KR100400968B1 - 스퍼터 장치 및 성막 방법 - Google Patents
스퍼터 장치 및 성막 방법 Download PDFInfo
- Publication number
- KR100400968B1 KR100400968B1 KR10-2000-0063763A KR20000063763A KR100400968B1 KR 100400968 B1 KR100400968 B1 KR 100400968B1 KR 20000063763 A KR20000063763 A KR 20000063763A KR 100400968 B1 KR100400968 B1 KR 100400968B1
- Authority
- KR
- South Korea
- Prior art keywords
- target
- substrate
- film
- ion
- processing chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3435—Applying energy to the substrate during sputtering
- C23C14/345—Applying energy to the substrate during sputtering using substrate bias
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/046—Coating cavities or hollow spaces, e.g. interior of tubes; Infiltration of porous substrates
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3457—Sputtering using other particles than noble gas ions
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32697—Electrostatic control
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76877—Filling of holes, grooves or trenches, e.g. vias, with conductive material
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1999-310298 | 1999-10-29 | ||
| JP31029899 | 1999-10-29 | ||
| JP2000-166059 | 2000-06-02 | ||
| JP2000166059A JP4021601B2 (ja) | 1999-10-29 | 2000-06-02 | スパッタ装置および成膜方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20010051319A KR20010051319A (ko) | 2001-06-25 |
| KR100400968B1 true KR100400968B1 (ko) | 2003-10-10 |
Family
ID=26566260
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR10-2000-0063763A Expired - Fee Related KR100400968B1 (ko) | 1999-10-29 | 2000-10-28 | 스퍼터 장치 및 성막 방법 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6423192B1 (enExample) |
| JP (1) | JP4021601B2 (enExample) |
| KR (1) | KR100400968B1 (enExample) |
| TW (1) | TW503470B (enExample) |
Families Citing this family (66)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6355183B1 (en) * | 1998-09-04 | 2002-03-12 | Matsushita Electric Industrial Co., Ltd. | Apparatus and method for plasma etching |
| US6610184B2 (en) | 2001-11-14 | 2003-08-26 | Applied Materials, Inc. | Magnet array in conjunction with rotating magnetron for plasma sputtering |
| US20030116427A1 (en) * | 2001-08-30 | 2003-06-26 | Applied Materials, Inc. | Self-ionized and inductively-coupled plasma for sputtering and resputtering |
| US8696875B2 (en) | 1999-10-08 | 2014-04-15 | Applied Materials, Inc. | Self-ionized and inductively-coupled plasma for sputtering and resputtering |
| WO2003042424A1 (en) * | 2000-10-10 | 2003-05-22 | Applied Materials, Inc. | Self-ionized and inductively-coupled plasma for sputtering and resputtering |
| US10047430B2 (en) | 1999-10-08 | 2018-08-14 | Applied Materials, Inc. | Self-ionized and inductively-coupled plasma for sputtering and resputtering |
| US6627050B2 (en) * | 2000-07-28 | 2003-09-30 | Applied Materials, Inc. | Method and apparatus for depositing a tantalum-containing layer on a substrate |
| JP4703828B2 (ja) * | 2000-09-07 | 2011-06-15 | 株式会社アルバック | スパッタリング装置及び薄膜製造方法 |
| JP4503194B2 (ja) * | 2001-02-16 | 2010-07-14 | アプライド マテリアルズ インコーポレイテッド | 気相堆積装置及び方法 |
| US7482757B2 (en) * | 2001-03-23 | 2009-01-27 | Tokyo Electron Limited | Inductively coupled high-density plasma source |
| US6537928B1 (en) * | 2002-02-19 | 2003-03-25 | Asm Japan K.K. | Apparatus and method for forming low dielectric constant film |
| US7041201B2 (en) * | 2001-11-14 | 2006-05-09 | Applied Materials, Inc. | Sidewall magnet improving uniformity of inductively coupled plasma and shields used therewith |
| US7122844B2 (en) * | 2002-05-13 | 2006-10-17 | Cree, Inc. | Susceptor for MOCVD reactor |
| US7504006B2 (en) | 2002-08-01 | 2009-03-17 | Applied Materials, Inc. | Self-ionized and capacitively-coupled plasma for sputtering and resputtering |
| US6846396B2 (en) * | 2002-08-08 | 2005-01-25 | Applied Materials, Inc. | Active magnetic shielding |
