KR100905977B1 - 광전자 적용 기판 제조방법 - Google Patents

광전자 적용 기판 제조방법 Download PDF

Info

Publication number
KR100905977B1
KR100905977B1 KR1020077014329A KR20077014329A KR100905977B1 KR 100905977 B1 KR100905977 B1 KR 100905977B1 KR 1020077014329 A KR1020077014329 A KR 1020077014329A KR 20077014329 A KR20077014329 A KR 20077014329A KR 100905977 B1 KR100905977 B1 KR 100905977B1
Authority
KR
South Korea
Prior art keywords
substrate
layer
semi
auxiliary
carrier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
KR1020077014329A
Other languages
English (en)
Korean (ko)
Other versions
KR20070089821A (ko
Inventor
파브리스 레터트르
브루스 포레
Original Assignee
에스. 오. 이. 떼끄 씰리꽁 오 냉쉴라또흐 떼끄놀로지
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 에스. 오. 이. 떼끄 씰리꽁 오 냉쉴라또흐 떼끄놀로지 filed Critical 에스. 오. 이. 떼끄 씰리꽁 오 냉쉴라또흐 떼끄놀로지
Publication of KR20070089821A publication Critical patent/KR20070089821A/ko
Application granted granted Critical
Publication of KR100905977B1 publication Critical patent/KR100905977B1/ko
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/139Manufacture or treatment of devices covered by this subclass using temporary substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/19Preparing inhomogeneous wafers
    • H10P90/1904Preparing vertically inhomogeneous wafers
    • H10P90/1906Preparing SOI wafers
    • H10P90/1914Preparing SOI wafers using bonding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/19Preparing inhomogeneous wafers
    • H10P90/1904Preparing vertically inhomogeneous wafers
    • H10P90/1906Preparing SOI wafers
    • H10P90/1914Preparing SOI wafers using bonding
    • H10P90/1916Preparing SOI wafers using bonding with separation or delamination along an ion implanted layer, e.g. Smart-cut
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W10/00Isolation regions in semiconductor bodies between components of integrated devices
    • H10W10/10Isolation regions comprising dielectric materials
    • H10W10/181Semiconductor-on-insulator [SOI] isolation regions, e.g. buried oxide regions of SOI wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • H10H20/011Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/018Bonding of wafers
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Landscapes

  • Led Devices (AREA)
  • Semiconductor Lasers (AREA)
  • Recrystallisation Techniques (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
KR1020077014329A 2005-01-13 2006-01-12 광전자 적용 기판 제조방법 Expired - Lifetime KR100905977B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP05290082.6 2005-01-13
EP05290082A EP1681712A1 (en) 2005-01-13 2005-01-13 Method of producing substrates for optoelectronic applications

Publications (2)

Publication Number Publication Date
KR20070089821A KR20070089821A (ko) 2007-09-03
KR100905977B1 true KR100905977B1 (ko) 2009-07-06

Family

ID=34941890

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020077014329A Expired - Lifetime KR100905977B1 (ko) 2005-01-13 2006-01-12 광전자 적용 기판 제조방법

Country Status (6)

Country Link
US (3) US7537949B2 (https=)
EP (1) EP1681712A1 (https=)
JP (1) JP5312797B2 (https=)
KR (1) KR100905977B1 (https=)
CN (1) CN100580880C (https=)
WO (1) WO2006074933A1 (https=)

