CZ20002684A3 - Sonda vířivého proudu s fóliovým snímačem, uspořádaným na špičce ohebné sondy, a způsob měření vířivého proudu - Google Patents

Sonda vířivého proudu s fóliovým snímačem, uspořádaným na špičce ohebné sondy, a způsob měření vířivého proudu Download PDF

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Publication number
CZ20002684A3
CZ20002684A3 CZ20002684A CZ20002684A CZ20002684A3 CZ 20002684 A3 CZ20002684 A3 CZ 20002684A3 CZ 20002684 A CZ20002684 A CZ 20002684A CZ 20002684 A CZ20002684 A CZ 20002684A CZ 20002684 A3 CZ20002684 A3 CZ 20002684A3
Authority
CZ
Czechia
Prior art keywords
probe
eddy current
coil
eddy
tip
Prior art date
Application number
CZ20002684A
Other languages
Czech (cs)
English (en)
Inventor
John Ruediger Mader Viertl
Martin Ken-Fei Lee
Original Assignee
General Electric Company
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Company filed Critical General Electric Company
Publication of CZ20002684A3 publication Critical patent/CZ20002684A3/cs

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
CZ20002684A 1999-12-22 2000-07-21 Sonda vířivého proudu s fóliovým snímačem, uspořádaným na špičce ohebné sondy, a způsob měření vířivého proudu CZ20002684A3 (cs)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/468,845 US6288537B1 (en) 1999-12-22 1999-12-22 Eddy current probe with foil sensor mounted on flexible probe tip and method of use

Publications (1)

Publication Number Publication Date
CZ20002684A3 true CZ20002684A3 (cs) 2001-08-15

Family

ID=23861478

Family Applications (1)

Application Number Title Priority Date Filing Date
CZ20002684A CZ20002684A3 (cs) 1999-12-22 2000-07-21 Sonda vířivého proudu s fóliovým snímačem, uspořádaným na špičce ohebné sondy, a způsob měření vířivého proudu

Country Status (7)

Country Link
US (1) US6288537B1 (enExample)
EP (1) EP1111379B1 (enExample)
JP (1) JP4646091B2 (enExample)
KR (1) KR100584186B1 (enExample)
AT (1) ATE330219T1 (enExample)
CZ (1) CZ20002684A3 (enExample)
DE (1) DE60028712T2 (enExample)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7514917B2 (en) * 2003-09-19 2009-04-07 Automotive Systems Laboratory, Inc. Magnetic crash sensor
US20080109177A1 (en) * 2003-09-19 2008-05-08 Cech Leonard S Magnetic crash sensor
US7209844B2 (en) * 2003-09-19 2007-04-24 Automotive Systems Laboratory, Inc. Magnetic crash sensor
US8180585B2 (en) * 1999-08-26 2012-05-15 Tk Holdings, Inc. Magnetic crash sensor
US7212895B2 (en) * 2003-12-21 2007-05-01 Automotive Systems Laboratory, Inc. Magnetic sensor
US6573706B2 (en) * 1999-11-18 2003-06-03 Intellijoint Systems Ltd. Method and apparatus for distance based detection of wear and the like in joints
US6894492B1 (en) * 2001-12-07 2005-05-17 General Electric Company Self-aligning probe and its use
US7259552B2 (en) * 2002-05-31 2007-08-21 Siemens Power Generation, Inc. Wear monitor for turbo-machine
GB2397652B (en) * 2002-11-15 2005-12-21 Immobilienges Helmut Fischer Measurement probe for measurement of the thickness of thin layers
US20040257072A1 (en) * 2003-06-19 2004-12-23 Rock Samson Dual-sensitivity eddy current test probe
WO2005028253A2 (en) * 2003-09-19 2005-03-31 Automotive Systems Laboratory, Inc. Magnetic crash sensing method
US7772839B2 (en) * 2003-09-19 2010-08-10 Tk Holdings, Inc. Eddy current magnetic crash sensor
US7839143B2 (en) * 2003-09-19 2010-11-23 Tk Holdings Inc. Eddy current magnetic crash sensor
US7839142B2 (en) * 2003-09-19 2010-11-23 Tk Holdings, Inc. Magnetic crash sensor
US8013599B2 (en) * 2004-11-19 2011-09-06 General Electric Company Methods and apparatus for testing a component
US7154265B2 (en) * 2004-12-21 2006-12-26 General Electric Company Eddy current probe and inspection method
WO2007016300A2 (en) 2005-07-29 2007-02-08 Automotive Systems Laboratory, Inc. Magnetic crash sensor
DE102005054593B4 (de) * 2005-11-14 2018-04-26 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Messonde zur Messung der Dicke dünner Schichten
KR20100006607A (ko) * 2008-07-10 2010-01-21 (주)노바마그네틱스 비파괴 센서용 단일 박막의 제조방법
US8395378B2 (en) 2010-04-29 2013-03-12 General Electric Company Nondestructive robotic inspection method and system therefor
US9646599B2 (en) * 2013-10-24 2017-05-09 Spirit Aerosystems, Inc. Remoldable contour sensor holder
JP6621581B2 (ja) * 2015-01-30 2019-12-18 新川センサテクノロジ株式会社 渦電流形変位センサ
DE102016205495B4 (de) * 2016-04-04 2022-06-09 Volkswagen Aktiengesellschaft Messvorrichtung und Verfahren zur Schichtdickenbestimmung sowie zugehöriger Referenzkörper und Kalibrierkörper
CN111246797B (zh) * 2017-10-24 2025-09-09 德克斯康公司 预连接分析物传感器
CN109342554A (zh) * 2018-11-20 2019-02-15 中国航发贵州黎阳航空动力有限公司 发动机异型薄壁空心零部件壁厚涡流判定方法
CN109540210A (zh) * 2018-11-28 2019-03-29 张春严 一种物理测量电气仪表
JP7441467B2 (ja) * 2020-04-10 2024-03-01 日立Ｇｅニュークリア・エナジー株式会社 渦電流探傷プローブ
CN112345632A (zh) * 2020-11-20 2021-02-09 西安热工研究院有限公司 重型燃机带涂层透平叶片基体裂纹涡流检测探头及制作方法
CN112345633A (zh) * 2020-11-20 2021-02-09 西安热工研究院有限公司 一种重型燃机透平叶片TBCs层间裂纹涡流检测系统及方法
EP4012399A1 (en) * 2020-12-10 2022-06-15 Introsys Integration for Robotics Systems, Integração de Sistemas Robóticos, S.A. A probe and a system for the non-destructive inspection of a welding
DE102021211836A1 (de) 2021-09-30 2023-03-30 Robert Bosch Gesellschaft mit beschränkter Haftung Messeinrichtung

