KR101063537B1 - 커패시턴스 측정 회로 - Google Patents

커패시턴스 측정 회로 Download PDF

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Publication number
KR101063537B1
KR101063537B1 KR1020090014944A KR20090014944A KR101063537B1 KR 101063537 B1 KR101063537 B1 KR 101063537B1 KR 1020090014944 A KR1020090014944 A KR 1020090014944A KR 20090014944 A KR20090014944 A KR 20090014944A KR 101063537 B1 KR101063537 B1 KR 101063537B1
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KR
South Korea
Prior art keywords
signal
capacitance
delay
value
response
Prior art date
Application number
KR1020090014944A
Other languages
English (en)
Korean (ko)
Other versions
KR20090026791A (ko
Inventor
문병준
한상윤
홍재석
정덕영
Original Assignee
주식회사 애트랩
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 애트랩 filed Critical 주식회사 애트랩
Priority to KR1020090014944A priority Critical patent/KR101063537B1/ko
Publication of KR20090026791A publication Critical patent/KR20090026791A/ko
Priority to CN2012104834696A priority patent/CN103018574A/zh
Priority to TW099105196A priority patent/TWI412756B/zh
Priority to US12/710,939 priority patent/US8456434B2/en
Priority to CN2010101182297A priority patent/CN101813726B/zh
Priority to JP2010037291A priority patent/JP5165708B2/ja
Application granted granted Critical
Publication of KR101063537B1 publication Critical patent/KR101063537B1/ko
Priority to US13/752,655 priority patent/US20130134995A1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/165—Spectrum analysis; Fourier analysis using filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Electronic Switches (AREA)
KR1020090014944A 2006-06-22 2009-02-23 커패시턴스 측정 회로 KR101063537B1 (ko)

Priority Applications (7)

Application Number Priority Date Filing Date Title
KR1020090014944A KR101063537B1 (ko) 2009-02-23 2009-02-23 커패시턴스 측정 회로
CN2012104834696A CN103018574A (zh) 2009-02-23 2010-02-23 电容测量电路
TW099105196A TWI412756B (zh) 2009-02-23 2010-02-23 電容測量電路
US12/710,939 US8456434B2 (en) 2006-06-22 2010-02-23 Touch sensor and operating method thereof
CN2010101182297A CN101813726B (zh) 2009-02-23 2010-02-23 电容测量电路
JP2010037291A JP5165708B2 (ja) 2009-02-23 2010-02-23 キャパシタンス測定回路
US13/752,655 US20130134995A1 (en) 2006-06-22 2013-01-29 Touch sensor and operating method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020090014944A KR101063537B1 (ko) 2009-02-23 2009-02-23 커패시턴스 측정 회로

Related Child Applications (1)

Application Number Title Priority Date Filing Date
KR1020110007534A Division KR101114561B1 (ko) 2011-01-25 2011-01-25 커패시턴스 측정 회로

Publications (2)

Publication Number Publication Date
KR20090026791A KR20090026791A (ko) 2009-03-13
KR101063537B1 true KR101063537B1 (ko) 2011-09-07

Family

ID=40694625

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020090014944A KR101063537B1 (ko) 2006-06-22 2009-02-23 커패시턴스 측정 회로

Country Status (4)

Country Link
JP (1) JP5165708B2 (zh)
KR (1) KR101063537B1 (zh)
CN (2) CN103018574A (zh)
TW (1) TWI412756B (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101172798B1 (ko) * 2010-11-04 2012-08-10 주식회사 애트랩 커패시턴스 측정 회로 및 커패시턴스 측정 방법
US9323385B2 (en) * 2011-04-05 2016-04-26 Parade Technologies, Ltd. Noise detection for a capacitance sensing panel
CN103424616B (zh) * 2013-08-22 2015-10-07 宁波三星智能电气有限公司 模拟电容滤波脉冲采集方法
US10042483B2 (en) * 2014-04-18 2018-08-07 Atmel Corporation Touch system with code hopping algorithms and code division multiplexing
US10204737B2 (en) 2014-06-11 2019-02-12 Avx Corporation Low noise capacitors
US10408870B2 (en) * 2016-06-28 2019-09-10 Himax Technologies Limited Capacitor sensor apparatus and sensing method thereof
CN106932650A (zh) * 2017-03-03 2017-07-07 广东合微集成电路技术有限公司 一种传感器电容值检测方法
CN110764394A (zh) * 2018-07-25 2020-02-07 苏州超锐微电子有限公司 一种应用于spad探测器的时间数字转换电路
US11281314B2 (en) * 2019-12-02 2022-03-22 Semiconductor Components Industries, Llc Methods and apparatus for variable capacitance detection

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100802656B1 (ko) 2006-06-22 2008-02-14 주식회사 애트랩 접촉 감지 센서 및 이의 동작 방법

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5585733A (en) * 1992-09-10 1996-12-17 David Sarnoff Research Center Capacitive sensor and method of measuring changes in capacitance
JP2618822B2 (ja) * 1994-02-10 1997-06-11 裕利 土屋 静電容量センサ
US7075316B2 (en) * 2003-10-02 2006-07-11 Alps Electric Co., Ltd. Capacitance detector circuit, capacitance detection method, and fingerprint sensor using the same
KR100642497B1 (ko) * 2004-06-03 2006-11-02 주식회사 애트랩 전기적 접촉센서
WO2006132960A1 (en) * 2005-06-03 2006-12-14 Synaptics Incorporated Methods and systems for detecting a capacitance using sigma-delta measurement techniques
KR100683249B1 (ko) * 2005-06-16 2007-02-15 주식회사 애트랩 접촉센서 및 이의 신호 발생 방법
JP4824768B2 (ja) * 2005-11-28 2011-11-30 エーティーラブ・インコーポレーテッド 時間−デジタル変換回路及びそれを用いる圧力感知装置
KR100725894B1 (ko) * 2005-11-28 2007-06-08 주식회사 애트랩 압력센서 및 압력 측정 방법
CN101315398B (zh) * 2007-05-28 2011-03-23 承永资讯科技股份有限公司 电容值测量装置及方法
TWM343798U (en) * 2008-06-25 2008-11-01 Princeton Technology Corp Circuit testing apparatus
CN101359011B (zh) * 2008-09-22 2011-04-13 天津菲特测控仪器有限公司 测量微量电容变化的电路

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100802656B1 (ko) 2006-06-22 2008-02-14 주식회사 애트랩 접촉 감지 센서 및 이의 동작 방법

Also Published As

Publication number Publication date
JP5165708B2 (ja) 2013-03-21
JP2010197390A (ja) 2010-09-09
TWI412756B (zh) 2013-10-21
TW201031932A (en) 2010-09-01
KR20090026791A (ko) 2009-03-13
CN103018574A (zh) 2013-04-03
CN101813726B (zh) 2013-03-20
CN101813726A (zh) 2010-08-25

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