KR101169575B1 - 진직도 측정 방법 및 진직도 측정 장치 - Google Patents

진직도 측정 방법 및 진직도 측정 장치 Download PDF

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Publication number
KR101169575B1
KR101169575B1 KR1020090100033A KR20090100033A KR101169575B1 KR 101169575 B1 KR101169575 B1 KR 101169575B1 KR 1020090100033 A KR1020090100033 A KR 1020090100033A KR 20090100033 A KR20090100033 A KR 20090100033A KR 101169575 B1 KR101169575 B1 KR 101169575B1
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KR
South Korea
Prior art keywords
profile
measurement
curve
measurement object
displacement meters
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KR1020090100033A
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English (en)
Korean (ko)
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KR20100047801A (ko
Inventor
요시나가 기요타
고이치 이치하라
Original Assignee
스미도모쥬기가이고교 가부시키가이샤
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Publication of KR20100047801A publication Critical patent/KR20100047801A/ko
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Publication of KR101169575B1 publication Critical patent/KR101169575B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • G01B5/285—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces for controlling eveness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D11/00—Component parts of measuring arrangements not specially adapted for a specific variable
    • G01D11/30—Supports specially adapted for an instrument; Supports specially adapted for a set of instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N19/00—Investigating materials by mechanical methods
    • G01N19/08—Detecting presence of flaws or irregularities

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
KR1020090100033A 2008-10-29 2009-10-21 진직도 측정 방법 및 진직도 측정 장치 KR101169575B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2008277597A JP5100613B2 (ja) 2008-10-29 2008-10-29 真直度測定方法及び真直度測定装置
JPJP-P-2008-277597 2008-10-29

Publications (2)

Publication Number Publication Date
KR20100047801A KR20100047801A (ko) 2010-05-10
KR101169575B1 true KR101169575B1 (ko) 2012-07-31

Family

ID=42274724

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020090100033A KR101169575B1 (ko) 2008-10-29 2009-10-21 진직도 측정 방법 및 진직도 측정 장치

Country Status (4)

Country Link
JP (1) JP5100613B2 (zh)
KR (1) KR101169575B1 (zh)
CN (1) CN101726279B (zh)
TW (1) TWI417512B (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103267461B (zh) * 2013-06-09 2015-08-12 南京晨光集团有限责任公司 用于测量空间物体重复定位精度的方法
KR101542996B1 (ko) 2014-03-25 2015-08-07 현대자동차 주식회사 마운팅 핀 직진도 관리 시스템 및 그 제어 방법
JP6401618B2 (ja) * 2015-01-13 2018-10-10 株式会社ナガセインテグレックス 測定方法及び測定装置
JP6352833B2 (ja) * 2015-02-26 2018-07-04 住友重機械工業株式会社 形状計測装置、加工装置及び形状計測方法
JP6392395B1 (ja) * 2017-03-26 2018-09-19 株式会社アドテックエンジニアリング 平面度測定方法及びピン高さ調整方法
JP7296279B2 (ja) * 2019-08-30 2023-06-22 住友重機械工業株式会社 形状計測装置、及び検出器の校正方法
JP7296334B2 (ja) * 2020-03-26 2023-06-22 住友重機械工業株式会社 真直度計測システム、変位センサ校正方法、及び真直度計測方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002228411A (ja) 2001-02-05 2002-08-14 Hitachi Kokusai Electric Inc 二次元測定装置
JP2005024567A (ja) 2004-09-07 2005-01-27 Hitachi Kokusai Electric Inc 位置測定装置
JP2008216122A (ja) 2007-03-06 2008-09-18 Mitsutoyo Corp 表面性状測定装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61139712A (ja) * 1984-12-13 1986-06-27 Mitsubishi Heavy Ind Ltd 真直度測定方法
JPS6447905A (en) * 1987-08-19 1989-02-22 Mitsubishi Heavy Ind Ltd Method for measuring straightness
JPH01107105A (ja) * 1987-10-20 1989-04-25 Mitsubishi Heavy Ind Ltd 真直度形状測定法
JPH07103751A (ja) * 1993-10-07 1995-04-18 Kawasaki Steel Corp ロールプロフィール測定方法
JP2960013B2 (ja) * 1996-07-29 1999-10-06 慧 清野 移動物体の検出用目盛及びこれを用いた移動物体の検出装置
US5816895A (en) * 1997-01-17 1998-10-06 Tokyo Seimitsu Co., Ltd. Surface grinding method and apparatus
DE102005021345A1 (de) * 2005-05-04 2006-11-09 Schaeffler Kg Linearführungseinheit mit Längenmesssystem

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002228411A (ja) 2001-02-05 2002-08-14 Hitachi Kokusai Electric Inc 二次元測定装置
JP2005024567A (ja) 2004-09-07 2005-01-27 Hitachi Kokusai Electric Inc 位置測定装置
JP2008216122A (ja) 2007-03-06 2008-09-18 Mitsutoyo Corp 表面性状測定装置

Also Published As

Publication number Publication date
CN101726279B (zh) 2012-02-01
JP2010107263A (ja) 2010-05-13
TWI417512B (zh) 2013-12-01
CN101726279A (zh) 2010-06-09
KR20100047801A (ko) 2010-05-10
TW201017096A (en) 2010-05-01
JP5100613B2 (ja) 2012-12-19

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