KR100509670B1 - 기억장치 및 그 검사방법 - Google Patents

기억장치 및 그 검사방법 Download PDF

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Publication number
KR100509670B1
KR100509670B1 KR10-1998-0011102A KR19980011102A KR100509670B1 KR 100509670 B1 KR100509670 B1 KR 100509670B1 KR 19980011102 A KR19980011102 A KR 19980011102A KR 100509670 B1 KR100509670 B1 KR 100509670B1
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KR
South Korea
Prior art keywords
data
area
written
stored
calculation result
Prior art date
Application number
KR10-1998-0011102A
Other languages
English (en)
Korean (ko)
Other versions
KR19980080887A (ko
Inventor
마사히로 후쿠다
Original Assignee
칼소닉 칸세이 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 칼소닉 칸세이 가부시끼가이샤 filed Critical 칼소닉 칸세이 가부시끼가이샤
Publication of KR19980080887A publication Critical patent/KR19980080887A/ko
Application granted granted Critical
Publication of KR100509670B1 publication Critical patent/KR100509670B1/ko

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Read Only Memory (AREA)
KR10-1998-0011102A 1997-04-10 1998-03-31 기억장치 및 그 검사방법 KR100509670B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP9-092493 1997-04-10
JP9092493A JPH10283273A (ja) 1997-04-10 1997-04-10 記憶装置及びその検査方法

Publications (2)

Publication Number Publication Date
KR19980080887A KR19980080887A (ko) 1998-11-25
KR100509670B1 true KR100509670B1 (ko) 2005-10-26

Family

ID=14055833

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-1998-0011102A KR100509670B1 (ko) 1997-04-10 1998-03-31 기억장치 및 그 검사방법

Country Status (2)

Country Link
JP (1) JPH10283273A (ja)
KR (1) KR100509670B1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4475320B2 (ja) * 2007-11-15 2010-06-09 株式会社デンソー 車両用記憶管理装置

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63164079A (ja) * 1986-12-25 1988-07-07 Mitsubishi Electric Corp 情報記憶装置
JPH02246149A (ja) * 1989-03-20 1990-10-01 Hitachi Ltd 半導体集積回路装置とその欠陥救済法
KR910003833A (ko) * 1989-07-14 1991-02-28 김정배 평면형 박막트랜지스터와 그 제조방법
JPH04228196A (ja) * 1990-04-18 1992-08-18 Hitachi Ltd 半導体集積回路
KR950006877A (ko) * 1993-08-28 1995-03-21 게오르그 그라프 메모리 모듈내의 에러를 검출하여 보정하는 방법 및 장치

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63164079A (ja) * 1986-12-25 1988-07-07 Mitsubishi Electric Corp 情報記憶装置
JPH02246149A (ja) * 1989-03-20 1990-10-01 Hitachi Ltd 半導体集積回路装置とその欠陥救済法
KR910003833A (ko) * 1989-07-14 1991-02-28 김정배 평면형 박막트랜지스터와 그 제조방법
JPH04228196A (ja) * 1990-04-18 1992-08-18 Hitachi Ltd 半導体集積回路
KR950006877A (ko) * 1993-08-28 1995-03-21 게오르그 그라프 메모리 모듈내의 에러를 검출하여 보정하는 방법 및 장치

Also Published As

Publication number Publication date
KR19980080887A (ko) 1998-11-25
JPH10283273A (ja) 1998-10-23

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