CZ20002684A3 - Sonda vířivého proudu s fóliovým snímačem, uspořádaným na špičce ohebné sondy, a způsob měření vířivého proudu - Google Patents
Sonda vířivého proudu s fóliovým snímačem, uspořádaným na špičce ohebné sondy, a způsob měření vířivého proudu Download PDFInfo
- Publication number
- CZ20002684A3 CZ20002684A3 CZ20002684A CZ20002684A CZ20002684A3 CZ 20002684 A3 CZ20002684 A3 CZ 20002684A3 CZ 20002684 A CZ20002684 A CZ 20002684A CZ 20002684 A CZ20002684 A CZ 20002684A CZ 20002684 A3 CZ20002684 A3 CZ 20002684A3
- Authority
- CZ
- Czechia
- Prior art keywords
- probe
- eddy current
- coil
- eddy
- currents
- Prior art date
Links
- 239000000523 sample Substances 0.000 title claims abstract description 124
- 238000000034 method Methods 0.000 title claims description 6
- 239000011888 foil Substances 0.000 title abstract description 32
- 230000006698 induction Effects 0.000 claims description 26
- 238000000576 coating method Methods 0.000 claims description 18
- 239000011248 coating agent Substances 0.000 claims description 17
- 239000000463 material Substances 0.000 claims description 9
- 238000012545 processing Methods 0.000 claims description 9
- 238000012360 testing method Methods 0.000 claims description 9
- 230000008878 coupling Effects 0.000 claims description 6
- 238000010168 coupling process Methods 0.000 claims description 6
- 238000005859 coupling reaction Methods 0.000 claims description 6
- 229920002379 silicone rubber Polymers 0.000 claims description 4
- 239000004945 silicone rubber Substances 0.000 claims description 4
- 238000000691 measurement method Methods 0.000 claims description 2
- 239000002184 metal Substances 0.000 abstract description 9
- 229910052751 metal Inorganic materials 0.000 abstract description 9
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 abstract description 4
- 229910052802 copper Inorganic materials 0.000 abstract description 4
- 239000010949 copper Substances 0.000 abstract description 4
- 230000005672 electromagnetic field Effects 0.000 abstract description 3
- 230000005284 excitation Effects 0.000 description 10
- 239000004065 semiconductor Substances 0.000 description 10
- 238000005259 measurement Methods 0.000 description 8
- 239000000853 adhesive Substances 0.000 description 6
- 230000001070 adhesive effect Effects 0.000 description 6
- 229920003223 poly(pyromellitimide-1,4-diphenyl ether) Polymers 0.000 description 4
- IHIDFKLAWYPTKB-UHFFFAOYSA-N 1,3-dichloro-2-(4-chlorophenyl)benzene Chemical compound C1=CC(Cl)=CC=C1C1=C(Cl)C=CC=C1Cl IHIDFKLAWYPTKB-UHFFFAOYSA-N 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 230000004907 flux Effects 0.000 description 3
- 230000001939 inductive effect Effects 0.000 description 3
- 230000001419 dependent effect Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 210000003811 finger Anatomy 0.000 description 2
- 210000003813 thumb Anatomy 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- 229920002449 FKM Polymers 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 239000002173 cutting fluid Substances 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/468,845 US6288537B1 (en) | 1999-12-22 | 1999-12-22 | Eddy current probe with foil sensor mounted on flexible probe tip and method of use |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CZ20002684A3 true CZ20002684A3 (cs) | 2001-08-15 |
Family
ID=23861478
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CZ20002684A CZ20002684A3 (cs) | 1999-12-22 | 2000-07-21 | Sonda vířivého proudu s fóliovým snímačem, uspořádaným na špičce ohebné sondy, a způsob měření vířivého proudu |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6288537B1 (enExample) |
| EP (1) | EP1111379B1 (enExample) |
| JP (1) | JP4646091B2 (enExample) |
| KR (1) | KR100584186B1 (enExample) |
| AT (1) | ATE330219T1 (enExample) |
| CZ (1) | CZ20002684A3 (enExample) |
| DE (1) | DE60028712T2 (enExample) |
Families Citing this family (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7209844B2 (en) * | 2003-09-19 | 2007-04-24 | Automotive Systems Laboratory, Inc. | Magnetic crash sensor |
| US7514917B2 (en) * | 2003-09-19 | 2009-04-07 | Automotive Systems Laboratory, Inc. | Magnetic crash sensor |
