JPWO2023234153A5 - - Google Patents

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Publication number
JPWO2023234153A5
JPWO2023234153A5 JP2024524786A JP2024524786A JPWO2023234153A5 JP WO2023234153 A5 JPWO2023234153 A5 JP WO2023234153A5 JP 2024524786 A JP2024524786 A JP 2024524786A JP 2024524786 A JP2024524786 A JP 2024524786A JP WO2023234153 A5 JPWO2023234153 A5 JP WO2023234153A5
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JP
Japan
Prior art keywords
sample chamber
unit
radiation detection
radiation
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024524786A
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English (en)
Japanese (ja)
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JPWO2023234153A1 (https=
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Publication date
Application filed filed Critical
Priority claimed from PCT/JP2023/019416 external-priority patent/WO2023234153A1/ja
Publication of JPWO2023234153A1 publication Critical patent/JPWO2023234153A1/ja
Publication of JPWO2023234153A5 publication Critical patent/JPWO2023234153A5/ja
Pending legal-status Critical Current

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JP2024524786A 2022-05-31 2023-05-25 Pending JPWO2023234153A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022088954 2022-05-31
PCT/JP2023/019416 WO2023234153A1 (ja) 2022-05-31 2023-05-25 放射線検出装置、制御方法及びコンピュータプログラム

Publications (2)

Publication Number Publication Date
JPWO2023234153A1 JPWO2023234153A1 (https=) 2023-12-07
JPWO2023234153A5 true JPWO2023234153A5 (https=) 2025-02-12

Family

ID=89024887

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024524786A Pending JPWO2023234153A1 (https=) 2022-05-31 2023-05-25

Country Status (2)

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JP (1) JPWO2023234153A1 (https=)
WO (1) WO2023234153A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025126801A1 (ja) * 2023-12-14 2025-06-19 株式会社堀場製作所 放射線検出装置、制御方法及びコンピュータプログラム

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6025985U (ja) * 1983-07-27 1985-02-21 日本電子株式会社 エネルギ−分散型ｘ線検出装置
JPS6191548A (ja) * 1984-10-12 1986-05-09 Hitachi Ltd 放射性金属酸化物の濃度分析方法
GB8718531D0 (en) * 1987-08-05 1987-09-09 Link Analytical Ltd X-ray detectors
JPH0869772A (ja) * 1994-08-30 1996-03-12 Nikon Corp 走査型電子顕微鏡
JP3887066B2 (ja) * 1997-05-10 2007-02-28 株式会社堀場製作所 エネルギー分散型半導体ｘ線検出器
JP7008519B2 (ja) * 2018-01-30 2022-01-25 日本電子株式会社 荷電粒子線装置

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