KR100400532B1 - 다수의전자회로성분을갖는회로장치 - Google Patents

다수의전자회로성분을갖는회로장치 Download PDF

Info

Publication number
KR100400532B1
KR100400532B1 KR10-1998-0707682A KR19980707682A KR100400532B1 KR 100400532 B1 KR100400532 B1 KR 100400532B1 KR 19980707682 A KR19980707682 A KR 19980707682A KR 100400532 B1 KR100400532 B1 KR 100400532B1
Authority
KR
South Korea
Prior art keywords
circuit
open
circuit components
control
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
KR10-1998-0707682A
Other languages
English (en)
Korean (ko)
Other versions
KR20000005055A (ko
Inventor
홀거 제틀라크
슈테판 파프
클라우스 오버랜더
Original Assignee
지멘스 악티엔게젤샤프트
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 지멘스 악티엔게젤샤프트 filed Critical 지멘스 악티엔게젤샤프트
Publication of KR20000005055A publication Critical patent/KR20000005055A/ko
Application granted granted Critical
Publication of KR100400532B1 publication Critical patent/KR100400532B1/ko
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/22Modifications for ensuring a predetermined initial state when the supply voltage has been applied

Landscapes

  • Static Random-Access Memory (AREA)
  • Storage Device Security (AREA)
  • Logic Circuits (AREA)
  • Electronic Switches (AREA)
  • Signal Processing For Digital Recording And Reproducing (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
  • Dram (AREA)
  • Read Only Memory (AREA)
  • Filters And Equalizers (AREA)
KR10-1998-0707682A 1996-03-28 1997-03-26 다수의전자회로성분을갖는회로장치 Expired - Lifetime KR100400532B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19612440.9 1996-03-28
DE19612440A DE19612440C1 (de) 1996-03-28 1996-03-28 Schaltungsanordnung mit einer Anzahl von elektronischen Schaltungskomponenten

Publications (2)

Publication Number Publication Date
KR20000005055A KR20000005055A (ko) 2000-01-25
KR100400532B1 true KR100400532B1 (ko) 2003-11-15

Family

ID=7789783

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-1998-0707682A Expired - Lifetime KR100400532B1 (ko) 1996-03-28 1997-03-26 다수의전자회로성분을갖는회로장치

Country Status (13)

Country Link
US (1) US5991207A (enExample)
EP (1) EP0890173B1 (enExample)
JP (1) JP3174066B2 (enExample)
KR (1) KR100400532B1 (enExample)
CN (1) CN1163906C (enExample)
AT (1) ATE227467T1 (enExample)
BR (1) BR9708367A (enExample)
DE (2) DE19612440C1 (enExample)
ES (1) ES2186890T3 (enExample)
IN (1) IN191217B (enExample)
RU (1) RU2189082C2 (enExample)
UA (1) UA54418C2 (enExample)
WO (1) WO1997037353A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100386949B1 (ko) * 2001-03-14 2003-06-09 삼성전자주식회사 디지털 데이터 처리 시스템
JP4443067B2 (ja) * 2001-04-26 2010-03-31 富士通マイクロエレクトロニクス株式会社 プロセッサおよびそのリセット制御方法
DE10152034B4 (de) * 2001-10-23 2004-08-26 Infineon Technologies Ag Speicheranordnung
US6990011B2 (en) * 2003-05-09 2006-01-24 Stmicroelectronics, Inc. Memory circuit and method for corrupting stored data
US7224600B2 (en) * 2004-01-08 2007-05-29 Stmicroelectronics, Inc. Tamper memory cell
CA2586445A1 (en) * 2004-11-05 2006-05-18 Qualcomm Incorporated Integrated circuit with adaptive speed binning
US8548420B2 (en) * 2007-10-05 2013-10-01 Hand Held Products, Inc. Panic button for data collection device
DE102010035374A1 (de) * 2010-08-25 2012-03-01 Airbus Operations Gmbh System und Verfahren zum Sammeln von Defektdaten von Bauteilen in einer Passagierkabine eines Fahrzeugs
CN103077137A (zh) * 2011-10-25 2013-05-01 北京大豪科技股份有限公司 中断控制方法及中断控制单元
CN108664435B (zh) * 2018-07-30 2024-02-23 合肥联宝信息技术有限公司 一种数据清除电路及电子设备

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE425705B (sv) * 1980-12-23 1982-10-25 Ericsson Telefon Ab L M Anordning for att i en databasanleggning automatiskt forstora informationsinnehallet i dataminnen och programminnen
DE3318101A1 (de) * 1983-05-18 1984-11-22 Siemens AG, 1000 Berlin und 8000 München Schaltungsanordung mit einem speicher und einer zugriffskontrolleinheit
US5054000A (en) * 1988-02-19 1991-10-01 Sony Corporation Static random access memory device having a high speed read-out and flash-clear functions
US4928266A (en) * 1988-05-26 1990-05-22 Visic, Inc. Static ram with high speed, low power reset
EP0356538B1 (en) * 1988-08-27 1993-12-22 International Business Machines Corporation Arrangement in data processing system for system initialization and reset
US5381366A (en) * 1989-04-11 1995-01-10 Mitsubishi Denki Kabushiki Kaisha Non-volatile semiconductor memory device with timer controlled re-write inhibit means
DE4135767C2 (de) * 1991-10-30 2003-04-30 Adp Gauselmann Gmbh Verfahren zum Sichern von in datenspeichernden elektronischen Bauelementen gespeicherten Daten gegen einen unbefugten Zugriff und/oder Manipulation und Vorrichtung zur Durchführung des Verfahrens
US5724289A (en) * 1993-09-08 1998-03-03 Fujitsu Limited Nonvolatile semiconductor memory capable of selectively performing a pre-conditioning of threshold voltage before an erase self-test of memory cells and a method related therewith
RU2054224C1 (ru) * 1993-10-18 1996-02-10 Акционерное общество "Тейвас" Декодер с исправлением ошибок