| US20080109177A1 (en) * | 2003-09-19 | 2008-05-08 | Cech Leonard S | Magnetic crash sensor |
| US8180585B2 (en) * | 1999-08-26 | 2012-05-15 | Tk Holdings, Inc. | Magnetic crash sensor |
| US6573706B2 (en) * | 1999-11-18 | 2003-06-03 | Intellijoint Systems Ltd. | Method and apparatus for distance based detection of wear and the like in joints |
| US6894492B1 (en) * | 2001-12-07 | 2005-05-17 | General Electric Company | Self-aligning probe and its use |
| US7259552B2 (en) * | 2002-05-31 | 2007-08-21 | Siemens Power Generation, Inc. | Wear monitor for turbo-machine |
| GB2397652B (en) * | 2002-11-15 | 2005-12-21 | Immobilienges Helmut Fischer | Measurement probe for measurement of the thickness of thin layers |
| US20040257072A1 (en) * | 2003-06-19 | 2004-12-23 | Rock Samson | Dual-sensitivity eddy current test probe |
| US7839143B2 (en) * | 2003-09-19 | 2010-11-23 | Tk Holdings Inc. | Eddy current magnetic crash sensor |
| US7772839B2 (en) * | 2003-09-19 | 2010-08-10 | Tk Holdings, Inc. | Eddy current magnetic crash sensor |
| WO2005028253A2 (en) * | 2003-09-19 | 2005-03-31 | Automotive Systems Laboratory, Inc. | Magnetic crash sensing method |
| US7839142B2 (en) * | 2003-09-19 | 2010-11-23 | Tk Holdings, Inc. | Magnetic crash sensor |
| CN101035699A (zh) * | 2003-12-21 | 2007-09-12 | 汽车系统实验室公司 | 磁传感器 |
| US8013599B2 (en) * | 2004-11-19 | 2011-09-06 | General Electric Company | Methods and apparatus for testing a component |
| US7154265B2 (en) * | 2004-12-21 | 2006-12-26 | General Electric Company | Eddy current probe and inspection method |
| EP1915585A2 (en) | 2005-07-29 | 2008-04-30 | Automotive Systems Laboratory Inc. | Magnetic crash sensor |
| DE102005054593B4 (de) * | 2005-11-14 | 2018-04-26 | Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg | Messonde zur Messung der Dicke dünner Schichten |
| KR20100006607A (ko) * | 2008-07-10 | 2010-01-21 | (주)노바마그네틱스 | 비파괴 센서용 단일 박막의 제조방법 |
| US8395378B2 (en) | 2010-04-29 | 2013-03-12 | General Electric Company | Nondestructive robotic inspection method and system therefor |
| US9646599B2 (en) * | 2013-10-24 | 2017-05-09 | Spirit Aerosystems, Inc. | Remoldable contour sensor holder |
| JP6621581B2 (ja) * | 2015-01-30 | 2019-12-18 | 新川センサテクノロジ株式会社 | 渦電流形変位センサ |
| DE102016205495B4 (de) * | 2016-04-04 | 2022-06-09 | Volkswagen Aktiengesellschaft | Messvorrichtung und Verfahren zur Schichtdickenbestimmung sowie zugehöriger Referenzkörper und Kalibrierkörper |
| EP3700416B1 (en) * | 2017-10-24 | 2024-06-26 | Dexcom, Inc. | Pre-connected analyte sensors |
| CN109342554A (zh) * | 2018-11-20 | 2019-02-15 | 中国航发贵州黎阳航空动力有限公司 | 发动机异型薄壁空心零部件壁厚涡流判定方法 |
| CN109540210A (zh) * | 2018-11-28 | 2019-03-29 | 张春严 | 一种物理测量电气仪表 |
| JP7441467B2 (ja) * | 2020-04-10 | 2024-03-01 | 日立Ｇｅニュークリア・エナジー株式会社 | 渦電流探傷プローブ |
| CN112345632A (zh) * | 2020-11-20 | 2021-02-09 | 西安热工研究院有限公司 | 重型燃机带涂层透平叶片基体裂纹涡流检测探头及制作方法 |
| CN112345633A (zh) * | 2020-11-20 | 2021-02-09 | 西安热工研究院有限公司 | 一种重型燃机透平叶片TBCs层间裂纹涡流检测系统及方法 |
| EP4012399A1 (en) * | 2020-12-10 | 2022-06-15 | Introsys Integration for Robotics Systems, Integração de Sistemas Robóticos, S.A. | A probe and a system for the non-destructive inspection of a welding |
| DE102021211836A1 (de) | 2021-09-30 | 2023-03-30 | Robert Bosch Gesellschaft mit beschränkter Haftung | Messeinrichtung |
Family Cites Families (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3475681A (en) | 1965-08-02 | 1969-10-28 | Magnaflux Corp | Apparatus display system for providing plural indications and threshold indications |
| US3737764A (en) | 1971-09-27 | 1973-06-05 | Commissariat Energie Atomique | Eddy-current test apparatus for detection of flaws in a metal seal placed within an electrically conductive tube |
| US3826132A (en) | 1973-06-01 | 1974-07-30 | Bethlehem Steel Corp | Device for producing a visual display of the transverse tension profile of a moving steel strip |
| US4194149A (en) | 1977-12-15 | 1980-03-18 | The Babcock & Wilcox Company | Method for generating the eddy current signature of a flaw in a tube proximate a contiguous member which obscures the flaw signal |
