KR100786620B1 - 기판 검사 장치 - Google Patents
기판 검사 장치 Download PDFInfo
- Publication number
- KR100786620B1 KR100786620B1 KR1020060041924A KR20060041924A KR100786620B1 KR 100786620 B1 KR100786620 B1 KR 100786620B1 KR 1020060041924 A KR1020060041924 A KR 1020060041924A KR 20060041924 A KR20060041924 A KR 20060041924A KR 100786620 B1 KR100786620 B1 KR 100786620B1
- Authority
- KR
- South Korea
- Prior art keywords
- illumination light
- substrate
- stage
- scattering plate
- fixing
- Prior art date
Links
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G51/00—Conveying articles through pipes or tubes by fluid flow or pressure; Conveying articles over a flat surface, e.g. the base of a trough, by jets located in the surface
- B65G51/02—Directly conveying the articles, e.g. slips, sheets, stockings, containers or workpieces, by flowing gases
- B65G51/03—Directly conveying the articles, e.g. slips, sheets, stockings, containers or workpieces, by flowing gases over a flat surface or in troughs
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Nonlinear Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Fluid Mechanics (AREA)
- Mechanical Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005139515 | 2005-05-12 | ||
JPJP-P-2005-00139515 | 2005-05-12 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20060117220A KR20060117220A (ko) | 2006-11-16 |
KR100786620B1 true KR100786620B1 (ko) | 2007-12-21 |
Family
ID=37389784
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020060041924A KR100786620B1 (ko) | 2005-05-12 | 2006-05-10 | 기판 검사 장치 |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR100786620B1 (zh) |
CN (1) | CN100428001C (zh) |
TW (1) | TWI307929B (zh) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100912401B1 (ko) * | 2008-01-29 | 2009-08-14 | 주식회사 쓰리비 시스템 | 광학필름 검사장치 |
JP5559644B2 (ja) * | 2010-09-03 | 2014-07-23 | 株式会社トプコン | 検査装置 |
JP2012073036A (ja) * | 2010-09-27 | 2012-04-12 | Hitachi High-Technologies Corp | ガラス基板欠陥検査装置及びガラス基板欠陥検査方法 |
CN102759531A (zh) * | 2012-07-25 | 2012-10-31 | 深圳市华星光电技术有限公司 | 自动光学检测装置 |
JP6199585B2 (ja) * | 2013-03-21 | 2017-09-20 | 住友化学株式会社 | レーザー光照射装置及び光学部材貼合体の製造装置 |
KR102606278B1 (ko) * | 2016-03-25 | 2023-11-27 | 삼성디스플레이 주식회사 | 표시 장치의 제조장치 |
CN107489688A (zh) * | 2016-06-13 | 2017-12-19 | 睿励科学仪器(上海)有限公司 | 具有水平调整功能的吸盘装置以及安装方法 |
KR20190036007A (ko) * | 2017-09-26 | 2019-04-04 | 삼성전자주식회사 | 그립 장치 및 이를 포함하는 기판 검사 시스템 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000111483A (ja) * | 1998-10-02 | 2000-04-21 | Dainippon Printing Co Ltd | 周期性パターンの検査方法及び装置 |
KR20020038488A (ko) * | 2000-11-17 | 2002-05-23 | 바스러 아게 | 디스플레이의 제조작업시 평면유리를 위한 검사시스템 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000193604A (ja) * | 1998-12-25 | 2000-07-14 | Takano Co Ltd | 基板用自動検査装置 |
JP2002181714A (ja) * | 2000-12-19 | 2002-06-26 | Ishikawajima Harima Heavy Ind Co Ltd | 薄板検査装置 |
JP4276867B2 (ja) * | 2003-03-18 | 2009-06-10 | オリンパス株式会社 | 基板ホルダ及びこれを備えた表面検査装置 |
JP4310622B2 (ja) * | 2003-04-11 | 2009-08-12 | 株式会社日立ハイテクノロジーズ | 基板の表面検査方法及び検査装置 |
KR100506702B1 (ko) * | 2003-05-06 | 2005-08-09 | 주식회사 디이엔티 | 기판 검사장치 |
JP4426276B2 (ja) * | 2003-10-06 | 2010-03-03 | 住友重機械工業株式会社 | 搬送装置、塗布システム、及び検査システム |
-
2006
- 2006-05-05 TW TW095116045A patent/TWI307929B/zh not_active IP Right Cessation
- 2006-05-10 CN CNB2006100801819A patent/CN100428001C/zh not_active Expired - Fee Related
- 2006-05-10 KR KR1020060041924A patent/KR100786620B1/ko not_active IP Right Cessation
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000111483A (ja) * | 1998-10-02 | 2000-04-21 | Dainippon Printing Co Ltd | 周期性パターンの検査方法及び装置 |
KR20020038488A (ko) * | 2000-11-17 | 2002-05-23 | 바스러 아게 | 디스플레이의 제조작업시 평면유리를 위한 검사시스템 |
Also Published As
Publication number | Publication date |
---|---|
TW200644143A (en) | 2006-12-16 |
CN100428001C (zh) | 2008-10-22 |
TWI307929B (en) | 2009-03-21 |
CN1862319A (zh) | 2006-11-15 |
KR20060117220A (ko) | 2006-11-16 |
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