KR100535353B1 - 인듐 틴 옥사이드막의 패터닝 방법 - Google Patents
인듐 틴 옥사이드막의 패터닝 방법 Download PDFInfo
- Publication number
- KR100535353B1 KR100535353B1 KR1019980036707A KR19980036707A KR100535353B1 KR 100535353 B1 KR100535353 B1 KR 100535353B1 KR 1019980036707 A KR1019980036707 A KR 1019980036707A KR 19980036707 A KR19980036707 A KR 19980036707A KR 100535353 B1 KR100535353 B1 KR 100535353B1
- Authority
- KR
- South Korea
- Prior art keywords
- indium tin
- tin oxide
- oxide film
- organic insulating
- etchant
- Prior art date
Links
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 title claims abstract description 60
- 238000000034 method Methods 0.000 title claims abstract description 17
- 238000000059 patterning Methods 0.000 title claims description 9
- 238000005530 etching Methods 0.000 claims abstract description 17
- 239000004973 liquid crystal related substance Substances 0.000 claims description 7
- 239000000758 substrate Substances 0.000 claims description 6
- 239000004642 Polyimide Substances 0.000 claims description 5
- 239000011521 glass Substances 0.000 claims description 5
- 229920002120 photoresistant polymer Polymers 0.000 claims description 5
- 229920001721 polyimide Polymers 0.000 claims description 5
- 229920005989 resin Polymers 0.000 claims description 5
- 239000011347 resin Substances 0.000 claims description 5
- YVQSLGWKPOKHFJ-UHFFFAOYSA-N bicyclo[4.2.0]octa-1,3,5-trien-7-yne Chemical compound C1=CC=C2C#CC2=C1 YVQSLGWKPOKHFJ-UHFFFAOYSA-N 0.000 claims description 3
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical compound [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 claims 1
- 239000010408 film Substances 0.000 description 57
- 239000010409 thin film Substances 0.000 description 5
- UMIVXZPTRXBADB-UHFFFAOYSA-N benzocyclobutene Chemical compound C1=CC=C2CCC2=C1 UMIVXZPTRXBADB-UHFFFAOYSA-N 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 238000000354 decomposition reaction Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1343—Electrodes
- G02F1/13439—Electrodes characterised by their electrical, optical, physical properties; materials therefor; method of making
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022466—Electrodes made of transparent conductive layers, e.g. TCO, ITO layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1884—Manufacture of transparent electrodes, e.g. TCO, ITO
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Nonlinear Science (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Mathematical Physics (AREA)
- Manufacturing & Machinery (AREA)
- Liquid Crystal (AREA)
Abstract
Description
Claims (5)
- 유리 기판을 준비하는 단계,상기 유리 기판 상면에 유기 절연막을 형성하는 단계,상기 유기 절연막 상면에 인듐 틴 옥사이드막을 형성하는 단계,상기 인듐 틴 옥사이드 막의 부분에 감광막 패턴을 형성하는 단계,상기 감광막 패턴을 마스크로 이용하고 HNO3 가스가 약 3 내지 4 부피%로 함유된 제1 식각제를 사용하여, 상기 인듐 틴 옥사이드가 부분적으로 식각되어 유기 절연막 상면에 잔존하는 제1 식각 단계, 및상기 감광막 패턴을 마스크로 이용하고 상기 제1 식각제보다 HNO3 가스가 감소된 제2 식각제를 사용하여, 상기 잔존하는 인듐 틴 옥사이드 막을 제거하는 제2 식각 단계를 포함하는 액정 표시 소자의 인듐 틴 옥사이드막 패터닝 방법.
- 제 1 항에 있어서, 상기 인듐 틴 옥사이드는 상기 유기 절연막 상부에 약 1200Å의 두께로 형성되고, 상기 제1 식각단계에서 부분적으로 식각되어 약 100Å의 두께로 형성되며, 제2 식각단계에서 완전히 제거되는 것을 특징으로 하는 액정 표시 소자의 인듐 틴 옥사이드막 패터닝 방법.
- 제 1 항에 있어서, 상기 제2 식각제는 HNO3 가스가 약 1 부피% 미만으로 함유되는 것을 특징으로 하는 액정 표시 소자의 인듐 틴 옥사이드막 패터닝 방법.
- 제 1 항 내지 제3 항 중의 어느 한 항에 있어서, 상기 식각제는 상기 HNO3, HCl 및 H2O로 구성되는 액정 표시 소장의 인듐 틴 옥사이드막 패터닝 방법.
