JPWO2022249995A1 - - Google Patents
Info
- Publication number
- JPWO2022249995A1 JPWO2022249995A1 JP2023523452A JP2023523452A JPWO2022249995A1 JP WO2022249995 A1 JPWO2022249995 A1 JP WO2022249995A1 JP 2023523452 A JP2023523452 A JP 2023523452A JP 2023523452 A JP2023523452 A JP 2023523452A JP WO2022249995 A1 JPWO2022249995 A1 JP WO2022249995A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/24—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/26—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux using optical pumping
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
- G01R33/0354—SQUIDS
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N24/00—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
- G01N24/006—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects using optical pumping
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Measuring Magnetic Variables (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021087914 | 2021-05-25 | ||
JP2021156983 | 2021-09-27 | ||
PCT/JP2022/021004 WO2022249995A1 (ja) | 2021-05-25 | 2022-05-20 | 検出基板、検出機及び検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2022249995A1 true JPWO2022249995A1 (ja) | 2022-12-01 |
JPWO2022249995A5 JPWO2022249995A5 (ja) | 2024-02-19 |
Family
ID=84229859
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023523452A Pending JPWO2022249995A1 (ja) | 2021-05-25 | 2022-05-20 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20240219486A1 (ja) |
EP (1) | EP4350376A1 (ja) |
JP (1) | JPWO2022249995A1 (ja) |
WO (1) | WO2022249995A1 (ja) |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007096645A (ja) * | 2005-09-28 | 2007-04-12 | Seiko Epson Corp | マイクロ波発生装置およびこれを用いた機器 |
US9778329B2 (en) * | 2014-02-19 | 2017-10-03 | Infinitum Solutions, Inc. | Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices |
JP6311188B2 (ja) | 2014-07-01 | 2018-04-18 | 学校法人金沢工業大学 | Squid顕微鏡 |
JP2016205954A (ja) * | 2015-04-21 | 2016-12-08 | ルネサスエレクトロニクス株式会社 | 磁気計測装置 |
JP6655415B2 (ja) * | 2016-02-16 | 2020-02-26 | ルネサスエレクトロニクス株式会社 | 磁気計測装置 |
JP7144730B2 (ja) * | 2018-09-03 | 2022-09-30 | 株式会社デンソー | ダイヤモンドセンサシステム |
JP7209176B2 (ja) * | 2018-10-26 | 2023-01-20 | スミダコーポレーション株式会社 | 磁場発生源検出装置および磁場発生源検出方法 |
JP2020189777A (ja) * | 2019-05-24 | 2020-11-26 | 国立大学法人京都大学 | 空孔欠陥形成方法 |
JP7445502B2 (ja) * | 2020-04-07 | 2024-03-07 | 矢崎総業株式会社 | センサ |
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2022
- 2022-05-20 US US18/562,786 patent/US20240219486A1/en active Pending
- 2022-05-20 JP JP2023523452A patent/JPWO2022249995A1/ja active Pending
- 2022-05-20 EP EP22811265.2A patent/EP4350376A1/en active Pending
- 2022-05-20 WO PCT/JP2022/021004 patent/WO2022249995A1/ja active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2022249995A1 (ja) | 2022-12-01 |
US20240219486A1 (en) | 2024-07-04 |
EP4350376A1 (en) | 2024-04-10 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20231116 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20231116 |