| WO2004015862A2 (en) * | 2002-08-13 | 2004-02-19 | Trikon Technologies Limited | Acoustic resonators |
| US8366830B2 (en) * | 2003-03-04 | 2013-02-05 | Cree, Inc. | Susceptor apparatus for inverted type MOCVD reactor |
| KR100784381B1 (ko) | 2004-07-23 | 2007-12-11 | 삼성전자주식회사 | 증착 장치 및 방법 |
| US7294574B2 (en) * | 2004-08-09 | 2007-11-13 | Applied Materials, Inc. | Sputter deposition and etching of metallization seed layer for overhang and sidewall improvement |
| US7351656B2 (en) * | 2005-01-21 | 2008-04-01 | Kabushiki Kaihsa Toshiba | Semiconductor device having oxidized metal film and manufacture method of the same |
| JP4762187B2 (ja) * | 2007-03-28 | 2011-08-31 | 株式会社東芝 | マグネトロンスパッタリング装置および半導体装置の製造方法 |
| KR100882906B1 (ko) * | 2007-04-17 | 2009-02-10 | 삼성모바일디스플레이주식회사 | 스퍼터링 장치 |
| JP2009182140A (ja) * | 2008-01-30 | 2009-08-13 | Tokyo Electron Ltd | 薄膜の形成方法、プラズマ成膜装置及び記憶媒体 |
| JP5118532B2 (ja) * | 2008-03-28 | 2013-01-16 | 新明和工業株式会社 | スパッタリング装置およびスパッタリング方法 |
| JP2009256747A (ja) * | 2008-04-18 | 2009-11-05 | Canon Anelva Corp | マグネトロンスパッタリング装置及び薄膜の製造法 |
| KR20100032644A (ko) * | 2008-09-18 | 2010-03-26 | 삼성전자주식회사 | 선택적 플라즈마 처리를 이용한 반도체 소자의 금속배선 형성방법 |
| US20100096253A1 (en) * | 2008-10-22 | 2010-04-22 | Applied Materials, Inc | Pvd cu seed overhang re-sputtering with enhanced cu ionization |
| KR101593544B1 (ko) * | 2008-12-15 | 2016-02-15 | 가부시키가이샤 알박 | 스퍼터링 장치 및 스퍼터링 방법 |
| GB0901157D0 (en) * | 2009-01-26 | 2009-03-11 | Aviza Technology Ltd | A method of plasma vapour deposition |
| JP5347868B2 (ja) * | 2009-09-24 | 2013-11-20 | 東京エレクトロン株式会社 | 載置台構造及びプラズマ成膜装置 |
| JP2011179068A (ja) * | 2010-03-01 | 2011-09-15 | Ulvac Japan Ltd | 金属薄膜の形成方法 |
| WO2011130092A1 (en) * | 2010-04-14 | 2011-10-20 | The Regents Of The University Of California | Method and apparatus for sputtering with a plasma lens |
| JP5654939B2 (ja) * | 2011-04-20 | 2015-01-14 | 株式会社アルバック | 成膜装置 |
| US9279179B2 (en) * | 2012-02-06 | 2016-03-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | Multi coil target design |
| US9640359B2 (en) * | 2012-08-09 | 2017-05-02 | Vactronix Scientific, Inc. | Inverted cylindrical magnetron (ICM) system and methods of use |
| TW201502302A (zh) * | 2013-07-15 | 2015-01-16 | Metal Ind Res & Dev Ct | 可微調整製程參數之濺鍍製程控制系統及其方法 |
| KR20160003871U (ko) | 2015-04-30 | 2016-11-09 | 에스엘 주식회사 | 차량용 램프 |
| CN109473331B (zh) * | 2017-09-08 | 2022-11-25 | 北京北方华创微电子装备有限公司 | 腔室屏蔽装置和半导体处理腔 |
| US10510575B2 (en) | 2017-09-20 | 2019-12-17 | Applied Materials, Inc. | Substrate support with multiple embedded electrodes |
| JP6998239B2 (ja) * | 2018-03-01 | 2022-01-18 | 株式会社アルバック | 成膜装置 |
| US10555412B2 (en) | 2018-05-10 | 2020-02-04 | Applied Materials, Inc. | Method of controlling ion energy distribution using a pulse generator with a current-return output stage |
| WO2020090164A1 (ja) * | 2018-10-30 | 2020-05-07 | 株式会社アルバック | 真空処理装置 |
| US11476145B2 (en) * | 2018-11-20 | 2022-10-18 | Applied Materials, Inc. | Automatic ESC bias compensation when using pulsed DC bias |
| KR20250100790A (ko) | 2019-01-22 | 2025-07-03 | 어플라이드 머티어리얼스, 인코포레이티드 | 펄스 전압 파형을 제어하기 위한 피드백 루프 |
| US11508554B2 (en) | 2019-01-24 | 2022-11-22 | Applied Materials, Inc. | High voltage filter assembly |
| US11462388B2 (en) | 2020-07-31 | 2022-10-04 | Applied Materials, Inc. | Plasma processing assembly using pulsed-voltage and radio-frequency power |
| US11798790B2 (en) | 2020-11-16 | 2023-10-24 | Applied Materials, Inc. | Apparatus and methods for controlling ion energy distribution |
| US11901157B2 (en) | 2020-11-16 | 2024-02-13 | Applied Materials, Inc. | Apparatus and methods for controlling ion energy distribution |
| US11495470B1 (en) | 2021-04-16 | 2022-11-08 | Applied Materials, Inc. | Method of enhancing etching selectivity using a pulsed plasma |
| US11791138B2 (en) | 2021-05-12 | 2023-10-17 | Applied Materials, Inc. | Automatic electrostatic chuck bias compensation during plasma processing |