- 제 1 항에 있어서, 상기 유기 절연막은 폴리 이미드, 수지 및 벤조 시클로 부틴으로 구성된 군에서 선택된 어느 하나로 형성되는 액정 표시 소자의 인듐 틴 옥사이드막 패터닝 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019980036707A KR100535353B1 (ko) | 1998-09-07 | 1998-09-07 | 인듐 틴 옥사이드막의 패터닝 방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019980036707A KR100535353B1 (ko) | 1998-09-07 | 1998-09-07 | 인듐 틴 옥사이드막의 패터닝 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20000018886A KR20000018886A (ko) | 2000-04-06 |
KR100535353B1 true KR100535353B1 (ko) | 2006-03-31 |
Family
ID=19549750
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019980036707A KR100535353B1 (ko) | 1998-09-07 | 1998-09-07 | 인듐 틴 옥사이드막의 패터닝 방법 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100535353B1 (ko) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR970049092A (ko) * | 1995-12-29 | 1997-07-29 | 김광호 | 산화인듐틴막용 습식식각제 |
JPH10178177A (ja) * | 1996-12-17 | 1998-06-30 | Mitsubishi Electric Corp | 液晶表示装置およびこれに用いられるtftアレイ基板の製造方法 |
KR19980023306A (ko) * | 1996-09-25 | 1998-07-06 | 배순훈 | 박막형 광로조절장치의 제조방법 |
KR19990031518A (ko) * | 1997-10-13 | 1999-05-06 | 윤종용 | 몰리브덴-텅스텐 합금을 사용한 배선을 이용한 액정 표시 장치및 그 제조 방법 |
-
1998
- 1998-09-07 KR KR1019980036707A patent/KR100535353B1/ko not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR970049092A (ko) * | 1995-12-29 | 1997-07-29 | 김광호 | 산화인듐틴막용 습식식각제 |
KR19980023306A (ko) * | 1996-09-25 | 1998-07-06 | 배순훈 | 박막형 광로조절장치의 제조방법 |
JPH10178177A (ja) * | 1996-12-17 | 1998-06-30 | Mitsubishi Electric Corp | 液晶表示装置およびこれに用いられるtftアレイ基板の製造方法 |
KR19990031518A (ko) * | 1997-10-13 | 1999-05-06 | 윤종용 | 몰리브덴-텅스텐 합금을 사용한 배선을 이용한 액정 표시 장치및 그 제조 방법 |
Also Published As
Publication number | Publication date |
---|---|
KR20000018886A (ko) | 2000-04-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100433463B1 (ko) | 패턴형성방법 및 이 방법을 사용한 디스플레이제조방법 | |
US7157319B2 (en) | Method of patterning a thin film transistor that includes simultaneously forming a gate electrode and a pixel electrode | |
KR100326821B1 (ko) | 액정표시장치 및 그 제조 방법 | |
US6767694B2 (en) | Process for forming pattern and method for producing liquid crystal apparatus employing process for forming pattern | |
US8178374B2 (en) | Thin film patterning method and method for manufacturing a liquid crystal display device | |
KR20070009329A (ko) | 컨택홀 형성 방법 및 이를 이용한 박막 트랜지스터 기판의제조 방법 | |
US20170221924A1 (en) | Method for Manufacturing TFT, Array Substrate and Display Device | |
GB2312073A (en) | Method for manufacturing a liquid crystal display | |
KR100535353B1 (ko) | 인듐 틴 옥사이드막의 패터닝 방법 | |
GB2315245A (en) | Etching a hole in an organic passivation layer for an LCD | |
US6486010B1 (en) | Method for manufacturing thin film transistor panel | |
KR100237005B1 (ko) | 액정표시장치의 절연막의 에칭방법 | |
KR20070001548A (ko) | 액정표시장치용 어레이 기판의 제조방법 | |
KR100915864B1 (ko) | 액정표시장치용 어레이 기판의 제조방법 | |
US7625823B1 (en) | Method of patterning a metal layer in a semiconductor device | |
US5916737A (en) | Method for fabricating liquid crystal display device | |
KR100613767B1 (ko) | 박막 트랜지스터 액정 표시소자의 제조방법 | |
KR100619160B1 (ko) | 박막 트랜지스터 액정표시장치의 제조방법 | |
KR100476055B1 (ko) | 반사형 액정표시소자의 박막트랜지스터 패널 제조방법 | |
KR100701658B1 (ko) | 액정표시장치의 제조방법 | |
KR100341129B1 (ko) | 박막 트랜지스터-액정 표시 장치의 제조방법 | |
JP2001168190A (ja) | 半導体装置、液晶表示装置、半導体装置の製造方法および液晶表示装置の製造方法 | |
KR100707010B1 (ko) | 박막 트랜지스터-액정표시소자의 제조방법 | |
KR100577784B1 (ko) | 박막 트랜지스터 액정 표시소자의 제조방법 | |
KR20000065954A (ko) | 액정표시장치의 제조방법 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
N231 | Notification of change of applicant | ||
N231 | Notification of change of applicant | ||
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20121107 Year of fee payment: 8 |
|
FPAY | Annual fee payment |
Payment date: 20131118 Year of fee payment: 9 |
|
FPAY | Annual fee payment |
Payment date: 20141118 Year of fee payment: 10 |
|
FPAY | Annual fee payment |
Payment date: 20151116 Year of fee payment: 11 |
|
FPAY | Annual fee payment |
Payment date: 20161118 Year of fee payment: 12 |
|
FPAY | Annual fee payment |
Payment date: 20171116 Year of fee payment: 13 |
|
EXPY | Expiration of term |