Families Citing this family (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10374120B2 (en) * 2005-02-18 2019-08-06 Koninklijke Philips N.V. High efficiency solar cells utilizing wafer bonding and layer transfer to integrate non-lattice matched materials
TW200707799A (en) * 2005-04-21 2007-02-16 Aonex Technologies Inc Bonded intermediate substrate and method of making same
TWI267946B (en) * 2005-08-22 2006-12-01 Univ Nat Chiao Tung Interconnection of group III-V semiconductor device and fabrication method for making the same
CN100474642C (zh) * 2005-10-27 2009-04-01 晶能光电(江西)有限公司 含有金属铬基板的铟镓铝氮半导体发光元件及其制造方法
US20070243703A1 (en) * 2006-04-14 2007-10-18 Aonex Technololgies, Inc. Processes and structures for epitaxial growth on laminate substrates
FR2914494A1 (fr) * 2007-03-28 2008-10-03 Soitec Silicon On Insulator Procede de report d'une couche mince de materiau
US7732301B1 (en) 2007-04-20 2010-06-08 Pinnington Thomas Henry Bonded intermediate substrate and method of making same
US20080303033A1 (en) * 2007-06-05 2008-12-11 Cree, Inc. Formation of nitride-based optoelectronic and electronic device structures on lattice-matched substrates
EP2171748A1 (en) * 2007-07-26 2010-04-07 S.O.I.Tec Silicon on Insulator Technologies Epitaxial methods and templates grown by the methods
US20090278233A1 (en) * 2007-07-26 2009-11-12 Pinnington Thomas Henry Bonded intermediate substrate and method of making same
WO2009015337A1 (en) * 2007-07-26 2009-01-29 S.O.I.Tec Silicon On Insulator Technologies Methods for producing improved epitaxial materials
EP2105972A3 (en) * 2008-03-28 2015-06-10 Semiconductor Energy Laboratory Co, Ltd. Photoelectric conversion device and method for manufacturing the same
US7781780B2 (en) * 2008-03-31 2010-08-24 Bridgelux, Inc. Light emitting diodes with smooth surface for reflective electrode
US20100295088A1 (en) * 2008-10-02 2010-11-25 Soraa, Inc. Textured-surface light emitting diode and method of manufacture
FR2936903B1 (fr) * 2008-10-07 2011-01-14 Soitec Silicon On Insulator Relaxation d'une couche de materiau contraint avec application d'un raidisseur
KR101408475B1 (ko) 2008-10-30 2014-06-19 소이텍 감소된 격자 변형을 갖는 반도체 재료층들, 반도체 구조들, 디바이스들 및 이를 포함하는 가공된 기판을 형성하는 방법들
US8637383B2 (en) 2010-12-23 2014-01-28 Soitec Strain relaxation using metal materials and related structures
US8247886B1 (en) 2009-03-09 2012-08-21 Soraa, Inc. Polarization direction of optical devices using selected spatial configurations
US8791499B1 (en) 2009-05-27 2014-07-29 Soraa, Inc. GaN containing optical devices and method with ESD stability
US8409366B2 (en) * 2009-06-23 2013-04-02 Oki Data Corporation Separation method of nitride semiconductor layer, semiconductor device, manufacturing method thereof, semiconductor wafer, and manufacturing method thereof
US9000466B1 (en) 2010-08-23 2015-04-07 Soraa, Inc. Methods and devices for light extraction from a group III-nitride volumetric LED using surface and sidewall roughening
US9583678B2 (en) 2009-09-18 2017-02-28 Soraa, Inc. High-performance LED fabrication
US9293644B2 (en) 2009-09-18 2016-03-22 Soraa, Inc. Power light emitting diode and method with uniform current density operation
CN107256915A (zh) 2009-09-18 2017-10-17 天空公司 发光二极管器件
US8933644B2 (en) 2009-09-18 2015-01-13 Soraa, Inc. LED lamps with improved quality of light
US8648387B2 (en) * 2009-12-30 2014-02-11 Industrial Technology Research Institute Nitride semiconductor template and method of manufacturing the same
US8905588B2 (en) 2010-02-03 2014-12-09 Sorra, Inc. System and method for providing color light sources in proximity to predetermined wavelength conversion structures
US10147850B1 (en) 2010-02-03 2018-12-04 Soraa, Inc. System and method for providing color light sources in proximity to predetermined wavelength conversion structures
US8740413B1 (en) 2010-02-03 2014-06-03 Soraa, Inc. System and method for providing color light sources in proximity to predetermined wavelength conversion structures
US9450143B2 (en) 2010-06-18 2016-09-20 Soraa, Inc. Gallium and nitrogen containing triangular or diamond-shaped configuration for optical devices
US8786053B2 (en) 2011-01-24 2014-07-22 Soraa, Inc. Gallium-nitride-on-handle substrate materials and devices and method of manufacture
FR2977069B1 (fr) 2011-06-23 2014-02-07 Soitec Silicon On Insulator Procede de fabrication d'une structure semi-conductrice mettant en oeuvre un collage temporaire
US8686431B2 (en) 2011-08-22 2014-04-01 Soraa, Inc. Gallium and nitrogen containing trilateral configuration for optical devices
KR101254716B1 (ko) * 2011-11-07 2013-04-15 삼성코닝정밀소재 주식회사 패턴을 갖는 전이기판 제조방법
US8912025B2 (en) 2011-11-23 2014-12-16 Soraa, Inc. Method for manufacture of bright GaN LEDs using a selective removal process
JP5879964B2 (ja) * 2011-11-25 2016-03-08 住友電気工業株式会社 複合基板の製造方法および半導体デバイスの製造方法
EP2823515A4 (en) 2012-03-06 2015-08-19 Soraa Inc LIGHT-EMITTING DIODES WITH MATERIAL LAYERS WITH LOW BREAKING INDEX TO REDUCE LIGHT PIPE EFFECTS
JP2013247362A (ja) * 2012-05-29 2013-12-09 Samsung Corning Precision Materials Co Ltd 半導体素子用薄膜貼り合わせ基板の製造方法
US8971368B1 (en) 2012-08-16 2015-03-03 Soraa Laser Diode, Inc. Laser devices having a gallium and nitrogen containing semipolar surface orientation
US9978904B2 (en) 2012-10-16 2018-05-22 Soraa, Inc. Indium gallium nitride light emitting devices
US8802471B1 (en) 2012-12-21 2014-08-12 Soraa, Inc. Contacts for an n-type gallium and nitrogen substrate for optical devices
US11721547B2 (en) * 2013-03-14 2023-08-08 Infineon Technologies Ag Method for manufacturing a silicon carbide substrate for an electrical silicon carbide device, a silicon carbide substrate and an electrical silicon carbide device
US8994033B2 (en) 2013-07-09 2015-03-31 Soraa, Inc. Contacts for an n-type gallium and nitrogen substrate for optical devices
US9548247B2 (en) * 2013-07-22 2017-01-17 Infineon Technologies Austria Ag Methods for producing semiconductor devices
US9419189B1 (en) 2013-11-04 2016-08-16 Soraa, Inc. Small LED source with high brightness and high efficiency
WO2016075927A1 (ja) * 2014-11-11 2016-05-19 出光興産株式会社 新規な積層体

