KR0141485B1 - 자전관 음극 스퍼터링 장치용 타게트 - Google Patents
자전관 음극 스퍼터링 장치용 타게트Info
- Publication number
- KR0141485B1 KR0141485B1 KR1019890008012A KR890008012A KR0141485B1 KR 0141485 B1 KR0141485 B1 KR 0141485B1 KR 1019890008012 A KR1019890008012 A KR 1019890008012A KR 890008012 A KR890008012 A KR 890008012A KR 0141485 B1 KR0141485 B1 KR 0141485B1
- Authority
- KR
- South Korea
- Prior art keywords
- target
- hexagonal
- phase
- targets
- magnetron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C19/00—Alloys based on nickel or cobalt
- C22C19/07—Alloys based on nickel or cobalt based on cobalt
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physical Vapour Deposition (AREA)
- Coating By Spraying Or Casting (AREA)
- Electrodes For Compound Or Non-Metal Manufacture (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE3819906A DE3819906C1 (enExample) | 1988-06-11 | 1988-06-11 | |
| DE3819906.9 | 1988-06-11 | ||
| DE3819906.8 | 1988-06-11 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR900000963A KR900000963A (ko) | 1990-01-31 |
| KR0141485B1 true KR0141485B1 (ko) | 1998-06-01 |
Family
ID=6356335
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019890008012A Expired - Fee Related KR0141485B1 (ko) | 1988-06-11 | 1989-06-10 | 자전관 음극 스퍼터링 장치용 타게트 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US5112468A (enExample) |
| EP (1) | EP0346599B1 (enExample) |
| JP (1) | JPH0794709B2 (enExample) |
| KR (1) | KR0141485B1 (enExample) |
| AT (1) | ATE89609T1 (enExample) |
| DE (2) | DE3819906C1 (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5282946A (en) * | 1991-08-30 | 1994-02-01 | Mitsubishi Materials Corporation | Platinum-cobalt alloy sputtering target and method for manufacturing same |
| EP0659901B1 (de) * | 1993-12-20 | 1998-04-15 | LEYBOLD MATERIALS GmbH | Target für Magnetron-Kathodenzerstäubungsanlage aus einer Kobalt-Basislegierung |
| DE4438202A1 (de) * | 1994-10-26 | 1996-05-02 | Leybold Materials Gmbh | Target für eine Magnetron-Kathodenzerstäubungsvorrichtung |
| DE19508535A1 (de) * | 1995-03-10 | 1996-09-12 | Leybold Materials Gmbh | Sputtertarget aus einer Kobalt-Basislegierung mit hohem Magnetfelddurchgriff |
| US6030514A (en) * | 1997-05-02 | 2000-02-29 | Sony Corporation | Method of reducing sputtering burn-in time, minimizing sputtered particulate, and target assembly therefor |
| US6391172B2 (en) | 1997-08-26 | 2002-05-21 | The Alta Group, Inc. | High purity cobalt sputter target and process of manufacturing the same |
| US6190516B1 (en) * | 1999-10-06 | 2001-02-20 | Praxair S.T. Technology, Inc. | High magnetic flux sputter targets with varied magnetic permeability in selected regions |
| US6176944B1 (en) | 1999-11-01 | 2001-01-23 | Praxair S.T. Technology, Inc. | Method of making low magnetic permeability cobalt sputter targets |
| US6514358B1 (en) | 2000-04-05 | 2003-02-04 | Heraeus, Inc. | Stretching of magnetic materials to increase pass-through-flux (PTF) |
| WO2002002848A2 (en) * | 2000-06-30 | 2002-01-10 | Honeywell International Inc. | Method and apparatus for processing metals, and the metals so produced |
| JPWO2007066555A1 (ja) * | 2005-12-05 | 2009-05-14 | 独立行政法人科学技術振興機構 | Co基合金及びその製造方法 |
| CN111155060A (zh) * | 2018-11-07 | 2020-05-15 | 宁波江丰电子材料股份有限公司 | 钴靶坯的制作方法 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2981620A (en) * | 1959-08-24 | 1961-04-25 | Westinghouse Electric Corp | Cobalt-nickel base alloy |
| US3100167A (en) * | 1960-10-19 | 1963-08-06 | Gen Electric | Magnetic material |
| JPS5696061A (en) * | 1979-12-28 | 1981-08-03 | Matsushita Electric Ind Co Ltd | Cobalt-nickel alloy magnetic thin film |
| JPS6314864A (ja) * | 1986-07-08 | 1988-01-22 | Ulvac Corp | Co基合金スパツタタ−ゲツトおよびその製造法 |