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3475681A (en) 1965-08-02 1969-10-28 Magnaflux Corp Apparatus display system for providing plural indications and threshold indications
US3737764A (en) 1971-09-27 1973-06-05 Commissariat Energie Atomique Eddy-current test apparatus for detection of flaws in a metal seal placed within an electrically conductive tube
US3826132A (en) 1973-06-01 1974-07-30 Bethlehem Steel Corp Device for producing a visual display of the transverse tension profile of a moving steel strip
US4194149A (en) 1977-12-15 1980-03-18 The Babcock & Wilcox Company Method for generating the eddy current signature of a flaw in a tube proximate a contiguous member which obscures the flaw signal
US4268791A (en) 1978-12-08 1981-05-19 The United States Of America As Represented By The Secretary Of The Air Force Dual trace automatic eddy current detection system for multilayer structures
SU903759A1 (ru) * 1980-05-21 1982-02-07 Кубанский Ордена Трудового Красного Знамени Сельскохозяйственный Институт Матрица токовихревых накладных преобразователей
US4480225A (en) * 1982-02-11 1984-10-30 The United States Of America As Represented By The United States Department Of Energy Improved multi-directional eddy current inspection test apparatus for detecting flaws in metal articles
US4593245A (en) * 1983-12-12 1986-06-03 General Electric Company Eddy current method for detecting a flaw in semi-conductive material
US4706020A (en) * 1983-12-12 1987-11-10 General Electric Company High frequency eddy current probe with planar, spiral-like coil on flexible substrate for detecting flaws in semi-conductive material
US4700134A (en) * 1985-01-10 1987-10-13 Anco Engineers, Inc. Method and apparatus for determining the amount of magnetic debris adhering to the exterior of a tube
US4797613A (en) * 1985-01-22 1989-01-10 Combustion Engineering, Inc. Expandable eddy current probe for inspecting the interior of tubular conduits
EP0228177A3 (en) * 1985-11-19 1988-11-02 Electric Power Research Institute, Inc Flexible eddy-current coil and coil array for nondestructive testing
US5241280A (en) * 1990-06-05 1993-08-31 Defelsko Corporation Coating thickness measurement gauge
US5389876A (en) * 1991-05-06 1995-02-14 General Electric Company Flexible eddy current surface measurement array for detecting near surface flaws in a conductive part
JP3091009B2 (ja) * 1992-03-03 2000-09-25 有限会社清田製作所 位置検出プローブ
US5463201A (en) * 1993-02-04 1995-10-31 Generla Electric Company Seam-tracking apparatus for a welding system employing an array of eddy current elements
US5341678A (en) 1993-05-12 1994-08-30 General Electric Company Method for determining thickness of ferromagnetic material deposition on nuclear fuel rods
JPH08304252A (ja) * 1995-04-28 1996-11-22 Olympus Optical Co Ltd 硬さ測定装置
JPH08320221A (ja) * 1995-05-25 1996-12-03 Mitsui Eng & Shipbuild Co Ltd 検査装置
US5793206A (en) * 1995-08-25 1998-08-11 Jentek Sensors, Inc. Meandering winding test circuit
US5841277A (en) * 1996-07-30 1998-11-24 General Electric Company Hand-holdable probe having a flexible eddy current sensor
US5801532A (en) 1996-07-30 1998-09-01 General Electric Company Hand-holdable eddy-current probe
US5903147A (en) 1997-03-18 1999-05-11 General Electric Company Eddy current array inspection device for shaped holes
US5915277A (en) 1997-06-23 1999-06-22 General Electric Co. Probe and method for inspecting an object
EP1029237A1 (de) * 1997-11-04 2000-08-23 Siemens Aktiengesellschaft Tastkopf zur wirbelstromprüfung, verfahren zur herstellung eines tastkopfes für eine wirbelstromprüfung und wirbelstromprüfverfahren
JPH11183441A (ja) * 1997-12-18 1999-07-09 Tokyo Gas Co Ltd 回転型渦流探傷装置
JPH11309123A (ja) * 1998-04-30 1999-11-09 Omron Corp 生体脂肪測定器

Also Published As

Publication number Publication date
KR20010071111A (ko) 2001-07-28
EP1111379A1 (en) 2001-06-27
DE60028712D1 (de) 2006-07-27
EP1111379B1 (en) 2006-06-14
KR100584186B1 (ko) 2006-05-29
US6288537B1 (en) 2001-09-11
JP4646091B2 (ja) 2011-03-09
ATE330219T1 (de) 2006-07-15
JP2001183348A (ja) 2001-07-06
DE60028712T2 (de) 2007-03-29

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