JPWO2023277039A1 - - Google Patents
Info
- Publication number
- JPWO2023277039A1 JPWO2023277039A1 JP2023531997A JP2023531997A JPWO2023277039A1 JP WO2023277039 A1 JPWO2023277039 A1 JP WO2023277039A1 JP 2023531997 A JP2023531997 A JP 2023531997A JP 2023531997 A JP2023531997 A JP 2023531997A JP WO2023277039 A1 JPWO2023277039 A1 JP WO2023277039A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
- G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/426—Imaging image comparing, unknown with known substance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021108333 | 2021-06-30 | ||
| JP2021108333 | 2021-06-30 | ||
| PCT/JP2022/025838 WO2023277039A1 (ja) | 2021-06-30 | 2022-06-28 | 透過ｘ線検査装置、及び透過ｘ線検査方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2023277039A1 true JPWO2023277039A1 (https=) | 2023-01-05 |
| JPWO2023277039A5 JPWO2023277039A5 (https=) | 2025-05-26 |
| JP7846111B2 JP7846111B2 (ja) | 2026-04-14 |
Family
ID=84691447
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023531997A Active JP7846111B2 (ja) | 2021-06-30 | 2022-06-28 | 透過ｘ線検査装置、及び透過ｘ線検査方法 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP7846111B2 (https=) |
| CN (1) | CN117546011A (https=) |
| DE (1) | DE112022003317T5 (https=) |
| WO (1) | WO2023277039A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2025006215A (ja) * | 2023-06-29 | 2025-01-17 | アンリツ株式会社 | Ｘ線検査装置および物品検査システムならびにｘ線画像形成装置 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5596620A (en) * | 1993-04-30 | 1997-01-21 | The University Of Connecticut | X-ray based extensometry device for radiography |
| JPH10318943A (ja) * | 1997-05-20 | 1998-12-04 | Shimadzu Corp | 異物検査装置 |
| JP2012049134A (ja) * | 2010-08-30 | 2012-03-08 | General Electric Co <Ge> | 勾配付き多層光学装置を用いたファン形ｘ線ビーム・イメージング・システム |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5329103B2 (ja) * | 2008-02-01 | 2013-10-30 | ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー | 画像処理装置及びｘ線ｃｔ装置 |
| KR101228911B1 (ko) * | 2010-08-06 | 2013-02-15 | 라드텍주식회사 | 이중 에너지 ｘ-선 흡광분석을 이용한 ｘ-선 영상장치 |
| JP6783456B2 (ja) * | 2016-08-24 | 2020-11-11 | 株式会社日立ハイテクサイエンス | Ｘ線透過検査装置 |
| JP6878038B2 (ja) * | 2017-02-15 | 2021-05-26 | キヤノン株式会社 | 放射線撮影装置、放射線撮影システム、画像処理装置、画像処理装置の作動方法、及びプログラム |
| JP6663374B2 (ja) | 2017-02-28 | 2020-03-11 | アンリツインフィビス株式会社 | Ｘ線検査装置 |
-
2022
- 2022-06-28 WO PCT/JP2022/025838 patent/WO2023277039A1/ja not_active Ceased
- 2022-06-28 DE DE112022003317.7T patent/DE112022003317T5/de active Pending
- 2022-06-28 JP JP2023531997A patent/JP7846111B2/ja active Active
- 2022-06-28 CN CN202280044285.1A patent/CN117546011A/zh active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5596620A (en) * | 1993-04-30 | 1997-01-21 | The University Of Connecticut | X-ray based extensometry device for radiography |
| JPH10318943A (ja) * | 1997-05-20 | 1998-12-04 | Shimadzu Corp | 異物検査装置 |
| JP2012049134A (ja) * | 2010-08-30 | 2012-03-08 | General Electric Co <Ge> | 勾配付き多層光学装置を用いたファン形ｘ線ビーム・イメージング・システム |
Also Published As
| Publication number | Publication date |
|---|---|
| JP7846111B2 (ja) | 2026-04-14 |
| DE112022003317T5 (de) | 2024-04-11 |
| WO2023277039A1 (ja) | 2023-01-05 |
| CN117546011A (zh) | 2024-02-09 |
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