KR100584186B1 - 에디 전류 프로브 - Google Patents

에디 전류 프로브 Download PDF

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Publication number
KR100584186B1
KR100584186B1 KR1020000044559A KR20000044559A KR100584186B1 KR 100584186 B1 KR100584186 B1 KR 100584186B1 KR 1020000044559 A KR1020000044559 A KR 1020000044559A KR 20000044559 A KR20000044559 A KR 20000044559A KR 100584186 B1 KR100584186 B1 KR 100584186B1
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KR
South Korea
Prior art keywords
eddy current
probe
coil
current probe
nose
Prior art date
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Expired - Fee Related
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KR1020000044559A
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English (en)
Korean (ko)
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KR20010071111A (ko
Inventor
비틀존루이디거메이더
리마틴킨-페이
Original Assignee
제너럴 일렉트릭 캄파니
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Publication of KR20010071111A publication Critical patent/KR20010071111A/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
KR1020000044559A 1999-12-22 2000-08-01 에디 전류 프로브 Expired - Fee Related KR100584186B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/468,845 US6288537B1 (en) 1999-12-22 1999-12-22 Eddy current probe with foil sensor mounted on flexible probe tip and method of use
US09/468,845 1999-12-22

Publications (2)

Publication Number Publication Date
KR20010071111A KR20010071111A (ko) 2001-07-28
KR100584186B1 true KR100584186B1 (ko) 2006-05-29

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020000044559A Expired - Fee Related KR100584186B1 (ko) 1999-12-22 2000-08-01 에디 전류 프로브

Country Status (7)

Country Link
US (1) US6288537B1 (enExample)
EP (1) EP1111379B1 (enExample)
JP (1) JP4646091B2 (enExample)
KR (1) KR100584186B1 (enExample)
AT (1) ATE330219T1 (enExample)
CZ (1) CZ20002684A3 (enExample)
DE (1) DE60028712T2 (enExample)

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US20040257072A1 (en) * 2003-06-19 2004-12-23 Rock Samson Dual-sensitivity eddy current test probe
WO2005028253A2 (en) * 2003-09-19 2005-03-31 Automotive Systems Laboratory, Inc. Magnetic crash sensing method
US7772839B2 (en) * 2003-09-19 2010-08-10 Tk Holdings, Inc. Eddy current magnetic crash sensor
US7839143B2 (en) * 2003-09-19 2010-11-23 Tk Holdings Inc. Eddy current magnetic crash sensor
US7839142B2 (en) * 2003-09-19 2010-11-23 Tk Holdings, Inc. Magnetic crash sensor
US8013599B2 (en) * 2004-11-19 2011-09-06 General Electric Company Methods and apparatus for testing a component
US7154265B2 (en) * 2004-12-21 2006-12-26 General Electric Company Eddy current probe and inspection method
WO2007016300A2 (en) 2005-07-29 2007-02-08 Automotive Systems Laboratory, Inc. Magnetic crash sensor
DE102005054593B4 (de) * 2005-11-14 2018-04-26 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Messonde zur Messung der Dicke dünner Schichten
US8395378B2 (en) 2010-04-29 2013-03-12 General Electric Company Nondestructive robotic inspection method and system therefor
US9646599B2 (en) * 2013-10-24 2017-05-09 Spirit Aerosystems, Inc. Remoldable contour sensor holder
JP6621581B2 (ja) * 2015-01-30 2019-12-18 新川センサテクノロジ株式会社 渦電流形変位センサ
DE102016205495B4 (de) * 2016-04-04 2022-06-09 Volkswagen Aktiengesellschaft Messvorrichtung und Verfahren zur Schichtdickenbestimmung sowie zugehöriger Referenzkörper und Kalibrierkörper
CN111246797B (zh) * 2017-10-24 2025-09-09 德克斯康公司 预连接分析物传感器
CN109342554A (zh) * 2018-11-20 2019-02-15 中国航发贵州黎阳航空动力有限公司 发动机异型薄壁空心零部件壁厚涡流判定方法
CN109540210A (zh) * 2018-11-28 2019-03-29 张春严 一种物理测量电气仪表
JP7441467B2 (ja) * 2020-04-10 2024-03-01 日立Ｇｅニュークリア・エナジー株式会社 渦電流探傷プローブ
CN112345632A (zh) * 2020-11-20 2021-02-09 西安热工研究院有限公司 重型燃机带涂层透平叶片基体裂纹涡流检测探头及制作方法
CN112345633A (zh) * 2020-11-20 2021-02-09 西安热工研究院有限公司 一种重型燃机透平叶片TBCs层间裂纹涡流检测系统及方法
EP4012399A1 (en) * 2020-12-10 2022-06-15 Introsys Integration for Robotics Systems, Integração de Sistemas Robóticos, S.A. A probe and a system for the non-destructive inspection of a welding
DE102021211836A1 (de) 2021-09-30 2023-03-30 Robert Bosch Gesellschaft mit beschränkter Haftung Messeinrichtung

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US5463201A (en) * 1993-02-04 1995-10-31 Generla Electric Company Seam-tracking apparatus for a welding system employing an array of eddy current elements
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010005167A3 (ko) * 2008-07-10 2010-03-04 (주)노바마그네틱스 비파괴 센서용 단일 박막의 제조방법

Also Published As

Publication number Publication date
KR20010071111A (ko) 2001-07-28
EP1111379A1 (en) 2001-06-27
DE60028712D1 (de) 2006-07-27
EP1111379B1 (en) 2006-06-14
US6288537B1 (en) 2001-09-11
CZ20002684A3 (cs) 2001-08-15
JP4646091B2 (ja) 2011-03-09
ATE330219T1 (de) 2006-07-15
JP2001183348A (ja) 2001-07-06
DE60028712T2 (de) 2007-03-29

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