JP5005074B2 - イオン量測定装置 - Google Patents

イオン量測定装置 Download PDF

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Publication number
JP5005074B2
JP5005074B2 JP2010165206A JP2010165206A JP5005074B2 JP 5005074 B2 JP5005074 B2 JP 5005074B2 JP 2010165206 A JP2010165206 A JP 2010165206A JP 2010165206 A JP2010165206 A JP 2010165206A JP 5005074 B2 JP5005074 B2 JP 5005074B2
Authority
JP
Japan
Prior art keywords
ion
electrode
current
ionized air
amount
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2010165206A
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English (en)
Japanese (ja)
Other versions
JP2012026850A5 (enExample
JP2012026850A (ja
Inventor
佳成 深田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koganei Corp
Original Assignee
Koganei Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koganei Corp filed Critical Koganei Corp
Priority to JP2010165206A priority Critical patent/JP5005074B2/ja
Priority to US13/809,684 priority patent/US8901506B2/en
Priority to PCT/JP2011/051609 priority patent/WO2012011293A1/ja
Priority to KR1020127029699A priority patent/KR101390130B1/ko
Publication of JP2012026850A publication Critical patent/JP2012026850A/ja
Publication of JP2012026850A5 publication Critical patent/JP2012026850A5/ja
Application granted granted Critical
Publication of JP5005074B2 publication Critical patent/JP5005074B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/60—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrostatic variables, e.g. electrographic flaw testing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05F—STATIC ELECTRICITY; NATURALLY-OCCURRING ELECTRICITY
    • H05F3/00—Carrying-off electrostatic charges
    • H05F3/04—Carrying-off electrostatic charges by means of spark gaps or other discharge devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01T—SPARK GAPS; OVERVOLTAGE ARRESTERS USING SPARK GAPS; SPARKING PLUGS; CORONA DEVICES; GENERATING IONS TO BE INTRODUCED INTO NON-ENCLOSED GASES
    • H01T19/00—Devices providing for corona discharge

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Elimination Of Static Electricity (AREA)
JP2010165206A 2010-07-22 2010-07-22 イオン量測定装置 Expired - Fee Related JP5005074B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2010165206A JP5005074B2 (ja) 2010-07-22 2010-07-22 イオン量測定装置
US13/809,684 US8901506B2 (en) 2010-07-22 2011-01-27 Air ion measuring apparatus
PCT/JP2011/051609 WO2012011293A1 (ja) 2010-07-22 2011-01-27 イオン量測定装置
KR1020127029699A KR101390130B1 (ko) 2010-07-22 2011-01-27 공기 이온 측정 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010165206A JP5005074B2 (ja) 2010-07-22 2010-07-22 イオン量測定装置

Publications (3)

Publication Number Publication Date
JP2012026850A JP2012026850A (ja) 2012-02-09
JP2012026850A5 JP2012026850A5 (enExample) 2012-05-17
JP5005074B2 true JP5005074B2 (ja) 2012-08-22

Family

ID=45496724

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010165206A Expired - Fee Related JP5005074B2 (ja) 2010-07-22 2010-07-22 イオン量測定装置

Country Status (4)

Country Link
US (1) US8901506B2 (enExample)
JP (1) JP5005074B2 (enExample)
KR (1) KR101390130B1 (enExample)
WO (1) WO2012011293A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5960619B2 (ja) * 2013-01-28 2016-08-02 日本特殊陶業株式会社 外部ガス流を利用した微粒子センサ
KR101750740B1 (ko) * 2013-04-11 2017-06-27 가부시키가이샤 고가네이 이온 발생기
WO2015076155A1 (ja) * 2013-11-20 2015-05-28 株式会社コガネイ イオン発生器
KR102498445B1 (ko) 2015-10-20 2023-02-13 삼성전자주식회사 이온의 농도를 검출하는 검출기 및 이를 구비하는 이온 크로마토그래피 장치
EP3225982A1 (en) 2016-03-28 2017-10-04 Naturion Pte. Ltd. Device for measuring ion concentration
KR102382561B1 (ko) * 2020-02-21 2022-04-04 에스케이하이닉스 주식회사 이온 발생기의 모니터링 장치 및 시스템
CN113447529B (zh) * 2021-08-11 2022-05-27 漳州市东南电子技术研究所有限公司 单位时间空气负离子产生量的测试方法及装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4357143A (en) * 1979-09-14 1982-11-02 Phillips Petroleum Company Determining ion concentration
US4451736A (en) * 1982-04-16 1984-05-29 Wisconsin Alumni Research Foundation Method and apparatus for measuring air ion concentrations
JP2880427B2 (ja) * 1995-06-29 1999-04-12 株式会社テクノ菱和 空気イオン化装置及び空気イオン化方法
JPH117914A (ja) * 1997-06-18 1999-01-12 Ulvac Japan Ltd イオン照射装置
JP4412764B2 (ja) 1999-06-29 2010-02-10 フィーサ株式会社 正負イオン量測定装置
JP3466518B2 (ja) * 1999-10-20 2003-11-10 ファブソリューション株式会社 電荷測定装置
EP1197747A1 (en) * 2000-03-30 2002-04-17 Organo Corporation Ion concentration meter
JP2005166268A (ja) 2003-11-28 2005-06-23 Sunx Ltd 除電装置
EP1781481B1 (en) * 2004-08-11 2009-04-15 Koninklijke Philips Electronics N.V. Air pollution sensor system
CN101208592B (zh) 2005-06-28 2013-04-24 皇家飞利浦电子股份有限公司 超微细颗粒传感器

Also Published As

Publication number Publication date
WO2012011293A1 (ja) 2012-01-26
US8901506B2 (en) 2014-12-02
KR20130008064A (ko) 2013-01-21
KR101390130B1 (ko) 2014-04-28
US20130105700A1 (en) 2013-05-02
JP2012026850A (ja) 2012-02-09

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