JPWO2023233597A1 - - Google Patents

Info

Publication number
JPWO2023233597A1
JPWO2023233597A1 JP2024524084A JP2024524084A JPWO2023233597A1 JP WO2023233597 A1 JPWO2023233597 A1 JP WO2023233597A1 JP 2024524084 A JP2024524084 A JP 2024524084A JP 2024524084 A JP2024524084 A JP 2024524084A JP WO2023233597 A1 JPWO2023233597 A1 JP WO2023233597A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2024524084A
Other languages
Japanese (ja)
Other versions
JPWO2023233597A5 (https=
JP7752243B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023233597A1 publication Critical patent/JPWO2023233597A1/ja
Publication of JPWO2023233597A5 publication Critical patent/JPWO2023233597A5/ja
Application granted granted Critical
Publication of JP7752243B2 publication Critical patent/JP7752243B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/34Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H10P72/3402Mechanical parts of transfer devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/33Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
    • H10P72/3302Mechanical parts of transfer devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J11/00Manipulators not otherwise provided for
    • B25J11/0095Manipulators transporting wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/06Apparatus for monitoring, sorting, marking, testing or measuring
    • H10P72/0606Position monitoring, e.g. misposition detection or presence detection
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/34Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H10P72/3406Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving removal of lid, door or cover
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/34Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H10P72/3411Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7602Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a robot blade or gripped by a gripper for conveyance

Landscapes

  • Engineering & Computer Science (AREA)
  • Robotics (AREA)
  • Mechanical Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
JP2024524084A 2022-06-01 2022-06-01 基板搬送装置 Active JP7752243B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2022/022370 WO2023233597A1 (ja) 2022-06-01 2022-06-01 基板搬送装置

Publications (3)

Publication Number Publication Date
JPWO2023233597A1 true JPWO2023233597A1 (https=) 2023-12-07
JPWO2023233597A5 JPWO2023233597A5 (https=) 2025-02-27
JP7752243B2 JP7752243B2 (ja) 2025-10-09

Family

ID=89026155

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024524084A Active JP7752243B2 (ja) 2022-06-01 2022-06-01 基板搬送装置

Country Status (4)

Country Link
US (1) US20250316514A1 (https=)
JP (1) JP7752243B2 (https=)
DE (1) DE112022006917T5 (https=)
WO (1) WO2023233597A1 (https=)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07211764A (ja) * 1994-01-20 1995-08-11 Nikon Corp レーザ応用装置
JPH11135594A (ja) * 1997-10-30 1999-05-21 Kokusai Electric Co Ltd カセット搬送方法および装置
JP2002110756A (ja) * 2000-09-22 2002-04-12 Applied Materials Inc オープンカセット用ロードポート
JP2007250563A (ja) * 2006-03-13 2007-09-27 Disco Abrasive Syst Ltd 研削装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5825948B2 (ja) 2011-09-14 2015-12-02 株式会社日立国際電気 基板処理装置及び半導体装置の製造方法
JP6217567B2 (ja) 2014-09-08 2017-10-25 信越半導体株式会社 半導体製造装置、半導体基板の製造方法及び搬送ロボット
JP6822953B2 (ja) 2014-11-25 2021-01-27 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated 基板キャリア及びパージチャンバの環境制御を伴う基板処理のシステム、装置、及び方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07211764A (ja) * 1994-01-20 1995-08-11 Nikon Corp レーザ応用装置
JPH11135594A (ja) * 1997-10-30 1999-05-21 Kokusai Electric Co Ltd カセット搬送方法および装置
JP2002110756A (ja) * 2000-09-22 2002-04-12 Applied Materials Inc オープンカセット用ロードポート
JP2007250563A (ja) * 2006-03-13 2007-09-27 Disco Abrasive Syst Ltd 研削装置

Also Published As

Publication number Publication date
WO2023233597A1 (ja) 2023-12-07
US20250316514A1 (en) 2025-10-09
DE112022006917T5 (de) 2025-01-09
JP7752243B2 (ja) 2025-10-09

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