| US11948780B2 (en) | 2021-05-12 | 2024-04-02 | Applied Materials, Inc. | Automatic electrostatic chuck bias compensation during plasma processing |
| US11967483B2 (en) | 2021-06-02 | 2024-04-23 | Applied Materials, Inc. | Plasma excitation with ion energy control |
| US12148595B2 (en) | 2021-06-09 | 2024-11-19 | Applied Materials, Inc. | Plasma uniformity control in pulsed DC plasma chamber |
| US20220399185A1 (en) | 2021-06-09 | 2022-12-15 | Applied Materials, Inc. | Plasma chamber and chamber component cleaning methods |
| US11810760B2 (en) | 2021-06-16 | 2023-11-07 | Applied Materials, Inc. | Apparatus and method of ion current compensation |
| US11569066B2 (en) | 2021-06-23 | 2023-01-31 | Applied Materials, Inc. | Pulsed voltage source for plasma processing applications |
| US11776788B2 (en) | 2021-06-28 | 2023-10-03 | Applied Materials, Inc. | Pulsed voltage boost for substrate processing |
| CN115679271B (zh) * | 2021-07-22 | 2024-09-20 | 北京北方华创微电子装备有限公司 | 半导体工艺腔室 |
| US11476090B1 (en) | 2021-08-24 | 2022-10-18 | Applied Materials, Inc. | Voltage pulse time-domain multiplexing |
| US12106938B2 (en) | 2021-09-14 | 2024-10-01 | Applied Materials, Inc. | Distortion current mitigation in a radio frequency plasma processing chamber |
| US11694876B2 (en) | 2021-12-08 | 2023-07-04 | Applied Materials, Inc. | Apparatus and method for delivering a plurality of waveform signals during plasma processing |
| US11972924B2 (en) | 2022-06-08 | 2024-04-30 | Applied Materials, Inc. | Pulsed voltage source for plasma processing applications |
| US12315732B2 (en) | 2022-06-10 | 2025-05-27 | Applied Materials, Inc. | Method and apparatus for etching a semiconductor substrate in a plasma etch chamber |
| US12272524B2 (en) | 2022-09-19 | 2025-04-08 | Applied Materials, Inc. | Wideband variable impedance load for high volume manufacturing qualification and on-site diagnostics |
| US12111341B2 (en) | 2022-10-05 | 2024-10-08 | Applied Materials, Inc. | In-situ electric field detection method and apparatus |
| WO2025192353A1 (ja) * | 2024-03-11 | 2025-09-18 | 東京エレクトロン株式会社 | Pvd成膜方法及びpvd成膜装置 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54149338A (en) | 1978-05-15 | 1979-11-22 | Anelva Corp | Thin film forming method by sputtering |
| JP2515731B2 (ja) | 1985-10-25 | 1996-07-10 | 株式会社日立製作所 | 薄膜形成装置および薄膜形成方法 |
| CZ281073B6 (cs) | 1993-09-03 | 1996-06-12 | Fyzikální ústav AVČR | Způsob rozprašování materiálu katody |
| JP2914644B2 (ja) | 1993-09-22 | 1999-07-05 | アネルバ株式会社 | 集積回路の配線方法及び集積回路における穴又は溝の埋め込み配線方法並びにマルチチャンバー基板処理装置 |
| JP2912181B2 (ja) | 1995-02-28 | 1999-06-28 | 広島日本電気株式会社 | スパッタリング装置 |
| JP2904263B2 (ja) * | 1995-12-04 | 1999-06-14 | 日本電気株式会社 | スパッタ装置 |
| JPH09256149A (ja) | 1996-03-22 | 1997-09-30 | Tokyo Electron Ltd | スパッタリング装置およびスパッタリング方法 |
| JP3957810B2 (ja) | 1997-03-27 | 2007-08-15 | 株式会社アルバック | 銅薄膜形成方法 |
| US6692617B1 (en) | 1997-05-08 | 2004-02-17 | Applied Materials, Inc. | Sustained self-sputtering reactor having an increased density plasma |
| US5897752A (en) | 1997-05-20 | 1999-04-27 | Applied Materials, Inc. | Wafer bias ring in a sustained self-sputtering reactor |
| JPH111770A (ja) * | 1997-06-06 | 1999-01-06 | Anelva Corp | スパッタリング装置及びスパッタリング方法 |
-
2000
- 2000-06-02 JP JP2000166059A patent/JP4021601B2/ja not_active Expired - Fee Related
- 2000-10-27 US US09/697,442 patent/US6423192B1/en not_active Expired - Fee Related
- 2000-10-27 TW TW089122692A patent/TW503470B/zh not_active IP Right Cessation
- 2000-10-28 KR KR10-2000-0063763A patent/KR100400968B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| TW503470B (en) | 2002-09-21 |
| JP2001192824A (ja) | 2001-07-17 |
| KR20010051319A (ko) | 2001-06-25 |
| JP4021601B2 (ja) | 2007-12-12 |
| US6423192B1 (en) | 2002-07-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
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| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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