JPWO2022249995A1 - - Google Patents

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Publication number
JPWO2022249995A1
JPWO2022249995A1 JP2023523452A JP2023523452A JPWO2022249995A1 JP WO2022249995 A1 JPWO2022249995 A1 JP WO2022249995A1 JP 2023523452 A JP2023523452 A JP 2023523452A JP 2023523452 A JP2023523452 A JP 2023523452A JP WO2022249995 A1 JPWO2022249995 A1 JP WO2022249995A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023523452A
Other languages
Japanese (ja)
Other versions
JPWO2022249995A5 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022249995A1 publication Critical patent/JPWO2022249995A1/ja
Publication of JPWO2022249995A5 publication Critical patent/JPWO2022249995A5/ja
Priority to JP2025092033A priority Critical patent/JP2025116172A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/20Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/24Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/26Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux using optical pumping
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/035Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
    • G01R33/0354SQUIDS
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N24/00Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
    • G01N24/006Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects using optical pumping

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Measuring Magnetic Variables (AREA)
JP2023523452A 2021-05-25 2022-05-20 Pending JPWO2022249995A1 (https=)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2025092033A JP2025116172A (ja) 2021-05-25 2025-06-02 検出機及び検出装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021087914 2021-05-25
JP2021156983 2021-09-27
PCT/JP2022/021004 WO2022249995A1 (ja) 2021-05-25 2022-05-20 検出基板、検出機及び検出装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2025092033A Division JP2025116172A (ja) 2021-05-25 2025-06-02 検出機及び検出装置

Publications (2)

Publication Number Publication Date
JPWO2022249995A1 true JPWO2022249995A1 (https=) 2022-12-01
JPWO2022249995A5 JPWO2022249995A5 (https=) 2024-02-19

Family

ID=84229859

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2023523452A Pending JPWO2022249995A1 (https=) 2021-05-25 2022-05-20
JP2025092033A Pending JP2025116172A (ja) 2021-05-25 2025-06-02 検出機及び検出装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2025092033A Pending JP2025116172A (ja) 2021-05-25 2025-06-02 検出機及び検出装置

Country Status (4)

Country Link
US (1) US20240219486A1 (https=)
EP (1) EP4350376A4 (https=)
JP (2) JPWO2022249995A1 (https=)
WO (1) WO2022249995A1 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024203140A1 (ja) * 2023-03-29 2024-10-03 京セラ株式会社 磁気検出器
WO2025187402A1 (ja) * 2024-03-04 2025-09-12 日新電機株式会社 量子デバイス及び評価装置
WO2025187461A1 (ja) * 2024-03-07 2025-09-12 京セラ株式会社 検出器及び顕微鏡
JP2025165073A (ja) * 2024-04-22 2025-11-04 株式会社アドバンテスト 計測装置、計測方法および被試験デバイス
KR102759056B1 (ko) * 2024-09-03 2025-01-23 주식회사 에이루트 5mA형 미세전류광자센싱 NV양자센서를 이용한 미세전류광자센싱 검출장치 및 방법
KR102814370B1 (ko) * 2024-10-14 2025-05-30 주식회사 에이루트 배터리온도센싱 nv양자센서·배터리압력센싱 nv양자센서로 이루어진 하이브리드 nv양자센서형 리튬이온 배터리 내부공간 온도·압력 센싱제어장치 및 방법

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007096645A (ja) * 2005-09-28 2007-04-12 Seiko Epson Corp マイクロ波発生装置およびこれを用いた機器
JP2008181492A (ja) * 2006-12-27 2008-08-07 Semiconductor Energy Lab Co Ltd 半導体装置
US20160282427A1 (en) * 2014-02-19 2016-09-29 Infinitum Solutions, Inc. Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices
JP2016205954A (ja) * 2015-04-21 2016-12-08 ルネサスエレクトロニクス株式会社 磁気計測装置
JP2017146158A (ja) * 2016-02-16 2017-08-24 ルネサスエレクトロニクス株式会社 磁気計測装置
CN108983121A (zh) * 2018-06-06 2018-12-11 中北大学 集成odmr功能部件的金刚石nv磁强计及制作工艺
CN110462417A (zh) * 2017-03-16 2019-11-15 苏黎世联邦理工学院 包括自旋缺陷的扫描传感器
JP2020038086A (ja) * 2018-09-03 2020-03-12 株式会社デンソー ダイヤモンドセンサシステム
JP2020067444A (ja) * 2018-10-26 2020-04-30 スミダコーポレーション株式会社 磁場発生源検出装置および磁場発生源検出方法
CN111568418A (zh) * 2020-06-03 2020-08-25 中北大学 一种基于金刚石nv色心用于心磁测量的磁强计及心磁测量系统
US20210103010A1 (en) * 2019-10-02 2021-04-08 X Development Llc Magnetometry Based on Electron Spin Defects

