2022-04-04 에스케이하이닉스 주식회사 이온 발생기의 모니터링 장치 및 시스템
CN113447529B (zh) * 2021-08-11 2022-05-27 漳州市东南电子技术研究所有限公司 单位时间空气负离子产生量的测试方法及装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4357143A (en) * 1979-09-14 1982-11-02 Phillips Petroleum Company Determining ion concentration
US4451736A (en) * 1982-04-16 1984-05-29 Wisconsin Alumni Research Foundation Method and apparatus for measuring air ion concentrations
JP2880427B2 (ja) * 1995-06-29 1999-04-12 株式会社テクノ菱和 空気イオン化装置及び空気イオン化方法
JPH117914A (ja) * 1997-06-18 1999-01-12 Ulvac Japan Ltd イオン照射装置
JP4412764B2 (ja) 1999-06-29 2010-02-10 フィーサ株式会社 正負イオン量測定装置
JP3466518B2 (ja) * 1999-10-20 2003-11-10 ファブソリューション株式会社 電荷測定装置
EP1197747A1 (en) * 2000-03-30 2002-04-17 Organo Corporation Ion concentration meter
JP2005166268A (ja) 2003-11-28 2005-06-23 Sunx Ltd 除電装置
EP1781481B1 (en) * 2004-08-11 2009-04-15 Koninklijke Philips Electronics N.V. Air pollution sensor system
CN101208592B (zh) 2005-06-28 2013-04-24 皇家飞利浦电子股份有限公司 超微细颗粒传感器

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Measurement of AC Ion Current from Ionizer by Using Faraday Cage, Asano et al. 2007년 IEEE 학회지(2007.9월) *

Also Published As

Publication number Publication date
WO2012011293A1 (ja) 2012-01-26
US8901506B2 (en) 2014-12-02
KR20130008064A (ko) 2013-01-21
US20130105700A1 (en) 2013-05-02
JP5005074B2 (ja) 2012-08-22
JP2012026850A (ja) 2012-02-09

Similar Documents

Publication Publication Date Title
KR101390130B1 (ko) 공기 이온 측정 장치
KR101017919B1 (ko) 제전장치
KR101167741B1 (ko) 이온 생성 방법 및 장치
US9683962B2 (en) Apparatus for monitoring particles in an aerosol
KR101085411B1 (ko) 제전 장치
US8018710B2 (en) Ionizer and static elimination method
JP5909785B2 (ja) イオン平衡測定及び調整のための遮蔽されたコンデンサ回路を有する電離平衡装置
JP6942802B2 (ja) ガスの流速を測定するための装置及び方法
US20230184615A1 (en) Device and system for a leak test of a container and method for same
JP4184213B2 (ja) イオン発生量制御方法及びイオナイザー
KR101629915B1 (ko) 챠지 플레이트 모니터링 장치
JP2008196952A (ja) コロナ放電型イオナイザの検査方法及び検査装置
JP6030926B2 (ja) 導通検査装置
KR101658676B1 (ko) 이온 생성장치
JP2006329859A (ja) イオンコントロールセンサ
CA2495319A1 (en) Apparatus for eliminating static electrical charges from a web of dielectric sheet material
JP5805026B2 (ja) イオン生成装置及びイオンバランス検知方法
JP2014017218A (ja) イオン生成装置及び異常放電検知方法
Liu et al. Variation of surface electric field intensity determined by space charge density at different temperatures
KR101967104B1 (ko) 노즐형 제전장치
Sinurat et al. Characteristic of PD Phase Patterns, PD Pulse Sequence Patterns and PD Frequency Spectrum in Air Insulation Measured by RC Detector
JP3117459U7 (enExample)
Zouzou et al. EHD flow in DBD precipitator
EP1873479B1 (en) Device for distance measurement
KR20170041214A (ko) 폐루프 피드백 및 인터리빙된 샘플링에 의한 활성 이온화 제어

Legal Events

Date Code Title Description
A201 Request for examination
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U12-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20170423

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20170423