KR100242788B1 - 압축가스 입자분석 장치 및 방법 - Google Patents
압축가스 입자분석 장치 및 방법 Download PDFInfo
- Publication number
- KR100242788B1 KR100242788B1 KR1019930001157A KR930001157A KR100242788B1 KR 100242788 B1 KR100242788 B1 KR 100242788B1 KR 1019930001157 A KR1019930001157 A KR 1019930001157A KR 930001157 A KR930001157 A KR 930001157A KR 100242788 B1 KR100242788 B1 KR 100242788B1
- Authority
- KR
- South Korea
- Prior art keywords
- gas
- pressure
- valve means
- sensor
- compressed gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N7/00—Analysing materials by measuring the pressure or volume of a gas or vapour
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
- G01N33/0029—Cleaning of the detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0026—General constructional details of gas analysers, e.g. portable test equipment using an alternating circulation of another gas
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/24—Suction devices
- G01N2001/242—Injectors or ejectors
- G01N2001/244—Injectors or ejectors using critical flow orifices
Landscapes
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Combustion & Propulsion (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Dispersion Chemistry (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US7/828,403 | 1992-01-31 | ||
| US07/828,403 US5209102A (en) | 1992-01-31 | 1992-01-31 | Method of introducing and controlling compressed gases for impurity analysis |
| US07/828,403 | 1992-01-31 | ||
| JP92-230493 | 1992-08-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR930016771A KR930016771A (ko) | 1993-08-30 |
| KR100242788B1 true KR100242788B1 (ko) | 2000-03-02 |
Family
ID=25251708
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019930001157A Expired - Fee Related KR100242788B1 (ko) | 1992-01-31 | 1993-01-29 | 압축가스 입자분석 장치 및 방법 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US5209102A (enExample) |
| EP (1) | EP0557150B1 (enExample) |
| JP (1) | JP3179611B2 (enExample) |
| KR (1) | KR100242788B1 (enExample) |
| CA (1) | CA2088378A1 (enExample) |
| DE (1) | DE69310570T2 (enExample) |
| TW (1) | TW215950B (enExample) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5324344A (en) * | 1993-03-31 | 1994-06-28 | Brown & Williamson Tobacco Corporation | System for and method to verify proper operation of a particulate emission detector |
| US5487313A (en) * | 1993-11-30 | 1996-01-30 | Microsensor Technology, Inc. | Fluid-lock fixed-volume injector |
| US5665902A (en) * | 1994-05-10 | 1997-09-09 | American Air Liquide, Inc. | Method to analyze particle contaminants in compressed gases |
| JP3459071B2 (ja) * | 1995-03-03 | 2003-10-20 | アジレント・テクノロジーズ・インク | バックフラッシュ機能を備えた定積インジェクタ |
| KR0176152B1 (ko) * | 1995-05-29 | 1999-04-15 | 김광호 | 반도체 장치의 제조과정에서 발생하는 오염입자의 측정장치, 측정방법 및 그 분석 방법 |
| US5537879A (en) * | 1995-08-02 | 1996-07-23 | Praxair Technology, Inc. | Particle sampling system for gas supply system |
| US5627328A (en) * | 1995-12-29 | 1997-05-06 | Gas Research Institute | Gas sampling system and method |
| US5814741A (en) * | 1996-03-01 | 1998-09-29 | American Air Liquide Inc. | Metal sampling method and system for non-hydrolyzable gases |
| KR100251645B1 (ko) * | 1997-03-21 | 2000-04-15 | 윤종용 | 반도체 공정용 가스 평가장치에 결합되는 샘플가스 분배 장치 및 구동방법 |
| KR100511948B1 (ko) * | 1998-03-06 | 2005-11-08 | 삼성전자주식회사 | 반도체장치 제조용 불순물 분석장치 |
| JP3933312B2 (ja) * | 1998-08-06 | 2007-06-20 | 株式会社前田シェルサービス | 圧縮空気中の微粒子計数装置並びに圧縮空気中の微粒子計数方法 |
| US6314793B1 (en) * | 1999-09-28 | 2001-11-13 | Gas Research Institute | Test device for measuring chemical emissions |
| US6474144B1 (en) * | 2000-03-18 | 2002-11-05 | John Barnes | Determining the level of particulate contamination in a fluid power system |
| US7867779B2 (en) | 2005-02-03 | 2011-01-11 | Air Products And Chemicals, Inc. | System and method comprising same for measurement and/or analysis of particles in gas stream |
| DE102012008423A1 (de) * | 2012-04-30 | 2013-10-31 | E.On New Build & Technology Gmbh | Einrichtung und Verfahren zur aggregierten Probenahme von Gas |
| GB201212878D0 (en) | 2012-07-20 | 2012-09-05 | Pike Justin | Authentication method and system |
| FR3010482B1 (fr) * | 2013-09-12 | 2015-10-16 | Air Liquide | Dispositif d'echantillonnage de gaz et station de remplissage comprenant un tel dispositif |
| US20150321859A1 (en) * | 2014-05-06 | 2015-11-12 | Air Liquide Large Industries U.S. Lp | Method And Apparatus For Providing Over-Pressure Protection For An Underground Storage Cavern |
| JP2016058642A (ja) * | 2014-09-11 | 2016-04-21 | 株式会社東芝 | 粒子供給装置及び方法 |
| GB201520741D0 (en) | 2015-05-27 | 2016-01-06 | Mypinpad Ltd And Licentia Group Ltd | Authentication methods and systems |
| CN109991043B (zh) * | 2017-12-31 | 2022-07-05 | 中国人民解放军63653部队 | 基于高温管式气氛炉的差压式取气测量系统 |
| GB201916441D0 (en) | 2019-11-12 | 2019-12-25 | Mypinpad Ltd | Computer-implemented system and method |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5027642A (en) * | 1987-10-13 | 1991-07-02 | American Air Liquide | Method of detecting and or removing trace amounts of condensible vapors from compressed gas |
| US4964278A (en) * | 1989-03-06 | 1990-10-23 | American Air Liquide | Method of separating condensible vapors from particles in highly compressed gases |
| US4962673A (en) * | 1989-03-08 | 1990-10-16 | American Air Liquide | Pressure reduction device for particle sampling from compressed gases |
-
1992
- 1992-01-31 US US07/828,403 patent/US5209102A/en not_active Expired - Lifetime
-
1993
- 1993-01-19 TW TW082100331A patent/TW215950B/zh active
- 1993-01-29 EP EP93400229A patent/EP0557150B1/en not_active Expired - Lifetime
- 1993-01-29 CA CA002088378A patent/CA2088378A1/en not_active Abandoned
- 1993-01-29 KR KR1019930001157A patent/KR100242788B1/ko not_active Expired - Fee Related
- 1993-01-29 JP JP01431393A patent/JP3179611B2/ja not_active Expired - Fee Related
- 1993-01-29 DE DE69310570T patent/DE69310570T2/de not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR930016771A (ko) | 1993-08-30 |
| EP0557150A1 (en) | 1993-08-25 |
| CA2088378A1 (en) | 1993-08-01 |
| EP0557150B1 (en) | 1997-05-14 |
| DE69310570D1 (de) | 1997-06-19 |
| US5209102A (en) | 1993-05-11 |
| DE69310570T2 (de) | 1997-11-13 |
| JP3179611B2 (ja) | 2001-06-25 |
| JPH05273113A (ja) | 1993-10-22 |
| TW215950B (enExample) | 1993-11-11 |
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St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
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| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
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| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
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| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
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| PA0201 | Request for examination |
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| LAPS | Lapse due to unpaid annual fee | ||
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