KR100394030B1 - 적층형 반도체 패키지 - Google Patents
적층형 반도체 패키지 Download PDFInfo
- Publication number
- KR100394030B1 KR100394030B1 KR10-2001-0002160A KR20010002160A KR100394030B1 KR 100394030 B1 KR100394030 B1 KR 100394030B1 KR 20010002160 A KR20010002160 A KR 20010002160A KR 100394030 B1 KR100394030 B1 KR 100394030B1
- Authority
- KR
- South Korea
- Prior art keywords
- chip
- lead
- semiconductor package
- solder
- lead frame
- Prior art date
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 42
- 239000008393 encapsulating agent Substances 0.000 claims abstract description 10
- 229910000679 solder Inorganic materials 0.000 claims description 29
- 239000000463 material Substances 0.000 claims description 4
- 239000010936 titanium Substances 0.000 claims description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 3
- 238000000034 method Methods 0.000 claims description 3
- 229910052719 titanium Inorganic materials 0.000 claims description 3
- 238000005530 etching Methods 0.000 claims description 2
- 239000011248 coating agent Substances 0.000 claims 2
- 238000000576 coating method Methods 0.000 claims 2
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 2
- 238000005538 encapsulation Methods 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
- H01L23/49548—Cross section geometry
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- H—ELECTRICITY
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
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- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0657—Stacked arrangements of devices
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- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/10—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers
- H01L25/105—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being of a type provided for in group H01L27/00
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0556—Disposition
- H01L2224/05568—Disposition the whole external layer protruding from the surface
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05573—Single external layer
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16245—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06517—Bump or bump-like direct electrical connections from device to substrate
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- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06572—Auxiliary carrier between devices, the carrier having an electrical connection structure
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/10—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers
- H01L2225/1005—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/1011—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement
- H01L2225/1017—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement the lowermost container comprising a device support
- H01L2225/1029—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement the lowermost container comprising a device support the support being a lead frame
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/10—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers
- H01L2225/1005—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/1011—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement
- H01L2225/1041—Special adaptations for top connections of the lowermost container, e.g. redistribution layer, integral interposer
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- H—ELECTRICITY
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
- H01L2924/1815—Shape
- H01L2924/1816—Exposing the passive side of the semiconductor or solid-state body
- H01L2924/18161—Exposing the passive side of the semiconductor or solid-state body of a flip chip
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/35—Mechanical effects
- H01L2924/351—Thermal stress
- H01L2924/3511—Warping
Abstract
Description
Claims (7)
- 내측부위를 이루면서 그의 상하면에는 제1칩 및 제2칩이 각각 장착되도록 이루어진 칩 장착부 및 외측부위를 이루면서 그 상면 및 하면이 외부로 놀출되도록 돌출 형성된 랜드부가 일체로 형성되어 이루어진 리드프레임과;상기 리드프레임의 내측부위에 위치되는 각 칩 장착부의 상면 및 하면에 각각 형성되어 상기 리드 프레임과 상기 각 칩 간의 전기적 연결을 수행하는 솔더 범프; 그리고,상기 각 칩 및 상기 리드프레임을 외부로부터 보호하기 위해 봉지되는 봉지제:를 포함하여 이루어지며, 적어도 둘 이상이 서로 적층되는 적층형 반도체 패키지.
- 삭제
- 제1항에 있어서,상기 각 리드의 상기 솔더 범프가 형성된 영역의 주위를 따라솔더와의 젖음성이 나쁜 솔더 마스크 물질로 코팅함을 특징으로 하는 적층형 반도체 패키지.
- 삭제
- 삭제
- 삭제
- 리드프레임을 형성하는 각 리드의 일면 내측부를 하프 에칭하여 칩 장착부를 형성하는 제1단계;상기 각 리드의 칩 장착부 주위에 솔더와의 젖음성이 나쁜 솔더 레지스트 또는 티타늄등과 같은 솔더 마스크 물질을 코팅하는 제2단계;상기 각 리드의 칩 장착부에 솔더범프를 구비하는 제3단계;상기 솔더범프에 본딩패드를 형성한 제1칩 및 제2칩을 각각 전기적으로 연결하는 제4단계; 그리고,상기 각 칩의 일부 및 랜드부가 외부로 노출되도록 그 주위를 봉지제로 봉지하는 제5단계:가 포함되어 제조됨을 특징으로 하는 적층형 반도체 패키지의 제조 방법.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0002160A KR100394030B1 (ko) | 2001-01-15 | 2001-01-15 | 적층형 반도체 패키지 |
US10/044,141 US20020093093A1 (en) | 2001-01-15 | 2002-01-11 | Semiconductor package with stacked dies |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0002160A KR100394030B1 (ko) | 2001-01-15 | 2001-01-15 | 적층형 반도체 패키지 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20020061222A KR20020061222A (ko) | 2002-07-24 |
KR100394030B1 true KR100394030B1 (ko) | 2003-08-06 |
Family
ID=19704635
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2001-0002160A KR100394030B1 (ko) | 2001-01-15 | 2001-01-15 | 적층형 반도체 패키지 |
Country Status (2)
Country | Link |
---|---|
US (1) | US20020093093A1 (ko) |
KR (1) | KR100394030B1 (ko) |
Families Citing this family (15)
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JP2005158814A (ja) * | 2003-11-20 | 2005-06-16 | Alps Electric Co Ltd | 電子回路ユニット |
US8294279B2 (en) * | 2005-01-25 | 2012-10-23 | Megica Corporation | Chip package with dam bar restricting flow of underfill |
KR100885419B1 (ko) * | 2006-04-26 | 2009-02-24 | 삼성전자주식회사 | 적층형 패키지 구조체 |
US20080237814A1 (en) * | 2007-03-26 | 2008-10-02 | National Semiconductor Corporation | Isolated solder pads |
US7705476B2 (en) * | 2007-11-06 | 2010-04-27 | National Semiconductor Corporation | Integrated circuit package |
US7619303B2 (en) * | 2007-12-20 | 2009-11-17 | National Semiconductor Corporation | Integrated circuit package |
US20090160039A1 (en) * | 2007-12-20 | 2009-06-25 | National Semiconductor Corporation | Method and leadframe for packaging integrated circuits |
US7868453B2 (en) | 2008-02-15 | 2011-01-11 | International Business Machines Corporation | Solder interconnect pads with current spreading layers |
KR101040311B1 (ko) * | 2008-12-24 | 2011-06-10 | 에스티에스반도체통신 주식회사 | 반도체 패키지 및 그 형성 방법 |
US8435835B2 (en) * | 2010-09-02 | 2013-05-07 | Stats Chippac, Ltd. | Semiconductor device and method of forming base leads from base substrate as standoff for stacking semiconductor die |
JP2015144216A (ja) * | 2014-01-31 | 2015-08-06 | 株式会社東芝 | 半導体装置及びその製造方法 |
CN105448871B (zh) * | 2014-08-18 | 2019-03-08 | 万国半导体股份有限公司 | 功率半导体器件及制备方法 |
US9337131B2 (en) * | 2014-09-29 | 2016-05-10 | Alpha And Omega Semiconductor (Cayman) Ltd. | Power semiconductor device and the preparation method |
TWI562255B (en) * | 2015-05-04 | 2016-12-11 | Chipmos Technologies Inc | Chip package structure and manufacturing method thereof |
KR102213604B1 (ko) * | 2017-02-15 | 2021-02-05 | 매그나칩 반도체 유한회사 | 반도체 패키지 장치 |
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