Also Published As

Publication number Publication date
WO1997037353A1 (de) 1997-10-09
KR20000005055A (ko) 2000-01-25
ATE227467T1 (de) 2002-11-15
RU2189082C2 (ru) 2002-09-10
IN191217B (enExample) 2003-10-11
DE59708669D1 (de) 2002-12-12
EP0890173B1 (de) 2002-11-06
CN1163906C (zh) 2004-08-25
JPH11507165A (ja) 1999-06-22
EP0890173A1 (de) 1999-01-13
DE19612440C1 (de) 1997-05-07
US5991207A (en) 1999-11-23
CN1214792A (zh) 1999-04-21
UA54418C2 (uk) 2003-03-17
ES2186890T3 (es) 2003-05-16
JP3174066B2 (ja) 2001-06-11
BR9708367A (pt) 1999-08-03

Similar Documents

Publication Publication Date Title
US5944837A (en) Controlling flash memory program and erase pulses
US7750678B2 (en) Nonvolatile programmable logic circuit
KR100400532B1 (ko) 다수의전자회로성분을갖는회로장치
KR950020749A (ko) 반도체 불휘발성 기억장치
US5987581A (en) Configurable address line inverter for remapping memory
KR970012736A (ko) 반도체 메모리 장치의 초기화 회로
EP0062438A2 (en) Microcomputer having memory content protecting means
US5265048A (en) Semiconductor storage device and method of accessing the same
JP3578175B2 (ja) メモリワードの管理回路
US5392235A (en) Semiconductor memory device
US4858180A (en) Content addressable memory and self-blocking driver
US6108232A (en) Method for the erasure of a static RAM and corresponding integrated circuit memory
US4048629A (en) Low power mos ram address decode circuit
KR970007572A (ko) 컴퓨터 확장 슬롯의 전원 제어 회로
KR960038979A (ko) 외부 입출력제어신호에 대한 입력버퍼회로의 관통전류를 제어할 수 있는 다이나믹형 반도체 기억장치
KR930001653B1 (ko) 불휘발성 반도체 기억장치
KR950010142B1 (ko) 라이트 인에이블 (we) 버퍼 보호 회로
US6870383B2 (en) Semiconductor device with high speed switching of test modes
RU98119735A (ru) Полупроводниковое запоминающее устройство
KR100238239B1 (ko) 반도체 메모리 장치의 승압 전압 발생기
US6111809A (en) Line decoder for a low supply voltage memory device
KR960035641A (ko) 라이트 리커버리 제어회로 및 그 제어방법
US6977862B2 (en) Address decoding circuit and method for addressing a regular memory area and a redundant memory area in a memory circuit
JPH02171984A (ja) 半導体集積回路
KR100261557B1 (ko) 로칼시스템

Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 19980928

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20011127

Comment text: Request for Examination of Application

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

Patent event code: PE07011S01D

Comment text: Decision to Grant Registration

Patent event date: 20030630

GRNT Written decision to grant
PR0701 Registration of establishment

Comment text: Registration of Establishment

Patent event date: 20030923

Patent event code: PR07011E01D

PR1002 Payment of registration fee

Payment date: 20030924

End annual number: 3

Start annual number: 1

PG1601 Publication of registration
PR1001 Payment of annual fee

Payment date: 20060830

Start annual number: 4

End annual number: 4

PR1001 Payment of annual fee

Payment date: 20070829

Start annual number: 5

End annual number: 5

PR1001 Payment of annual fee

Payment date: 20080828

Start annual number: 6

End annual number: 6

PR1001 Payment of annual fee

Payment date: 20090915

Start annual number: 7

End annual number: 7

PR1001 Payment of annual fee

Payment date: 20100916

Start annual number: 8

End annual number: 8

PR1001 Payment of annual fee

Payment date: 20110920

Start annual number: 9

End annual number: 9

FPAY Annual fee payment

Payment date: 20120917

Year of fee payment: 10

PR1001 Payment of annual fee

Payment date: 20120917

Start annual number: 10

End annual number: 10

FPAY Annual fee payment

Payment date: 20130913

Year of fee payment: 11

PR1001 Payment of annual fee

Payment date: 20130913

Start annual number: 11

End annual number: 11

FPAY Annual fee payment

Payment date: 20140912

Year of fee payment: 12

PR1001 Payment of annual fee

Payment date: 20140912

Start annual number: 12

End annual number: 12

FPAY Annual fee payment

Payment date: 20150911

Year of fee payment: 13

PR1001 Payment of annual fee

Payment date: 20150911

Start annual number: 13

End annual number: 13

FPAY Annual fee payment

Payment date: 20160919

Year of fee payment: 14

PR1001 Payment of annual fee

Payment date: 20160919

Start annual number: 14

End annual number: 14

EXPY Expiration of term
PC1801 Expiration of term

Termination date: 20170926

Termination category: Expiration of duration