JPWO2022259885A5 - - Google Patents

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Publication number
JPWO2022259885A5
JPWO2022259885A5 JP2023527612A JP2023527612A JPWO2022259885A5 JP WO2022259885 A5 JPWO2022259885 A5 JP WO2022259885A5 JP 2023527612 A JP2023527612 A JP 2023527612A JP 2023527612 A JP2023527612 A JP 2023527612A JP WO2022259885 A5 JPWO2022259885 A5 JP WO2022259885A5
Authority
JP
Japan
Prior art keywords
forming
composition
underlayer film
resist underlayer
group
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2023527612A
Other languages
English (en)
Japanese (ja)
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JPWO2022259885A1 (https=
JP7841535B2 (ja
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Publication date
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Priority claimed from PCT/JP2022/021673 external-priority patent/WO2022259885A1/ja
Publication of JPWO2022259885A1 publication Critical patent/JPWO2022259885A1/ja
Publication of JPWO2022259885A5 publication Critical patent/JPWO2022259885A5/ja
Application granted granted Critical
Publication of JP7841535B2 publication Critical patent/JP7841535B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2023527612A 2021-06-07 2022-05-27 半導体基板の製造方法及びレジスト下層膜形成用組成物 Active JP7841535B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021095000 2021-06-07
JP2021095000 2021-06-07
PCT/JP2022/021673 WO2022259885A1 (ja) 2021-06-07 2022-05-27 半導体基板の製造方法及びレジスト下層膜形成用組成物

Publications (3)

Publication Number Publication Date
JPWO2022259885A1 JPWO2022259885A1 (https=) 2022-12-15
JPWO2022259885A5 true JPWO2022259885A5 (https=) 2025-10-20
JP7841535B2 JP7841535B2 (ja) 2026-04-07

Family

ID=84424887

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023527612A Active JP7841535B2 (ja) 2021-06-07 2022-05-27 半導体基板の製造方法及びレジスト下層膜形成用組成物

Country Status (5)

Country Link
US (1) US20240142876A1 (https=)
JP (1) JP7841535B2 (https=)
KR (1) KR20240018455A (https=)
TW (1) TW202314387A (https=)
WO (1) WO2022259885A1 (https=)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3852107B2 (ja) 2000-11-14 2006-11-29 Jsr株式会社 反射防止膜形成組成物
JP2005309141A (ja) * 2004-04-22 2005-11-04 Jsr Corp レジストパターン形成方法および回路素子の製造方法
WO2013141015A1 (ja) 2012-03-23 2013-09-26 日産化学工業株式会社 Euvリソグラフィー用レジスト下層膜形成組成物
KR102038942B1 (ko) * 2015-06-24 2019-10-31 후지필름 가부시키가이샤 패턴 형성 방법, 적층체, 및 유기 용제 현상용 레지스트 조성물

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