-
1988
- 1988-06-11 DE DE3819906A patent/DE3819906C1/de not_active Expired
-
1989
- 1989-04-22 DE DE8989107319T patent/DE58904394D1/de not_active Expired - Lifetime
- 1989-04-22 AT AT89107319T patent/ATE89609T1/de not_active IP Right Cessation
- 1989-04-22 EP EP89107319A patent/EP0346599B1/de not_active Expired - Lifetime
- 1989-06-10 KR KR1019890008012A patent/KR0141485B1/ko not_active Expired - Fee Related
- 1989-06-12 JP JP1146940A patent/JPH0794709B2/ja not_active Expired - Lifetime
-
1991
- 1991-02-04 US US07/651,050 patent/US5112468A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0251839A (ja) | 1990-02-21 |
| US5112468A (en) | 1992-05-12 |
| EP0346599A1 (de) | 1989-12-20 |
| EP0346599B1 (de) | 1993-05-19 |
| DE3819906C1 (enExample) | 1989-08-03 |
| DE58904394D1 (de) | 1993-06-24 |
| JPH0794709B2 (ja) | 1995-10-11 |
| ATE89609T1 (de) | 1993-06-15 |
| KR900000963A (ko) | 1990-01-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR0141485B1 (ko) | 자전관 음극 스퍼터링 장치용 타게트 | |
| Kennedy et al. | Rapid method for determining ternary‐alloy phase diagrams | |
| US4159909A (en) | Cathode target material compositions for magnetic sputtering | |
| Waits | Planar magnetron sputtering | |
| US3560200A (en) | Permanent magnetic materials | |
| KR100552500B1 (ko) | 고순도 코발트 스퍼터 타겟 및 제조 과정 | |
| US6176944B1 (en) | Method of making low magnetic permeability cobalt sputter targets | |
| US4600490A (en) | Anode for magnetic sputtering | |
| Fan et al. | A cross-corner effect in a rectangular sputtering magnetron | |
| Sproul | Multi-cathode unbalanced magnetron sputtering systems | |
| JPH0249384B2 (enExample) | ||
| Rathenau et al. | Electron-optical observations of transformations in eutectoid steel | |
| KR20050007566A (ko) | 고순도 강자성 스퍼터 타겟 | |
| Echlin | Recent advances in specimen coating techniques. | |
| US5728279A (en) | Cobalt base alloy target for a magnetron cathode sputtering system | |
| Spencer et al. | The design and performance of planar magnetron sputtering cathodes | |
| Hofer | Anisotropic emission in single crystal sputtering measurements on HCP single crystals | |
| JPS59179784A (ja) | スパツタ装置 | |
| Swann | Spatial distribution of sputtered atoms from magnetron source | |
| Hoffman | Film stress diagnostics in the sputter deposition of metals | |
| Dahlgren | TREATISE ON MATERIALS SCIENCE AND TECHNOLOGY, VOL. 19A | |
| JP4698779B2 (ja) | 磁性体スパッタリングターゲット及びその製造方法 | |
| RU1770390C (ru) | Способ термической обработки металлических изделий | |
| JPH0790560A (ja) | 高純度チタニウムスパッタリングターゲット | |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
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| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
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| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
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| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
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| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
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| FPAY | Annual fee payment |
Payment date: 20030224 Year of fee payment: 6 |
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| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6 |
|
| LAPS | Lapse due to unpaid annual fee | ||
| PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 20040321 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
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| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 20040321 |
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| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |