KR100674551B1 - 도금 장치 및 반도체 장치의 제조 방법 - Google Patents
도금 장치 및 반도체 장치의 제조 방법 Download PDFInfo
- Publication number
- KR100674551B1 KR100674551B1 KR1020020001330A KR20020001330A KR100674551B1 KR 100674551 B1 KR100674551 B1 KR 100674551B1 KR 1020020001330 A KR1020020001330 A KR 1020020001330A KR 20020001330 A KR20020001330 A KR 20020001330A KR 100674551 B1 KR100674551 B1 KR 100674551B1
- Authority
- KR
- South Korea
- Prior art keywords
- plating
- plating liquid
- semiconductor substrate
- substrate
- bath
- Prior art date
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/08—Electroplating with moving electrolyte e.g. jet electroplating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
- H01L21/2885—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001062920A JP3364485B2 (ja) | 2001-03-07 | 2001-03-07 | めっき装置、及び半導体装置の製造方法 |
JPJP-P-2001-00062920 | 2001-03-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20020071720A KR20020071720A (ko) | 2002-09-13 |
KR100674551B1 true KR100674551B1 (ko) | 2007-01-26 |
Family
ID=18921990
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020020001330A KR100674551B1 (ko) | 2001-03-07 | 2002-01-10 | 도금 장치 및 반도체 장치의 제조 방법 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP3364485B2 (ja) |
KR (1) | KR100674551B1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4330380B2 (ja) * | 2003-05-29 | 2009-09-16 | 株式会社荏原製作所 | めっき装置及びめっき方法 |
KR101494175B1 (ko) | 2013-05-22 | 2015-02-17 | (주)포인텍 | 도금조의 노즐 요동장치 |
JP7073332B2 (ja) * | 2016-07-20 | 2022-05-23 | テクニク,インク. | 半導体ウェハ上の均一な厚さの金属層の電着 |
JP6995544B2 (ja) * | 2017-09-20 | 2022-01-14 | 上村工業株式会社 | 表面処理装置および表面処理方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0474886A (ja) * | 1990-07-17 | 1992-03-10 | Canon Inc | メッキ法及びそれに用いるノズル |
JPH05243235A (ja) * | 1992-03-02 | 1993-09-21 | Fujitsu Ltd | 半導体装置の製造装置 |
JPH06224202A (ja) * | 1993-01-22 | 1994-08-12 | Oki Electric Ind Co Ltd | 半導体ウエハのバンプ電極めっき装置 |
US5402563A (en) * | 1992-08-28 | 1995-04-04 | Hitachi, Ltd. | Apparatus for removing electronic device from printed circuit board |
-
2001
- 2001-03-07 JP JP2001062920A patent/JP3364485B2/ja not_active Expired - Fee Related
-
2002
- 2002-01-10 KR KR1020020001330A patent/KR100674551B1/ko not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0474886A (ja) * | 1990-07-17 | 1992-03-10 | Canon Inc | メッキ法及びそれに用いるノズル |
JPH05243235A (ja) * | 1992-03-02 | 1993-09-21 | Fujitsu Ltd | 半導体装置の製造装置 |
US5402563A (en) * | 1992-08-28 | 1995-04-04 | Hitachi, Ltd. | Apparatus for removing electronic device from printed circuit board |
JPH06224202A (ja) * | 1993-01-22 | 1994-08-12 | Oki Electric Ind Co Ltd | 半導体ウエハのバンプ電極めっき装置 |
Also Published As
Publication number | Publication date |
---|---|
JP3364485B2 (ja) | 2003-01-08 |
KR20020071720A (ko) | 2002-09-13 |
JP2002266098A (ja) | 2002-09-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US9512538B2 (en) | Plating cup with contoured cup bottom | |
US20050247567A1 (en) | Method of plating | |
JP2006519932A (ja) | めっき装置 | |
KR20010098418A (ko) | 원하지 않는 전기도금 증착물의 제거 방법 및 장치 | |
US20030192782A1 (en) | Cathode cartridge for electroplating tester | |
JP2004149895A (ja) | メッキ装置およびメッキ方法 | |
KR100674551B1 (ko) | 도금 장치 및 반도체 장치의 제조 방법 | |
US11469134B2 (en) | Plating chuck | |
JP3886919B2 (ja) | めっき装置 | |
US20020000383A1 (en) | Electroplating cell based upon rotational plating solution flow | |
JP5822212B2 (ja) | 電解メッキ装置 | |
CN110541161B (zh) | 半导体装置的制造装置及半导体装置的制造方法 | |
JP4245713B2 (ja) | めっき装置、めっきシステム及びこれを用いためっき処理方法 | |
TW202016364A (zh) | 鍍覆裝置及鍍覆方法 | |
TWI389318B (zh) | 在使用於液晶顯示器的玻璃基板上製作導電性特徵部的方法與設備 | |
KR20040007399A (ko) | 반도체 제조를 위한 원격 2차 양극을 갖는 도금 시스템 | |
US20060163058A1 (en) | Apparatus for plating a semiconductor wafer and plating solution bath used therein | |
JP2002294495A (ja) | 液処理装置 | |
KR100850158B1 (ko) | 도금 장치 및 반도체 장치의 제조 방법 | |
US20190338438A1 (en) | Plating apparatus | |
JP3223020B2 (ja) | 洗浄/エッチング装置およびその方法 | |
JPS61270889A (ja) | めつき装置 | |
JP7111386B2 (ja) | 無電解めっき装置 | |
JP2019085606A (ja) | めっき装置及びめっき方法 | |
WO2021177035A1 (ja) | めっき処理装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
N231 | Notification of change of applicant | ||
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20130111 Year of fee payment: 7 |
|
FPAY | Annual fee payment |
Payment date: 20140107 Year of fee payment: 8 |
|
FPAY | Annual fee payment |
Payment date: 20150105 Year of fee payment: 9 |
|
FPAY | Annual fee payment |
Payment date: 20151217 Year of fee payment: 10 |
|
LAPS | Lapse due to unpaid annual fee |