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6556013B2 (en) * 2001-03-09 2003-04-29 Bruker Biospin Corp. Planar NMR coils with localized field-generating and capacitive elements
US8193808B2 (en) * 2009-09-11 2012-06-05 Hewlett-Packard Development Company, L.P. Optically integrated biosensor based on optically detected magnetic resonance
WO2012174098A2 (en) * 2011-06-13 2012-12-20 President And Fellow Of Harvard College Dynamic decoupling in solid state spin ensembles
JP6311188B2 (ja) 2014-07-01 2018-04-18 学校法人金沢工業大学 Squid顕微鏡
DE102014219561A1 (de) * 2014-09-26 2016-03-31 Robert Bosch Gmbh Einrichtung zur Analyse von Substanzen in einer Probe, Atemgasanalysegerät, Kraftstoffsensor und Verfahren
US10677953B2 (en) * 2016-05-31 2020-06-09 Lockheed Martin Corporation Magneto-optical detecting apparatus and methods
US20200334559A1 (en) * 2019-04-19 2020-10-22 Hi Llc Systems and methods for suppression of interferences in magnetoencephalography (meg) and other magnetometer measurements
JP2020189777A (ja) * 2019-05-24 2020-11-26 国立大学法人京都大学 空孔欠陥形成方法
DE102020004617A1 (de) * 2019-07-25 2021-01-28 Bernd Burchard NV-Zentrum basierender Quantensensor mit großer Empfindlichkeit
JP7445502B2 (ja) * 2020-04-07 2024-03-07 矢崎総業株式会社 センサ

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007096645A (ja) * 2005-09-28 2007-04-12 Seiko Epson Corp マイクロ波発生装置およびこれを用いた機器
JP2008181492A (ja) * 2006-12-27 2008-08-07 Semiconductor Energy Lab Co Ltd 半導体装置
US20160282427A1 (en) * 2014-02-19 2016-09-29 Infinitum Solutions, Inc. Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices
JP2016205954A (ja) * 2015-04-21 2016-12-08 ルネサスエレクトロニクス株式会社 磁気計測装置
JP2017146158A (ja) * 2016-02-16 2017-08-24 ルネサスエレクトロニクス株式会社 磁気計測装置
CN110462417A (zh) * 2017-03-16 2019-11-15 苏黎世联邦理工学院 包括自旋缺陷的扫描传感器
CN108983121A (zh) * 2018-06-06 2018-12-11 中北大学 集成odmr功能部件的金刚石nv磁强计及制作工艺
JP2020038086A (ja) * 2018-09-03 2020-03-12 株式会社デンソー ダイヤモンドセンサシステム
JP2020067444A (ja) * 2018-10-26 2020-04-30 スミダコーポレーション株式会社 磁場発生源検出装置および磁場発生源検出方法
US20210103010A1 (en) * 2019-10-02 2021-04-08 X Development Llc Magnetometry Based on Electron Spin Defects
CN111568418A (zh) * 2020-06-03 2020-08-25 中北大学 一种基于金刚石nv色心用于心磁测量的磁强计及心磁测量系统

Also Published As

Publication number Publication date
US20240219486A1 (en) 2024-07-04
EP4350376A1 (en) 2024-04-10
JP2025116172A (ja) 2025-08-07
EP4350376A4 (en) 2024-09-25
WO2022249995A1 (ja) 2022-12-01

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