KR100584186B1 - 에디 전류 프로브 - Google Patents

에디 전류 프로브 Download PDF

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Publication number
KR100584186B1
KR100584186B1 KR1020000044559A KR20000044559A KR100584186B1 KR 100584186 B1 KR100584186 B1 KR 100584186B1 KR 1020000044559 A KR1020000044559 A KR 1020000044559A KR 20000044559 A KR20000044559 A KR 20000044559A KR 100584186 B1 KR100584186 B1 KR 100584186B1
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KR
South Korea
Prior art keywords
eddy current
coil
probe
current probe
nose
Prior art date
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Expired - Fee Related
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KR1020000044559A
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English (en)
Korean (ko)
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KR20010071111A (ko
Inventor
비틀존루이디거메이더
리마틴킨-페이
Original Assignee
제너럴 일렉트릭 캄파니
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Publication of KR20010071111A publication Critical patent/KR20010071111A/ko
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
KR1020000044559A 1999-12-22 2000-08-01 에디 전류 프로브 Expired - Fee Related KR100584186B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/468,845 US6288537B1 (en) 1999-12-22 1999-12-22 Eddy current probe with foil sensor mounted on flexible probe tip and method of use
US09/468,845 1999-12-22

Publications (2)

Publication Number Publication Date
KR20010071111A KR20010071111A (ko) 2001-07-28
KR100584186B1 true KR100584186B1 (ko) 2006-05-29

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020000044559A Expired - Fee Related KR100584186B1 (ko) 1999-12-22 2000-08-01 에디 전류 프로브

Country Status (7)

Country Link
US (1) US6288537B1 (enExample)
EP (1) EP1111379B1 (enExample)
JP (1) JP4646091B2 (enExample)
KR (1) KR100584186B1 (enExample)
AT (1) ATE330219T1 (enExample)
CZ (1) CZ20002684A3 (enExample)
DE (1) DE60028712T2 (enExample)

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JP2007510134A (ja) * 2003-09-19 2007-04-19 オートモーティブ システムズ ラボラトリー インコーポレーテッド 磁気衝突検知方法
WO2005028254A2 (en) * 2003-09-19 2005-03-31 Automotive Systems Laboratory, Inc. Magnetic crash sensor
US7772839B2 (en) * 2003-09-19 2010-08-10 Tk Holdings, Inc. Eddy current magnetic crash sensor
US7839143B2 (en) * 2003-09-19 2010-11-23 Tk Holdings Inc. Eddy current magnetic crash sensor
US7839142B2 (en) * 2003-09-19 2010-11-23 Tk Holdings, Inc. Magnetic crash sensor
CN101035699A (zh) * 2003-12-21 2007-09-12 汽车系统实验室公司 磁传感器
US8013599B2 (en) * 2004-11-19 2011-09-06 General Electric Company Methods and apparatus for testing a component
US7154265B2 (en) * 2004-12-21 2006-12-26 General Electric Company Eddy current probe and inspection method
EP1915585A2 (en) 2005-07-29 2008-04-30 Automotive Systems Laboratory Inc. Magnetic crash sensor
DE102005054593B4 (de) * 2005-11-14 2018-04-26 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Messonde zur Messung der Dicke dünner Schichten
US8395378B2 (en) * 2010-04-29 2013-03-12 General Electric Company Nondestructive robotic inspection method and system therefor
US9646599B2 (en) * 2013-10-24 2017-05-09 Spirit Aerosystems, Inc. Remoldable contour sensor holder
JP6621581B2 (ja) * 2015-01-30 2019-12-18 新川センサテクノロジ株式会社 渦電流形変位センサ
DE102016205495B4 (de) * 2016-04-04 2022-06-09 Volkswagen Aktiengesellschaft Messvorrichtung und Verfahren zur Schichtdickenbestimmung sowie zugehöriger Referenzkörper und Kalibrierkörper
DK3700416T3 (da) * 2017-10-24 2024-09-30 Dexcom Inc På forhånd forbundne analytsensorer
CN109342554A (zh) * 2018-11-20 2019-02-15 中国航发贵州黎阳航空动力有限公司 发动机异型薄壁空心零部件壁厚涡流判定方法
CN109540210A (zh) * 2018-11-28 2019-03-29 张春严 一种物理测量电气仪表
JP7441467B2 (ja) * 2020-04-10 2024-03-01 日立Ｇｅニュークリア・エナジー株式会社 渦電流探傷プローブ
CN112345633A (zh) * 2020-11-20 2021-02-09 西安热工研究院有限公司 一种重型燃机透平叶片TBCs层间裂纹涡流检测系统及方法
CN112345632A (zh) * 2020-11-20 2021-02-09 西安热工研究院有限公司 重型燃机带涂层透平叶片基体裂纹涡流检测探头及制作方法
EP4012399A1 (en) * 2020-12-10 2022-06-15 Introsys Integration for Robotics Systems, Integração de Sistemas Robóticos, S.A. A probe and a system for the non-destructive inspection of a welding
DE102021211836A1 (de) 2021-09-30 2023-03-30 Robert Bosch Gesellschaft mit beschränkter Haftung Messeinrichtung

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US5463201A (en) * 1993-02-04 1995-10-31 Generla Electric Company Seam-tracking apparatus for a welding system employing an array of eddy current elements
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010005167A3 (ko) * 2008-07-10 2010-03-04 (주)노바마그네틱스 비파괴 센서용 단일 박막의 제조방법

Also Published As

Publication number Publication date
DE60028712D1 (de) 2006-07-27
KR20010071111A (ko) 2001-07-28
JP2001183348A (ja) 2001-07-06
ATE330219T1 (de) 2006-07-15
US6288537B1 (en) 2001-09-11
DE60028712T2 (de) 2007-03-29
CZ20002684A3 (cs) 2001-08-15
EP1111379B1 (en) 2006-06-14
EP1111379A1 (en) 2001-06-27
JP4646091B2 (ja) 2011-03-09

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