KR100538070B1 - 잔존 수명 예측방법, 온도 검출구조 및 전자기기 - Google Patents
잔존 수명 예측방법, 온도 검출구조 및 전자기기 Download PDFInfo
- Publication number
- KR100538070B1 KR100538070B1 KR10-2003-0004193A KR20030004193A KR100538070B1 KR 100538070 B1 KR100538070 B1 KR 100538070B1 KR 20030004193 A KR20030004193 A KR 20030004193A KR 100538070 B1 KR100538070 B1 KR 100538070B1
- Authority
- KR
- South Korea
- Prior art keywords
- temperature
- remaining life
- life
- time
- actual use
- Prior art date
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Classifications
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H6/00—Emergency protective circuit arrangements responsive to undesired changes from normal non-electric working conditions using simulators of the apparatus being protected, e.g. using thermal images
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K3/00—Thermometers giving results other than momentary value of temperature
- G01K3/02—Thermometers giving results other than momentary value of temperature giving means values; giving integrated values
- G01K3/04—Thermometers giving results other than momentary value of temperature giving means values; giving integrated values in respect of time
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/64—Testing of capacitors
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Inverter Devices (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Dc-Dc Converters (AREA)
Abstract
Description
Claims (17)
- 콘덴서의 실사용에 있어서의 잔존 수명을 예측하는 방법에 있어서,온도-수명 법칙에 의거한 연산식에 따라, 소정 온도에 있어서의 초기시점에서의 총수명을 산출하는 스텝과,온도-수명 법칙에 의거한 연산식에 따라, 실사용시의 온도에 있어서의 시간의 경과를 소정온도에 있어서의 경과시간으로 환산한 후에 소정온도에 있어서의 잔존 수명을 산출하는 스텝과,상기 소정온도에 있어서 초기 시점에서의 총수명과, 상기 소정 온도에 있어서의 잔존 수명과, 상기 실사용시의 온도에 있어서 시간의 경과에 의거하여 상기 소정 온도에 있어서의 잔존수명과 실사용에 있어서의 잔존 수명과의 사이의 비례관계를 이용하여 실사용에 있어서의 잔존 수명을 산출하는 스텝을 구비하며,상기 소정 온도에 있어서의 잔존 수명을 산출하는 스텝 및 상기 실사용에 있어서의 잔존 수명을 산출하는 스텝은 미리 정한 시간이 경과하는 때 행해지며, 상기 실사용시의 온도로서 상기 미리 정해진 시간에 있어서 검출된 온도의 평균온도를 이용하는 것을 특징으로 하는 잔존 수명 예측 방법.
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Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002044630A JP3850311B2 (ja) | 2002-02-21 | 2002-02-21 | 残存寿命予測報知方法および電子機器 |
JPJP-P-2002-00044630 | 2002-02-21 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020050101582A Division KR100656665B1 (ko) | 2002-02-21 | 2005-10-27 | 온도 검출구조 및 전자기기 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20030069806A KR20030069806A (ko) | 2003-08-27 |
KR100538070B1 true KR100538070B1 (ko) | 2005-12-20 |
Family
ID=27655309
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2003-0004193A KR100538070B1 (ko) | 2002-02-21 | 2003-01-22 | 잔존 수명 예측방법, 온도 검출구조 및 전자기기 |
KR1020050101582A KR100656665B1 (ko) | 2002-02-21 | 2005-10-27 | 온도 검출구조 및 전자기기 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020050101582A KR100656665B1 (ko) | 2002-02-21 | 2005-10-27 | 온도 검출구조 및 전자기기 |
Country Status (6)
Country | Link |
---|---|
US (1) | US6880967B2 (ko) |
EP (1) | EP1338874B2 (ko) |
JP (1) | JP3850311B2 (ko) |
KR (2) | KR100538070B1 (ko) |
CN (2) | CN2630815Y (ko) |
TW (1) | TWI259906B (ko) |
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2002
- 2002-02-21 JP JP2002044630A patent/JP3850311B2/ja not_active Expired - Lifetime
-
2003
- 2003-01-22 KR KR10-2003-0004193A patent/KR100538070B1/ko active IP Right Grant
- 2003-02-11 US US10/361,843 patent/US6880967B2/en not_active Expired - Lifetime
- 2003-02-17 TW TW092103176A patent/TWI259906B/zh not_active IP Right Cessation
- 2003-02-19 EP EP03003773.3A patent/EP1338874B2/en not_active Expired - Fee Related
- 2003-02-21 CN CNU032044429U patent/CN2630815Y/zh not_active Expired - Lifetime
- 2003-02-21 CN CNB03104896XA patent/CN1181353C/zh not_active Expired - Fee Related
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2005
- 2005-10-27 KR KR1020050101582A patent/KR100656665B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
CN2630815Y (zh) | 2004-08-04 |
US20030185271A1 (en) | 2003-10-02 |
US6880967B2 (en) | 2005-04-19 |
JP3850311B2 (ja) | 2006-11-29 |
CN1439867A (zh) | 2003-09-03 |
TW200303424A (en) | 2003-09-01 |
JP2003243269A (ja) | 2003-08-29 |
TWI259906B (en) | 2006-08-11 |
EP1338874B1 (en) | 2014-04-09 |
KR20030069806A (ko) | 2003-08-27 |
CN1181353C (zh) | 2004-12-22 |
EP1338874B2 (en) | 2017-12-27 |
KR20050109414A (ko) | 2005-11-21 |
EP1338874A1 (en) | 2003-08-27 |
KR100656665B1 (ko) | 2006-12-11 |
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