| US4268791A (en) | 1978-12-08 | 1981-05-19 | The United States Of America As Represented By The Secretary Of The Air Force | Dual trace automatic eddy current detection system for multilayer structures |
| SU903759A1 (ru) * | 1980-05-21 | 1982-02-07 | Кубанский Ордена Трудового Красного Знамени Сельскохозяйственный Институт | Матрица токовихревых накладных преобразователей |
| US4480225A (en) * | 1982-02-11 | 1984-10-30 | The United States Of America As Represented By The United States Department Of Energy | Improved multi-directional eddy current inspection test apparatus for detecting flaws in metal articles |
| US4593245A (en) * | 1983-12-12 | 1986-06-03 | General Electric Company | Eddy current method for detecting a flaw in semi-conductive material |
| US4706020A (en) * | 1983-12-12 | 1987-11-10 | General Electric Company | High frequency eddy current probe with planar, spiral-like coil on flexible substrate for detecting flaws in semi-conductive material |
| US4700134A (en) * | 1985-01-10 | 1987-10-13 | Anco Engineers, Inc. | Method and apparatus for determining the amount of magnetic debris adhering to the exterior of a tube |
| US4797613A (en) * | 1985-01-22 | 1989-01-10 | Combustion Engineering, Inc. | Expandable eddy current probe for inspecting the interior of tubular conduits |
| EP0228177A3 (en) * | 1985-11-19 | 1988-11-02 | Electric Power Research Institute, Inc | Flexible eddy-current coil and coil array for nondestructive testing |
| US5241280A (en) * | 1990-06-05 | 1993-08-31 | Defelsko Corporation | Coating thickness measurement gauge |
| US5389876A (en) | 1991-05-06 | 1995-02-14 | General Electric Company | Flexible eddy current surface measurement array for detecting near surface flaws in a conductive part |
| JP3091009B2 (ja) * | 1992-03-03 | 2000-09-25 | 有限会社清田製作所 | 位置検出プローブ |
| US5463201A (en) * | 1993-02-04 | 1995-10-31 | Generla Electric Company | Seam-tracking apparatus for a welding system employing an array of eddy current elements |
| US5341678A (en) | 1993-05-12 | 1994-08-30 | General Electric Company | Method for determining thickness of ferromagnetic material deposition on nuclear fuel rods |
| JPH08304252A (ja) * | 1995-04-28 | 1996-11-22 | Olympus Optical Co Ltd | 硬さ測定装置 |
| JPH08320221A (ja) * | 1995-05-25 | 1996-12-03 | Mitsui Eng & Shipbuild Co Ltd | 検査装置 |
| US5793206A (en) * | 1995-08-25 | 1998-08-11 | Jentek Sensors, Inc. | Meandering winding test circuit |
| US5801532A (en) * | 1996-07-30 | 1998-09-01 | General Electric Company | Hand-holdable eddy-current probe |
| US5841277A (en) | 1996-07-30 | 1998-11-24 | General Electric Company | Hand-holdable probe having a flexible eddy current sensor |
| US5903147A (en) | 1997-03-18 | 1999-05-11 | General Electric Company | Eddy current array inspection device for shaped holes |
| US5915277A (en) * | 1997-06-23 | 1999-06-22 | General Electric Co. | Probe and method for inspecting an object |
| WO1999023484A1 (de) * | 1997-11-04 | 1999-05-14 | Siemens Aktiengesellschaft | Tastkopf zur wirbelstromprüfung, verfahren zur herstellung eines tastkopfes für eine wirbelstromprüfung und wirbelstromprüfverfahren |
| JPH11183441A (ja) * | 1997-12-18 | 1999-07-09 | Tokyo Gas Co Ltd | 回転型渦流探傷装置 |
| JPH11309123A (ja) * | 1998-04-30 | 1999-11-09 | Omron Corp | 生体脂肪測定器 |
-
1999
- 1999-12-22 US US09/468,845 patent/US6288537B1/en not_active Expired - Lifetime
-
2000
- 2000-07-21 CZ CZ20002684A patent/CZ20002684A3/cs unknown
- 2000-08-01 KR KR1020000044559A patent/KR100584186B1/ko not_active Expired - Fee Related
- 2000-08-16 EP EP00306991A patent/EP1111379B1/en not_active Expired - Lifetime
- 2000-08-16 DE DE60028712T patent/DE60028712T2/de not_active Expired - Lifetime
- 2000-08-16 AT AT00306991T patent/ATE330219T1/de not_active IP Right Cessation
- 2000-08-18 JP JP2000248044A patent/JP4646091B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US6288537B1 (en) | 2001-09-11 |
| EP1111379A1 (en) | 2001-06-27 |
| JP4646091B2 (ja) | 2011-03-09 |
| DE60028712D1 (de) | 2006-07-27 |
| EP1111379B1 (en) | 2006-06-14 |
| KR100584186B1 (ko) | 2006-05-29 |
| KR20010071111A (ko) | 2001-07-28 |
| DE60028712T2 (de) | 2007-03-29 |
| ATE330219T1 (de) | 2006-07-15 |
| JP2001183348A (ja) | 2001-07-06 |
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