KR100566752B1 - 전자 장치 및 반도체 기억 장치 - Google Patents
전자 장치 및 반도체 기억 장치 Download PDFInfo
- Publication number
- KR100566752B1 KR100566752B1 KR1019990023965A KR19990023965A KR100566752B1 KR 100566752 B1 KR100566752 B1 KR 100566752B1 KR 1019990023965 A KR1019990023965 A KR 1019990023965A KR 19990023965 A KR19990023965 A KR 19990023965A KR 100566752 B1 KR100566752 B1 KR 100566752B1
- Authority
- KR
- South Korea
- Prior art keywords
- strobe signal
- output
- input
- data
- strobe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 title claims description 25
- 230000000295 complement effect Effects 0.000 claims abstract description 73
- 239000000872 buffer Substances 0.000 claims description 91
- 238000000034 method Methods 0.000 claims 1
- 240000007320 Pinus strobus Species 0.000 description 212
- 238000010586 diagram Methods 0.000 description 6
- 238000012790 confirmation Methods 0.000 description 4
- 101000894525 Homo sapiens Transforming growth factor-beta-induced protein ig-h3 Proteins 0.000 description 3
- 102100021398 Transforming growth factor-beta-induced protein ig-h3 Human genes 0.000 description 3
- 230000001360 synchronised effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1066—Output synchronization
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4076—Timing circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1072—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers for memories with random access ports synchronised on clock signal pulse trains, e.g. synchronous memories, self timed memories
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17831598A JP4075140B2 (ja) | 1998-06-25 | 1998-06-25 | 電子装置及び半導体記憶装置 |
| JP98-178315 | 1998-06-25 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20000006420A KR20000006420A (ko) | 2000-01-25 |
| KR100566752B1 true KR100566752B1 (ko) | 2006-04-03 |
Family
ID=16046339
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019990023965A Expired - Lifetime KR100566752B1 (ko) | 1998-06-25 | 1999-06-24 | 전자 장치 및 반도체 기억 장치 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6172938B1 (enExample) |
| JP (1) | JP4075140B2 (enExample) |
| KR (1) | KR100566752B1 (enExample) |
| TW (1) | TW411413B (enExample) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4683690B2 (ja) * | 1999-11-05 | 2011-05-18 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| US6807613B1 (en) * | 2000-08-21 | 2004-10-19 | Mircon Technology, Inc. | Synchronized write data on a high speed memory bus |
| US6388943B1 (en) * | 2001-01-29 | 2002-05-14 | Advanced Micro Devices, Inc. | Differential clock crossing point level-shifting device |
| US6515914B2 (en) | 2001-03-21 | 2003-02-04 | Micron Technology, Inc. | Memory device and method having data path with multiple prefetch I/O configurations |
| US7102937B2 (en) * | 2004-07-07 | 2006-09-05 | Micron Technology, Inc. | Solution to DQS postamble ringing problem in memory chips |
| KR100640783B1 (ko) * | 2004-10-30 | 2006-11-01 | 주식회사 하이닉스반도체 | 노이즈를 줄일 수 있는 데이터 출력 드라이버 |
| US20060115016A1 (en) * | 2004-11-12 | 2006-06-01 | Ati Technologies Inc. | Methods and apparatus for transmitting and receiving data signals |
| US7262637B2 (en) * | 2005-03-22 | 2007-08-28 | Micron Technology, Inc. | Output buffer and method having a supply voltage insensitive slew rate |
| JP4544115B2 (ja) * | 2005-09-22 | 2010-09-15 | パナソニック電工株式会社 | 床置き畳台 |
| JP4600467B2 (ja) * | 2007-12-03 | 2010-12-15 | 富士通セミコンダクター株式会社 | 電子装置及びダブル・データ・レート・シンクロナス・ダイナミック・ランダム・アクセス・メモリ |
| US7889579B2 (en) * | 2008-01-28 | 2011-02-15 | Promos Technologies Pte. Ltd. | Using differential data strobes in non-differential mode to enhance data capture window |
