KR100194202B1 - 정전기 방전 보호장치 - Google Patents
정전기 방전 보호장치 Download PDFInfo
- Publication number
- KR100194202B1 KR100194202B1 KR1019960011911A KR19960011911A KR100194202B1 KR 100194202 B1 KR100194202 B1 KR 100194202B1 KR 1019960011911 A KR1019960011911 A KR 1019960011911A KR 19960011911 A KR19960011911 A KR 19960011911A KR 100194202 B1 KR100194202 B1 KR 100194202B1
- Authority
- KR
- South Korea
- Prior art keywords
- impurity region
- high concentration
- concentration impurity
- type
- well
- Prior art date
Links
- 239000012535 impurity Substances 0.000 claims abstract description 63
- 239000004065 semiconductor Substances 0.000 claims abstract description 8
- 239000000758 substrate Substances 0.000 claims abstract description 5
- 239000008280 blood Substances 0.000 claims description 2
- 210000004369 blood Anatomy 0.000 claims description 2
- 230000005669 field effect Effects 0.000 description 3
- 230000015556 catabolic process Effects 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 230000006378 damage Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000010354 integration Effects 0.000 description 1
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/711—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using bipolar transistors as protective elements
- H10D89/713—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using bipolar transistors as protective elements including a PNP transistor and a NPN transistor, wherein each of said transistors has its base region coupled to the collector region of the other transistor, e.g. silicon controlled rectifier [SCR] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D10/00—Bipolar junction transistors [BJT]
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
Description
Claims (2)
- 제1전도형 반도체 기판의 일부영역에 형성된 제2전도형 웰; 상기 웰의 저면에 형성된 고농도의 제2전도형 매몰층; 상기 웰의 표면 일부영역에 형성된 필드산화막; 상기 필드산화막의 일단에 인접한 웰의 표면으로부터 상기 매몰층까지 형성된 제1전도형의 제1불순물 영역; 상기 필드산화막의 타단에 인접한 웰의 표면으로부터 상기 매몰층까지 형성된 제1전도형의 제2불순물 영역; 상기 제1불순물 영역의 표면 근방에 형성된 제1전도형 제1고농도 불순물 영역; 상기 제2불순물 영역의 표면 근방에 형성된 제1전도형 제2고농도 불순물 영역; 상기 제2고농도 불순물 영역에 이웃한, 웰의 표면 가장자리 근방에 형성된 제2전도형 고농도 불순물 영역; 상기 필드산화막 상에 형성되고 입출력패드와 전기적 연결된 필드 게이트 전극층; 상기 제1고농도 불순물 영역에 콘택하고 저항을 통하여 상기 입출력패드에 전기적 연결된 제1전극층; 상기 제2고농도 불순물 영역에 콘택하고 접지전원단자에 연결된 제2전극층; 그리고 상기 제2전도형의 고농도 불순물 영역에 콘택하고 상기 접지전원단자에 전기적 연결된 제3전극층을 구비한 것을 특징으로 하는 정전기 방전 보호장치.
- 제1항에 있어서, 상기 제1전도형은 엔형이고 제2전도형은 피형인 것을 특징으로 하는 정전기 방전 보호장치.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019960011911A KR100194202B1 (ko) | 1996-04-19 | 1996-04-19 | 정전기 방전 보호장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019960011911A KR100194202B1 (ko) | 1996-04-19 | 1996-04-19 | 정전기 방전 보호장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970072389A KR970072389A (ko) | 1997-11-07 |
KR100194202B1 true KR100194202B1 (ko) | 1999-06-15 |
Family
ID=66222853
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019960011911A KR100194202B1 (ko) | 1996-04-19 | 1996-04-19 | 정전기 방전 보호장치 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100194202B1 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100494143B1 (ko) * | 1997-12-31 | 2005-09-02 | 주식회사 하이닉스반도체 | 반도체장치의 필드트랜지스터 구조 |
KR100970437B1 (ko) | 2008-01-24 | 2010-07-15 | 인제대학교 산학협력단 | 고전압 보호회로 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20020057086A (ko) * | 2000-12-30 | 2002-07-11 | 임철호 | 집적회로의 정전기 보호 입출력회로 제조공정 |
-
1996
- 1996-04-19 KR KR1019960011911A patent/KR100194202B1/ko not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100494143B1 (ko) * | 1997-12-31 | 2005-09-02 | 주식회사 하이닉스반도체 | 반도체장치의 필드트랜지스터 구조 |
KR100970437B1 (ko) | 2008-01-24 | 2010-07-15 | 인제대학교 산학협력단 | 고전압 보호회로 |
Also Published As
Publication number | Publication date |
---|---|
KR970072389A (ko) | 1997-11-07 |
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