KR100803565B1 - 액정 표시 장치용 어레이 기판 - Google Patents
액정 표시 장치용 어레이 기판 Download PDFInfo
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- KR100803565B1 KR100803565B1 KR1020010049109A KR20010049109A KR100803565B1 KR 100803565 B1 KR100803565 B1 KR 100803565B1 KR 1020010049109 A KR1020010049109 A KR 1020010049109A KR 20010049109 A KR20010049109 A KR 20010049109A KR 100803565 B1 KR100803565 B1 KR 100803565B1
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- 239000000758 substrate Substances 0.000 title claims abstract description 37
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 23
- 239000010949 copper Substances 0.000 claims abstract description 27
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 26
- 229910052802 copper Inorganic materials 0.000 claims abstract description 26
- 239000011229 interlayer Substances 0.000 claims abstract description 25
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims abstract description 22
- 229910052796 boron Inorganic materials 0.000 claims abstract description 17
- 238000000034 method Methods 0.000 claims abstract description 14
- -1 boron ions Chemical class 0.000 claims abstract description 13
- 239000000463 material Substances 0.000 claims abstract description 13
- 239000010410 layer Substances 0.000 claims description 57
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 9
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 9
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 9
- 238000002161 passivation Methods 0.000 claims description 8
- 239000010936 titanium Substances 0.000 claims description 7
- 229910052719 titanium Inorganic materials 0.000 claims description 7
- WTEOIRVLGSZEPR-UHFFFAOYSA-N boron trifluoride Chemical compound FB(F)F WTEOIRVLGSZEPR-UHFFFAOYSA-N 0.000 claims description 6
- 239000011241 protective layer Substances 0.000 claims description 4
- 229910015900 BF3 Inorganic materials 0.000 claims description 3
- 239000010408 film Substances 0.000 abstract description 31
- 238000005530 etching Methods 0.000 abstract description 10
- 239000010409 thin film Substances 0.000 abstract description 10
- 229910052782 aluminium Inorganic materials 0.000 abstract description 9
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract description 9
- 230000003647 oxidation Effects 0.000 abstract description 7
- 238000007254 oxidation reaction Methods 0.000 abstract description 7
- 230000007547 defect Effects 0.000 abstract description 6
- 229910000838 Al alloy Inorganic materials 0.000 abstract description 5
- 230000008021 deposition Effects 0.000 abstract description 5
- 239000000956 alloy Substances 0.000 abstract description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 10
- 239000004020 conductor Substances 0.000 description 8
- 238000000151 deposition Methods 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 7
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 4
- 238000002425 crystallisation Methods 0.000 description 4
- 230000008025 crystallization Effects 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 230000005669 field effect Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- 239000012670 alkaline solution Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- ZOCHARZZJNPSEU-UHFFFAOYSA-N diboron Chemical compound B#B ZOCHARZZJNPSEU-UHFFFAOYSA-N 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 238000005224 laser annealing Methods 0.000 description 1
- 238000004518 low pressure chemical vapour deposition Methods 0.000 description 1
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000007790 solid phase Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
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Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136286—Wiring, e.g. gate line, drain line
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1343—Electrodes
- G02F1/134309—Electrodes characterised by their geometrical arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78651—Silicon transistors
- H01L29/7866—Non-monocrystalline silicon transistors
- H01L29/78672—Polycrystalline or microcrystalline silicon transistor
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Power Engineering (AREA)
- Optics & Photonics (AREA)
- Ceramic Engineering (AREA)
- Geometry (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Liquid Crystal (AREA)
- Thin Film Transistor (AREA)
Abstract
Description
또한, 상기 붕소이온의 소스물질은 삼플루오르화붕소(BF3) 또는 디보란(diborane : B2H6) 중의 어느 하나일 수 있다.
