JPWO2024162171A5 - - Google Patents
Info
- Publication number
- JPWO2024162171A5 JPWO2024162171A5 JP2024574836A JP2024574836A JPWO2024162171A5 JP WO2024162171 A5 JPWO2024162171 A5 JP WO2024162171A5 JP 2024574836 A JP2024574836 A JP 2024574836A JP 2024574836 A JP2024574836 A JP 2024574836A JP WO2024162171 A5 JPWO2024162171 A5 JP WO2024162171A5
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- processing apparatus
- plasma processing
- substrate support
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023015672 | 2023-02-03 | ||
| PCT/JP2024/002218 WO2024162171A1 (ja) | 2023-02-03 | 2024-01-25 | プラズマ処理装置及びプラズマエッチング方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2024162171A1 JPWO2024162171A1 (https=) | 2024-08-08 |
| JPWO2024162171A5 true JPWO2024162171A5 (https=) | 2025-10-16 |
Family
ID=92146646
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024574836A Pending JPWO2024162171A1 (https=) | 2023-02-03 | 2024-01-25 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20250349524A1 (https=) |
| JP (1) | JPWO2024162171A1 (https=) |
| TW (1) | TW202503828A (https=) |
| WO (1) | WO2024162171A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2022224795A1 (ja) * | 2021-04-23 | 2022-10-27 | 東京エレクトロン株式会社 | プラズマ処理装置及び基板処理方法 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05251397A (ja) * | 1992-03-05 | 1993-09-28 | Fujitsu Ltd | 基板温度の測定方法 |
| JPH08222549A (ja) * | 1995-02-16 | 1996-08-30 | Sony Corp | プラズマ処理装置およびプラズマ処理方法 |
| JP2020043180A (ja) * | 2018-09-07 | 2020-03-19 | 東京エレクトロン株式会社 | 基板処理装置及び基板処理方法 |
| WO2020110192A1 (ja) * | 2018-11-27 | 2020-06-04 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置及びそれを用いた試料の処理方法 |
-
2024
- 2024-01-25 WO PCT/JP2024/002218 patent/WO2024162171A1/ja not_active Ceased
- 2024-01-25 JP JP2024574836A patent/JPWO2024162171A1/ja active Pending
- 2024-01-31 TW TW113103674A patent/TW202503828A/zh unknown
-
2025
- 2025-07-24 US US19/278,865 patent/US20250349524A1/en active Pending
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