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20000057891A (ko) * 1999-02-05 2000-09-25 마리 오 휴버 발광 소자 제조 장치 및 방법

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2540791B2 (ja) * 1991-11-08 1996-10-09 日亜化学工業株式会社 p型窒化ガリウム系化合物半導体の製造方法。
JP3325713B2 (ja) * 1994-08-22 2002-09-17 ローム株式会社 半導体発光素子の製法
JP4024994B2 (ja) * 2000-06-30 2007-12-19 株式会社東芝 半導体発光素子
FR2816445B1 (fr) * 2000-11-06 2003-07-25 Commissariat Energie Atomique Procede de fabrication d'une structure empilee comprenant une couche mince adherant a un substrat cible
FR2840731B3 (fr) * 2002-06-11 2004-07-30 Soitec Silicon On Insulator Procede de fabrication d'un substrat comportant une couche utile en materiau semi-conducteur monocristallin de proprietes ameliorees
FR2817394B1 (fr) * 2000-11-27 2003-10-31 Soitec Silicon On Insulator Procede de fabrication d'un substrat notamment pour l'optique, l'electronique ou l'optoelectronique et substrat obtenu par ce procede
JP2002284600A (ja) 2001-03-26 2002-10-03 Hitachi Cable Ltd 窒化ガリウム結晶基板の製造方法及び窒化ガリウム結晶基板
JP3886341B2 (ja) * 2001-05-21 2007-02-28 日本電気株式会社 窒化ガリウム結晶基板の製造方法及び窒化ガリウム結晶基板
US6936357B2 (en) * 2001-07-06 2005-08-30 Technologies And Devices International, Inc. Bulk GaN and ALGaN single crystals
US7052974B2 (en) * 2001-12-04 2006-05-30 Shin-Etsu Handotai Co., Ltd. Bonded wafer and method of producing bonded wafer
FR2834123B1 (fr) * 2001-12-21 2005-02-04 Soitec Silicon On Insulator Procede de report de couches minces semi-conductrices et procede d'obtention d'une plaquette donneuse pour un tel procede de report
FR2835095B1 (fr) 2002-01-22 2005-03-18 Procede de preparation d'ensembles a semi-conducteurs separables, notamment pour former des substrats pour l'electronique, l'optoelectrique et l'optique
TW577178B (en) 2002-03-04 2004-02-21 United Epitaxy Co Ltd High efficient reflective metal layer of light emitting diode
US6791120B2 (en) 2002-03-26 2004-09-14 Sanyo Electric Co., Ltd. Nitride-based semiconductor device and method of fabricating the same
US20030189215A1 (en) * 2002-04-09 2003-10-09 Jong-Lam Lee Method of fabricating vertical structure leds
KR20110042249A (ko) * 2003-06-04 2011-04-25 유명철 수직 구조 화합물 반도체 디바이스의 제조 방법
TWI240434B (en) 2003-06-24 2005-09-21 Osram Opto Semiconductors Gmbh Method to produce semiconductor-chips
JP4232605B2 (ja) * 2003-10-30 2009-03-04 住友電気工業株式会社 窒化物半導体基板の製造方法と窒化物半導体基板
US7118813B2 (en) * 2003-11-14 2006-10-10 Cree, Inc. Vicinal gallium nitride substrate for high quality homoepitaxy
US7148124B1 (en) * 2004-11-18 2006-12-12 Alexander Yuri Usenko Method for forming a fragile layer inside of a single crystalline substrate preferably for making silicon-on-insulator wafers
US20060124956A1 (en) * 2004-12-13 2006-06-15 Hui Peng Quasi group III-nitride substrates and methods of mass production of the same

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20000057891A (ko) * 1999-02-05 2000-09-25 마리 오 휴버 발광 소자 제조 장치 및 방법

Also Published As

Publication number Publication date
US20060166390A1 (en) 2006-07-27
US20110237008A1 (en) 2011-09-29
JP5312797B2 (ja) 2013-10-09
CN101091234A (zh) 2007-12-19
JP2008527731A (ja) 2008-07-24
US7537949B2 (en) 2009-05-26
EP1681712A1 (en) 2006-07-19
US8541290B2 (en) 2013-09-24
KR20070089821A (ko) 2007-09-03
US20090200569A1 (en) 2009-08-13
WO2006074933A1 (en) 2006-07-20
CN100580880C (zh) 2010-01-13

Similar Documents

Publication Publication Date Title
KR100905977B1 (ko) 광전자 적용 기판 제조방법
CN102656712B (zh) 用于固态照明装置的氮化镓晶片衬底以及相关联系统及方法
JP5441297B2 (ja) Iii−v族発光デバイス
KR100773997B1 (ko) 질화 갈륨계 디바이스 및 그 제조 방법
TWI240434B (en) Method to produce semiconductor-chips
TWI532209B (zh) 一種用於形成一埋入式金屬層結構的方法
US8502264B2 (en) Composite substrate, and method for the production of a composite substrate
JP2006521984A (ja) Iii族の窒化物装置を製作する方法およびそのように製作された装置
CN101656286B (zh) 发光二极管与其制造方法
CN1471733A (zh) GaN基的半导体元件的制造方法
JPH10321911A (ja) 単結晶シリコン上に化合物半導体のエピタキシヤル層を製造する方法及びそれにより製造された発光ダイオード
US9331236B2 (en) Engineered substrates having epitaxial formation structures with enhanced shear strength and associated systems and methods
SG178573A1 (en) Solid state lighting devices with selected thermal expansion and/or surface characteristics, and associated methods
KR20090100230A (ko) 샌드위치 구조의 웨이퍼 결합 및 포톤 빔을 이용한 단결정 반도체 박막 전이
CN102714256A (zh) 具有用于补偿基底热膨胀的层的半导体发光器件
US7446346B2 (en) Semiconductor substrate for optoelectronic components and method for fabricating it
KR101231118B1 (ko) 반도체 발광소자용 지지기판 및 상기 지지기판을 이용한고성능 수직구조의 반도체 발광소자
KR20070100852A (ko) 호모에피택셜 기판 및 발광 다층구조체 성장용 템플렛을 이용한 그룹 3족 질화물계 반도체 수직구조의 발광소자 제작
KR100858362B1 (ko) 수직구조 발광다이오드 소자의 제조방법
US8658446B2 (en) Method for fabricating semiconductor substrate for optoelectronic components
Faure Review of compound materials bonding and layer transfer for optoelectronic applications

Legal Events

Date Code Title Description
A201 Request for examination
PA0105 International application

Patent event date: 20070622

Patent event code: PA01051R01D

Comment text: International Patent Application

PA0201 Request for examination
PG1501 Laying open of application
E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 20080529

Patent event code: PE09021S01D

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 20081125

Patent event code: PE09021S01D

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

Patent event code: PE07011S01D

Comment text: Decision to Grant Registration

Patent event date: 20090525

GRNT Written decision to grant
PR0701 Registration of establishment

Comment text: Registration of Establishment

Patent event date: 20090626

Patent event code: PR07011E01D

PR1002 Payment of registration fee

Payment date: 20090629

End annual number: 3

Start annual number: 1

PG1601 Publication of registration
PR1001 Payment of annual fee

Payment date: 20120601

Start annual number: 4

End annual number: 4

FPAY Annual fee payment

Payment date: 20130603

Year of fee payment: 5

PR1001 Payment of annual fee

Payment date: 20130603

Start annual number: 5

End annual number: 5

FPAY Annual fee payment

Payment date: 20140623

Year of fee payment: 6

PR1001 Payment of annual fee

Payment date: 20140623

Start annual number: 6

End annual number: 6

FPAY Annual fee payment

Payment date: 20150611

Year of fee payment: 7

PR1001 Payment of annual fee

Payment date: 20150611

Start annual number: 7

End annual number: 7

FPAY Annual fee payment

Payment date: 20180601

Year of fee payment: 10

PR1001 Payment of annual fee

Payment date: 20180601

Start annual number: 10

End annual number: 10

PR1001 Payment of annual fee

Payment date: 20210526

Start annual number: 13

End annual number: 13

PR1001 Payment of annual fee

Payment date: 20230524

Start annual number: 15

End annual number: 15

PR1001 Payment of annual fee

Payment date: 20250522

Start annual number: 17

End annual number: 17