Claims (5)
- 기판과;상기 기판 상부에 형성된 버퍼층과;상기 버퍼층 상부에 다결정 실리콘으로 이루어진 액티브층과;상기 액티브층의 양측에 위치하며 붕소이온이 도핑된 다결정 실리콘으로 이루어진 소스 및 드레인 영역과;상기 액티브층 상부에 형성되고 산화실리콘으로 이루어지는 게이트 절연막과;상기 게이트 절연막 상부에 형성되고, 티타늄으로 이루어지는 제 1층과 붕소이온이 도핑된 구리로 이루어며 상기 제 1층 상부에 형성되는 제 2층을 포함하는 게이트 전극과;상기 게이트 전극을 덮고 있으며, 상기 소스 및 드레인 영역을 각각 드러내는 제 1 및 제 2 콘택홀을 가지는 층간 절연막과;상기 층간 절연막 상부에 상기 제 1 콘택홀을 통해 상기 소스 영역과 접촉하는 소스 전극과;상기 제 2 콘택홀을 통해 상기 드레인 영역과 접촉하는 드레인 전극과;상기 소스 전극 및 상기 드레인 전극을 덮고 있으며, 상기 드레인 전극 상부에 제 3 콘택홀을 가지는 보호층;상기 보호층 상부에 형성되고, 상기 제 3 콘택홀을 통해 상기 드레인 전극과 연결되어 있는 화소 전극을 포함하는 액정 표시 장치용 어레이 기판.
- 제 1 항에 있어서,상기 게이트 전극은 1,800 Å 내지 2,000 Å 의 두께를 가지는 액정 표시 장치용 어레이 기판.
- 제 2 항에 있어서,상기 층간 절연막은 3,000 Å 내지 4,000 Å의 두께를 가지는 액정 표시 장치용 어레이 기판.
- 제 3 항에 있어서,상기 게이트 전극의 제 1층은 10 Å 내지 60 Å 두께를 갖는 것이 특징인 액정 표시 장치용 어레이 기판.
- 제 1 항에 있어서,상기 붕소이온의 소스물질은 삼플루오르화붕소(BF3) 또는 디보란(diborane : B2H6) 중의 어느 하나인 액정 표시 장치용 어레이 기판.
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KR1020010049109A KR100803565B1 (ko) | 2001-08-14 | 2001-08-14 | 액정 표시 장치용 어레이 기판 |
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KR1020010049109A KR100803565B1 (ko) | 2001-08-14 | 2001-08-14 | 액정 표시 장치용 어레이 기판 |
Publications (2)
Publication Number | Publication Date |
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KR20030015063A KR20030015063A (ko) | 2003-02-20 |
KR100803565B1 true KR100803565B1 (ko) | 2008-02-15 |
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KR1020010049109A KR100803565B1 (ko) | 2001-08-14 | 2001-08-14 | 액정 표시 장치용 어레이 기판 |
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Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR102002765B1 (ko) | 2012-11-13 | 2019-07-24 | 삼성디스플레이 주식회사 | 유기발광 표시장치 및 그것의 제조 방법 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19990030139A (ko) * | 1997-09-25 | 1999-04-26 | 니시무로 타이죠 | 박막트랜지스터 및 그 제조방법 |
KR19990054584A (ko) * | 1997-12-26 | 1999-07-15 | 구자홍 | 다결정실리콘 박막트랜지스터 및 그 제조방법 |
KR20000058064A (ko) * | 1999-02-25 | 2000-09-25 | 이데이 노부유끼 | 반도체 장치 및 그 제조 방법 |
JP2000315791A (ja) * | 1999-05-06 | 2000-11-14 | Nec Corp | 半導体装置およびその製造方法 |
JP2001196591A (ja) * | 2000-01-13 | 2001-07-19 | Internatl Business Mach Corp <Ibm> | 薄膜トランジスタ、および薄膜トランジスタの製造方法 |
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2001
- 2001-08-14 KR KR1020010049109A patent/KR100803565B1/ko active IP Right Grant
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19990030139A (ko) * | 1997-09-25 | 1999-04-26 | 니시무로 타이죠 | 박막트랜지스터 및 그 제조방법 |
KR19990054584A (ko) * | 1997-12-26 | 1999-07-15 | 구자홍 | 다결정실리콘 박막트랜지스터 및 그 제조방법 |
KR20000058064A (ko) * | 1999-02-25 | 2000-09-25 | 이데이 노부유끼 | 반도체 장치 및 그 제조 방법 |
JP2000315791A (ja) * | 1999-05-06 | 2000-11-14 | Nec Corp | 半導体装置およびその製造方法 |
JP2001196591A (ja) * | 2000-01-13 | 2001-07-19 | Internatl Business Mach Corp <Ibm> | 薄膜トランジスタ、および薄膜トランジスタの製造方法 |
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KR20030015063A (ko) | 2003-02-20 |
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