JPWO2022249995A1 - - Google Patents

Info

Publication number
JPWO2022249995A1
JPWO2022249995A1 JP2023523452A JP2023523452A JPWO2022249995A1 JP WO2022249995 A1 JPWO2022249995 A1 JP WO2022249995A1 JP 2023523452 A JP2023523452 A JP 2023523452A JP 2023523452 A JP2023523452 A JP 2023523452A JP WO2022249995 A1 JPWO2022249995 A1 JP WO2022249995A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023523452A
Other versions
JPWO2022249995A5 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022249995A1 publication Critical patent/JPWO2022249995A1/ja
Publication of JPWO2022249995A5 publication Critical patent/JPWO2022249995A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/24—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/26—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux using optical pumping
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N24/00—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
    • G01N24/006—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects using optical pumping

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Optics & Photonics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measuring Magnetic Variables (AREA)
JP2023523452A 2021-05-25 2022-05-20 Pending JPWO2022249995A1 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021087914 2021-05-25
JP2021156983 2021-09-27
PCT/JP2022/021004 WO2022249995A1 (ja) 2021-05-25 2022-05-20 検出基板、検出機及び検出装置

Publications (2)

Publication Number Publication Date
JPWO2022249995A1 true JPWO2022249995A1 (ja) 2022-12-01
JPWO2022249995A5 JPWO2022249995A5 (ja) 2024-02-19

Family

ID=84229859

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023523452A Pending JPWO2022249995A1 (ja) 2021-05-25 2022-05-20

Country Status (3)

Country Link
EP (1) EP4350376A1 (ja)
JP (1) JPWO2022249995A1 (ja)
WO (1) WO2022249995A1 (ja)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007096645A (ja) * 2005-09-28 2007-04-12 Seiko Epson Corp マイクロ波発生装置およびこれを用いた機器
US9778329B2 (en) * 2014-02-19 2017-10-03 Infinitum Solutions, Inc. Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices
JP6311188B2 (ja) 2014-07-01 2018-04-18 学校法人金沢工業大学 Ｓｑｕｉｄ顕微鏡
JP2016205954A (ja) * 2015-04-21 2016-12-08 ルネサスエレクトロニクス株式会社 磁気計測装置
JP6655415B2 (ja) * 2016-02-16 2020-02-26 ルネサスエレクトロニクス株式会社 磁気計測装置
JP7144730B2 (ja) * 2018-09-03 2022-09-30 株式会社デンソー ダイヤモンドセンサシステム
JP7209176B2 (ja) * 2018-10-26 2023-01-20 スミダコーポレーション株式会社 磁場発生源検出装置および磁場発生源検出方法
JP2020189777A (ja) * 2019-05-24 2020-11-26 国立大学法人京都大学 空孔欠陥形成方法
JP7445502B2 (ja) * 2020-04-07 2024-03-07 矢崎総業株式会社 センサ

Also Published As

Publication number Publication date
EP4350376A1 (en) 2024-04-10
WO2022249995A1 (ja) 2022-12-01

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Legal Events

Date Code Title Description
A521 Request for written amendment filed

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Effective date: 20231116

A621 Written request for application examination

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Effective date: 20231116