| JP5489427B2 (ja) * | 2008-06-27 | 2014-05-14 | スパンション エルエルシー | メモリ制御装置、メモリシステムおよびメモリ装置の制御方法。 |
| KR101796116B1 (ko) | 2010-10-20 | 2017-11-10 | 삼성전자 주식회사 | 반도체 장치, 이를 포함하는 메모리 모듈, 메모리 시스템 및 그 동작방법 |
| KR102076858B1 (ko) * | 2013-12-24 | 2020-02-12 | 에스케이하이닉스 주식회사 | 반도체장치 및 이를 포함하는 반도체시스템 |
| CN115240748B (zh) * | 2021-04-23 | 2025-08-29 | 长鑫存储技术有限公司 | 存储芯片测试方法、计算机设备及介质 |
| EP4099330B1 (en) | 2021-04-23 | 2025-04-09 | Changxin Memory Technologies, Inc. | Memory chip testing method, computer device and medium |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01138684A (ja) * | 1987-11-26 | 1989-05-31 | Mitsubishi Electric Corp | 半導体記憶装置 |
| US5666321A (en) * | 1995-09-01 | 1997-09-09 | Micron Technology, Inc. | Synchronous DRAM memory with asynchronous column decode |
| KR980006858A (ko) * | 1996-06-29 | 1998-03-30 | 김주용 | 스트로브 클럭신호 생성장치 및 그를 사용하는 동기식 반도체 장치 |
| KR19990082815A (ko) * | 1998-04-02 | 1999-11-25 | 김영환 | 동기반도체메모리를위한인터페이스 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0715312A (ja) * | 1993-06-15 | 1995-01-17 | Fujitsu Ltd | 半導体記憶装置 |
| KR100192573B1 (ko) * | 1995-09-18 | 1999-06-15 | 윤종용 | 멀티 뱅크 구조의 반도체 메모리 장치 |
| KR100214262B1 (ko) * | 1995-10-25 | 1999-08-02 | 김영환 | 메모리 장치 |
| KR100224681B1 (ko) * | 1997-01-10 | 1999-10-15 | 윤종용 | 반도체 메모리 장치의 로우 어드레스 제어 회로 |
| US6016066A (en) * | 1998-03-19 | 2000-01-18 | Intel Corporation | Method and apparatus for glitch protection for input buffers in a source-synchronous environment |
-
1998
- 1998-06-25 JP JP17831598A patent/JP4075140B2/ja not_active Expired - Lifetime
-
1999
- 1999-06-23 US US09/338,597 patent/US6172938B1/en not_active Expired - Lifetime
- 1999-06-24 TW TW088110642A patent/TW411413B/zh not_active IP Right Cessation
- 1999-06-24 KR KR1019990023965A patent/KR100566752B1/ko not_active Expired - Lifetime
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01138684A (ja) * | 1987-11-26 | 1989-05-31 | Mitsubishi Electric Corp | 半導体記憶装置 |
| US5666321A (en) * | 1995-09-01 | 1997-09-09 | Micron Technology, Inc. | Synchronous DRAM memory with asynchronous column decode |
| KR980006858A (ko) * | 1996-06-29 | 1998-03-30 | 김주용 | 스트로브 클럭신호 생성장치 및 그를 사용하는 동기식 반도체 장치 |
| KR19990082815A (ko) * | 1998-04-02 | 1999-11-25 | 김영환 | 동기반도체메모리를위한인터페이스 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4075140B2 (ja) | 2008-04-16 |
| KR20000006420A (ko) | 2000-01-25 |
| TW411413B (en) | 2000-11-11 |
| JP2000011646A (ja) | 2000-01-14 |
| US6172938B1 (en) | 2001-01-09 |
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| Date | Code | Title | Description |
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| PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19990624 |
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| A201 | Request for examination | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20030818 Comment text: Request for Examination of Application Patent event code: PA02011R01I Patent event date: 19990624 Comment text: Patent Application |
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| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20050629 Patent event code: PE09021S01D |
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| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20051230 |
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| GRNT | Written decision to grant | ||
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Comment text: Registration of Establishment Patent event date: 20060327 Patent event code: PR07011E01D |
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